JP2007500849A5 - - Google Patents

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Publication number
JP2007500849A5
JP2007500849A5 JP2006529746A JP2006529746A JP2007500849A5 JP 2007500849 A5 JP2007500849 A5 JP 2007500849A5 JP 2006529746 A JP2006529746 A JP 2006529746A JP 2006529746 A JP2006529746 A JP 2006529746A JP 2007500849 A5 JP2007500849 A5 JP 2007500849A5
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JP
Japan
Prior art keywords
contact detection
deflection
parameter
coordinate measuring
contact
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2006529746A
Other languages
English (en)
Japanese (ja)
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JP2007500849A (ja
JP4845734B2 (ja
Filing date
Publication date
Priority claimed from DE10327867A external-priority patent/DE10327867A1/de
Application filed filed Critical
Priority claimed from PCT/EP2004/004805 external-priority patent/WO2004106854A1/de
Publication of JP2007500849A publication Critical patent/JP2007500849A/ja
Publication of JP2007500849A5 publication Critical patent/JP2007500849A5/ja
Application granted granted Critical
Publication of JP4845734B2 publication Critical patent/JP4845734B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP2006529746A 2003-05-28 2004-05-06 座標測定装置、方法、コンピュータプログラム並びにデータ担体 Expired - Lifetime JP4845734B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
DE10324695.9 2003-05-28
DE10324695 2003-05-28
DE10327867.2 2003-06-18
DE10327867A DE10327867A1 (de) 2003-05-28 2003-06-18 Verfahren zur Kalibrierung eines Tasters
PCT/EP2004/004805 WO2004106854A1 (de) 2003-05-28 2004-05-06 Verfahren zur kalibrierung eines tasters

Publications (3)

Publication Number Publication Date
JP2007500849A JP2007500849A (ja) 2007-01-18
JP2007500849A5 true JP2007500849A5 (enExample) 2011-05-19
JP4845734B2 JP4845734B2 (ja) 2011-12-28

Family

ID=33441520

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006529746A Expired - Lifetime JP4845734B2 (ja) 2003-05-28 2004-05-06 座標測定装置、方法、コンピュータプログラム並びにデータ担体

Country Status (2)

Country Link
JP (1) JP4845734B2 (enExample)
DE (1) DE10327867A1 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4568621B2 (ja) * 2005-02-28 2010-10-27 株式会社ミツトヨ 表面性状測定機の真直度補正方法および表面性状測定機
JP4611403B2 (ja) * 2008-06-03 2011-01-12 パナソニック株式会社 形状測定装置及び形状測定方法
DE102010006382B4 (de) * 2010-01-29 2013-09-26 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren und Anordnung zum Betreiben von Koordinatenmessgeräten
DE102011008421A1 (de) * 2011-01-12 2012-07-12 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren und Anordnung zum Kalibrieren von messwertgebenden Sensoren eines taktilen Koordinatenmessgerätes
DE102015201582B4 (de) * 2015-01-29 2020-10-01 Carl Zeiss Industrielle Messtechnik Gmbh Ermittlung und Korrektur eines Fehlers einer Drehvorrichtung für ein Koordinatenmessgerät
DE102016209547A1 (de) 2016-06-01 2017-12-07 Carl Zeiss Industrielle Messtechnik Gmbh Verfahren und Vorrichtung zur Vermessung von Messobjekten
JP2025145431A (ja) * 2024-03-21 2025-10-03 株式会社東京精密 校正方法及び校正装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57127805A (en) * 1981-01-31 1982-08-09 Osaka Kiko Co Ltd Device for measuring three-dimensional shape
GB9907868D0 (en) * 1999-04-08 1999-06-02 Renishaw Plc Method of calibrating a scanning system
JP4611403B2 (ja) * 2008-06-03 2011-01-12 パナソニック株式会社 形状測定装置及び形状測定方法

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