JP2007139776A - 光学式エッジ急変部ゲージ - Google Patents
光学式エッジ急変部ゲージ Download PDFInfo
- Publication number
- JP2007139776A JP2007139776A JP2006308932A JP2006308932A JP2007139776A JP 2007139776 A JP2007139776 A JP 2007139776A JP 2006308932 A JP2006308932 A JP 2006308932A JP 2006308932 A JP2006308932 A JP 2006308932A JP 2007139776 A JP2007139776 A JP 2007139776A
- Authority
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- Japan
- Prior art keywords
- projector
- edge
- sudden change
- optical
- light path
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 44
- 238000005259 measurement Methods 0.000 claims description 6
- 238000001514 detection method Methods 0.000 claims 1
- 230000000087 stabilizing effect Effects 0.000 claims 1
- 238000007689 inspection Methods 0.000 abstract description 4
- 238000004458 analytical method Methods 0.000 description 10
- 238000003384 imaging method Methods 0.000 description 7
- 230000010363 phase shift Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 238000012545 processing Methods 0.000 description 4
- 238000003672 processing method Methods 0.000 description 4
- 238000005286 illumination Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000002377 Fourier profilometry Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000011960 computer-aided design Methods 0.000 description 2
- 238000013500 data storage Methods 0.000 description 2
- 238000005305 interferometry Methods 0.000 description 2
- 238000013178 mathematical model Methods 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000004590 computer program Methods 0.000 description 1
- 238000011424 computer programming method Methods 0.000 description 1
- 238000012407 engineering method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000013507 mapping Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 239000000700 radioactive tracer Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
- G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
Landscapes
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US11/274,578 US7489408B2 (en) | 2005-11-15 | 2005-11-15 | Optical edge break gage |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2007139776A true JP2007139776A (ja) | 2007-06-07 |
| JP2007139776A5 JP2007139776A5 (enExample) | 2013-06-06 |
Family
ID=37680699
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006308932A Pending JP2007139776A (ja) | 2005-11-15 | 2006-11-15 | 光学式エッジ急変部ゲージ |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7489408B2 (enExample) |
| EP (1) | EP1785693B1 (enExample) |
| JP (1) | JP2007139776A (enExample) |
| CN (1) | CN101029819B (enExample) |
| DE (1) | DE602006005028D1 (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010271312A (ja) * | 2009-05-21 | 2010-12-02 | General Electric Co <Ge> | マルチイメージフェーズシフト解析を用いた検査システム及び方法 |
| JP2012521005A (ja) * | 2009-03-19 | 2012-09-10 | ゼネラル・エレクトリック・カンパニイ | 光学式ゲージ及び3次元表面プロファイル測定方法 |
Families Citing this family (40)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7925075B2 (en) * | 2007-05-07 | 2011-04-12 | General Electric Company | Inspection system and methods with autocompensation for edge break gauging orientation |
| GB0714974D0 (en) * | 2007-07-31 | 2007-09-12 | Third Dimension Software Ltd | Measurement apparatus |
| CA2606267A1 (fr) * | 2007-10-11 | 2009-04-11 | Hydro-Quebec | Systeme et methode de cartographie tridimensionnelle d'une surface structurelle |
| US7812968B2 (en) * | 2008-03-05 | 2010-10-12 | Ge Inspection Technologies, Lp | Fringe projection system and method for a probe using a coherent fiber bundle |
| US8107083B2 (en) * | 2008-03-05 | 2012-01-31 | General Electric Company | System aspects for a probe system that utilizes structured-light |
| US8422030B2 (en) * | 2008-03-05 | 2013-04-16 | General Electric Company | Fringe projection system with intensity modulating by columns of a plurality of grating elements |
| US7821649B2 (en) | 2008-03-05 | 2010-10-26 | Ge Inspection Technologies, Lp | Fringe projection system and method for a probe suitable for phase-shift analysis |
| US8917320B2 (en) * | 2009-03-04 | 2014-12-23 | VISIONx INC. | Digital optical comparator |
| US20100309290A1 (en) * | 2009-06-08 | 2010-12-09 | Stephen Brooks Myers | System for capture and display of stereoscopic content |
| US8269970B2 (en) * | 2009-07-02 | 2012-09-18 | Quality Vision International, Inc. | Optical comparator with digital gage |
| US9001029B2 (en) * | 2011-02-15 | 2015-04-07 | Basf Se | Detector for optically detecting at least one object |
| AU2013365772B2 (en) | 2012-12-19 | 2017-08-10 | Basf Se | Detector for optically detecting at least one object |
| JP2014182028A (ja) * | 2013-03-19 | 2014-09-29 | Omron Corp | 限定領域反射型光電センサ |
| CN105452808A (zh) | 2013-06-13 | 2016-03-30 | 巴斯夫欧洲公司 | 用于光学检测至少一个对象的取向的检测器 |
| US9989623B2 (en) | 2013-06-13 | 2018-06-05 | Basf Se | Detector for determining a longitudinal coordinate of an object via an intensity distribution of illuminated pixels |
| WO2015024870A1 (en) | 2013-08-19 | 2015-02-26 | Basf Se | Detector for determining a position of at least one object |
| EP3036503B1 (en) | 2013-08-19 | 2019-08-07 | Basf Se | Optical detector |
| CN104036545A (zh) * | 2014-06-27 | 2014-09-10 | 嘉善天慧光电科技有限公司 | 一种便携式自适应图像三维重建仪的光源结构 |
| KR102397527B1 (ko) | 2014-07-08 | 2022-05-13 | 바스프 에스이 | 하나 이상의 물체의 위치를 결정하기 위한 검출기 |
| WO2016051323A1 (en) | 2014-09-29 | 2016-04-07 | Basf Se | Detector for optically determining a position of at least one object |
| EP3230841B1 (en) | 2014-12-09 | 2019-07-03 | Basf Se | Optical detector |
| CN107438775B (zh) | 2015-01-30 | 2022-01-21 | 特里纳米克斯股份有限公司 | 用于至少一个对象的光学检测的检测器 |
| WO2017012986A1 (en) | 2015-07-17 | 2017-01-26 | Trinamix Gmbh | Detector for optically detecting at least one object |
| CN108141579B (zh) | 2015-09-14 | 2020-06-12 | 特里纳米克斯股份有限公司 | 3d相机 |
| CN109564927B (zh) | 2016-07-29 | 2023-06-20 | 特里纳米克斯股份有限公司 | 光学传感器和用于光学检测的检测器 |
| JP2019532517A (ja) | 2016-10-25 | 2019-11-07 | トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング | 光学的に検出するための光検出器 |
| JP7241684B2 (ja) | 2016-10-25 | 2023-03-17 | トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング | 少なくとも1個の対象物の光学的な検出のための検出器 |
| US11860292B2 (en) | 2016-11-17 | 2024-01-02 | Trinamix Gmbh | Detector and methods for authenticating at least one object |
| EP3571522B1 (en) | 2016-11-17 | 2023-05-10 | trinamiX GmbH | Detector for optically detecting at least one object |
| US11060922B2 (en) | 2017-04-20 | 2021-07-13 | Trinamix Gmbh | Optical detector |
| US11067692B2 (en) | 2017-06-26 | 2021-07-20 | Trinamix Gmbh | Detector for determining a position of at least one object |
| DE102017223287A1 (de) | 2017-12-19 | 2019-06-19 | Lufthansa Technik Ag | Verfahren zum Überprüfen des technischen Zustands eines Gegenstands |
| WO2019243046A1 (en) | 2018-06-18 | 2019-12-26 | Lumileds Holding B.V. | Lighting device comprising led and grating |
| KR102545980B1 (ko) | 2018-07-19 | 2023-06-21 | 액티브 서지컬, 인크. | 자동화된 수술 로봇을 위한 비전 시스템에서 깊이의 다중 모달 감지를 위한 시스템 및 방법 |
| CA3125166A1 (en) | 2018-12-28 | 2020-07-02 | Activ Surgical, Inc. | User interface elements for orientation of remote camera during surgery |
| CN113993474A (zh) | 2018-12-28 | 2022-01-28 | 艾科缇弗外科公司 | 在微创手术中优化可达性、工作空间和灵巧性的系统和方法 |
| CN113950279B (zh) | 2019-04-08 | 2023-04-14 | 艾科缇弗外科公司 | 用于医疗成像的系统和方法 |
| US12292564B2 (en) | 2019-04-08 | 2025-05-06 | Activ Surgical, Inc. | Systems and methods for medical imaging |
| WO2020214821A1 (en) | 2019-04-19 | 2020-10-22 | Activ Surgical, Inc. | Systems and methods for trocar kinematics |
| EP4017340A4 (en) | 2019-08-21 | 2023-12-13 | Activ Surgical, Inc. | Systems and methods for medical imaging |
Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02500217A (ja) * | 1986-10-15 | 1990-01-25 | イーストマン・コダック・カンパニー | 拡張範囲モアレ等高線作成法 |
| JPH04110706A (ja) * | 1990-08-31 | 1992-04-13 | Kiyadeitsukusu:Kk | 三次元形状データ取込み装置 |
| JPH07311030A (ja) * | 1994-05-19 | 1995-11-28 | Nissan Motor Co Ltd | 塗装面性状測定装置 |
| JPH10510352A (ja) * | 1994-08-24 | 1998-10-06 | トリコーダー テクノロジー ピーエルシー | 走査装置および走査方法 |
| JPH1119039A (ja) * | 1997-06-30 | 1999-01-26 | Nidek Co Ltd | 眼科装置 |
| JP2000009444A (ja) * | 1998-06-23 | 2000-01-14 | Takaoka Electric Mfg Co Ltd | 表面形状計測装置 |
| JP2000097672A (ja) * | 1998-09-18 | 2000-04-07 | Sanyo Electric Co Ltd | 3次元計測機における制御情報生成方法及び制御情報生成支援システム |
| JP2000292131A (ja) * | 1999-04-07 | 2000-10-20 | Minolta Co Ltd | 3次元情報入力カメラ |
| JP2001012930A (ja) * | 1999-06-28 | 2001-01-19 | Nissan Motor Co Ltd | 表面欠陥検査装置 |
| JP2002056348A (ja) * | 2000-08-07 | 2002-02-20 | Tohken Co Ltd | オートフォーカス機能を有する手持ち式読取装置及びオートフォーカス方法、並び距離計測方法 |
| JP2003527590A (ja) * | 2000-03-10 | 2003-09-16 | パーセプトロン インコーポレイテッド | 非接触測定装置 |
| JP2004354382A (ja) * | 2003-05-28 | 2004-12-16 | General Electric Co <Ge> | 流れ開口面積を測定するための方法及び装置 |
| JP2005121644A (ja) * | 2003-09-25 | 2005-05-12 | Brother Ind Ltd | 3次元形状検出システム、3次元形状検出装置、及び3次元形状検出プログラム |
Family Cites Families (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4641972A (en) | 1984-09-14 | 1987-02-10 | New York Institute Of Technology | Method and apparatus for surface profilometry |
| US4983043A (en) | 1987-04-17 | 1991-01-08 | Industrial Technology Institute | High accuracy structured light profiler |
| US4727390A (en) * | 1987-06-22 | 1988-02-23 | Brown Melvin W | Camera mounting bracket |
| US4952772A (en) | 1988-11-16 | 1990-08-28 | Westinghouse Electric Corp. | Automatic seam tracker and real time error cumulative control system for an industrial robot |
| US4984893A (en) | 1989-12-01 | 1991-01-15 | Wyko Corporation | Phase shifting device and method |
| US5069548A (en) | 1990-08-08 | 1991-12-03 | Industrial Technology Institute | Field shift moire system |
| US5189493A (en) | 1990-11-02 | 1993-02-23 | Industrial Technology Institute | Moire contouring camera |
| US5636025A (en) | 1992-04-23 | 1997-06-03 | Medar, Inc. | System for optically measuring the surface contour of a part using more fringe techniques |
| US5307152A (en) | 1992-09-29 | 1994-04-26 | Industrial Technology Institute | Moire inspection system |
| US5500737A (en) | 1993-07-21 | 1996-03-19 | General Electric Company | Method for measuring the contour of a surface |
| US5825495A (en) | 1995-02-27 | 1998-10-20 | Lockheed Martin Corporation | Bright field illumination system |
| WO1996041304A1 (en) | 1995-06-07 | 1996-12-19 | The Trustees Of Columbia University In The City Of New York | Apparatus and methods for determining the three-dimensional shape of an object using active illumination and relative blurring in two images due to defocus |
| KR19990029064A (ko) | 1995-07-18 | 1999-04-15 | 낸시 엘. 후체슨 | 확장된 영상 깊이를 갖는 모아레 간섭 시스템 및 방법 |
| US6009189A (en) | 1996-08-16 | 1999-12-28 | Schaack; David F. | Apparatus and method for making accurate three-dimensional size measurements of inaccessible objects |
| US6438272B1 (en) | 1997-12-31 | 2002-08-20 | The Research Foundation Of State University Of Ny | Method and apparatus for three dimensional surface contouring using a digital video projection system |
| US6636255B1 (en) | 1998-01-29 | 2003-10-21 | Fuji Photo Optical Co., Ltd. | Three-dimensional image scanner and heat-insulating device for optical apparatus |
| US6252623B1 (en) | 1998-05-15 | 2001-06-26 | 3Dmetrics, Incorporated | Three dimensional imaging system |
| US6040910A (en) | 1998-05-20 | 2000-03-21 | The Penn State Research Foundation | Optical phase-shift triangulation technique (PST) for non-contact surface profiling |
| US6522777B1 (en) | 1998-07-08 | 2003-02-18 | Ppt Vision, Inc. | Combined 3D- and 2D-scanning machine-vision system and method |
| US6084712A (en) | 1998-11-03 | 2000-07-04 | Dynamic Measurement And Inspection,Llc | Three dimensional imaging using a refractive optic design |
| DE50008847D1 (de) | 1999-06-10 | 2005-01-05 | Mpt Praez Steile Gmbh Mittweid | Vorrichtung zur berührungslosen dreidimensionalen vermessung von körpern und verfahren zur bestimmung eines koordinatensystems für messpunktkoordinaten |
| US6788210B1 (en) | 1999-09-16 | 2004-09-07 | The Research Foundation Of State University Of New York | Method and apparatus for three dimensional surface contouring and ranging using a digital video projection system |
| US6639685B1 (en) | 2000-02-25 | 2003-10-28 | General Motors Corporation | Image processing method using phase-shifted fringe patterns and curve fitting |
| US6593587B2 (en) * | 2000-03-10 | 2003-07-15 | Perceptron, Inc. | Non-contact measurement device for quickly and accurately obtaining dimensional measurement data |
| US7002589B2 (en) | 2000-03-17 | 2006-02-21 | Sun Microsystems, Inc. | Blending the edges of multiple overlapping screen images |
| KR100389017B1 (ko) | 2000-11-22 | 2003-06-25 | (주) 인텍플러스 | 모아레무늬 발생기를 적용한 위상천이 영사식 모아레방법및 장치 |
| US6841780B2 (en) | 2001-01-19 | 2005-01-11 | Honeywell International Inc. | Method and apparatus for detecting objects |
| DE10142166A1 (de) | 2001-08-29 | 2003-03-20 | Bosch Gmbh Robert | Handgerät zur berührungslosen Abstandsmessung |
| US6910278B2 (en) | 2003-01-30 | 2005-06-28 | Lockheed Martin Corporation | Apparatus and method for inspecting and marking repair areas on a blade |
| US7324677B2 (en) | 2003-10-14 | 2008-01-29 | Agilent Technologies, Inc. | Feature quantitation methods and system |
| US6945124B1 (en) | 2004-10-22 | 2005-09-20 | Pratt & Whitney Canada Corp. | Measurement system |
-
2005
- 2005-11-15 US US11/274,578 patent/US7489408B2/en active Active - Reinstated
-
2006
- 2006-11-13 DE DE602006005028T patent/DE602006005028D1/de active Active
- 2006-11-13 EP EP06255799A patent/EP1785693B1/en not_active Not-in-force
- 2006-11-15 JP JP2006308932A patent/JP2007139776A/ja active Pending
- 2006-11-15 CN CN2006100642028A patent/CN101029819B/zh not_active Expired - Fee Related
Patent Citations (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02500217A (ja) * | 1986-10-15 | 1990-01-25 | イーストマン・コダック・カンパニー | 拡張範囲モアレ等高線作成法 |
| JPH04110706A (ja) * | 1990-08-31 | 1992-04-13 | Kiyadeitsukusu:Kk | 三次元形状データ取込み装置 |
| JPH07311030A (ja) * | 1994-05-19 | 1995-11-28 | Nissan Motor Co Ltd | 塗装面性状測定装置 |
| JPH10510352A (ja) * | 1994-08-24 | 1998-10-06 | トリコーダー テクノロジー ピーエルシー | 走査装置および走査方法 |
| JPH1119039A (ja) * | 1997-06-30 | 1999-01-26 | Nidek Co Ltd | 眼科装置 |
| JP2000009444A (ja) * | 1998-06-23 | 2000-01-14 | Takaoka Electric Mfg Co Ltd | 表面形状計測装置 |
| JP2000097672A (ja) * | 1998-09-18 | 2000-04-07 | Sanyo Electric Co Ltd | 3次元計測機における制御情報生成方法及び制御情報生成支援システム |
| JP2000292131A (ja) * | 1999-04-07 | 2000-10-20 | Minolta Co Ltd | 3次元情報入力カメラ |
| JP2001012930A (ja) * | 1999-06-28 | 2001-01-19 | Nissan Motor Co Ltd | 表面欠陥検査装置 |
| JP2003527590A (ja) * | 2000-03-10 | 2003-09-16 | パーセプトロン インコーポレイテッド | 非接触測定装置 |
| JP2002056348A (ja) * | 2000-08-07 | 2002-02-20 | Tohken Co Ltd | オートフォーカス機能を有する手持ち式読取装置及びオートフォーカス方法、並び距離計測方法 |
| JP2004354382A (ja) * | 2003-05-28 | 2004-12-16 | General Electric Co <Ge> | 流れ開口面積を測定するための方法及び装置 |
| JP2005121644A (ja) * | 2003-09-25 | 2005-05-12 | Brother Ind Ltd | 3次元形状検出システム、3次元形状検出装置、及び3次元形状検出プログラム |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012521005A (ja) * | 2009-03-19 | 2012-09-10 | ゼネラル・エレクトリック・カンパニイ | 光学式ゲージ及び3次元表面プロファイル測定方法 |
| JP2010271312A (ja) * | 2009-05-21 | 2010-12-02 | General Electric Co <Ge> | マルチイメージフェーズシフト解析を用いた検査システム及び方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP1785693A1 (en) | 2007-05-16 |
| US7489408B2 (en) | 2009-02-10 |
| US20070109558A1 (en) | 2007-05-17 |
| CN101029819A (zh) | 2007-09-05 |
| CN101029819B (zh) | 2010-09-29 |
| DE602006005028D1 (de) | 2009-03-19 |
| EP1785693B1 (en) | 2009-01-28 |
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