JP2007139776A - 光学式エッジ急変部ゲージ - Google Patents

光学式エッジ急変部ゲージ Download PDF

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Publication number
JP2007139776A
JP2007139776A JP2006308932A JP2006308932A JP2007139776A JP 2007139776 A JP2007139776 A JP 2007139776A JP 2006308932 A JP2006308932 A JP 2006308932A JP 2006308932 A JP2006308932 A JP 2006308932A JP 2007139776 A JP2007139776 A JP 2007139776A
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JP
Japan
Prior art keywords
projector
edge
sudden change
optical
light path
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Pending
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JP2006308932A
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English (en)
Japanese (ja)
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JP2007139776A5 (enExample
Inventor
Kevin George Harding
ケビン・ジョージ・ハーディング
Shu-Guo Tang
シュ−グオ・タン
Craig Alan Cantello
クレッグ・アラン・カンテロ
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General Electric Co
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General Electric Co
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Application filed by General Electric Co filed Critical General Electric Co
Publication of JP2007139776A publication Critical patent/JP2007139776A/ja
Publication of JP2007139776A5 publication Critical patent/JP2007139776A5/ja
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns

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  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2006308932A 2005-11-15 2006-11-15 光学式エッジ急変部ゲージ Pending JP2007139776A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/274,578 US7489408B2 (en) 2005-11-15 2005-11-15 Optical edge break gage

Publications (2)

Publication Number Publication Date
JP2007139776A true JP2007139776A (ja) 2007-06-07
JP2007139776A5 JP2007139776A5 (enExample) 2013-06-06

Family

ID=37680699

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006308932A Pending JP2007139776A (ja) 2005-11-15 2006-11-15 光学式エッジ急変部ゲージ

Country Status (5)

Country Link
US (1) US7489408B2 (enExample)
EP (1) EP1785693B1 (enExample)
JP (1) JP2007139776A (enExample)
CN (1) CN101029819B (enExample)
DE (1) DE602006005028D1 (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
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JP2010271312A (ja) * 2009-05-21 2010-12-02 General Electric Co <Ge> マルチイメージフェーズシフト解析を用いた検査システム及び方法
JP2012521005A (ja) * 2009-03-19 2012-09-10 ゼネラル・エレクトリック・カンパニイ 光学式ゲージ及び3次元表面プロファイル測定方法

Families Citing this family (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7925075B2 (en) * 2007-05-07 2011-04-12 General Electric Company Inspection system and methods with autocompensation for edge break gauging orientation
GB0714974D0 (en) * 2007-07-31 2007-09-12 Third Dimension Software Ltd Measurement apparatus
CA2606267A1 (fr) * 2007-10-11 2009-04-11 Hydro-Quebec Systeme et methode de cartographie tridimensionnelle d'une surface structurelle
US7812968B2 (en) * 2008-03-05 2010-10-12 Ge Inspection Technologies, Lp Fringe projection system and method for a probe using a coherent fiber bundle
US8107083B2 (en) * 2008-03-05 2012-01-31 General Electric Company System aspects for a probe system that utilizes structured-light
US8422030B2 (en) * 2008-03-05 2013-04-16 General Electric Company Fringe projection system with intensity modulating by columns of a plurality of grating elements
US7821649B2 (en) 2008-03-05 2010-10-26 Ge Inspection Technologies, Lp Fringe projection system and method for a probe suitable for phase-shift analysis
US8917320B2 (en) * 2009-03-04 2014-12-23 VISIONx INC. Digital optical comparator
US20100309290A1 (en) * 2009-06-08 2010-12-09 Stephen Brooks Myers System for capture and display of stereoscopic content
US8269970B2 (en) * 2009-07-02 2012-09-18 Quality Vision International, Inc. Optical comparator with digital gage
US9001029B2 (en) * 2011-02-15 2015-04-07 Basf Se Detector for optically detecting at least one object
AU2013365772B2 (en) 2012-12-19 2017-08-10 Basf Se Detector for optically detecting at least one object
JP2014182028A (ja) * 2013-03-19 2014-09-29 Omron Corp 限定領域反射型光電センサ
CN105452808A (zh) 2013-06-13 2016-03-30 巴斯夫欧洲公司 用于光学检测至少一个对象的取向的检测器
US9989623B2 (en) 2013-06-13 2018-06-05 Basf Se Detector for determining a longitudinal coordinate of an object via an intensity distribution of illuminated pixels
WO2015024870A1 (en) 2013-08-19 2015-02-26 Basf Se Detector for determining a position of at least one object
EP3036503B1 (en) 2013-08-19 2019-08-07 Basf Se Optical detector
CN104036545A (zh) * 2014-06-27 2014-09-10 嘉善天慧光电科技有限公司 一种便携式自适应图像三维重建仪的光源结构
KR102397527B1 (ko) 2014-07-08 2022-05-13 바스프 에스이 하나 이상의 물체의 위치를 결정하기 위한 검출기
WO2016051323A1 (en) 2014-09-29 2016-04-07 Basf Se Detector for optically determining a position of at least one object
EP3230841B1 (en) 2014-12-09 2019-07-03 Basf Se Optical detector
CN107438775B (zh) 2015-01-30 2022-01-21 特里纳米克斯股份有限公司 用于至少一个对象的光学检测的检测器
WO2017012986A1 (en) 2015-07-17 2017-01-26 Trinamix Gmbh Detector for optically detecting at least one object
CN108141579B (zh) 2015-09-14 2020-06-12 特里纳米克斯股份有限公司 3d相机
CN109564927B (zh) 2016-07-29 2023-06-20 特里纳米克斯股份有限公司 光学传感器和用于光学检测的检测器
JP2019532517A (ja) 2016-10-25 2019-11-07 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 光学的に検出するための光検出器
JP7241684B2 (ja) 2016-10-25 2023-03-17 トリナミクス ゲゼルシャフト ミット ベシュレンクテル ハフツング 少なくとも1個の対象物の光学的な検出のための検出器
US11860292B2 (en) 2016-11-17 2024-01-02 Trinamix Gmbh Detector and methods for authenticating at least one object
EP3571522B1 (en) 2016-11-17 2023-05-10 trinamiX GmbH Detector for optically detecting at least one object
US11060922B2 (en) 2017-04-20 2021-07-13 Trinamix Gmbh Optical detector
US11067692B2 (en) 2017-06-26 2021-07-20 Trinamix Gmbh Detector for determining a position of at least one object
DE102017223287A1 (de) 2017-12-19 2019-06-19 Lufthansa Technik Ag Verfahren zum Überprüfen des technischen Zustands eines Gegenstands
WO2019243046A1 (en) 2018-06-18 2019-12-26 Lumileds Holding B.V. Lighting device comprising led and grating
KR102545980B1 (ko) 2018-07-19 2023-06-21 액티브 서지컬, 인크. 자동화된 수술 로봇을 위한 비전 시스템에서 깊이의 다중 모달 감지를 위한 시스템 및 방법
CA3125166A1 (en) 2018-12-28 2020-07-02 Activ Surgical, Inc. User interface elements for orientation of remote camera during surgery
CN113993474A (zh) 2018-12-28 2022-01-28 艾科缇弗外科公司 在微创手术中优化可达性、工作空间和灵巧性的系统和方法
CN113950279B (zh) 2019-04-08 2023-04-14 艾科缇弗外科公司 用于医疗成像的系统和方法
US12292564B2 (en) 2019-04-08 2025-05-06 Activ Surgical, Inc. Systems and methods for medical imaging
WO2020214821A1 (en) 2019-04-19 2020-10-22 Activ Surgical, Inc. Systems and methods for trocar kinematics
EP4017340A4 (en) 2019-08-21 2023-12-13 Activ Surgical, Inc. Systems and methods for medical imaging

Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02500217A (ja) * 1986-10-15 1990-01-25 イーストマン・コダック・カンパニー 拡張範囲モアレ等高線作成法
JPH04110706A (ja) * 1990-08-31 1992-04-13 Kiyadeitsukusu:Kk 三次元形状データ取込み装置
JPH07311030A (ja) * 1994-05-19 1995-11-28 Nissan Motor Co Ltd 塗装面性状測定装置
JPH10510352A (ja) * 1994-08-24 1998-10-06 トリコーダー テクノロジー ピーエルシー 走査装置および走査方法
JPH1119039A (ja) * 1997-06-30 1999-01-26 Nidek Co Ltd 眼科装置
JP2000009444A (ja) * 1998-06-23 2000-01-14 Takaoka Electric Mfg Co Ltd 表面形状計測装置
JP2000097672A (ja) * 1998-09-18 2000-04-07 Sanyo Electric Co Ltd 3次元計測機における制御情報生成方法及び制御情報生成支援システム
JP2000292131A (ja) * 1999-04-07 2000-10-20 Minolta Co Ltd 3次元情報入力カメラ
JP2001012930A (ja) * 1999-06-28 2001-01-19 Nissan Motor Co Ltd 表面欠陥検査装置
JP2002056348A (ja) * 2000-08-07 2002-02-20 Tohken Co Ltd オートフォーカス機能を有する手持ち式読取装置及びオートフォーカス方法、並び距離計測方法
JP2003527590A (ja) * 2000-03-10 2003-09-16 パーセプトロン インコーポレイテッド 非接触測定装置
JP2004354382A (ja) * 2003-05-28 2004-12-16 General Electric Co <Ge> 流れ開口面積を測定するための方法及び装置
JP2005121644A (ja) * 2003-09-25 2005-05-12 Brother Ind Ltd 3次元形状検出システム、3次元形状検出装置、及び3次元形状検出プログラム

Family Cites Families (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4641972A (en) 1984-09-14 1987-02-10 New York Institute Of Technology Method and apparatus for surface profilometry
US4983043A (en) 1987-04-17 1991-01-08 Industrial Technology Institute High accuracy structured light profiler
US4727390A (en) * 1987-06-22 1988-02-23 Brown Melvin W Camera mounting bracket
US4952772A (en) 1988-11-16 1990-08-28 Westinghouse Electric Corp. Automatic seam tracker and real time error cumulative control system for an industrial robot
US4984893A (en) 1989-12-01 1991-01-15 Wyko Corporation Phase shifting device and method
US5069548A (en) 1990-08-08 1991-12-03 Industrial Technology Institute Field shift moire system
US5189493A (en) 1990-11-02 1993-02-23 Industrial Technology Institute Moire contouring camera
US5636025A (en) 1992-04-23 1997-06-03 Medar, Inc. System for optically measuring the surface contour of a part using more fringe techniques
US5307152A (en) 1992-09-29 1994-04-26 Industrial Technology Institute Moire inspection system
US5500737A (en) 1993-07-21 1996-03-19 General Electric Company Method for measuring the contour of a surface
US5825495A (en) 1995-02-27 1998-10-20 Lockheed Martin Corporation Bright field illumination system
WO1996041304A1 (en) 1995-06-07 1996-12-19 The Trustees Of Columbia University In The City Of New York Apparatus and methods for determining the three-dimensional shape of an object using active illumination and relative blurring in two images due to defocus
KR19990029064A (ko) 1995-07-18 1999-04-15 낸시 엘. 후체슨 확장된 영상 깊이를 갖는 모아레 간섭 시스템 및 방법
US6009189A (en) 1996-08-16 1999-12-28 Schaack; David F. Apparatus and method for making accurate three-dimensional size measurements of inaccessible objects
US6438272B1 (en) 1997-12-31 2002-08-20 The Research Foundation Of State University Of Ny Method and apparatus for three dimensional surface contouring using a digital video projection system
US6636255B1 (en) 1998-01-29 2003-10-21 Fuji Photo Optical Co., Ltd. Three-dimensional image scanner and heat-insulating device for optical apparatus
US6252623B1 (en) 1998-05-15 2001-06-26 3Dmetrics, Incorporated Three dimensional imaging system
US6040910A (en) 1998-05-20 2000-03-21 The Penn State Research Foundation Optical phase-shift triangulation technique (PST) for non-contact surface profiling
US6522777B1 (en) 1998-07-08 2003-02-18 Ppt Vision, Inc. Combined 3D- and 2D-scanning machine-vision system and method
US6084712A (en) 1998-11-03 2000-07-04 Dynamic Measurement And Inspection,Llc Three dimensional imaging using a refractive optic design
DE50008847D1 (de) 1999-06-10 2005-01-05 Mpt Praez Steile Gmbh Mittweid Vorrichtung zur berührungslosen dreidimensionalen vermessung von körpern und verfahren zur bestimmung eines koordinatensystems für messpunktkoordinaten
US6788210B1 (en) 1999-09-16 2004-09-07 The Research Foundation Of State University Of New York Method and apparatus for three dimensional surface contouring and ranging using a digital video projection system
US6639685B1 (en) 2000-02-25 2003-10-28 General Motors Corporation Image processing method using phase-shifted fringe patterns and curve fitting
US6593587B2 (en) * 2000-03-10 2003-07-15 Perceptron, Inc. Non-contact measurement device for quickly and accurately obtaining dimensional measurement data
US7002589B2 (en) 2000-03-17 2006-02-21 Sun Microsystems, Inc. Blending the edges of multiple overlapping screen images
KR100389017B1 (ko) 2000-11-22 2003-06-25 (주) 인텍플러스 모아레무늬 발생기를 적용한 위상천이 영사식 모아레방법및 장치
US6841780B2 (en) 2001-01-19 2005-01-11 Honeywell International Inc. Method and apparatus for detecting objects
DE10142166A1 (de) 2001-08-29 2003-03-20 Bosch Gmbh Robert Handgerät zur berührungslosen Abstandsmessung
US6910278B2 (en) 2003-01-30 2005-06-28 Lockheed Martin Corporation Apparatus and method for inspecting and marking repair areas on a blade
US7324677B2 (en) 2003-10-14 2008-01-29 Agilent Technologies, Inc. Feature quantitation methods and system
US6945124B1 (en) 2004-10-22 2005-09-20 Pratt & Whitney Canada Corp. Measurement system

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02500217A (ja) * 1986-10-15 1990-01-25 イーストマン・コダック・カンパニー 拡張範囲モアレ等高線作成法
JPH04110706A (ja) * 1990-08-31 1992-04-13 Kiyadeitsukusu:Kk 三次元形状データ取込み装置
JPH07311030A (ja) * 1994-05-19 1995-11-28 Nissan Motor Co Ltd 塗装面性状測定装置
JPH10510352A (ja) * 1994-08-24 1998-10-06 トリコーダー テクノロジー ピーエルシー 走査装置および走査方法
JPH1119039A (ja) * 1997-06-30 1999-01-26 Nidek Co Ltd 眼科装置
JP2000009444A (ja) * 1998-06-23 2000-01-14 Takaoka Electric Mfg Co Ltd 表面形状計測装置
JP2000097672A (ja) * 1998-09-18 2000-04-07 Sanyo Electric Co Ltd 3次元計測機における制御情報生成方法及び制御情報生成支援システム
JP2000292131A (ja) * 1999-04-07 2000-10-20 Minolta Co Ltd 3次元情報入力カメラ
JP2001012930A (ja) * 1999-06-28 2001-01-19 Nissan Motor Co Ltd 表面欠陥検査装置
JP2003527590A (ja) * 2000-03-10 2003-09-16 パーセプトロン インコーポレイテッド 非接触測定装置
JP2002056348A (ja) * 2000-08-07 2002-02-20 Tohken Co Ltd オートフォーカス機能を有する手持ち式読取装置及びオートフォーカス方法、並び距離計測方法
JP2004354382A (ja) * 2003-05-28 2004-12-16 General Electric Co <Ge> 流れ開口面積を測定するための方法及び装置
JP2005121644A (ja) * 2003-09-25 2005-05-12 Brother Ind Ltd 3次元形状検出システム、3次元形状検出装置、及び3次元形状検出プログラム

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012521005A (ja) * 2009-03-19 2012-09-10 ゼネラル・エレクトリック・カンパニイ 光学式ゲージ及び3次元表面プロファイル測定方法
JP2010271312A (ja) * 2009-05-21 2010-12-02 General Electric Co <Ge> マルチイメージフェーズシフト解析を用いた検査システム及び方法

Also Published As

Publication number Publication date
EP1785693A1 (en) 2007-05-16
US7489408B2 (en) 2009-02-10
US20070109558A1 (en) 2007-05-17
CN101029819A (zh) 2007-09-05
CN101029819B (zh) 2010-09-29
DE602006005028D1 (de) 2009-03-19
EP1785693B1 (en) 2009-01-28

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