JP2007123734A - Substrate processing device - Google Patents

Abstract

<P>PROBLEM TO BE SOLVED: To provide a substrate processing device capable of applying substrate processing with appropriate details to individual substrates or a given number of substrate groups. <P>SOLUTION: The substrate processing device comprises processing units 11 to 14 for applying processing to the substrates, and a main controller 51 for holding recipe data representing the details (processing procedures and processing conditions) of the substrate processing. The processing units 11 to 14 are provided with unit controllers 41 to 44 which are connected to the main controller 51 to be able to communicate therewith, and with a state parameter detecting means for detecting state parameters associated with the state of each of the individual substrates and given number of substrate groups which are supplied to the processing units for being processed. The unit controllers 41 to 44 receive the recipe data from the main controller 51 to correct the received recipe data in response to the result of the detection by the state parameter detecting means, and create recipe data to be finally performed. The substrate processing is performed in accordance with the recipe data to be finally performed. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

  The present invention relates to a substrate processing apparatus for processing a substrate. Examples of substrates to be processed include semiconductor wafers, liquid crystal display substrates, plasma display substrates, FED (Field Emission Display) substrates, optical disk substrates, magnetic disk substrates, magneto-optical disk substrates, photo A mask substrate is included. Examples of the treatment for these substrates include treatment using a treatment fluid (treatment liquid or treatment gas) and heat treatment (heating treatment or cooling treatment).

  For example, in a semiconductor device manufacturing process, a substrate processing apparatus is used to perform various processes on a semiconductor wafer. The substrate processing apparatus includes a plurality of processing units for processing each substrate. Each processing unit is provided with a unit controller for controlling each part of the processing unit. The plurality of unit controllers corresponding to the plurality of processing units are connected to a main controller that controls the entire substrate processing apparatus, and can exchange data with the main controller. The main controller is further connected to a host computer as necessary.

  The main controller is provided with a recipe database that holds recipe data that defines the contents of substrate processing to be executed in a plurality of processing units. Appropriate recipe data extracted from this recipe database is transmitted from the main controller to the unit controller. The unit controller controls each part in the processing unit according to the recipe data given from the main controller, and executes substrate processing.

The host computer gives correction data for correcting the recipe data to the main controller as necessary. In this case, the main controller corrects the recipe data read from the recipe database using the correction data, and transmits the corrected recipe data to the unit controller.
An example of the correction data is the waiting time of the substrate from the previous process until the processing in the substrate processing apparatus is started. For example, in the case of a substrate processing apparatus that removes a resist residue (polymer) remaining on the substrate surface after dry etching (pre-process) using a resist as a mask, a small amount of etching gas remaining on the substrate Therefore, the chemical reaction gradually proceeds during the waiting time of the substrate. Of course, this chemical reaction proceeds as the standby time of the substrate becomes longer. Therefore, when the waiting time of the substrate is given as correction data to the main controller, the main controller corrects the recipe data in accordance with the progress of the chemical reaction.

Another example of the correction data is data (atmosphere state data) such as the temperature, humidity, and atmospheric pressure of the atmosphere in which the substrate processing apparatus is placed. Substrate processing is affected by these atmospheric conditions. Therefore, when the atmospheric state data is given to the main controller, the main controller corrects the recipe data in accordance with the atmospheric state data.
On the other hand, with the miniaturization and high definition of the pattern formed on the substrate, the form of the substrate processing apparatus is changed from a batch type that processes a plurality of substrates at once to a single wafer type that processes substrates one by one. It is shifting to. The single wafer type substrate processing apparatus includes, for example, an indexer unit and a substrate processing unit. The indexer unit includes a carrier holding unit that holds a carrier (cassette, pod, or other substrate storage container) that can store a plurality of (for example, 25) substrates, and a substrate that is held by the carrier holding unit. It is equipped with an indexer robot that moves in and out. The substrate processing unit includes a plurality of processing units and a substrate transport robot for taking in and out the substrates with respect to the plurality of processing units. The substrate transfer robot and the indexer robot are arranged so that the substrate can be transferred.

The unprocessed substrate is taken out of any carrier by the indexer robot and transferred to the substrate transport robot. The substrate transfer robot transfers the received unprocessed substrate to one of the processing units, and loads it into the processing unit. The processed substrate is unloaded from the processing unit by the substrate transport robot, transported toward the indexer robot, and delivered to the indexer robot. The indexer robot stores the received processed substrate in one of the carriers.
JP-A-4-305269

The plurality of substrates accommodated in one carrier have different waiting times from when they are set in the substrate processing apparatus until they are actually processed by the processing unit.
Nevertheless, in the above-described prior art, a common process according to the recipe data corrected by the main controller is performed on a plurality of substrates. Therefore, an optimized process cannot be applied to each substrate.

  This problem may be solved by predicting the time until each substrate is actually processed in the main controller and creating correction recipe data for each substrate based on the prediction result. However, it is actually impossible to accurately predict the time until the substrate is actually processed. In particular, in the case of a substrate processing apparatus having a large number of processing units, it is often difficult to predict in advance which processing unit will receive each substrate. Therefore, it is impossible to accurately predict the waiting time until each substrate is processed. In addition, the overhead for calculating the correction recipe data in the main controller becomes large. In particular, when a large number of processing units are provided, the concentration of processing in the main controller may cause overhead that cannot be ignored.

In the above-described prior art, common correction recipe data is applied to a plurality of substrates processed by a plurality of processing units in accordance with the detection result of the atmospheric state of the substrate processing apparatus. However, in actuality, the atmosphere state is different for each processing unit, and there is no guarantee that the atmosphere state at the timing when each substrate is processed is kept constant.
Therefore, in the above-described prior art, it cannot be said that an optimized process can be applied to each substrate from this viewpoint.

  SUMMARY OF THE INVENTION Accordingly, an object of the present invention is to provide a substrate processing apparatus capable of performing substrate processing with appropriate contents on individual substrates or a predetermined number of substrate groups.

  The invention described in claim 1 for achieving the above object includes a processing unit (11-14, 81-84) for processing a substrate (W), and the contents of the substrate processing (processing procedure, processing). A main controller (51) that holds recipe data representing a condition), a unit controller (41 to 44) that is provided in the processing unit and connected to be communicable with the main controller, and is provided in the processing unit. State parameter detecting means (48, 70, 71, 79) for detecting a state parameter related to the state of each individual substrate or each predetermined number of substrate groups supplied to the processing unit and processed, and the unit controller The recipe data receiving means (68, 76) for receiving recipe data from the main controller and the recipe data receiving means Therefore, the received recipe data is corrected according to the detection result by the state parameter detecting means, and the recipe data correcting means (72, 73) for creating the final execution recipe data, and the recipe data correcting means. The substrate processing apparatus includes substrate processing control means (78) for controlling the substrate processing in accordance with the corrected final execution recipe data. The alphanumeric characters in parentheses indicate corresponding components in the embodiments described later. The same applies hereinafter.

  According to this configuration, the processing unit is provided with the state parameter detecting means for detecting the state parameter of the substrate supplied to the processing unit or a predetermined number of substrate groups (particularly, a group of substrates that are simultaneously processed at once). . The recipe data correcting means provided in the unit controller of the processing unit corrects the recipe data based on the state parameter detected by the state parameter detecting means. Thereby, final execution recipe data optimized for each individual substrate or each substrate group is obtained. In this way, substrate processing with appropriate contents can be performed on individual substrates. In addition, the correction of the recipe data is performed not by the main controller but by the unit controller, so that a final execution recipe that is reliably optimized for each individual board or each individual board group can be obtained, and the main controller There is no risk of excessive processing load.

The invention according to claim 2 is the substrate processing apparatus according to claim 1, wherein the unit controller further includes correction content notification means (69) for notifying the main controller of the correction content by the recipe data correction means. .
According to this configuration, the correction content of the recipe data in each processing unit is notified to the main controller, so that the main controller can manage the history of processing for each substrate or group of substrates. The correction contents of the recipe data in the processing unit are preferably held in the main controller and can be referred to by the host controller (55) or the user as necessary.

According to a third aspect of the present invention, the state parameter detecting means includes an atmosphere state detecting means (48) for detecting a state of the substrate processing atmosphere (substrate processing environment data: temperature, humidity, pressure) in the processing unit. Item 3. The substrate processing apparatus according to Item 1 or 2.
According to this configuration, the recipe data can be corrected according to the state of the substrate processing atmosphere in each processing unit. As a result, the substrate processing content can be optimized according to the processing status of each individual substrate or each individual substrate group, and the substrate processing quality can be further improved. For example, the substrate processing atmosphere (substrate processing environment) in the processing unit may fluctuate after the substrate to be processed is carried into the substrate processing apparatus and before the substrate is actually processed in the processing unit. Even in such a case, an appropriate process can be performed for each substrate or substrate group. Conversely, since it is not necessary to strictly manage the atmosphere in the processing unit, it is possible to omit an expensive air conditioning unit, and to reduce the cost of the apparatus.

According to a fourth aspect of the present invention, the state parameter detecting means is configured so that the individual substrate or the predetermined number of substrates from the end of the previous process, which is a process before the processing by the substrate processing apparatus, to the processing in the processing unit. The substrate processing apparatus according to claim 1, further comprising standby time calculation means (70, 71, 79) for determining the standby time of the first to third.
According to this configuration, the recipe data can be corrected according to the standby time from the previous process until the actual process is received. Therefore, even if some chemical reaction proceeds on the substrate after the previous process and the state of the substrate surface changes with time, the state of the substrate immediately before processing in the processing unit It is possible to perform substrate processing with an appropriate content according to the conditions. Thereby, the substrate processing quality can be further improved.

  According to a fifth aspect of the present invention, the waiting time calculating means is a first waiting time that is a waiting time of a substrate from the end of the previous process until the substrate processing apparatus is loaded and processing by the substrate processing apparatus is started. First standby time acquisition means (68, 74) for acquiring data corresponding to time, and processing by the processing unit for individual substrates or the predetermined number of substrate groups after processing by the substrate processing apparatus is started A second standby time measuring means (71) for measuring a second standby time which is a standby time until the operation is performed, and a total standby time calculating means for obtaining a total standby time by adding the first standby time and the second standby time. The substrate processing apparatus according to claim 4, further comprising:

  According to this configuration, the unit controller acquires the first standby time from the previous process until the processing by the substrate processing apparatus is started, and measures the second standby time that is the subsequent standby time, By adding the first and second standby times, the total standby time for each substrate or group of substrates can be determined. This makes it possible to correct the recipe data based on the accurate standby time from the previous process, and appropriate processing can be performed for each individual substrate or substrate group.

  The first waiting time is, for example, until a carrier (C) containing a plurality of substrates that has undergone a previous process is put into a substrate processing apparatus and processing by a plurality of substrates held by the carrier is started. It is a waiting time. The second standby time is, for example, a standby time from when the first standby time acquisition unit acquires the first standby time to when each substrate or substrate group is carried to the processing unit.

  According to a sixth aspect of the present invention, the recipe data correction means includes a plurality of correction functions or correction tables respectively corresponding to a plurality of processing types (chemical liquid types and the like) specified by the recipe data. 6. The substrate processing apparatus according to claim 1, wherein a correction corresponding to the state parameter detected by the state parameter detecting means is performed on the recipe data according to the table.

According to this configuration, the unit controller can perform appropriate correction corresponding to the state parameter in accordance with the type of recipe data. This makes it possible to perform correction processing corresponding to a plurality of types of recipe data.
It is preferable that the coefficient of the correction function or the content of the correction table can be changed by, for example, a host controller or a user. Thereby, the aspect of correction | amendment of recipe data can be changed.

The invention according to claim 7 is the substrate processing apparatus according to claim 1, wherein the main controller includes correction data receiving means (62, 66) for receiving correction data for recipe data from the outside. .
The correction of the recipe data based on the correction data may be performed by the main controller or the unit controller. When correcting the recipe data based on at least a part of the correction data in the unit controller, the correction data is transmitted from the main controller to the unit controller.

For example, when the correction data includes a plurality of types of correction elements (factors), correction of recipe data for some correction elements is performed by the main controller, and recipe data for the remaining correction elements is corrected by the unit controller. You may do it.
The correction data receiving means may receive correction data from the host controller, may receive correction data input by the user, or may receive both of them. .

The invention according to claim 8 is characterized in that the main controller further includes correction data transmitting means (65) for transmitting a part or all of the correction data received by the correction data receiving means to the unit controller. It is a substrate processing apparatus of description.
With this configuration, the unit controller can correct the recipe data based on the correction data given from the outside.

The invention according to claim 9 is characterized in that the correction data receiving means includes means (62, 66) for receiving standby time data representing a standby time of the substrate from the previous process until the processing by the substrate processing apparatus is started, 9. The substrate processing apparatus according to claim 8, wherein the correction data transmitting means includes means (65) for transmitting the waiting time data to the processing unit.
With this configuration, the recipe data can be corrected based on the standby time data in the unit controller. For example, when combined with the configuration of claim 5, the unit controller can calculate the waiting time from the previous step until each substrate or group of substrates is actually processed. Appropriate processing can be performed according to the actual waiting time of the group.

  The standby time data may be data in a format representing the standby time itself, or may represent a recipe data correction value corresponding to the standby time.

Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings.
FIG. 1 is an illustrative plan view for explaining the configuration of a substrate processing apparatus according to an embodiment of the present invention. This substrate processing apparatus is a single wafer type apparatus for performing processing using a processing liquid on a substrate such as a semiconductor wafer, and is used by being installed in a clean room such as a semiconductor manufacturing factory.

This substrate processing apparatus can hold a carrier C that accommodates a substrate, and is connected to the indexer unit 1 for loading and unloading the substrate with respect to the carrier C, and to the indexer unit 1, and performs processing on the substrate. And a processing unit 2 for this purpose.
The indexer unit 1 can hold a plurality of carriers C along a predetermined horizontal direction. The indexer unit 1 includes an indexer robot 3 that executes unloading of unprocessed substrates and loading of processed substrates with respect to a plurality of held carriers C. The carrier C may be a FOUP (Front Opening Unified Pod) that accommodates the substrate in a sealed state, a SMIF (Standard Mechanical Interface) pod, or an OC (Open Cassette). Good.

  The processing unit 2 receives a plurality (four in this embodiment) of processing units 11 to 14 and an unprocessed substrate from the indexer robot 3 and carries them into one of the processing units 11 to 14. To the main transfer robot 5 which carries out the processed substrates from ˜14 and delivers them to the indexer robot 3. More specifically, the conveyance path 6 is formed along a direction orthogonal to the arrangement direction of the carriers C in the indexer unit 1. A main transfer robot 5 is arranged on the transfer path 6. Two processing units 11 and 12 are arranged along the conveyance path 6 on one side of the conveyance path 6, and the remaining two processing units 13 and 14 are arranged on the conveyance path 6 on the other side of the conveyance path 6. Are arranged along.

  For example, the processing units 11 to 14 can perform common processing, and unprocessed substrates are carried into any of the processing units 11 to 14 for processing. More specifically, an unprocessed substrate is unloaded from the carrier C by the indexer robot 3 and transferred to the main transfer robot 5. The main transfer robot 5 includes, for example, a pair of hands each capable of holding a substrate. With one hand, a processed substrate is carried out from one of the processing units 11 to 14, and the other hand is used. Then, an unprocessed substrate is carried into the processing unit. The processed substrate carried out is transferred from the main transfer robot 5 to the indexer robot 3. The indexer robot 3 carries the processed substrate into the carrier C.

FIG. 2 is an illustrative view for explaining a configuration example of the processing units 11 to 14. In this example, the processing units 11 to 14 execute a polymer removal process for removing a resist residue (polymer) remaining on the surface of the substrate W after the dry etching process.
The processing units 11 to 14 are single-wafer type polymer removal processing units for processing the substrates W one by one. The processing units 11 to 14 include a spin chuck 20 for holding and rotating the substrates W horizontally in the processing chamber 21. The pure water is supplied to the upper surface of the substrate W held by the spin chuck 20 and the chemical solution nozzle 22 for supplying a polymer removal liquid which is a chemical solution for removing the polymer to the upper surface of the substrate W held by the spin chuck 20. And a pure water nozzle 23 for the purpose.

  As an example of the polymer removing liquid, at least one of a liquid containing an organic alkaline liquid, a liquid containing an organic acid, a liquid containing an inorganic acid, and a liquid containing an ammonium fluoride-based substance can be used. Among these, examples of the liquid containing an organic alkaline liquid include a liquid containing at least one of DMF (dimethylformamide), DMSO (dimethyl sulfoxide), hydroxylamine, and choline. Examples of the liquid containing an organic acid include a liquid containing at least one of citric acid, oxalic acid, iminodiacid, and oxalic acid. Examples of the liquid containing an inorganic acid include a liquid containing at least one of hydrofluoric acid and phosphoric acid. Other polymer removal solutions include 1-methyl-2pyrrolidone, tetrahydrothiophene 1.1-dioxide, isopropanolamine, monoethanolamine, 2- (2aminoethoxy) ethanol, catechol, N-methylpyrrolidone, aromatic diol, A liquid containing at least one of parkren, a liquid containing phenol, and the like, more specifically, a mixed liquid of 1-methyl-2-pyrrolidone, tetrahydrothiophene 1.1-dioxide and isopropanolamine, dimethyl Mixed liquid of sulfoxide and monoethanolamine, mixed liquid of 2- (2aminoethoxy) ethanol, hydroxyamine and catechol, mixed liquid of 2- (2aminoethoxy) ethanol and N-methylpyrrolidone, monoethanolamine And water Mixed solution of Roma tick diols include at least any one of a mixed liquid of Pafuren and phenol. In addition, a liquid containing at least one of amines such as triethanolamine and pentamethyldiethylenetriamine, propylene glycol, dipropylene glycol monomethyl ether, and the like can be given.

  For example, the spin chuck 20 can hold the substrate W substantially horizontally by vacuum-sucking the non-device formation surface (lower surface) of the substrate W with the device formation surface of the substrate W facing upward. A vacuum suction type (vacuum chuck) that can be used is used. The vacuum chucking spin chuck 20 rotates, for example, the held substrate W in a horizontal plane by rotating around a vertical rotation axis passing through substantially the center of the substrate W while holding the substrate W. Can do. Of course, a mechanical chuck in which the substrate W is sandwiched by a plurality of chuck pins that abut on the peripheral edge of the substrate W can be applied instead of the vacuum suction type.

  The spin chuck 20 is accommodated in the processing cup 24. The processing cup 24 surrounds the periphery of the spin chuck 20, and an annular drainage groove 25 for draining pure water after being used for processing the substrate W and a processing for the substrate W at the bottom. And an annular recovery groove 26 for recovering the chemical after being used for the purpose. The drainage groove 25 and the recovery groove 26 are partitioned by a cylindrical partition wall 27, and an exhaust path 28 having one end facing the drainage groove 25 is formed below the partition wall 27. Yes. An in-cup exhaust duct 29 is connected to the other end of the exhaust path 28. Reference numeral 18 denotes a fan filter unit (FFU) that sends a downflow of clean air into the processing chamber 21, and reference numeral 19 denotes a processing chamber exhaust duct for exhausting the processing chamber 21.

  In association with the processing cup 24, a splash guard 30 is provided for capturing chemicals or pure water scattered from the substrate W. The splash guard 30 has a substantially rotationally symmetric shape with respect to the rotation axis of the substrate W, and the inner surface of the upper portion has a square cross-sectional shape that is open so as to face the rotation axis of the substrate W. It is part 31. In addition, a recovery liquid capturing part 32 having an inclined curved surface that goes downward as it goes outward in the rotational radius direction of the substrate W is formed in the lower part of the splash guard 30. A partition wall storage groove 33 for receiving the partition wall 27 of the processing cup 24 is formed in the vicinity of the upper end of the recovered liquid capturing unit 32.

  The splash guard 30 is configured to be movable up and down with respect to the processing cup 24, and the drainage capture unit 31 or the recovery solution capture unit 32 is opposed to the peripheral end surface of the substrate W held by the spin chuck 20, or the spin chuck The substrate W can be retracted below the holding position of the substrate W by the spin chuck 20 so as not to hinder the loading / unloading of the substrate W with respect to the substrate 20.

In a state where the drainage capture unit 31 faces the peripheral end surface of the substrate W, the chemical solution or pure water scattered from the substrate W can be captured by the drainage capture unit 31. The chemical liquid or pure water captured by the drainage capture unit 31 flows down through the drainage capture unit 31, is collected in the drainage groove 25 of the processing cup 24, and passes through the drainage pipe 25 </ b> A from the drainage groove 25. It is drained to a drainage treatment facility not shown.
Further, in a state in which the recovery liquid capturing unit 32 is opposed to the peripheral end surface of the substrate W, the processing liquid (mainly chemical liquid) scattered from the substrate W can be captured by the recovery liquid capturing unit 32. The processing liquid captured by the recovery liquid capturing section 32 flows down through the recovery liquid capturing section 32, is collected in the recovery groove 26 of the processing cup 24, and the used processing liquid is returned from the recovery groove 26. The liquid is recovered into a chemical liquid cabinet (not shown) through a recovery pipe 26A which is a processing liquid return pipe.

  A chemical solution supply pipe 35 for supplying a chemical solution from the chemical solution cabinet is connected to the chemical solution nozzle 22. In the middle of the chemical solution supply pipe 35, a temperature controller 36 for adjusting the chemical solution to a temperature suitable for processing in order from the chemical solution supply source side, and a chemical solution for controlling the discharge of the chemical solution from the chemical solution nozzle 22. A supply valve 37 is interposed. A chemical solution circulation pipe 38 branched from the chemical solution supply pipe 35 is connected between the chemical liquid nozzle 22 and the temperature controller 36. This chemical circulation pipe 38 is a processing liquid return pipe for returning the processing liquid before being used for the processing of the substrate W to the chemical cabinet. When the chemical supply valve 37 is closed, the temperature controller 36 is connected from the chemical cabinet. A chemical solution circulation path is formed that passes through the chemical solution supply valve 37 (near the chemical solution nozzle 22) and returns to the chemical solution cabinet.

A pure water supply pipe 39 for supplying pure water from a pure water supply module (not shown) is connected to the pure water nozzle 23. A pure water supply valve 40 is interposed in the middle of the pure water supply pipe 39. By opening and closing the pure water supply valve 40, pure water is supplied from the pure water nozzle 23 to the substrate W, The supply of pure water to the substrate W can be stopped.
The processing units 11 to 14 are respectively provided with unit controllers 41 to 44 for controlling each part in the unit. The unit controllers 41 to 44 control the operation of the rotary drive mechanism 45 that applies a rotational force to the spin chuck 20 and the lift drive mechanism 46 that raises and lowers the splash guard 30, and opens and closes the chemical solution supply valve 37 and the pure water supply valve 40. In addition, the energization control of the temperature regulator 36 is performed. The unit controllers 41 to 44 are connected to at least one atmosphere state sensor 48 that detects the state of the atmosphere in the processing chamber 21 of each processing unit 11 to 14. The atmosphere state sensor 48 detects an atmosphere state that affects the substrate processing. Examples thereof include a temperature sensor that detects the temperature of the processing chamber 21, a humidity sensor that detects the humidity in the processing chamber 21, and processing. An atmospheric pressure sensor for detecting the atmospheric pressure in the chamber 21 and an exhaust flow rate sensor for detecting the exhaust flow rate in the processing chamber 21 (the exhaust air volume in the exhaust duct 19 in the processing chamber) can be given.

  FIG. 3 is a block diagram for explaining an electrical configuration of the substrate processing apparatus. Unit controllers 41 to 44 corresponding to the plurality of processing units 11 to 14 are connected to a local area network 50 (for example, Ethernet (registered trademark)). The local area network 50 is connected to a main controller 51 that controls the entire substrate processing apparatus (control of the transfer schedule and substrate processing contents). Further, an indexer controller 52 for controlling the indexer unit 1, A main transfer controller 53 for controlling the main transfer robot 5 is also connected. Further, a host controller 55 for supplying correction data and the like from the outside to the main controller 51 is connected as necessary. With such a configuration, the main controller 51 can perform data communication with the unit controllers 41 to 44, the indexer controller 52, the main transport controller 53, and the host controller 55 via the local area network 50. The main controller 51 is connected to a display unit 57 and an operation unit 58 (such as a keyboard and a pointing device) that constitute a man-machine interface with the operator.

  The main controller 51 includes a recipe database 60 for storing basic recipe data defining the substrate processing contents (processing procedure and processing conditions) to be executed in the processing units 11 to 14, and correction contents to be applied to the basic recipe data. A correction data storage unit 61 that stores correction data that defines the correction data, a correction control unit 62 that receives input of correction data from the host controller 55 and / or the operation unit 58, and a correction required for basic recipe data based on the correction data The correction processing unit 63 that creates execution recipe data (correction recipe data) by performing the above, the execution recipe data storage unit 64 that stores the created execution recipe data, and data transmission to the unit controllers 41 to 44, etc. Data transmitter 65, unit controllers 41 to 44, and host And a data receiving section 66 for receiving various data from the controller 55 and the like.

The basic recipe data can be created by the operator operating the operation unit 58, or can be given from the host controller 55 to the main controller 51 via the local area network 50 and stored in the recipe database 60.
The correction control unit 62 receives correction data as an external input from the host controller 55 or the operation unit 58 and stores it in the correction data storage unit 61. The correction processing unit 63 reads basic recipe data from the recipe database 60, performs correction based on the correction data, creates execution recipe data, and stores the execution recipe data in the execution recipe data storage unit 64. The data transmission unit 65 reads the execution recipe data from the execution recipe data storage unit 64 and transmits it to the unit controllers 41 to 44.

  The correction data is tuning data for tuning the basic recipe data. The correction data includes, for example, correction data corresponding to the processing conditions in the previous process and correction data (elapsed time data) indicating the elapsed time from the previous process. More specifically, the elapsed time from the previous process is more specifically the substrate C accommodated in the substrate processing apparatus after the carrier C accommodating the substrate W is set in the substrate processing apparatus after the dry etching as the previous process is completed. This is a waiting time of the substrate W until processing for W is started. In this embodiment, the correction process of the recipe data based on the elapsed time data is not performed by the main controller 51, but is performed by the unit controllers 41 to 44. Therefore, the correction control unit 62 causes the data transmission unit 65 to transmit the elapsed time data among the correction data to the unit controllers 41 to 44.

The elapsed time data is given from the host controller 55 or the operation unit 58 as numerical data representing the elapsed time from the previous process, and the host controller 55 or the operation unit as numerical data representing the liquid processing correction time according to the elapsed time data. 58 may be given.
FIG. 4 is a block diagram for explaining the electrical configuration of the unit controllers 41 to 44. The unit controllers 41 to 44 include a sensor data input unit 70, an elapsed time measurement unit 71, a correction data processing unit 72, a correction function data holding unit 73, a main correction data holding unit 74, and a local correction data holding unit 75. The execution recipe data holding unit 76, the final execution recipe data holding unit 77, the substrate processing control unit 78, and the total elapsed time from the end of the previous process until the processing of the substrate W is started in the processing unit. A total elapsed time calculation unit 79 is provided. Furthermore, the unit controllers 41 to 44 include a data receiving unit 68 that receives data from the main controller 51 via the local area network 50, and a data transmitting unit 69 that transmits data to the main controller 51 via the local area network 50. It has.

  The sensor data input unit 70 receives input data from the atmosphere state sensor 48. The elapsed time measuring unit 71 measures an elapsed time from when the substrate W to be processed is carried into the substrate processing apparatus until each substrate W is transferred to the processing units 11 to 14. More specifically, the elapsed time measuring unit 71 measures the elapsed time after the elapsed time data, which is a part of the correction data, is received from the main controller 51 by the data receiving unit 68.

  The elapsed time data (first standby time) given from the main controller 51 is acquired by the data receiving unit 68 and held in the main correction data holding unit 74. The total elapsed time calculation unit 79 adds the elapsed time data (second standby time) measured by the elapsed time measurement unit 71 to the elapsed time data held in the main correction data holding unit 74, thereby allowing each substrate to be added. For W, total elapsed time data (total standby time) representing the total elapsed time from the previous process until receiving the processing by the processing unit is calculated.

  Based on the sensor data acquired by the sensor data input unit 70 and the total elapsed time data calculated by the total elapsed time calculation unit 79, the correction data processing unit 72 converts the correction function data held in the correction function data holding unit 73. With reference, correction data for correcting the execution recipe data is created. This correction data is held in the local correction data holding unit 75. The sensor data and the total elapsed time data represent the state of the substrate W when processing each substrate W (the state of the substrate itself and the environment in which the substrate is placed). That's it.

Hereinafter, the correction data (elapsed time data in this embodiment) given from the main controller 51 and held in the main correction data holding unit 74 is referred to as “main correction data”, and the correction held in the local correction data holding unit 75. The data is called “local correction data”.
The correction function data holding unit 73 stores a function formula or table for calculating local correction data representing the correction amount to be applied to the execution recipe data based on the state parameter. When the calculation method of local correction data is different for each processing recipe (or each used chemical solution) applied to the substrate processing, the function formula or table is the correction function data holding unit 73 for each processing recipe (or every used chemical solution). Will be held. It is preferable that the coefficient of the function held in the correction function data holding unit 73 or the contents of the table can be changed by an instruction from the host controller 55 or a user input via the operation unit 58, for example.

  The correction data processing unit 72 refers to the execution recipe data held in the execution recipe data holding unit 76, selects a function formula or table that matches the execution recipe data from the correction function data holding unit 73, and selects the selection The local correction data is calculated by applying the function expression or table thus obtained to the state parameter, and stored in the local correction data holding unit 75.

The correction data processing unit 72 further corrects the execution recipe data held in the execution recipe data holding unit 76 based on the local correction data held in the local correction data holding unit 75. The execution recipe data is received in advance by the data receiving unit 68 from the main controller 51 and is held in the execution recipe data holding unit 76.
The correction data processing unit 72 further stores the final execution recipe data, which is the corrected recipe data, in the final execution recipe data holding unit 77. In this embodiment, the final execution recipe data is calculated every time one substrate W is processed.

  The substrate processing control unit 78 operates the rotary drive mechanism 45 that applies a rotational force to the spin chuck 20 and the lift drive mechanism 46 that raises and lowers the splash guard 30 according to the final execution recipe data held in the final execution recipe data holding unit 77. Control is performed to control opening and closing of the chemical solution supply valve 37 and the pure water supply valve 40, and further, energization control of the temperature regulator 36 is performed (see FIG. 1).

  On the other hand, the correction data processing unit 72 reads the local correction data from the local correction data holding unit 75 and transmits it to the main controller 51 via the data transmission unit 69. Thereby, the correction content of the execution recipe data by the unit controllers 41 to 44 is notified to the main controller 51. Receiving this notification, the main controller 51 holds the received local correction data in an internal memory (not shown). The local correction data is acquired by the host controller 55 as necessary, and is viewed by the user by operating the operation unit 58.

  FIG. 5 is a diagram illustrating an example of a correction function (correction curve) held in the correction function data holding unit 73 in the form of a function formula or a table. FIG. 5 shows a correction for the elapsed time (standby time) from the end of the dry etching process, which is the previous process, and the basic time (basic liquid processing time determined by the basic recipe data) for supplying the polymer removal liquid to the substrate W. The relationship with time (liquid processing correction time) is shown. More specifically, a curve representing the correction function Aa for the chemical solution a used in the processing recipe A and a curve representing the correction function Bb for the chemical solution b used in another processing recipe B are represented.

  A trace amount of etching gas remains on the surface of the substrate W after completion of the dry etching process. The chemical reaction proceeds due to the influence of the residual etching gas, but this chemical reaction proceeds more as the elapsed time is longer. Therefore, the longer the elapsed time from the previous step, the longer the liquid treatment correction time. However, the relationship between the liquid processing correction time and the elapsed time differs depending on the types of chemicals (chemicals a and b) supplied to the substrate W for polymer removal. Since different types of chemicals a and b are used in the processing recipes A and B, the relationship between the liquid processing correction time and the elapsed time varies depending on the processing recipe.

Elapsed time data (main correction data) representing the time t1 from the completion of the previous process until the substrate W is carried into the substrate processing apparatus is supplied from the host controller 55 or the operation unit 58 to the main controller 51 as correction data. . The main controller 51 passes the elapsed time data to the unit controllers 41 to 44.
The elapsed time data may be given in the form of time t1, or may be given in the form of liquid processing correction time T1 corresponding to time t1. When delivered in the form of the liquid processing correction time T1, the total elapsed time calculation unit 79 of the unit controllers 41 to 44 refers to the execution recipe data held in the execution recipe data holding unit 76, and the type of the processing recipe (Ie, the type of chemical used) is specified, and a correction function corresponding to the type of the processing recipe (type of chemical) is referred to from the data held in the correction function data holding unit 73. Then, an elapsed time t1 is obtained based on this correction function.

  Further, the total elapsed time calculation unit 79 obtains the measurement result of the time t2 from immediately before each substrate W is loaded into the processing units 11 to 14 and supplied with the polymer removal liquid from the elapsed time measurement unit 71, The elapsed time t3 (= t1 + t2) is obtained. The total elapsed time t3 is delivered to the correction data processing unit 72. The correction data processing unit 72 obtains the liquid processing correction time T3 by applying the total elapsed time t3 to a correction function corresponding to the type of processing recipe (type of chemical used), and the local correction data holding unit 75 as local correction data. To store.

In this way, for each individual substrate W, the execution recipe data is corrected according to the total elapsed time t3 from the previous step to immediately before the liquid processing.
FIG. 6 is a flowchart for explaining the flow of substrate processing by the substrate processing apparatus. The substrate W that has finished the previous process (dry etching process) is carried into the substrate processing apparatus while being accommodated in the carrier C (S1). Thereafter, processing conditions (recipe designation and elapsed time data from the previous process and other correction data) are input from the host controller 55 or the operation unit 58 to the main controller 51, and further, a processing start instruction is given ( S2).

  In the main controller 51, basic correction data corresponding to the designated recipe is read from the recipe database 60 by the correction processing unit 63, and correction data other than the elapsed time data (for example, processing conditions in the previous process) Correction based on the correction data). In this way, execution recipe data is created and stored in the execution recipe data storage unit 64. Thereafter, the main controller 51 transmits execution recipe data and elapsed time data from the data transmission unit 65 to the unit controllers 41 to 44 (S3).

Thereafter, the substrates W are transferred one by one to the processing units 11 to 14 by the functions of the indexer robot 3 and the main transfer robot 5 (S4).
In the unit controllers 41 to 44, atmosphere state data is taken from the sensor data input unit 70. Further, the total elapsed time t3 from the previous process is calculated based on the elapsed time data given from the main controller 51 and the elapsed time t2 measured by the elapsed time measuring unit 71 (S5).

  The correction data processing unit 72 obtains local correction data by comparing the atmosphere state data and the total elapsed time t3 with the correction function held in the correction function data holding unit 73 (S6). The obtained local correction data is notified to the main controller 51 via the data transmission unit 69 (S6). The local correction data is received by the data receiving unit 66 of the main controller 51, stored in a memory (not shown) as described above, and saved as a process history.

  The correction data processing unit 72 further corrects the execution recipe data based on the obtained local correction data and creates final execution recipe data (S7). This final execution recipe data is held in the final execution recipe data holding unit 77. The substrate processing control unit 78 executes substrate processing according to the final execution recipe data (S8). When the substrate processing is completed (S9), the processed substrate W is unloaded by the main transfer robot 5, and an unprocessed substrate W is loaded instead. The above processing is repeated for this unprocessed substrate W.

  As described above, according to this embodiment, the total elapsed time from the previous process to immediately before the liquid processing is measured for each substrate W, and the recipe data is corrected in the unit controllers 41 to 44 according to the total elapsed time ( Tuning). The unit controllers 41 to 44 also correct recipe data based on the atmosphere state data in the individual processing units 11 to 14. As a result, the substrate processing optimized for each substrate W can be realized, so that the substrate processing quality can be remarkably improved. Further, since the recipe data is optimized in the unit controllers 41 to 44 for each substrate W, the processing load on the main controller 51 that controls the entire substrate processing apparatus is not excessively increased, and overhead is increased. There is no worry about it.

FIG. 7 is a block diagram showing an electrical configuration of a substrate processing apparatus according to another embodiment of the present invention. In FIG. 7, parts corresponding to the parts shown in FIG. 3 are given the same reference numerals as in FIG. In the description of this embodiment, the above-described FIG. 4 is also referred to.
This substrate processing apparatus is a so-called coater / developer apparatus that can be connected in-line with an exposure machine, and forms a photoresist pattern on the substrate surface in cooperation with the exposure machine. More specifically, the substrate processing apparatus includes a coater unit 81 for applying a photoresist to the substrate surface, a bake unit 82 for heating a photoresist film on the substrate surface, and a photo after being exposed by an exposure machine. A developer unit 83 for developing the resist film, an etching unit 84 for etching the thin film under the photoresist pattern using the developed photoresist pattern as a mask, and an inspection unit 85 for inspecting the processed substrate And. In FIG. 7, one coater unit 81, one bake unit 82 as a heat treatment unit, one developer unit 83, and one etching unit 84 are shown. However, an actual coater / developer apparatus includes a plurality of these units. The main controller 51 is responsible for controlling a number of processing units.

The coater unit 81, the bake unit 82, the developer unit 83, and the etching unit 84 are provided with unit controllers 41 to 44, respectively.
For example, in the bake unit 82, a bake process (PEB: Post Exposure Bake) after the exposure process by the exposure machine is performed. Basic recipe data defining conditions for post-exposure bake processing in the bake unit 82 is stored in advance in the recipe database 60 of the main controller 51.

Before the substrate after exposure is carried into the bake unit 82, the host controller 55 carries the processing data (for example, exposure amount) in the exposure machine and the substrate into the substrate processing apparatus after the completion of the exposure process as a previous process. Elapsed time data representing the elapsed time until the operation is given to the main controller 51 as correction data.
In the main controller 51, the correction control unit 62 corrects the basic recipe data based on the processing data (for example, the exposure amount), and creates execution recipe data. More specifically, the correction control unit 62 corrects the basic recipe data so as to shorten the baking processing time as the exposure amount increases, and creates execution recipe data. This execution recipe data is given to the unit controller 42 corresponding to the bake unit 82. The elapsed time data is also given to the unit controller 42.

  In the unit controller 42, the execution recipe data from the main controller 51 is stored in the execution recipe data holding unit 76, while the elapsed time measurement unit 71 measures the elapsed time. The measured elapsed time is an elapsed time starting from the time when the substrate returns from the exposure machine to the substrate processing apparatus. More precisely, the elapsed time measuring unit 71 starts measuring elapsed time in response to execution recipe data and elapsed time data being given from the main controller 51. The elapsed time measuring unit 71 measures the elapsed time until the substrate is carried into the bake unit 82 and immediately before being subjected to heat treatment.

  The total elapsed time calculation unit 79 adds the elapsed time data (main correction data) given from the main controller 51 and the elapsed time measured by the elapsed time measurement unit 71, thereby baking from the previous process (exposure process). The total elapsed time until immediately before processing is obtained. The correction data processing unit 72 compares the obtained total elapsed time with a correction function held in the correction function data holding unit 73 and a correction value (local correction data) of the baking temperature (substrate temperature during the baking process). And the execution recipe data is corrected based on the correction value. In this case, the correction function data holding unit 73 holds in advance a correction function (function formula or table) representing the relationship of the baking temperature correction value with respect to the elapsed time from the exposure process.

The correction data processing unit 72 further creates local correction data according to the correction function held in the correction function data holding unit 73 with respect to the atmosphere state data acquired by the sensor data input unit 70, if necessary. The execution recipe data is corrected by the local correction data.
In this way, final execution recipe data obtained by correcting the execution recipe data in the unit controller 42 is obtained, and the substrate processing control unit 78 executes post-exposure baking processing according to the final execution recipe data.

  As described above, according to this embodiment, the basic recipe data is corrected in the main controller 51 based on the processing data (exposure amount) in the exposure machine, and the recipe is based on the elapsed time (standby time) from the exposure processing to the substrate processing. Data correction is performed in the unit controller 42. In the exposed photoresist, a chemical reaction proceeds with time, and this elapsed time affects a CD (Critical Dimension) value. Therefore, by adopting the configuration of this embodiment in which the elapsed time from the exposure process to the baking process is measured for each substrate and the recipe data is corrected, an appropriate post-exposure baking process is performed on each substrate. And a stable CD value can be obtained.

  Although two embodiments of the present invention have been described above, the present invention can be implemented in other forms. For example, in the above-described embodiment, the substrate processing apparatus including the single-wafer processing unit that processes the substrates one by one is taken as an example. However, the present invention collectively processes a plurality of substrates. The present invention can also be applied to a substrate processing apparatus provided with a batch type processing unit. In this case, the elapsed time from the previous process is obtained for each of a plurality of substrates (batch) that are simultaneously processed at once, and the recipe data is corrected in the unit controller accordingly.

In the above-described embodiment, the example in which the elapsed time data from the previous process is once given to the main controller 51 and then given to the unit controllers 41 to 44 has been described. It is good also as a structure given to the unit controllers 41-44, without going through.
Furthermore, in the above-described embodiment, the elapsed time from when the substrate is loaded into the substrate processing apparatus until the substrate is actually processed by the processing unit is measured, but this is necessary for processing one substrate. When the time can be regarded as substantially constant, the number of processed substrates may be counted, and the elapsed time may be estimated based on the counting result.

Transmission of data (recipe data and elapsed time data) from the main controller 51 to the unit controllers 41 to 44 may be performed in a format in which the unit controllers 41 to 44 refer to data in the main controller 51.
In addition, various design changes can be made within the scope of matters described in the claims.

It is an illustrative top view for demonstrating the structure of the substrate processing apparatus which concerns on one Embodiment of this invention. It is an illustration figure for demonstrating the structural example of a processing unit. It is a block diagram for demonstrating the electrical structure of the said substrate processing apparatus. It is a block diagram for demonstrating the electrical structure of a unit controller. It is a figure which shows an example of the correction function (correction curve) hold | maintained in the form of a function type | formula or a table in the correction function data holding part. It is a flowchart for demonstrating the flow of the substrate processing by the said substrate processing apparatus. It is a block diagram which shows the electric constitution of the substrate processing apparatus which concerns on other embodiment of this invention.

Explanation of symbols

DESCRIPTION OF SYMBOLS 1 Indexer part 2 Processing part 3 Indexer robot 5 Main transfer robot 6 Transfer path 11-14 Processing unit 18 Fan filter unit 19 Processing chamber exhaust duct 20 Spin chuck 21 Processing chamber 22 Chemical solution nozzle 23 Pure water nozzle 24 Processing cup 25 Drainage groove 25A Drainage pipe 26 Recovery groove 26A Recovery pipe 27 Partition wall 28 Exhaust path 29 Exhaust duct in cup 30 Splash guard 31 Drainage capture part 32 Recovery liquid capture part 33 Partition wall storage groove 35 Chemical liquid supply pipe 36 Temperature controller 37 Chemical liquid supply Valve 38 Chemical solution circulation pipe 39 Pure water supply pipe 40 Pure water supply valve 41 to 44 Unit controller 45 Rotation drive mechanism 46 Elevating drive mechanism 48 Atmosphere state sensor 50 Local area network 51 Main controller 52 Indexer control Controller 53 main transport controller 55 host controller 57 display unit 58 operation unit 60 recipe database 61 correction data storage unit 62 correction control unit 63 correction processing unit 64 execution recipe data storage unit 65 data transmission unit 66 data reception unit 68 data reception unit 69 Data transmission unit 70 Sensor data input unit 71 Elapsed time measurement unit 72 Correction data processing unit 73 Correction function data holding unit 74 Main correction data holding unit 75 Local correction data holding unit 76 Execution recipe data holding unit 77 Final execution recipe data holding unit 78 Substrate processing control unit 79 Total elapsed time calculation unit 81 Coater unit 82 Bake unit 83 Developer unit 84 Etching unit 85 Inspection unit W Substrate

Claims (9)

A processing unit for processing a substrate;
A main controller that holds recipe data representing the contents of substrate processing;
A unit controller provided in the processing unit and connected to the main controller in a communicable manner;
A state parameter detection unit that is provided in the processing unit and detects a state parameter related to a state of each individual substrate or a predetermined number of substrates that are supplied to the processing unit and processed;
The unit controller is
Recipe data receiving means for receiving recipe data from the main controller;
Recipe data correction means for applying the correction according to the detection result by the state parameter detection means to the recipe data received by the recipe data receiving means, and creating final execution recipe data;
A substrate processing apparatus including substrate processing control means for controlling substrate processing in accordance with final execution recipe data corrected by the recipe data correcting means.   The substrate processing apparatus according to claim 1, wherein the unit controller further includes correction content notification means for notifying the main controller of the correction content by the recipe data correction means.   The substrate processing apparatus according to claim 1, wherein the state parameter detection unit includes an atmosphere state detection unit that detects a state of a substrate processing atmosphere in the processing unit.   The state parameter detecting means calculates a standby time for determining a standby time of each substrate or the predetermined number of substrate groups from the end of the previous process, which is a process before the processing by the substrate processing apparatus, to processing in the processing unit. 4. The substrate processing apparatus according to claim 1, comprising means. The waiting time calculating means includes:
First standby time acquisition means for acquiring data corresponding to a first standby time which is a standby time of the substrate from the end of the previous process to the substrate processing apparatus until processing by the substrate processing apparatus is started; ,
Second standby time measuring means for measuring a second standby time that is a standby time from the start of processing by the substrate processing apparatus to the start of processing by the processing unit for each substrate or the predetermined number of substrates. When,
5. The substrate processing apparatus according to claim 4, further comprising: a total standby time calculating unit that obtains a total standby time by adding the first standby time and the second standby time.   The recipe data correction means includes a plurality of correction functions or correction tables respectively corresponding to a plurality of processing types specified by recipe data, and the state parameters detected by the state parameter detection means according to the correction functions or correction tables The substrate processing apparatus according to claim 1, wherein correction corresponding to the above is performed on the recipe data.   The substrate processing apparatus according to claim 1, wherein the main controller includes correction data receiving means for receiving correction data for recipe data from the outside.   The substrate processing apparatus according to claim 7, wherein the main controller further includes a correction data transmitting unit that transmits a part or all of the correction data received by the correction data receiving unit to the unit controller. The correction data receiving means includes means for receiving standby time data representing standby time of a substrate from the previous process until processing by the substrate processing apparatus is started,
9. The substrate processing apparatus according to claim 8, wherein the correction data transmission means includes means for transmitting the waiting time data to the processing unit.

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