JP2007071879A5 - - Google Patents

Download PDF

Info

Publication number
JP2007071879A5
JP2007071879A5 JP2006243550A JP2006243550A JP2007071879A5 JP 2007071879 A5 JP2007071879 A5 JP 2007071879A5 JP 2006243550 A JP2006243550 A JP 2006243550A JP 2006243550 A JP2006243550 A JP 2006243550A JP 2007071879 A5 JP2007071879 A5 JP 2007071879A5
Authority
JP
Japan
Prior art keywords
sample plate
image
ion source
sample
light beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2006243550A
Other languages
English (en)
Japanese (ja)
Other versions
JP5039342B2 (ja
JP2007071879A (ja
Filing date
Publication date
Priority claimed from US11/223,285 external-priority patent/US7495231B2/en
Application filed filed Critical
Publication of JP2007071879A publication Critical patent/JP2007071879A/ja
Publication of JP2007071879A5 publication Critical patent/JP2007071879A5/ja
Application granted granted Critical
Publication of JP5039342B2 publication Critical patent/JP5039342B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2006243550A 2005-09-08 2006-09-08 Ｍａｌｄｉサンプルプレート撮像ワークステーション Expired - Fee Related JP5039342B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/223,285 US7495231B2 (en) 2005-09-08 2005-09-08 MALDI sample plate imaging workstation
US11/223285 2005-09-08

Publications (3)

Publication Number Publication Date
JP2007071879A JP2007071879A (ja) 2007-03-22
JP2007071879A5 true JP2007071879A5 (https=) 2009-10-15
JP5039342B2 JP5039342B2 (ja) 2012-10-03

Family

ID=37624114

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006243550A Expired - Fee Related JP5039342B2 (ja) 2005-09-08 2006-09-08 Ｍａｌｄｉサンプルプレート撮像ワークステーション

Country Status (4)

Country Link
US (1) US7495231B2 (https=)
EP (1) EP1763061B1 (https=)
JP (1) JP5039342B2 (https=)
CN (1) CN1928549A (https=)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7435951B2 (en) * 2005-06-08 2008-10-14 Agilent Technologies, Inc. Ion source sample plate illumination system
WO2007116509A1 (ja) * 2006-04-07 2007-10-18 Shimadzu Corporation 質量分析装置
JP5020742B2 (ja) * 2007-08-27 2012-09-05 日本電子株式会社 Ｍａｌｄｉイオン源を備えた質量分析装置およびｍａｌｄｉイオン源用サンプルプレート
DE102010052975A1 (de) * 2010-11-30 2012-05-31 Bruker Daltonik Gmbh Verfahren und Probenträger für die Unterstützung der händischen Präparation von Proben für eine Ionisierung mit matrix-unterstützter Laserdesorption
EP2669011B1 (de) 2012-05-30 2018-05-16 Bruker Daltonik GmbH Bildprojektionsverfahren und -vorrichtung zur Unterstützung der händischen MALDI-Probenpräparation
JP2014021048A (ja) * 2012-07-23 2014-02-03 Jeol Ltd サンプルプレートおよび質量分析装置
DE102012025046B4 (de) 2012-12-20 2015-03-05 Bruker Daltonik Gmbh Verfahren zum Nachweis einer Fehlbelegung auf einem MALDI-Probenträger
DE102013006132B9 (de) * 2013-04-10 2015-11-19 Bruker Daltonik Gmbh Hochdurchsatz-Charakterisierung von Proben durch Massenspektrometrie
RU2696343C2 (ru) * 2014-12-22 2019-08-01 Пирелли Тайр С.П.А. Способ и устройство для контроля шин на производственной линии
CN107110639B (zh) 2014-12-22 2020-10-09 倍耐力轮胎股份公司 用于检查轮胎生产线上的轮胎的装置
US11232940B2 (en) * 2016-08-02 2022-01-25 Virgin Instruments Corporation Method and apparatus for surgical monitoring using MALDI-TOF mass spectrometry
CN110023950B (zh) 2016-10-28 2023-08-08 拜克门寇尔特公司 物质准备评估系统
JP6812944B2 (ja) * 2017-10-18 2021-01-13 株式会社島津製作所 質量分析装置用情報管理装置
US20210183632A1 (en) * 2019-04-11 2021-06-17 Exum Instruments Mass spectrometry of samples including coaxial desorption/ablation and image capture
FR3106206B1 (fr) * 2020-01-14 2024-08-09 Biomerieux Sa Procédé de détermination de l’intégrité d’un dépôt d’un complexe à base d’un échantillon biologique et système permettant la mise en œuvre dudit procédé.

Family Cites Families (42)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4898471A (en) 1987-06-18 1990-02-06 Tencor Instruments Particle detection on patterned wafers and the like
US4935623A (en) 1989-06-08 1990-06-19 Hughes Aircraft Company Production of energetic atom beams
US7045289B2 (en) 1991-09-09 2006-05-16 Third Wave Technologies, Inc. Detection of RNA Sequences
ATE242485T1 (de) 1993-05-28 2003-06-15 Baylor College Medicine Verfahren und massenspektrometer zur desorption und ionisierung von analyten
DE4408034C1 (de) 1994-03-10 1995-07-13 Bruker Franzen Analytik Gmbh Verfahren zur massenspektrometrischen Analyse von Proben aus 2D-Gel-Elektrophoreseplatten mit matrixunterstützter ionisierender Laser-Desorption
US5498545A (en) 1994-07-21 1996-03-12 Vestal; Marvin L. Mass spectrometer system and method for matrix-assisted laser desorption measurements
US5827659A (en) 1995-05-19 1998-10-27 Perseptive Biosystems, Inc. Methods and apparatus for sequencing polymers using mass spectrometry
US5869240A (en) 1995-05-19 1999-02-09 Perseptive Biosystems, Inc. Methods and apparatus for sequencing polymers with a statistical certainty using mass spectrometry
US5840256A (en) 1996-04-09 1998-11-24 David Sarnoff Research Center Inc. Plate for reaction system
US5861623A (en) 1996-05-10 1999-01-19 Bruker Analytical Systems, Inc. Nth order delayed extraction
US5808300A (en) 1996-05-10 1998-09-15 Board Of Regents, The University Of Texas System Method and apparatus for imaging biological samples with MALDI MS
US5777324A (en) 1996-09-19 1998-07-07 Sequenom, Inc. Method and apparatus for maldi analysis
AUPO625497A0 (en) * 1997-04-16 1997-05-15 Macquarie Research Limited Analysis of molecules
EP0991777A1 (en) 1997-06-18 2000-04-12 Ulrich J. Krull Nucleic acid biosensor diagnostics
US6245506B1 (en) 1997-07-30 2001-06-12 Bbi Bioseq, Inc. Integrated sequencing device
JP3361735B2 (ja) 1997-12-01 2003-01-07 セイコーインスツルメンツ株式会社 表面分析装置
US5920068A (en) 1998-03-05 1999-07-06 Micron Technology, Inc. Analysis of semiconductor surfaces by secondary ion mass spectrometry
US5969350A (en) 1998-03-17 1999-10-19 Comstock, Inc. Maldi/LDI time-of-flight mass spectrometer
US6221626B1 (en) 1998-06-30 2001-04-24 University Of Geneva Kit for electroblotting polypeptides separated on an electrophoresis gel
EP1876442A3 (en) 1998-09-17 2008-03-05 Advion BioSciences, Inc. Integrated monolithic microfabricated liquid chromatography system and method
KR100284340B1 (ko) 1999-02-27 2001-03-02 김순택 플라즈마 표시 패널의 구동방법
US6288390B1 (en) 1999-03-09 2001-09-11 Scripps Research Institute Desorption/ionization of analytes from porous light-absorbing semiconductor
WO2001016574A1 (en) 1999-08-27 2001-03-08 Large Scale Proteomics, Corp. Devices for use in maldi mass spectrometry
GB9922837D0 (en) 1999-09-27 1999-11-24 Ludwig Inst Cancer Res Modified ion source targets for use in liquid maldi ms
US6496256B1 (en) 1999-10-01 2002-12-17 Applied Materials, Inc. Inspection systems using sensor array and double threshold arrangement
US6787764B2 (en) 2000-02-18 2004-09-07 Bruker Daltonics, Inc. Method and apparatus for automating a matrix-assisted laser desorption/ionization (MALDI) mass spectrometer
US6794644B2 (en) 2000-02-18 2004-09-21 Melvin A. Park Method and apparatus for automating an atmospheric pressure ionization (API) source for mass spectrometry
US6643007B2 (en) 2000-07-12 2003-11-04 Tuan Le Apparatus for optical inspection of a working surface having a dynamic reflective spatial attenuator
US6716629B2 (en) 2000-10-10 2004-04-06 Biotrove, Inc. Apparatus for assay, synthesis and storage, and methods of manufacture, use, and manipulation thereof
US20020074517A1 (en) 2000-12-15 2002-06-20 Andrew Krutchinsky High capacity and scanning speed system for sample handling and analysis
AUPR378001A0 (en) * 2001-03-16 2001-04-12 Proteome Systems Ltd Protein chip
US6804410B2 (en) 2001-04-17 2004-10-12 Large Scale Proteomics Corporation System for optimizing alignment of laser beam with selected points on samples in MALDI mass spectrometer
CA2386462A1 (en) 2001-05-18 2002-11-18 Institut National De La Recherche Scientifique Multi-layers coating for protecting metallic substrates
DE02744176T1 (de) 2001-05-24 2005-01-13 New Objective, Inc., Woburn Verfahren und vorrichtung für elektrospray mit rückkopplungsregelung
EP1402561A4 (en) 2001-05-25 2007-06-06 Analytica Of Branford Inc ATMOSPHERIC MALDI IONS SOURCE AND UNDER LOW
US6673315B2 (en) 2001-06-29 2004-01-06 Biomachines, Inc. Method and apparatus for accessing a site on a biological substrate
KR100979071B1 (ko) 2002-02-22 2010-08-31 에이저 시스템즈 인크 이중 배향 다결정성 재료의 화학 기계적 연마
US7138625B2 (en) 2003-05-02 2006-11-21 Agilent Technologies, Inc. User customizable plate handling for MALDI mass spectrometry
US7145135B1 (en) * 2003-05-30 2006-12-05 Agilent Technologies, Inc. Apparatus and method for MALDI source control with external image capture
US7068363B2 (en) * 2003-06-06 2006-06-27 Kla-Tencor Technologies Corp. Systems for inspection of patterned or unpatterned wafers and other specimen
US7064318B2 (en) 2003-08-26 2006-06-20 Thermo Finnigan Llc Methods and apparatus for aligning ion optics in a mass spectrometer
US7282706B2 (en) 2004-02-12 2007-10-16 The Texas A&M University System Advanced optics for rapidly patterned laser profiles in analytical spectrometry

Similar Documents

Publication Publication Date Title
JP2007071879A5 (https=)
JP2012134555A5 (ja) 液浸部材、液浸露光装置、液浸露光方法、及びデバイス製造方法
CY1123804T1 (el) Μεθοδος και συστημα για την εξατμιση ουσιας
JP2014202650A5 (https=)
ATE429689T1 (de) Bildverarbeitungseinrichtung, -verfahren und - programm
RU2012156197A (ru) Способ неразрушающего контроля и устройство для осуществления способа
JP2004289151A5 (https=)
MX2009000759A (es) Aparato para capturar una imagen.
FR2868156B1 (fr) Procede et dispositif de controle non destructif de structure et de caracterisation des endommagements de structure par le principe de moire d'ombre
TW200632582A (en) Polarized radiation in lithographic apparatus and device manufacturing method
JP2017150922A (ja) 検査装置及びレーザー加工装置
EP2105945A3 (en) Mass spectroscope
TW200643064A (en) Transparent film and method for manufacturing the same, polarized plate and image display device
JP2013513122A5 (https=)
TW200717192A (en) Charged particle beam writing method and apparatus and readable storage medium
JP2007178274A5 (https=)
SE0401695D0 (sv) Collision detecting device and method
TW200611079A (en) Lithographic apparatus, control system and device manufacturing method
TW200513808A (en) Lithographic apparatus and device manufacturing method
TW200729520A (en) Ultraviolet detector
JP2009503448A5 (https=)
EP1970764A3 (en) Lithographic apparatus and method
JP2006233283A5 (https=)
JP2008092811A5 (https=)
US11584140B2 (en) Concealable marking