JP2007059694A - Suction apparatus, manufacturing method therefor, and vacuum processing apparatus - Google Patents

Suction apparatus, manufacturing method therefor, and vacuum processing apparatus Download PDF

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JP2007059694A
JP2007059694A JP2005244258A JP2005244258A JP2007059694A JP 2007059694 A JP2007059694 A JP 2007059694A JP 2005244258 A JP2005244258 A JP 2005244258A JP 2005244258 A JP2005244258 A JP 2005244258A JP 2007059694 A JP2007059694 A JP 2007059694A
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adsorption
electrodes
suction
substrate
groove
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JP4763380B2 (en
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Shigenobu Taira
重信 平
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Ulvac Inc
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a suction apparatus that has a large gradient force and a large vacuum suction force. <P>SOLUTION: An insulative base film 22 is formed on a base 21, and a first and a second electrodes 23a, 23b are formed on the base film 22. The base film between the first and second electrodes 23a, 23b is removed halfway from the surface side to form a suction groove 26. The suction groove 26 can be formed deep even if the first and second electrodes 23a, 23b and the film thickness of protective films 24 covering the surface of the electrodes are thin. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は、吸着装置とそれを用いた真空処理装置にかかり、特に、絶縁性の基板を吸着できる吸着装置と、その吸着装置を用いた真空処理装置に関する。   The present invention relates to an adsorption apparatus and a vacuum processing apparatus using the adsorption apparatus, and more particularly to an adsorption apparatus capable of adsorbing an insulating substrate and a vacuum processing apparatus using the adsorption apparatus.

従来より、真空装置内で基板を保持するために吸着装置が使用されている。導電性の基板(半導体基板など)を保持する場合は保持対象物との間にコンデンサを形成し、その静電容量で保持することができる。   Conventionally, a suction device is used to hold a substrate in a vacuum apparatus. In the case of holding a conductive substrate (semiconductor substrate or the like), a capacitor can be formed between the holding object and held by its capacitance.

しかし、液晶表示装置の基板ような絶縁性基板(ガラス基板など)の場合はコンデンサを形成できないため、絶縁性基板を電極が形成する不均一電界中に置き、グラディエント力(gradient力)によって保持している(特開2001−35907)。
静電吸着力を用いた吸着装置は既に大型基板の液晶表示装置の生産に用いられており、液晶滴下貼り合せ装置の中の重要な構成となっている(特開2002−229044の図8)。
However, in the case of an insulating substrate (such as a glass substrate) such as a substrate of a liquid crystal display device, a capacitor cannot be formed. Therefore, the insulating substrate is placed in a non-uniform electric field formed by an electrode and held by a gradient force. (Japanese Patent Laid-Open No. 2001-35907).
An attracting device using electrostatic attracting force has already been used for production of a liquid crystal display device having a large substrate, and is an important configuration in a liquid crystal dropping and laminating device (FIG. 8 of JP-A-2002-229044). .

実際の装置では、先ず、大気中で真空吸着によってガラス基板を吸着保持し、真空槽内に搬入した後、真空槽内を真空雰囲気にするまでに、ガラス基板の保持力を真空吸着力から静電気力又はグラディエント力に切換える必要がある。従って、一台の吸着装置で二種類の吸着力を発生させる必要がある。
最近は液晶表示装置等の表示装置が増々大型化し、大型ガラス基板の保持するための強い保持力が要求されている。
In an actual device, the glass substrate is first sucked and held in the atmosphere by vacuum suction, and after the glass substrate is carried into the vacuum chamber, the holding power of the glass substrate is changed from the vacuum suction force to the static electricity. It is necessary to switch to force or gradient force. Therefore, it is necessary to generate two types of adsorption forces with a single adsorption device.
Recently, a display device such as a liquid crystal display device has been increased in size, and a strong holding force for holding a large glass substrate is required.

図9の符号111は、従来技術の吸着装置を示している。符号111aは、内部構造を説明するための平面図、符号111b、111cは、それぞれF−F線、G−G線切断断面図である。
この吸着装置111は、絶縁性の基板121上に第一、第二の電極123a、123bが配置されている。
The code | symbol 111 of FIG. 9 has shown the adsorption | suction apparatus of the prior art. Reference numeral 111a is a plan view for explaining the internal structure, and reference numerals 111b and 111c are sectional views taken along lines FF and GG, respectively.
In the adsorption device 111, first and second electrodes 123a and 123b are arranged on an insulating substrate 121.

第一、第二の電極123a、123bは、所定間隔で離間されており、吸着装置111には、第一、第二の電極123a、123bの表面と、その間に位置する絶縁性の基板121の表面とを覆う絶縁性の保護膜124が形成されている。
保護膜124には、有底の溝から成る吸着溝126が形成されている。
吸着溝126の一部底面には、基板121の裏面まで貫通する排気孔127が形成されている。
The first and second electrodes 123a and 123b are spaced apart from each other at a predetermined interval, and the adsorption device 111 includes a surface of the first and second electrodes 123a and 123b and an insulating substrate 121 positioned therebetween. An insulating protective film 124 that covers the surface is formed.
In the protective film 124, an adsorption groove 126 made of a bottomed groove is formed.
An exhaust hole 127 that penetrates to the back surface of the substrate 121 is formed in a part of the bottom surface of the suction groove 126.

排気孔127を真空排気系に接続し、吸着装置111の第一、第二の電極123a、123bが形成された面を鉛直下方に向けそれら表面の保護膜124をガラス基板等の吸着対象物に密着させる。そして、排気孔127から吸着溝126内の大気を真空排気すると、吸着対象物は吸着装置111の表面に真空吸着され、真空吸着力によって保持される。   The exhaust hole 127 is connected to an evacuation system, and the surface on which the first and second electrodes 123a and 123b of the adsorption device 111 are formed is directed vertically downward so that the protective film 124 on the surface is an adsorption target such as a glass substrate. Adhere closely. Then, when the atmosphere in the adsorption groove 126 is evacuated from the exhaust hole 127, the object to be adsorbed is vacuum adsorbed on the surface of the adsorption device 111 and is held by the vacuum adsorption force.

第一、第二の電極123a、123b間に電圧を印加すると、吸着対象物は第一、第二の電極123a、123b間に形成される電界の中に置かれ、グラディエント力によって吸着装置111に吸着される。   When a voltage is applied between the first and second electrodes 123a and 123b, the object to be adsorbed is placed in an electric field formed between the first and second electrodes 123a and 123b, and is applied to the adsorption device 111 by a gradient force. Adsorbed.

次に、真空槽内を真空排気すると真空吸着力は消滅し、吸着対象物はグラディエント力によって保持された状態になる。
グラディエント力を発生させる場合、吸着対象のガラス基板と電極の間の距離は短い程有利であるが、吸着溝126のパターンと第一、第二の電極123a、123bのパターンとは、相互に独立に設計されていたため、吸着溝126と第一、第二の電極123a、123bとが交差していた。
Next, when the inside of the vacuum chamber is evacuated, the vacuum adsorption force disappears and the object to be adsorbed is held by the gradient force.
When the gradient force is generated, it is advantageous that the distance between the glass substrate to be attracted and the electrode is short, but the pattern of the attracting groove 126 and the patterns of the first and second electrodes 123a and 123b are mutually independent. Therefore, the suction groove 126 and the first and second electrodes 123a and 123b intersected each other.

図10(a)は吸着溝126のパターン、同図(b)は第一、第二の電極123a、123bのパターンである。
吸着溝126の深さは深い方が真空吸着力は強くなるが、そのために保護膜124の膜厚を厚くするとグラディエント力が弱くなってしまう。
FIG. 10A shows the pattern of the suction groove 126, and FIG. 10B shows the pattern of the first and second electrodes 123a and 123b.
As the suction groove 126 is deeper, the vacuum suction force becomes stronger. For this reason, if the protective film 124 is made thicker, the gradient force becomes weaker.

第一、第二の電極123a、123bには高電圧が印加されるため、絶縁性の保護膜124で覆っておく必要があるが、第一、第二の電極123a、123bが吸着溝126の底面に露出せず、第一、第二の電極123a、123b上の保護膜124の膜厚T12が確保されるためには、吸着溝126の深さD11は、第一、第二の電極123a、123b上の保護膜124の膜厚T11よりも十分浅くする必要がある。 Since a high voltage is applied to the first and second electrodes 123 a and 123 b, it is necessary to cover the first and second electrodes 123 a and 123 b with an insulating protective film 124. not exposed on the bottom, first, to the second electrode 123a, the thickness T 12 of the protective film 124 on 123b is ensured, the depth D 11 of the suction grooves 126, first, second electrodes 123a, it is necessary to sufficiently shallower than the thickness T 11 of the protective film 124 on 123b.

吸着溝126の深さは最低でも30μmが必要であるが、充分な真空吸着力を得るには、100〜150μmの深さが望ましいのに対し、グラディエント力を強くするため、保護膜124の膜厚を300μm以下にすると、吸着溝126の深さは50μm程度になり、真空吸着力が弱くなっていた。
特開2001−35907号公報 特開2002−229044号公報
The depth of the suction groove 126 is required to be at least 30 μm. To obtain a sufficient vacuum suction force, a depth of 100 to 150 μm is desirable. On the other hand, in order to increase the gradient force, the film of the protective film 124 When the thickness was 300 μm or less, the depth of the suction groove 126 was about 50 μm, and the vacuum suction force was weak.
JP 2001-35907 A Japanese Patent Laid-Open No. 2002-229044

本発明は、上記従来技術の課題を解決するために創作されたものであり、絶縁性の基板に対するグラディエント力と真空吸着力を大きくできる吸着装置を提供することにある。  The present invention was created to solve the above-described problems of the prior art, and it is an object of the present invention to provide an adsorption device that can increase the gradient force and the vacuum adsorption force on an insulating substrate.

上記課題を解決するため、本発明は、表面が絶縁性を有する基板と、前記基板の平坦な表面上に配置された導電性材料と、前記導電性材料で構成され、互いに異なる電圧が印加される第一、第二の電極と、前記第一、第二の電極表面を被覆する絶縁性の保護膜と、前記第一、第二の電極間に位置する吸着溝と、前記吸着溝に接続され、前記吸着溝を真空排気系に接続する排気孔とを有し、前記保護膜上に吸着対象物を配置し、前記排気孔から前記吸着溝内の気体を真空排気すると前記吸着対象物は真空吸着力によって前記保護膜上に吸着され、前記第一、第二の電極間に電圧を印加するとグラディエント力によって前記吸着対象物は前記保護膜上に吸着されるように構成された吸着装置であって、前記吸着溝の底面は、前記第一、第二の電極の底面よりも低く、前記基板の内部に位置するように構成された吸着装置である。
また、本発明は、基板と、前記基板の平坦な表面上に配置された導電性材料と、前記導電性材料で構成され、互いに異なる電圧が印加される第一、第二の電極と、前記第一、第二の電極表面を被覆する絶縁性の保護膜と、前記第一、第二の電極間に位置する吸着溝と、前記吸着溝に接続され、前記吸着溝を真空排気系に接続する排気孔とを有し、前記保護膜上に吸着対象物を配置し、前記排気孔から前記吸着溝内の気体を真空排気すると前記吸着対象物は真空吸着力によって前記保護膜上に吸着され、前記第一、第二の電極間に電圧を印加するとグラディエント力によって前記吸着対象物は前記保護膜上に吸着されるように構成された吸着装置であって、前記基板は金属製の基板本体と、前記基板本体の表面に形成された絶縁性の下地膜とを有し、前記第一、第二の電極は前記下地膜に密着配置され、
前記吸着溝の底部には、前記下地膜が露出された吸着装置である。
また、本発明は、前記吸着溝の底部は前記下地膜表面よりも低く、前記吸着溝の下部は前記基板の内部に位置するように構成された吸着装置である。
また、本発明は、前記吸着溝は前記導電性材料で囲まれた吸着装置である。
また、本発明は、前記吸着溝は前記第一又は前記第二の電極で囲まれた吸着装置である。
また、本発明は、上記いずれかの吸着装置を製造する製造方法であって、表面が絶縁性を有する基板の表面に前記導電性材料の膜を形成する工程と、前記導電性材料の膜をパターニングして前記第一、第二の電極を形成する工程と、前記第一、第二の電極膜の表面に前記保護膜を形成する工程と、前記保護膜と前記基板とをパターニングし、前記第一、第二の導電膜の間の位置に、底部が前記基板の表面よりも低い吸着溝を形成し、前記吸着溝の下部を前記基板の内部に位置させる吸着装置の製造方法である。
In order to solve the above problems, the present invention includes a substrate having an insulating surface, a conductive material disposed on a flat surface of the substrate, and the conductive material, and different voltages are applied to the substrate. Connecting the first and second electrodes, the insulating protective film covering the surfaces of the first and second electrodes, the suction groove positioned between the first and second electrodes, and the suction groove The suction groove is connected to a vacuum exhaust system, and an object to be adsorbed is disposed on the protective film, and when the gas in the adsorption groove is evacuated from the exhaust hole, the object to be adsorbed is An adsorption device configured to be adsorbed on the protective film by a vacuum adsorption force, and to adsorb the object to be adsorbed on the protective film by a gradient force when a voltage is applied between the first and second electrodes. The bottom surface of the suction groove is the first and second electrodes Lower than the bottom surface, is configured adsorber so as to be located inside the substrate.
The present invention also includes a substrate, a conductive material disposed on a flat surface of the substrate, the first and second electrodes configured with the conductive material, to which different voltages are applied, An insulating protective film covering the surfaces of the first and second electrodes, an adsorption groove positioned between the first and second electrodes, and connected to the adsorption groove, and the adsorption groove is connected to a vacuum exhaust system When an object to be adsorbed is disposed on the protective film and the gas in the adsorption groove is evacuated from the exhaust hole, the object to be adsorbed is adsorbed on the protective film by a vacuum adsorption force. The adsorption device is configured such that when a voltage is applied between the first and second electrodes, the adsorption object is adsorbed on the protective film by a gradient force, and the substrate is a metal substrate body And an insulating base film formed on the surface of the substrate body. And, the first, second electrodes are disposed in close contact to the base film,
In the suction device, the base film is exposed at the bottom of the suction groove.
Further, the present invention is the suction apparatus configured such that the bottom portion of the suction groove is lower than the surface of the base film, and the lower portion of the suction groove is located inside the substrate.
Moreover, this invention is an adsorption | suction apparatus with which the said adsorption | suction groove | channel was enclosed with the said electroconductive material.
Moreover, this invention is an adsorption | suction apparatus with which the said adsorption | suction groove | channel was enclosed by said 1st or said 2nd electrode.
Further, the present invention is a manufacturing method for manufacturing any one of the above adsorption devices, the step of forming a film of the conductive material on the surface of a substrate having an insulating surface, and the film of the conductive material Patterning the first and second electrodes by patterning, forming the protective film on the surfaces of the first and second electrode films, patterning the protective film and the substrate, In the manufacturing method of the suction device, a suction groove whose bottom is lower than the surface of the substrate is formed at a position between the first and second conductive films, and a lower portion of the suction groove is positioned inside the substrate.

本発明は、真空槽と、上記いずれかの吸着装置を有し、前記吸着装置は、前記真空槽内に出入り可能に構成されたハンドラーから前記吸着対象物を受け取る真空処理装置である。   The present invention includes a vacuum chamber and any one of the suction devices described above, and the suction device is a vacuum processing device that receives the suction object from a handler configured to be able to enter and exit the vacuum chamber.

真空吸着力とグラディエント力の両方が強い吸着装置が得られる。   An adsorption device with strong vacuum adsorption force and gradient force is obtained.

図7の符号10は、本発明の真空処理装置を示している。
この真空処理装置10は、真空槽41と、本発明の第一例の吸着装置1(又は後述する他の例の吸着装置2、3)を有している。
The code | symbol 10 of FIG. 7 has shown the vacuum processing apparatus of this invention.
The vacuum processing apparatus 10 includes a vacuum chamber 41 and a first example of the adsorption device 1 of the present invention (or other examples of adsorption devices 2 and 3 to be described later).

真空槽41の外部には、高真空排気系42と低真空排気系43が設けられている。真空槽41は、バルブ45を介して高真空排気系42に接続されており、高真空排気系42を動作させてバルブ45を開状態にすると、真空槽41の内部を高真空雰囲気まで真空排気できるように構成されている。   A high vacuum exhaust system 42 and a low vacuum exhaust system 43 are provided outside the vacuum chamber 41. The vacuum chamber 41 is connected to a high vacuum exhaust system 42 via a valve 45, and when the high vacuum exhaust system 42 is operated to open the valve 45, the inside of the vacuum chamber 41 is vacuum exhausted to a high vacuum atmosphere. It is configured to be able to.

吸着装置1は切替器44を介して高真空排気系42と低真空排気系43に接続されている。切替器44内には三方弁が設けられており、三方弁を切換えることで、真空槽41は高真空排気系42と低真空排気系43のいずれか一方に接続されるように構成されている。   The adsorption device 1 is connected to a high vacuum exhaust system 42 and a low vacuum exhaust system 43 via a switch 44. A three-way valve is provided in the switch 44, and the vacuum chamber 41 is configured to be connected to either the high vacuum exhaust system 42 or the low vacuum exhaust system 43 by switching the three-way valve. .

吸着装置1の構造を図1に示す。同図符号1aは内部構造を説明するための平面図、符号1b、1cは、それぞれそのA−A線、B−B線切断断面図である。
この吸着装置1は、板状の基板20を有している。
基板20は、金属製の板から成る基体21と、該基体21の表面に形成された絶縁性の下地膜22とで構成されており、基板20の表面が絶縁性を有するようにされている。
The structure of the adsorption device 1 is shown in FIG. Reference numeral 1a in the figure is a plan view for explaining the internal structure, and reference numerals 1b and 1c are sectional views taken along lines AA and BB, respectively.
The suction device 1 has a plate-like substrate 20.
The substrate 20 includes a base 21 made of a metal plate and an insulating base film 22 formed on the surface of the base 21 so that the surface of the substrate 20 has an insulating property. .

基板20の表面には、パターニングされた導電性材料膜から成る第一〜第三の電極23a、23b、23cが配置されている。第一〜第三の電極23a〜23cの底面は、下地膜22の表面に密着されている。   On the surface of the substrate 20, first to third electrodes 23a, 23b, and 23c made of a patterned conductive material film are disposed. The bottom surfaces of the first to third electrodes 23 a to 23 c are in close contact with the surface of the base film 22.

第一〜第三の電極23a〜23cは、電気導電性を有する導電性材料の膜を塗布して形成したり、スパッタリンや蒸着法で形成した後、エッチング等でパターニングして構成することができる。また、スクリーン印刷によって直接パターニングした導電性材料膜を塗布し、第一〜第三の電極23a〜23cを構成させることもできる。   The first to third electrodes 23a to 23c may be formed by applying a film of a conductive material having electrical conductivity, or formed by sputtering or vapor deposition, and then patterned by etching or the like. it can. Alternatively, the first to third electrodes 23a to 23c can be configured by applying a conductive material film directly patterned by screen printing.

第一〜第三の電極23a〜23cは互いに所定間隔を開けて配置されており、その間には基板20の表面(ここでは下地膜22)が位置している。
前記第一〜第三の電極23a〜23cの間隔は2mm以下であり、第一〜第三の電極23a〜23cの幅は4mm以下である。
The first to third electrodes 23a to 23c are arranged at a predetermined interval from each other, and the surface of the substrate 20 (here, the base film 22) is located between the first to third electrodes 23a to 23c.
The interval between the first to third electrodes 23a to 23c is 2 mm or less, and the width of the first to third electrodes 23a to 23c is 4 mm or less.

第一、第二の電極23a、23bは例えば櫛の歯状であり、互いにかみ合うように配置されている。第三の電極23cはリング状であり、第一、第二の電極23a、23bとは非接触で、第一、第二の電極23a、23bを取り囲んでいる。   The first and second electrodes 23a and 23b have, for example, comb-like shapes and are arranged to engage with each other. The third electrode 23c has a ring shape and is not in contact with the first and second electrodes 23a and 23b, and surrounds the first and second electrodes 23a and 23b.

第一〜第三の電極23a〜23cの表面には、絶縁性の保護膜24が形成されており、第一〜第三の電極23a〜23cの間には吸着溝26が配置されている。
吸着溝26は、基板20の表面の、第一〜第三の電極23a〜23cの間に位置する部分を一部除去することで形成されており、吸着溝26の底面は下地膜22の内部に位置している。
An insulating protective film 24 is formed on the surfaces of the first to third electrodes 23a to 23c, and an adsorption groove 26 is disposed between the first to third electrodes 23a to 23c.
The suction groove 26 is formed by partially removing a portion of the surface of the substrate 20 located between the first to third electrodes 23 a to 23 c, and the bottom surface of the suction groove 26 is inside the base film 22. Is located.

即ち、吸着溝26の底面は、第一〜第三の電極23a〜23cの底面よりも低くされており、従って、下地膜22を厚く形成し、吸着溝26の底面を深くすることで、第一〜第三の電極23a〜23cや保護膜24を薄くしても、50μm以上の深さの吸着溝26が得られる。   That is, the bottom surface of the suction groove 26 is set lower than the bottom surfaces of the first to third electrodes 23a to 23c. Therefore, the base film 22 is formed thick and the bottom surface of the suction groove 26 is deepened. Even if the first to third electrodes 23a to 23c and the protective film 24 are thinned, the adsorption groove 26 having a depth of 50 μm or more can be obtained.

吸着溝26の一部は、第一、第二の電極23a、23b間の最短距離よりも幅広に形成されており、幅広に形成された部分の底面には、基板20の裏面まで貫通する排気孔27が設けられている。
この排気孔27は、基板20の裏面部分で配管に接続されており、その配管によって上述の切替器44に接続されている。
A part of the adsorption groove 26 is formed wider than the shortest distance between the first and second electrodes 23 a and 23 b, and the exhaust gas penetrating to the back surface of the substrate 20 is formed on the bottom surface of the wide portion. A hole 27 is provided.
The exhaust hole 27 is connected to a pipe at the back surface portion of the substrate 20 and is connected to the switch 44 described above by the pipe.

図7の符号15は、ガラス基板等の絶縁性の吸着対象物であり、吸着の手順を説明すると、先ず、保護膜24が鉛直下方を向くようにして吸着装置1を真空槽41内に配置し、吸着対象物をハンドラー19上に乗せて真空吸着して移動させ、真空槽41内に搬入し、吸着装置1の下方で静止させる。
そしてハンドラ19を上昇させ、吸着対象物15を吸着装置1に近づけ、吸着装置1に接触させる。
Reference numeral 15 in FIG. 7 denotes an insulating object to be adsorbed such as a glass substrate. The adsorbing procedure will be described. First, the adsorbing device 1 is arranged in the vacuum chamber 41 so that the protective film 24 faces vertically downward. Then, the object to be adsorbed is placed on the handler 19 and is sucked and moved by vacuum suction, is carried into the vacuum chamber 41, and is stationary under the suction device 1.
Then, the handler 19 is raised, the suction object 15 is brought close to the suction device 1 and brought into contact with the suction device 1.

第一〜第三の電極23a〜23c上の保護膜24の高さは互いに等しくなっており、吸着装置1の第一〜第三の電極23a〜23c上の保護膜24は、吸着対象物15の表面に同時に接触する。   The heights of the protective films 24 on the first to third electrodes 23 a to 23 c are equal to each other, and the protective films 24 on the first to third electrodes 23 a to 23 c of the adsorption device 1 are the objects to be adsorbed 15. Simultaneously touch the surface.

吸着溝26の周囲は第三の電極23cで取り囲まれており、吸着対象物15が吸着装置1に密着した状態では、吸着溝26は吸着対象物15によって蓋がされた状態になり、吸着溝26の内部は吸着装置1の周囲の雰囲気から遮断される。   The suction groove 26 is surrounded by the third electrode 23c. When the suction object 15 is in close contact with the suction device 1, the suction groove 26 is covered with the suction object 15, and the suction groove 26 The interior of 26 is cut off from the atmosphere around the adsorption device 1.

切替器44によって吸着装置1を低真空排気系43に接続しておき、吸着対象物15と吸着装置1が密着した状態で低真空排気系43によって吸着溝26の内部を真空排気すると、吸着溝26の内部の気体が真空排気され、数分の一気圧に減圧される。   When the suction device 1 is connected to the low vacuum exhaust system 43 by the switch 44 and the inside of the suction groove 26 is evacuated by the low vacuum exhaust system 43 in a state where the suction target 15 and the suction device 1 are in close contact, the suction groove The gas inside 26 is evacuated and reduced in pressure to a fraction of a pressure.

吸着対象物15及び吸着装置1の周囲雰囲気は大気圧であり、吸着溝26の内部との差圧により、吸着対象物15は吸着装置1に真空吸着される。
ハンドラ19の真空吸着を解除して降下させると、吸着装置1の真空吸着力によって、吸着対象物15は吸着装置1に保持される(図8)。
The ambient atmosphere around the adsorption object 15 and the adsorption device 1 is atmospheric pressure, and the adsorption object 15 is vacuum adsorbed by the adsorption device 1 due to the differential pressure with the inside of the adsorption groove 26.
When the vacuum suction of the handler 19 is released and lowered, the suction object 15 is held by the suction device 1 by the vacuum suction force of the suction device 1 (FIG. 8).

基板20には裏面又は側面から不図示の配線が挿通されており、第一〜第三の電極23a〜23cは、その配線を介して電源装置48に接続されている。
真空槽41は接地電位に接続されており、電源装置48を動作させ、第一、第二の電極23a、23bに電圧を印加する。
A wiring (not shown) is inserted through the substrate 20 from the back or side surface, and the first to third electrodes 23a to 23c are connected to the power supply device 48 through the wiring.
The vacuum chamber 41 is connected to the ground potential, operates the power supply device 48, and applies a voltage to the first and second electrodes 23a and 23b.

第一、第二の電極23a、23bには、互いに逆極性の電圧を印加する。即ち、第一の電極23aに正電圧を印加する場合には第二の電極23bには負電圧、逆に第一の電極23aに負電圧を印加する場合には第二の電極23bには正電圧を印加する。
第三の電極23cは、第一の電極23a又は第二の電極23bのいずれか一方と短絡されており、第一又は第二の電極23a、23bと同じ電圧が印加される。
Voltages having opposite polarities are applied to the first and second electrodes 23a and 23b. That is, when a positive voltage is applied to the first electrode 23a, a negative voltage is applied to the second electrode 23b. Conversely, when a negative voltage is applied to the first electrode 23a, a positive voltage is applied to the second electrode 23b. Apply voltage.
The third electrode 23c is short-circuited with either the first electrode 23a or the second electrode 23b, and the same voltage as that of the first or second electrode 23a, 23b is applied.

第一、第二の電極23a、23b間に電圧が印加されると、その間に形成される電界によってグラディエント力が発生する。絶縁性の吸着対象物15には、真空吸着力に加えてグラディエント力も加わる。   When a voltage is applied between the first and second electrodes 23a and 23b, a gradient force is generated by the electric field formed therebetween. In addition to the vacuum suction force, a gradient force is also applied to the insulating suction object 15.

ここで形成されたグラディエント力は単独でも吸着対象物15を保持可能な大きさであり、吸着対象物15にグラディエント力が印加された後、真空槽41を高真空排気系42に接続し、高真空排気系42によって真空槽41内を真空排気する。   The gradient force formed here is large enough to hold the adsorption target 15 alone. After the gradient force is applied to the adsorption target 15, the vacuum chamber 41 is connected to the high vacuum exhaust system 42, and the high The inside of the vacuum chamber 41 is evacuated by the evacuation system 42.

高真空排気系42によって真空槽41内が真空排気され、圧力が低下すると、吸着溝26の内部と吸着装置1の周囲との間の差圧が小さくなり、吸着装置1の真空吸着力は消滅する。   When the inside of the vacuum chamber 41 is evacuated by the high vacuum evacuation system 42 and the pressure is reduced, the differential pressure between the inside of the adsorption groove 26 and the periphery of the adsorption device 1 becomes small, and the vacuum adsorption force of the adsorption device 1 disappears. To do.

真空排気により、真空槽41の内部の圧力が吸着溝26の内部の圧力よりも低くなった場合は、吸着溝26内の残留気体により、吸着力ではなく、吸着対象物15を吸着装置1から離間させる反発力が発生してしまう。   When the pressure inside the vacuum chamber 41 becomes lower than the pressure inside the adsorption groove 26 due to evacuation, the adsorption target 15 is removed from the adsorption device 1 instead of the adsorption force by the residual gas in the adsorption groove 26. A repulsive force that causes separation will occur.

本発明では、真空槽41の内部を高真空排気系42によって真空排気する際、切替器44によって、吸着装置1の接続を低真空排気系43から高真空排気系42に切り換え、吸着溝26内を真空槽41内と共に高真空排気系42によって真空排気する。この場合、低真空排気系43によるよりも吸着溝26の内部を低圧力まで真空排気でき、真空槽41と吸着溝26の内部を同じ高真空排気系42によって一緒に真空排気するので、大きな反発力は発生せず、グラディエント力によって吸着対象物15は吸着装置1に保持された状態が維持される。   In the present invention, when the inside of the vacuum chamber 41 is evacuated by the high vacuum evacuation system 42, the switch 44 switches the connection of the adsorption device 1 from the low vacuum evacuation system 43 to the high vacuum evacuation system 42. The vacuum chamber 41 is evacuated together with the high vacuum evacuation system 42. In this case, the inside of the suction groove 26 can be evacuated to a lower pressure than by the low vacuum exhaust system 43, and the inside of the vacuum chamber 41 and the suction groove 26 is evacuated together by the same high vacuum exhaust system 42. No force is generated, and the suction target 15 is maintained in the suction device 1 by the gradient force.

真空処理装置10がスパッタ装置や蒸着装置の場合、真空槽41内にターゲットや蒸着源が配置されており、吸着対象物15は吸着装置1に保持された状態で薄膜が形成される。   When the vacuum processing apparatus 10 is a sputtering apparatus or a vapor deposition apparatus, a target and a vapor deposition source are arranged in the vacuum chamber 41, and a thin film is formed while the adsorption target 15 is held by the adsorption apparatus 1.

真空処理装置10がパネル封止装置である場合、吸着装置1に保持された吸着対象物15は、真空槽41内に配置された他の基板と位置合わせされ、貼り合わされる。   When the vacuum processing apparatus 10 is a panel sealing apparatus, the adsorption object 15 held by the adsorption apparatus 1 is aligned with and bonded to another substrate disposed in the vacuum chamber 41.

以上説明したように、本発明の吸着装置1では、第一〜第三の電極23a〜23cや、その上の保護膜24を薄くした場合であっても、下地膜22を厚くし、吸着溝26の、下地膜22の表面よりも下の部分を深くすることで、吸着溝26を50μm以上に深くすることができる。通常は100μm〜150μmである。   As described above, in the adsorption device 1 of the present invention, even if the first to third electrodes 23a to 23c and the protective film 24 thereon are thinned, the base film 22 is made thick, and the adsorption groove By deepening the portion 26 below the surface of the base film 22, the suction groove 26 can be deepened to 50 μm or more. Usually, it is 100 micrometers-150 micrometers.

吸着溝26を深くすることによって強い真空吸着力が発現され、また、高真空排気系42によって吸着溝26の内部の残留気体が真空排気され易くなり、反発力が生じにくくなる。
他方、保護膜24を薄くするとグラディエント力は強くなるので、真空吸着力とグラディエント力の両方が強い吸着装置1が得られる。
By deepening the suction groove 26, a strong vacuum suction force is expressed, and the high vacuum exhaust system 42 makes it easy for the residual gas inside the suction groove 26 to be evacuated, so that a repulsive force is hardly generated.
On the other hand, when the protective film 24 is made thinner, the gradient force becomes stronger, so that the adsorption device 1 having both strong vacuum adsorption force and gradient force can be obtained.

また、第三の電極23cによって吸着溝26が囲まれているので、吸着溝26が外部雰囲気と遮断され、吸着溝26内に外部雰囲気から気体が侵入しない。この場合、第一、第二の電極23a、23b上の保護膜24の表面高さは、第三の電極23c上の保護膜24の表面高さよりも低くしてもよい。
第一、第二の電極23a、23b間の電界強度は絶縁破壊が起こらない範囲で大きい方がよく、3×106V/m以上の強度の電場を形成することが望ましい。
保護膜24については、厚い方が寿命が長くなるがグラディエント力は弱くなってしまうため、100μm以下の厚みが好ましい。
Further, since the adsorption groove 26 is surrounded by the third electrode 23c, the adsorption groove 26 is blocked from the external atmosphere, and no gas enters the adsorption groove 26 from the external atmosphere. In this case, the surface height of the protective film 24 on the first and second electrodes 23a and 23b may be lower than the surface height of the protective film 24 on the third electrode 23c.
The electric field strength between the first and second electrodes 23a and 23b should be as large as possible without causing dielectric breakdown, and it is desirable to form an electric field having an intensity of 3 × 10 6 V / m or more.
About the protective film 24, the thicker one has a longer life but the gradient force becomes weaker. Therefore, a thickness of 100 μm or less is preferable.

次に、本発明の他の例について説明する。
下記第二例及び第三例の吸着装置2、3については、第一例の吸着装置1と同じ部材には同じ符号を付して説明を省略する。
Next, another example of the present invention will be described.
About the adsorption | suction apparatus 2 and 3 of the following 2nd example and the 3rd example, the same code | symbol is attached | subjected to the same member as the adsorption apparatus 1 of a 1st example, and description is abbreviate | omitted.

第一例の吸着装置1では、第一、第二の電極23a、23bとは離間した第三の電極23cを有しており、吸着溝26は第三の電極23cによって囲まれていた。   The adsorption device 1 of the first example has the third electrode 23c that is separated from the first and second electrodes 23a and 23b, and the adsorption groove 26 is surrounded by the third electrode 23c.

図2の第二例の吸着装置2では、第三の電極は設けられておらず、吸着溝26は第一又は第二の電極(この吸着装置12では第二の電極23b)で囲まれている。
図2の符号2aは、第二例の吸着装置2の内部構造を説明するための平面図、同図符号2b、2cは、C−C線、D−D線切断断面図である。
In the adsorption device 2 of the second example of FIG. 2, the third electrode is not provided, and the adsorption groove 26 is surrounded by the first or second electrode (the second electrode 23b in the adsorption device 12). Yes.
2 is a plan view for explaining the internal structure of the suction device 2 of the second example, and the reference numerals 2b and 2c are sectional views taken along the line CC and DD.

上記第一、第二例の吸着装置1、2は、吸着対象物15で蓋をされた状態では吸着溝26の内部は外部雰囲気から分離されていたが、真空吸着力が低下しなければ外部雰囲気と接続されていてもよい。   In the suction devices 1 and 2 of the first and second examples, the inside of the suction groove 26 is separated from the external atmosphere in the state where the suction target 15 is covered. It may be connected to the atmosphere.

図3の第三例の吸着装置3では、吸着溝26が電極で囲まれておらず、吸着溝26の周囲は、第一、第二の電極23a、23bが位置する部分よりも、第一、第二の電極23a、23bの膜厚分だけ薄くなっている。   In the suction device 3 of the third example in FIG. 3, the suction groove 26 is not surrounded by electrodes, and the periphery of the suction groove 26 is more than the portion where the first and second electrodes 23 a and 23 b are located. The thickness is reduced by the thickness of the second electrodes 23a and 23b.

しかし、スパッタ法や蒸着法によって形成した金属薄膜をパターニングして第一、第二の電極23a、23bを形成すれば、その膜厚は非常に薄くできる。例えば1μm以下にできる。従って、この吸着装置3上に吸着対象物15を配置して吸着溝26の内部を真空排気したときに、吸着溝26の周囲から吸着溝26内に流入する気体は僅かであり、真空吸着力は低下しない。   However, if the metal thin film formed by sputtering or vapor deposition is patterned to form the first and second electrodes 23a and 23b, the film thickness can be made very thin. For example, it can be 1 μm or less. Therefore, when the adsorption object 15 is arranged on the adsorption device 3 and the inside of the adsorption groove 26 is evacuated, the amount of gas flowing from the periphery of the adsorption groove 26 into the adsorption groove 26 is small, and the vacuum adsorption force Will not drop.

第三例の吸着装置3では、吸着溝26を取り囲む領域の高さが第1、第2の電極23a、23bが位置する部分の高さよりも低くなっていたが、第一、第二の電極23a、23bの内側だけ溝を形成すれば、第一、第二の電極23a、23bで挟まれた領域の端部28が吸着溝26の端部となり、周囲ではなく、この端部28だけから気体が流入するため、流入量は一層少くなる。
排気孔27は、気体が流入する領域からできるだけ遠い位置に設け、気体流入のコンダクタンスを小さくしておくとよい。
In the suction device 3 of the third example, the height of the region surrounding the suction groove 26 is lower than the height of the portion where the first and second electrodes 23a and 23b are located. If a groove is formed only inside 23a, 23b, the end portion 28 of the region sandwiched between the first and second electrodes 23a, 23b becomes the end portion of the adsorption groove 26, and only from this end portion 28, not the periphery. Since gas flows in, the amount of inflow becomes even smaller.
The exhaust hole 27 may be provided at a position as far as possible from the region where the gas flows, and the conductance of the gas flow may be reduced.

次に、本発明の吸着装置1〜3の製造工程の一例について説明する。
図4(a)に示すように、先ず、金属製の板から成る基体21上に絶縁性の下地膜22を形成し、基板20を構成させる。下地膜22は、アルミナ、二酸化ケイ素や窒化ケイ素等のセラミックスの板やポリイミド樹脂の板又はフィルムを用いることができる。
Next, an example of the manufacturing process of the adsorption devices 1 to 3 of the present invention will be described.
As shown in FIG. 4A, first, an insulating base film 22 is formed on a base 21 made of a metal plate to constitute a substrate 20. The base film 22 may be a ceramic plate such as alumina, silicon dioxide or silicon nitride, or a polyimide resin plate or film.

次に、同図(b)に示すように、下地膜22上に導電性膜33を形成する。この導電性膜33は導電性ペーストの塗布、金属箔の貼付、スパッタリング法や蒸着法等によって形成することができる。金属に限定されず、導電性を有すれば有機膜でも無機膜でもよい。   Next, a conductive film 33 is formed on the base film 22 as shown in FIG. The conductive film 33 can be formed by applying a conductive paste, sticking a metal foil, a sputtering method, a vapor deposition method, or the like. It is not limited to metals, and may be an organic film or an inorganic film as long as it has conductivity.

次に、導電性膜33を所望形状にパターニングし、第一、第二の電極(及び必要に応じて第三の電極)を形成する。同図(c)はその状態を示しており、符号23は、第一〜第三の電極を示している。第一〜第三の電極23間には、下地膜22が露出している。   Next, the conductive film 33 is patterned into a desired shape to form first and second electrodes (and a third electrode if necessary). FIG. 2C shows the state, and reference numeral 23 indicates first to third electrodes. The base film 22 is exposed between the first to third electrodes 23.

次に、同図(d)に示すように、基板20の第一〜第三の電極23が配置された表面に絶縁性の保護膜34を形成する。
上記保護膜34上にレジスト膜を形成し、該レジスト膜をパターニングし、同図(e)に示すように、第一〜第三の電極23間に位置する保護膜34は露出させ、第一〜第三の電極23上の保護膜34はレジスト35で覆う。
レジスト35をマスクとし、保護膜34の露出部分をエッチングする。
Next, as shown in FIG. 4D, an insulating protective film 34 is formed on the surface of the substrate 20 on which the first to third electrodes 23 are disposed.
A resist film is formed on the protective film 34, the resist film is patterned, and the protective film 34 located between the first to third electrodes 23 is exposed as shown in FIG. The protective film 34 on the third electrode 23 is covered with a resist 35.
The exposed portion of the protective film 34 is etched using the resist 35 as a mask.

ここでは同図(f)に示すように、保護膜34の厚み方向全部と、その真下の下地膜22の深さ方向表面側途中までをエッチングによって除去した後、同図(g)に示すようにレジスト35を除去すると、底面が下地膜22の表面よりも下方に位置する吸着溝26が得られる。吸着溝26の底面は基体21には達しておらず、その底面には下地膜22が露出している。
なお、保護膜24をエッチングした後、レジスト35を除去し、保護膜24をマスクとして下地膜22をエッチングしてもよい。
Here, as shown in FIG. 5F, after removing all the thickness direction of the protective film 34 and halfway along the surface in the depth direction of the underlying film 22 just below it, as shown in FIG. When the resist 35 is removed, the suction groove 26 whose bottom surface is located below the surface of the base film 22 is obtained. The bottom surface of the suction groove 26 does not reach the base 21, and the base film 22 is exposed on the bottom surface.
Note that after the protective film 24 is etched, the resist 35 may be removed, and the base film 22 may be etched using the protective film 24 as a mask.

また、下地膜22表面から第一、又は第二の電極23上の保護膜24の表面までの高さ、即ち、第一、第二の電極23の膜厚とその上の保護膜24の膜厚の合計膜厚が厚い場合は、図5に示すように、下地膜22はエッチングせず、底面に下地膜22を露出させても深い吸着溝26'が得られる。   The height from the surface of the base film 22 to the surface of the protective film 24 on the first or second electrode 23, that is, the film thickness of the first and second electrodes 23 and the film of the protective film 24 thereon. When the total film thickness is large, as shown in FIG. 5, the deep adsorption groove 26 ′ is obtained even if the base film 22 is exposed on the bottom surface without etching the base film 22.

第一、第二の電極23と保護膜24の合計膜厚が更に厚い場合は、図6(a)に示すように、保護膜24を深さ方向途中までエッチングして吸着溝26を形成した後、レジスト35を除去し、同図(b)に示すように、底面に保護膜24が露出する深い吸着溝26”を形成することができる。
上記各例では基板20を、金属製の基体21と下地膜22の積層体で構成させたが、絶縁性の板によって基板を構成してもよい。
When the total thickness of the first and second electrodes 23 and the protective film 24 is larger, as shown in FIG. 6A, the protective film 24 is etched halfway in the depth direction to form the adsorption groove 26. Thereafter, the resist 35 is removed, and a deep suction groove 26 ″ where the protective film 24 is exposed can be formed on the bottom surface, as shown in FIG.
In each of the above examples, the substrate 20 is constituted by a laminated body of the metal base 21 and the base film 22, but the substrate may be constituted by an insulating plate.

膜厚の厚い保護膜24を形成した後、第一〜第三の電極23a〜23c上の部分を残して保護膜をエッチングすると、一層深い吸着溝26を形成することもできる。
なお、上記各例の吸着装置1〜3の平面図では、第一〜第三の電極23a〜23cのパターンは、実際よりも簡略化してある。
After forming the thick protective film 24, the protective film is etched leaving the portions on the first to third electrodes 23a to 23c, so that a deeper adsorption groove 26 can be formed.
In addition, in the top view of the adsorption | suction apparatuses 1-3 of each said example, the pattern of the 1st-3rd electrodes 23a-23c is simplified rather than actual.

本発明の第一例の吸着装置First example of adsorption apparatus of the present invention 本発明の第二例の吸着装置Adsorption device of the second example of the present invention 本発明の第三例の吸着装置The adsorption device of the third example of the present invention (a)〜(g):本発明の吸着装置の製造工程を説明するための図(a)-(g): The figure for demonstrating the manufacturing process of the adsorption | suction apparatus of this invention 下地膜をエッチングしない吸着装置の例Example of an adsorption device that does not etch the underlying film (a)、(b):吸着溝の底面に保護膜を残す場合の工程を説明するための図(a), (b): The figure for demonstrating the process in the case of leaving a protective film on the bottom face of an adsorption | suction groove | channel. 本発明の吸着装置を用いた真空処理装置を説明するための図(1)FIG. (1) for explaining a vacuum processing apparatus using the adsorption apparatus of the present invention 本発明の吸着装置を用いた真空処理装置を説明するための図(2)FIG. (2) for explaining a vacuum processing apparatus using the adsorption apparatus of the present invention 従来技術の吸着装置Prior art adsorption device (a):その吸着溝のパターン (b):その電極パターン(a): The pattern of the adsorption groove (b): The electrode pattern

符号の説明Explanation of symbols

10……真空処理装置
1〜3……吸着装置
15……吸着対象物
20……基板
21……基体
22……下地膜
23a……第一の電極
23b……第二の電極
24……保護膜
26……吸着溝
27……排気孔
42、43……真空排気系
DESCRIPTION OF SYMBOLS 10 ... Vacuum processing apparatus 1-3 ... Adsorption | suction apparatus 15 ... Adsorption object 20 ... Substrate 21 ... Base | substrate 22 ... Base film 23a ... 1st electrode 23b ... 2nd electrode 24 ... Protection Membrane 26 ... Adsorption groove 27 ... Exhaust hole 42, 43 ... Vacuum exhaust system

Claims (7)

表面が絶縁性を有する基板と、
前記基板の平坦な表面上に配置された導電性材料と、
前記導電性材料で構成され、互いに異なる電圧が印加される第一、第二の電極と、
前記第一、第二の電極表面を被覆する絶縁性の保護膜と、
前記第一、第二の電極間に位置する吸着溝と、
前記吸着溝に接続され、前記吸着溝を真空排気系に接続する排気孔とを有し、
前記保護膜上に吸着対象物を配置し、前記排気孔から前記吸着溝内の気体を真空排気すると前記吸着対象物は真空吸着力によって前記保護膜上に吸着され、
前記第一、第二の電極間に電圧を印加するとグラディエント力によって前記吸着対象物は前記保護膜上に吸着されるように構成された吸着装置であって、
前記吸着溝の底面は、前記第一、第二の電極の底面よりも低く、前記基板の内部に位置するように構成された吸着装置。
A substrate having an insulating surface;
A conductive material disposed on a flat surface of the substrate;
First and second electrodes made of the conductive material to which different voltages are applied;
An insulating protective film covering the surfaces of the first and second electrodes;
A suction groove located between the first and second electrodes;
An exhaust hole connected to the suction groove and connecting the suction groove to a vacuum exhaust system;
When an object to be adsorbed is disposed on the protective film, and the gas in the adsorption groove is evacuated from the exhaust hole, the object to be adsorbed is adsorbed on the protective film by a vacuum adsorption force,
When the voltage is applied between the first and second electrodes, the adsorption object is configured to be adsorbed on the protective film by a gradient force,
A suction device configured such that a bottom surface of the suction groove is lower than bottom surfaces of the first and second electrodes and is located inside the substrate.
基板と、
前記基板の平坦な表面上に配置された導電性材料と、
前記導電性材料で構成され、互いに異なる電圧が印加される第一、第二の電極と、
前記第一、第二の電極表面を被覆する絶縁性の保護膜と、
前記第一、第二の電極間に位置する吸着溝と、
前記吸着溝に接続され、前記吸着溝を真空排気系に接続する排気孔とを有し、
前記保護膜上に吸着対象物を配置し、前記排気孔から前記吸着溝内の気体を真空排気すると前記吸着対象物は真空吸着力によって前記保護膜上に吸着され、
前記第一、第二の電極間に電圧を印加するとグラディエント力によって前記吸着対象物は前記保護膜上に吸着されるように構成された吸着装置であって、
前記基板は金属製の基板本体と、
前記基板本体の表面に形成された絶縁性の下地膜とを有し、
前記第一、第二の電極は前記下地膜に密着配置され、
前記吸着溝の底部には、前記下地膜が露出された吸着装置。
A substrate,
A conductive material disposed on a flat surface of the substrate;
First and second electrodes made of the conductive material to which different voltages are applied;
An insulating protective film covering the surfaces of the first and second electrodes;
A suction groove located between the first and second electrodes;
An exhaust hole connected to the suction groove and connecting the suction groove to a vacuum exhaust system;
When an object to be adsorbed is disposed on the protective film, and the gas in the adsorption groove is evacuated from the exhaust hole, the object to be adsorbed is adsorbed on the protective film by a vacuum adsorption force,
When the voltage is applied between the first and second electrodes, the adsorption object is configured to be adsorbed on the protective film by a gradient force,
The substrate is a metal substrate body,
An insulating base film formed on the surface of the substrate body;
The first and second electrodes are arranged in close contact with the base film,
An adsorption device in which the base film is exposed at the bottom of the adsorption groove.
前記吸着溝の底部は前記下地膜表面よりも低く、前記吸着溝の下部は前記基板の内部に位置するように構成された請求項2記載の吸着装置。   The suction device according to claim 2, wherein a bottom portion of the suction groove is lower than a surface of the base film, and a lower portion of the suction groove is positioned inside the substrate. 前記吸着溝は前記導電性材料で囲まれた請求項1乃至請求項3のいずれか1項記載の吸着装置。   The adsorption device according to any one of claims 1 to 3, wherein the adsorption groove is surrounded by the conductive material. 前記吸着溝は前記第一又は前記第二の電極で囲まれた請求項4記載の吸着装置。   The suction device according to claim 4, wherein the suction groove is surrounded by the first or second electrode. 請求項1乃至請求項4のいずれか1項記載の吸着装置を製造する製造方法であって、
表面が絶縁性を有する基板の表面に前記導電性材料の膜を形成する工程と、
前記導電性材料の膜をパターニングして前記第一、第二の電極を形成する工程と、
前記第一、第二の電極膜の表面に前記保護膜を形成する工程と、
前記保護膜と前記基板とをパターニングし、前記第一、第二の導電膜の間の位置に、底部が前記基板の表面よりも低い吸着溝を形成し、前記吸着溝の下部を前記基板の内部に位置させる吸着装置の製造方法。
A manufacturing method for manufacturing the adsorption device according to any one of claims 1 to 4,
Forming a film of the conductive material on the surface of the substrate having an insulating surface;
Patterning the conductive material film to form the first and second electrodes;
Forming the protective film on the surfaces of the first and second electrode films;
The protective film and the substrate are patterned, and a suction groove whose bottom is lower than the surface of the substrate is formed at a position between the first and second conductive films, and a lower portion of the suction groove is formed on the substrate. A manufacturing method of a suction device located inside.
真空槽と、請求項1乃至請求項5のいずれか1項記載の吸着装置を有し、前記吸着装置は、前記真空槽内に出入り可能に構成されたハンドラーから前記吸着対象物を受け取る真空処理装置。   A vacuum processing system comprising: a vacuum chamber; and the suction device according to any one of claims 1 to 5, wherein the suction device receives the object to be suctioned from a handler configured to be able to enter and exit the vacuum chamber. apparatus.
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