JP2004311765A5 - - Google Patents

Download PDF

Info

Publication number
JP2004311765A5
JP2004311765A5 JP2003104018A JP2003104018A JP2004311765A5 JP 2004311765 A5 JP2004311765 A5 JP 2004311765A5 JP 2003104018 A JP2003104018 A JP 2003104018A JP 2003104018 A JP2003104018 A JP 2003104018A JP 2004311765 A5 JP2004311765 A5 JP 2004311765A5
Authority
JP
Japan
Prior art keywords
substrate
tile
semiconductor device
insulator
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2003104018A
Other languages
Japanese (ja)
Other versions
JP2004311765A (en
JP4370796B2 (en
Filing date
Publication date
Application filed filed Critical
Priority to JP2003104018A priority Critical patent/JP4370796B2/en
Priority claimed from JP2003104018A external-priority patent/JP4370796B2/en
Publication of JP2004311765A publication Critical patent/JP2004311765A/en
Publication of JP2004311765A5 publication Critical patent/JP2004311765A5/ja
Application granted granted Critical
Publication of JP4370796B2 publication Critical patent/JP4370796B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Claims (15)

基板と、
前記基板に貼り付けられているものであって、微小なタイル形状の素子からなる微小タイル状素子と、
前記微小タイル状素子と前記基板とを電気的に接続する配線の通り道となる部位であって、該微小タイル状素子の上面及び側面の一部を少なくとも含む部位に設けられた絶縁物と、
少なくとも前記絶縁物の上面を横断するように設けられた配線とを有することを特徴とする半導体装置。
A substrate,
A small tile-shaped element that is affixed to the substrate and is composed of a small tile-shaped element;
An insulating material provided at a portion that becomes a path of wiring for electrically connecting the micro tile-shaped element and the substrate, and includes at least a part of an upper surface and a side surface of the micro tile-shaped element;
And a wiring provided so as to cross at least an upper surface of the insulator.
前記絶縁物は、前記基板における前記配線の通り道となる部位であって、前記微小タイル状素子の側面付近にも設けられていることを特徴とする請求項1に記載の半導体装置。  2. The semiconductor device according to claim 1, wherein the insulator is a part of the substrate that serves as a path for the wiring, and is also provided near a side surface of the micro tile element. 前記絶縁物は、樹脂、ガラス、セラミックのいずれかからなることを特徴とする請求項1又は2に記載の半導体装置。  The semiconductor device according to claim 1, wherein the insulator is made of any one of resin, glass, and ceramic. 前記絶縁物は、酸化シリコンからなることを特徴とする請求項1乃至3のいずれか一項に記載の半導体装置。  The semiconductor device according to claim 1, wherein the insulator is made of silicon oxide. 前記微小タイル状素子は、面発光レーザ、発光ダイオード、フォトダイオード、フォトトランジスタ、高電子移動度トランジスタ、ヘテロバイポーラトランジスタ、インダクター、キャパシター及び抵抗のうちの少なくとも一つを有することを特徴とする請求項1乃至4のいずれか一項に記載の半導体装置。  The micro tile-like element includes at least one of a surface emitting laser, a light emitting diode, a photodiode, a phototransistor, a high electron mobility transistor, a heterobipolar transistor, an inductor, a capacitor, and a resistor. The semiconductor device according to any one of 1 to 4. 前記微小タイル状素子は、面発光レーザを有し、
前記配線は、前記面発光レーザのアノード電極又はカソード電極と前記基板に設けられている電極又は素子とを電気的に接続するものであることを特徴とする請求項1乃至5のいずれか一項に記載の半導体装置。
The micro tile element has a surface emitting laser,
6. The wiring according to claim 1, wherein the wiring electrically connects an anode electrode or a cathode electrode of the surface emitting laser and an electrode or an element provided on the substrate. A semiconductor device according to 1.
請求項1乃至6のいずれか一項に記載の半導体装置を備えたことを特徴とする電子機器。  An electronic apparatus comprising the semiconductor device according to claim 1. 基板に微小タイル状素子を貼り付け、
前記微小タイル状素子の側面の所望箇所を横断するように該絶縁物を形成し、
前記絶縁物の上を横断するように、導電体膜からなる配線を形成することを特徴とする半導体装置の製造方法。
A small tile-like element is attached to the substrate,
Forming the insulator so as to cross a desired portion of the side surface of the micro tile element;
A method of manufacturing a semiconductor device, comprising forming a wiring made of a conductor film so as to cross over the insulator.
前記配線は、前記微小タイル状素子の上面に設けられた電極と前記基板に設けられた電極とを接続するように形成されることを特徴とする請求項8に記載の半導体装置の製造方法。  9. The method of manufacturing a semiconductor device according to claim 8, wherein the wiring is formed so as to connect an electrode provided on an upper surface of the micro tile-like element and an electrode provided on the substrate. 前記絶縁物は、液状体の絶縁材料を前記所望箇所に塗布し、その後硬化させることで形成することを特徴とする請求項8又は9に記載の半導体装置の製造方法。  The method of manufacturing a semiconductor device according to claim 8, wherein the insulator is formed by applying a liquid insulating material to the desired portion and then curing the insulating material. 前記絶縁物は、液滴吐出方式を用いて形成することを特徴とする請求項10に記載の半導体装置の製造方法。  The method of manufacturing a semiconductor device according to claim 10, wherein the insulator is formed using a droplet discharge method. 前記配線は、液滴吐出方式を用いて形成することを特徴とする請求項8乃至11のいずれか一項に記載の半導体装置の製造方法。  The method for manufacturing a semiconductor device according to claim 8, wherein the wiring is formed by a droplet discharge method. 前記微小タイル状素子は、エピタキシャルリフトオフ法を用いて前記基板に接着することを特徴とする請求項8乃至12のいずれか一項に記載の半導体装置の製造方法。  13. The method of manufacturing a semiconductor device according to claim 8, wherein the micro tile-like element is bonded to the substrate by using an epitaxial lift-off method. 前記微小タイル状素子は、
エッチングによって除去することが可能な層である犠牲層を最下層に有する半導体基板に、半導体素子を形成し、
前記半導体基板の表面に、少なくとも前記犠牲層に到達する深さをもつ溝である分離溝を形成し、
前記半導体基板の表面に、フィルムを貼り付け、
前記分離溝と前記フィルムで囲まれた空間にエッチング液を注入して、前記犠牲層をエッチングすることで、前記半導体素子を前記半導体基板から切り離すことで形成し、
前記基板への微小タイル状素子の貼り付けは、
前記半導体基板から切り離された前記半導体素子を前記フィルムに貼り付けた状態でハンドリングして、前記基板の所望位置に接着することで行うことを特徴とする請求項8乃至12のいずれか一項に記載の半導体装置の製造方法。
The micro tile element is:
A semiconductor element is formed on a semiconductor substrate having a sacrificial layer as a lowermost layer that can be removed by etching,
Forming a separation groove, which is a groove having a depth reaching at least the sacrificial layer, on the surface of the semiconductor substrate;
Affixing a film on the surface of the semiconductor substrate,
Injecting an etchant into the space surrounded by the separation groove and the film, and etching the sacrificial layer to form the semiconductor element by separating it from the semiconductor substrate,
Affixing the micro tile element to the substrate is
The semiconductor element separated from the semiconductor substrate is handled in a state where the semiconductor element is attached to the film, and is adhered to a desired position of the substrate. The manufacturing method of the semiconductor device of description.
基板と、
前記基板上に形成され側面が順テーパー状のタイル部と、該タイル部上に形成された柱状部と、を有する微小タイル状素子と、
前記タイル部の上面に形成され、側面が順テーパー状の絶縁層と、
前記タイル部の上面に形成された第1電極と、
前記柱状部の上面および前記絶縁層の上面に形成された第2電極と、
前記タイル部の側面の上と、前記第1電極の上面の一部と、に形成された第1の絶縁物と、
前記タイル部の側面の上と、前記絶縁層の側面の上と、前記第2電極の上面の一部と、に形成された第2の絶縁物と、
前記基板上の一部と、前記第1の絶縁物の上面と、前記第1電極の上面の一部と、に形成された第1配線と、
前記基板上の一部と、前記第2の絶縁物の上面と、前記第2電極の上面の一部と、に形成された第2配線と、を有することを特徴とする半導体装置。
A substrate,
A micro tile-like element having a tile part formed on the substrate and having a tapered side surface and a columnar part formed on the tile part;
An insulating layer formed on the top surface of the tile portion and having a forward tapered side surface;
A first electrode formed on an upper surface of the tile portion;
A second electrode formed on the top surface of the columnar portion and the top surface of the insulating layer;
A first insulator formed on a side surface of the tile portion and a part of an upper surface of the first electrode;
A second insulator formed on the side surface of the tile portion, on the side surface of the insulating layer, and on a part of the upper surface of the second electrode;
A first wiring formed on a part of the substrate, a top surface of the first insulator, and a part of a top surface of the first electrode;
A semiconductor device comprising: a second wiring formed on a part of the substrate, a top surface of the second insulator, and a part of a top surface of the second electrode.
JP2003104018A 2003-04-08 2003-04-08 SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, AND ELECTRONIC DEVICE Expired - Fee Related JP4370796B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003104018A JP4370796B2 (en) 2003-04-08 2003-04-08 SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, AND ELECTRONIC DEVICE

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003104018A JP4370796B2 (en) 2003-04-08 2003-04-08 SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, AND ELECTRONIC DEVICE

Publications (3)

Publication Number Publication Date
JP2004311765A JP2004311765A (en) 2004-11-04
JP2004311765A5 true JP2004311765A5 (en) 2005-10-27
JP4370796B2 JP4370796B2 (en) 2009-11-25

Family

ID=33466967

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003104018A Expired - Fee Related JP4370796B2 (en) 2003-04-08 2003-04-08 SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, AND ELECTRONIC DEVICE

Country Status (1)

Country Link
JP (1) JP4370796B2 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006061696A1 (en) 2006-12-28 2008-07-03 Robert Bosch Gmbh Mobile telephone for e.g. generating statement about health condition of patient, has radiation source and gas detector abutting at intermediate chamber via radiation-permeable window, and another chamber coupled to ambient atmosphere
JP2010044964A (en) * 2008-08-13 2010-02-25 Toshiba Corp Micro movable device
JP2010114106A (en) 2008-11-04 2010-05-20 Canon Inc Transfer method of functional region, led array, led printer head, and led printer
JP5390832B2 (en) 2008-11-04 2014-01-15 キヤノン株式会社 Functional area transfer method, LED array, LED printer head, and LED printer
JP5276412B2 (en) 2008-11-04 2013-08-28 キヤノン株式会社 Functional area transfer method, LED array, LED printer head, and LED printer
JP2010205943A (en) 2009-03-04 2010-09-16 Canon Inc Transfer method of functional region, led array, led printer head, and led printer
FR3108777A1 (en) * 2020-03-24 2021-10-01 Commissariat à l'Energie Atomique et aux Energies Alternatives method of manufacturing a semiconductor structure by transferring thumbnails onto a support substrate

Similar Documents

Publication Publication Date Title
JP3956697B2 (en) Manufacturing method of semiconductor integrated circuit
CN108538877B (en) Manufacturing method of Micro LED display panel
CN104067379B (en) The method for making micro element transfer head
JP2003197881A5 (en)
US10367117B2 (en) Apparatus and method for transferring micro light-emitting diodes
CN108735863B (en) Manufacturing method of emission type LED display device
US9721823B2 (en) Method of transferring micro-device
JP4211256B2 (en) Semiconductor integrated circuit, semiconductor integrated circuit manufacturing method, electro-optical device, and electronic apparatus
TWI591861B (en) Micro device with stabilization post
US20230343630A1 (en) Multi-level micro-device tethers
US10505079B2 (en) Flexible devices and methods using laser lift-off
TWI658527B (en) Separation method and separation apparatus
KR100670984B1 (en) Method of manufacturing thin film circuit device
US10998352B2 (en) Integration of microdevices into system substrate
US20210336114A1 (en) Structures and methods for electrically connecting printed components
US10643880B2 (en) Method for transferring micro device
CN109300932B (en) LED display and manufacturing method thereof
TWI646873B (en) Electronic device and manufacturing method thereof
JP2010238845A (en) Method of manufacturing semiconductor device, semiconductor device, and semiconductor composite device
JP2003347672A5 (en)
CN112768370B (en) Transfer method and transfer device for micro-component
JP2004311765A5 (en)
US8618675B2 (en) Thin semiconductor die package
US8916420B2 (en) Chip package and manufacturing method thereof
JP4370796B2 (en) SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE MANUFACTURING METHOD, AND ELECTRONIC DEVICE