JP2006509194A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2006509194A5 JP2006509194A5 JP2004556554A JP2004556554A JP2006509194A5 JP 2006509194 A5 JP2006509194 A5 JP 2006509194A5 JP 2004556554 A JP2004556554 A JP 2004556554A JP 2004556554 A JP2004556554 A JP 2004556554A JP 2006509194 A5 JP2006509194 A5 JP 2006509194A5
- Authority
- JP
- Japan
- Prior art keywords
- artifact
- contact
- measurement probe
- measurement
- type
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GBGB0228371.1A GB0228371D0 (en) | 2002-12-05 | 2002-12-05 | Workpiece inspection method |
| PCT/GB2003/005326 WO2004051179A1 (en) | 2002-12-05 | 2003-12-05 | Workpiece inspection method |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2006509194A JP2006509194A (ja) | 2006-03-16 |
| JP2006509194A5 true JP2006509194A5 (enExample) | 2007-02-01 |
| JP4504818B2 JP4504818B2 (ja) | 2010-07-14 |
Family
ID=9949114
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004556554A Expired - Fee Related JP4504818B2 (ja) | 2002-12-05 | 2003-12-05 | 加工物検査方法 |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US7131207B2 (enExample) |
| EP (1) | EP1579168B2 (enExample) |
| JP (1) | JP4504818B2 (enExample) |
| CN (1) | CN100335860C (enExample) |
| AT (1) | ATE352767T1 (enExample) |
| AU (1) | AU2003292386A1 (enExample) |
| DE (1) | DE60311527T3 (enExample) |
| GB (1) | GB0228371D0 (enExample) |
| WO (1) | WO2004051179A1 (enExample) |
Families Citing this family (39)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7543393B2 (en) * | 2003-12-16 | 2009-06-09 | Renishaw Plc | Method of calibrating a scanning system |
| GB0329098D0 (en) * | 2003-12-16 | 2004-01-21 | Renishaw Plc | Method of calibrating a scanning system |
| EP1596160A1 (en) * | 2004-05-10 | 2005-11-16 | Hexagon Metrology AB | Method of inspecting workpieces on a measuring machine |
| GB0417536D0 (en) * | 2004-08-06 | 2004-09-08 | Renishaw Plc | The use of surface measurement probes |
| CN1841008A (zh) | 2005-04-01 | 2006-10-04 | 鸿富锦精密工业（深圳）有限公司 | 激光量测机台扫描精度验证方法 |
| JP2006349547A (ja) * | 2005-06-17 | 2006-12-28 | Kanto Auto Works Ltd | 非接触式三次元形状計測方法及び計測機 |
| GB0605796D0 (en) * | 2006-03-23 | 2006-05-03 | Renishaw Plc | Apparatus and method of measuring workpieces |
| ATE523761T1 (de) * | 2006-04-21 | 2011-09-15 | Renishaw Plc | Verfahren zur fehlerkorrektur |
| US8209839B1 (en) * | 2006-11-28 | 2012-07-03 | Florida Turbine Technologies, Inc. | Process for re-designing a distressed component used under thermal and structural loading |
| EP1988357B1 (en) * | 2007-05-04 | 2018-10-17 | Hexagon Technology Center GmbH | Coordinate measuring method and device |
| JP5203028B2 (ja) * | 2007-05-30 | 2013-06-05 | 株式会社ミツトヨ | 形状測定機構の異常検出方法及び形状測定機構 |
| GB0712008D0 (en) * | 2007-06-21 | 2007-08-01 | Renishaw Plc | Apparatus and method of calibration |
| CN101821582B (zh) * | 2007-06-28 | 2013-04-17 | 海克斯康测量技术有限公司 | 用于确定测量机中的动态误差的方法 |
| US7912572B2 (en) * | 2007-09-20 | 2011-03-22 | General Electric Company | Calibration assembly for an inspection system |
| GB2453127A (en) | 2007-09-26 | 2009-04-01 | Intelligent Energy Ltd | Fuel Cell System |
| GB2453126B (en) | 2007-09-26 | 2013-02-06 | Intelligent Energy Ltd | Fuel cell system |
| US7712224B2 (en) * | 2007-10-03 | 2010-05-11 | Hexagon Metrology Ab | Validating the error map of CMM using calibrated probe |
| US7908756B2 (en) * | 2007-10-12 | 2011-03-22 | Los Alamos National Security, Llc | Integrated calibration sphere and calibration step fixture for improved coordinate measurement machine calibration |
| GB2464509C (en) | 2008-10-17 | 2014-05-21 | Taylor Hobson Ltd | Surface measurement instrument and method |
| US7905031B1 (en) * | 2009-03-06 | 2011-03-15 | Florida Turbine Technologies, Inc. | Process for measuring a part |
| GB201003363D0 (en) * | 2010-03-01 | 2010-04-14 | Renishaw Plc | Measurement method and apparatus |
| GB201003599D0 (en) * | 2010-03-04 | 2010-04-21 | Renishaw Plc | Measurement method and apparatus |
| JP5649926B2 (ja) * | 2010-11-22 | 2015-01-07 | 株式会社小坂研究所 | 表面形状測定装置及び表面形状測定方法 |
| US8826719B2 (en) * | 2010-12-16 | 2014-09-09 | Hexagon Metrology, Inc. | Machine calibration artifact |
| JP5834317B2 (ja) | 2011-05-11 | 2015-12-16 | 株式会社ミツトヨ | 誤差画像生成方法 |
| GB201113715D0 (en) | 2011-08-09 | 2011-09-21 | Renishaw Plc | Method and apparatus for inspecting workpieces |
| GB201204947D0 (en) * | 2012-03-21 | 2012-05-02 | Renishaw Plc | Method and apparatus for inspecting workpieces |
| CN104813140B (zh) * | 2012-11-14 | 2019-05-03 | 瑞尼斯豪公司 | 用于通过机床测量工件的方法和设备 |
| GB201308467D0 (en) | 2013-05-10 | 2013-06-19 | Renishaw Plc | Method and Apparatus for Inspecting Workpieces |
| GB201316329D0 (en) * | 2013-09-13 | 2013-10-30 | Renishaw Plc | A Method of Using a scanning probe |
| EP3077763B1 (de) | 2014-01-23 | 2018-01-03 | Carl Zeiss Industrielle Messtechnik GmbH | Verfahren zur auswertung von koordinatenmessdaten, entsprechende vorrichtung zum vermessen eines messobjektes und entsprechendes computerprogrammprodukt |
| CN104123751A (zh) * | 2014-07-24 | 2014-10-29 | 福州大学 | Kinect与关节臂结合的复合式测量和三维重建方法 |
| JP6341962B2 (ja) | 2016-08-26 | 2018-06-13 | 株式会社ミツトヨ | 三次元測定装置及び座標補正方法 |
| JP2018031754A (ja) | 2016-08-26 | 2018-03-01 | 株式会社ミツトヨ | 三次元測定装置及び座標補正方法 |
| JP6295299B2 (ja) * | 2016-08-26 | 2018-03-14 | 株式会社ミツトヨ | 座標補正方法及び三次元測定装置 |
| US11092430B2 (en) * | 2016-09-09 | 2021-08-17 | Gleason Metrology Systems Corporation | Measurement of toothed articles utilizing multiple sensors |
| DE102017116772B4 (de) | 2017-02-01 | 2021-12-09 | Jenoptik Industrial Metrology Germany Gmbh | Verfahren zur Durchführung einer Geradheitskompensation bei einem Form- oder Konturmessgerät |
| JP7249846B2 (ja) | 2019-03-28 | 2023-03-31 | ヘキサゴン・メトロジー株式会社 | Ｃｎｃ加工装置のキャリブレーション方法 |
| CN113739702B (zh) * | 2020-05-27 | 2024-07-12 | 台达电子（东莞）有限公司 | Oa轴芯尺寸量测装置及方法 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB8713715D0 (en) * | 1987-06-11 | 1987-07-15 | Renishaw Plc | Workpiece inspection method |
| US5209131A (en) * | 1989-11-03 | 1993-05-11 | Rank Taylor Hobson | Metrology |
| US5251156A (en) * | 1990-08-25 | 1993-10-05 | Carl-Zeiss-Stiftung, Heidenheim/Brenz | Method and apparatus for non-contact measurement of object surfaces |
| JPH04178509A (ja) * | 1990-11-13 | 1992-06-25 | Tokyo Seimitsu Co Ltd | 座標測定機の測定方法 |
| US5315259A (en) * | 1992-05-26 | 1994-05-24 | Universities Research Association, Inc. | Omnidirectional capacitive probe for gauge of having a sensing tip formed as a substantially complete sphere |
| US5426861A (en) † | 1993-04-19 | 1995-06-27 | Advanced Metrological Development | Method and apparatus for inspecting parts for dimensional accuracy outside a laboratory environment |
| DE19730471C5 (de) | 1997-07-16 | 2009-02-19 | Hexagon Metrology Gmbh | Verfahren zum Scannen mit einem Koordinatenmeßgerät |
| GB9823228D0 (en) * | 1998-10-24 | 1998-12-16 | Renishaw Plc | Method of calibrating analogue probes |
| GB9907868D0 (en) * | 1999-04-08 | 1999-06-02 | Renishaw Plc | Method of calibrating a scanning system |
| DE10050795C2 (de) * | 1999-12-23 | 2002-11-07 | Klingelnberg Gmbh | Verfahren und Vorrichtung zum Scannen auf einem Koordinatenmessgerät |
| JP3827548B2 (ja) * | 2001-10-04 | 2006-09-27 | 株式会社ミツトヨ | 倣いプローブの校正方法および校正プログラム |
| GB0205332D0 (en) * | 2002-03-06 | 2002-04-17 | Renishaw Plc | Dynamic artefact comparison |
| US7693325B2 (en) * | 2004-01-14 | 2010-04-06 | Hexagon Metrology, Inc. | Transprojection of geometry data |
-
2002
- 2002-12-05 GB GBGB0228371.1A patent/GB0228371D0/en not_active Ceased
-
2003
- 2003-12-05 CN CNB2003801052395A patent/CN100335860C/zh not_active Expired - Fee Related
- 2003-12-05 AU AU2003292386A patent/AU2003292386A1/en not_active Abandoned
- 2003-12-05 US US10/535,207 patent/US7131207B2/en not_active Expired - Fee Related
- 2003-12-05 DE DE60311527T patent/DE60311527T3/de not_active Expired - Lifetime
- 2003-12-05 AT AT03767963T patent/ATE352767T1/de not_active IP Right Cessation
- 2003-12-05 EP EP03767963A patent/EP1579168B2/en not_active Expired - Lifetime
- 2003-12-05 WO PCT/GB2003/005326 patent/WO2004051179A1/en not_active Ceased
- 2003-12-05 JP JP2004556554A patent/JP4504818B2/ja not_active Expired - Fee Related
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP2006509194A5 (enExample) | ||
| JP4504818B2 (ja) | 加工物検査方法 | |
| CN100437027C (zh) | 校准坐标定位装置的方法 | |
| JP4638732B2 (ja) | 走査システムの較正方法 | |
| JP5425267B2 (ja) | 座標測定装置 | |
| CN100371672C (zh) | 表面特性测量机及其校正方法 | |
| US7543393B2 (en) | Method of calibrating a scanning system | |
| JP6321791B2 (ja) | 接触プローブの較正 | |
| US20070028677A1 (en) | Method of error correction | |
| JP5866629B2 (ja) | 変位検出装置、目盛の校正方法及び目盛の校正プログラム | |
| JP2010533303A5 (enExample) | ||
| JP2002541469A5 (enExample) | ||
| JP2015514205A (ja) | 工作物を検査するための方法および装置 | |
| JP5069287B2 (ja) | 誤差補正の方法 | |
| JP5658863B2 (ja) | プローブの較正 | |
| JP2010008277A (ja) | 可変端度器 | |
| JP2002310641A (ja) | 三次元形状計測機の座標系のキャリブレーション方法 | |
| JP6128639B2 (ja) | 測定方法 | |
| WIŚNIEWSKA | Obtaining characteristics of FMM displacement sensor by applying a flick standard | |
| Wiśniewska et al. | Determination of form measuring machine displacement sensor characteristics with a use of flick standard | |
| JP2005257562A (ja) | 変位校正方法及び装置 | |
| KR20050016971A (ko) | 스캐닝 시스템 교정 방법 |