JP2006349676A - 表面特性測定方法および装置 - Google Patents

表面特性測定方法および装置 Download PDF

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Publication number
JP2006349676A
JP2006349676A JP2006151151A JP2006151151A JP2006349676A JP 2006349676 A JP2006349676 A JP 2006349676A JP 2006151151 A JP2006151151 A JP 2006151151A JP 2006151151 A JP2006151151 A JP 2006151151A JP 2006349676 A JP2006349676 A JP 2006349676A
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JP
Japan
Prior art keywords
radiation
measuring device
property measuring
region
surface property
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2006151151A
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English (en)
Japanese (ja)
Inventor
Peter Schwarz
シュヴァルツ ペーテル
Gerhard Hentschel
ヘンチェル ゲルハルト
Konrad Lex
レックス コンラト
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BYK Gardner GmbH
BYK Gardner USA Inc
Original Assignee
BYK Gardner GmbH
BYK Gardner USA Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BYK Gardner GmbH, BYK Gardner USA Inc filed Critical BYK Gardner GmbH
Publication of JP2006349676A publication Critical patent/JP2006349676A/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials

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  • General Health & Medical Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2006151151A 2005-06-02 2006-05-31 表面特性測定方法および装置 Pending JP2006349676A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE102005025291.5A DE102005025291B4 (de) 2005-06-02 2005-06-02 Verfahren und Vorrichtung zur Bestimmung von Oberflächeneigenschaften

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2009277853A Division JP5372719B2 (ja) 2005-06-02 2009-12-07 表面特性測定方法および装置

Publications (1)

Publication Number Publication Date
JP2006349676A true JP2006349676A (ja) 2006-12-28

Family

ID=37401841

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2006151151A Pending JP2006349676A (ja) 2005-06-02 2006-05-31 表面特性測定方法および装置
JP2009277853A Active JP5372719B2 (ja) 2005-06-02 2009-12-07 表面特性測定方法および装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2009277853A Active JP5372719B2 (ja) 2005-06-02 2009-12-07 表面特性測定方法および装置

Country Status (3)

Country Link
US (1) US7468800B2 (enExample)
JP (2) JP2006349676A (enExample)
DE (1) DE102005025291B4 (enExample)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004034160A1 (de) * 2004-07-15 2006-02-09 Byk Gardner Gmbh Vorrichtung zur Untersuchung optischer Oberflächeneigenschaften
DE102008013387B4 (de) 2008-03-10 2020-02-13 Byk-Gardner Gmbh Vorrichtung zum Bestimmen optischer Oberflächeneigenschaften von Werkstücken
EP3719479A1 (en) * 2017-12-15 2020-10-07 HORIBA, Ltd. Surface characteristic inspection device and surface characteristic inspection program
DE102019100615A1 (de) * 2019-01-11 2020-07-16 NoKra Optische Prüftechnik und Automation GmbH Verfahren und Vorrichtung zur Erfassung einer Beschichtung auf einer Oberfläche
LU101529B1 (de) * 2019-12-12 2021-06-15 Aim Systems Gmbh Vorrichtung und Verfahren zur Bestimmung einer Materialeigenschaft eines Prüfkörpers in einem oberflächennahen Prüfkörperbereich
DE102021114262A1 (de) 2021-06-02 2022-12-08 Bayerische Motoren Werke Aktiengesellschaft Verfahren zum Messen wenigstens eines Parameters und ein Fahrzeugbauteil
DE102024115228A1 (de) * 2024-05-31 2025-12-04 HELLA GmbH & Co. KGaA Verfahren zum Bestimmen der Welligkeit einer Oberfläche eines Bauteils sowie Oberflächenmessvorrichtung zum Durchführen eines solchen Verfahrens

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01110365U (enExample) * 1988-01-19 1989-07-25
US4929846A (en) * 1988-10-05 1990-05-29 Ford Motor Company Surface quality analyzer apparatus and method
DE4127215C2 (de) 1991-08-16 2003-07-17 Byk Gardner Gmbh Verfahren und Vorrichtung zur quantifizierten Bewertung des physiologischen Eindruckes von reflektionsfähigen Oberflächen
JP3650974B2 (ja) * 1995-03-15 2005-05-25 オムロン株式会社 光学式センサ装置
JP3498120B2 (ja) * 1995-04-26 2004-02-16 旭化成ケミカルズ株式会社 光沢むらの高精度測定方法および装置
JPH11304701A (ja) * 1998-04-22 1999-11-05 Ricoh Co Ltd 複素屈折率の評価方法、膜厚の評価方法、複素屈折率の評価装置、及び膜厚の評価装置
JP3682835B2 (ja) * 1998-07-03 2005-08-17 オムロン株式会社 反射型光電センサ
JP4019293B2 (ja) * 1998-11-11 2007-12-12 澁谷工業株式会社 マウント検査部における照明装置
JP2000162137A (ja) * 1998-11-26 2000-06-16 Nikon Corp 面検査装置
DE19909534B4 (de) * 1999-03-04 2011-07-07 BYK-Gardner GmbH, 82538 Vorrichtung und Verfahren zur Bestimmung der Qualität strukturierter Oberflächen
DE19930688A1 (de) * 1999-07-02 2001-01-04 Byk Gardner Gmbh Vorrichtung und Verfahren zur Bestimmung der Qualität von Oberflächen
US7139083B2 (en) * 2000-09-20 2006-11-21 Kla-Tencor Technologies Corp. Methods and systems for determining a composition and a thickness of a specimen
JP2002139309A (ja) * 2000-11-02 2002-05-17 Nikon Corp 光学特性測定装置、膜厚測定装置、研磨終点判定装置及び研磨装置
DE10122313A1 (de) * 2001-05-08 2002-11-21 Wolfgang P Weinhold Verfahren und Vorrichtung zur berührungsfreien Untersuchung eines Gegenstandes, insbesondere hinsichtlich dessen Oberflächengestalt
JP2002350326A (ja) * 2001-05-30 2002-12-04 Fujita Corp 建築材料の劣化診断方法
JP4808871B2 (ja) * 2001-07-12 2011-11-02 倉敷紡績株式会社 表面性状評価装置
JP3882542B2 (ja) * 2001-07-13 2007-02-21 凸版印刷株式会社 酸素インジケーター
DE102004034160A1 (de) 2004-07-15 2006-02-09 Byk Gardner Gmbh Vorrichtung zur Untersuchung optischer Oberflächeneigenschaften
DE202004011811U1 (de) 2004-07-28 2005-12-08 Byk-Gardner Gmbh Vorrichtung zur goniometrischen Untersuchung optischer Oberflächeneigenschaften
DE102004037040B4 (de) 2004-07-30 2013-11-21 Byk Gardner Gmbh Vorrichtung zur quantifizierten Bewertung von Oberflächeneigenschaften
DE102004059186A1 (de) 2004-12-08 2006-06-14 Byk Gardner Gmbh Verfahren und Vorrichtung zur ortsauflösenden Bewertung von Oberflächeneigenschaften

Also Published As

Publication number Publication date
US20060274317A1 (en) 2006-12-07
US7468800B2 (en) 2008-12-23
DE102005025291A1 (de) 2006-12-07
JP2010066273A (ja) 2010-03-25
JP5372719B2 (ja) 2013-12-18
DE102005025291B4 (de) 2019-07-25

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