JP2006234621A5 - - Google Patents

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Publication number
JP2006234621A5
JP2006234621A5 JP2005050494A JP2005050494A JP2006234621A5 JP 2006234621 A5 JP2006234621 A5 JP 2006234621A5 JP 2005050494 A JP2005050494 A JP 2005050494A JP 2005050494 A JP2005050494 A JP 2005050494A JP 2006234621 A5 JP2006234621 A5 JP 2006234621A5
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JP
Japan
Prior art keywords
application
input
measurement unit
applications
parameter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2005050494A
Other languages
English (en)
Japanese (ja)
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JP2006234621A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2005050494A priority Critical patent/JP2006234621A/ja
Priority claimed from JP2005050494A external-priority patent/JP2006234621A/ja
Priority to TW095103507A priority patent/TW200630628A/zh
Priority to US11/346,408 priority patent/US7330044B2/en
Priority to CNA2006100074725A priority patent/CN1825129A/zh
Publication of JP2006234621A publication Critical patent/JP2006234621A/ja
Publication of JP2006234621A5 publication Critical patent/JP2006234621A5/ja
Pending legal-status Critical Current

Links

JP2005050494A 2005-02-25 2005-02-25 半導体測定システムおよびその制御方法 Pending JP2006234621A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2005050494A JP2006234621A (ja) 2005-02-25 2005-02-25 半導体測定システムおよびその制御方法
TW095103507A TW200630628A (en) 2005-02-25 2006-01-27 Method and apparatus for semiconductor testing
US11/346,408 US7330044B2 (en) 2005-02-25 2006-02-02 Method and apparatus for semiconductor testing
CNA2006100074725A CN1825129A (zh) 2005-02-25 2006-02-14 用于半导体测试的方法和装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005050494A JP2006234621A (ja) 2005-02-25 2005-02-25 半導体測定システムおよびその制御方法

Publications (2)

Publication Number Publication Date
JP2006234621A JP2006234621A (ja) 2006-09-07
JP2006234621A5 true JP2006234621A5 (https=) 2008-04-10

Family

ID=36933163

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005050494A Pending JP2006234621A (ja) 2005-02-25 2005-02-25 半導体測定システムおよびその制御方法

Country Status (4)

Country Link
US (1) US7330044B2 (https=)
JP (1) JP2006234621A (https=)
CN (1) CN1825129A (https=)
TW (1) TW200630628A (https=)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7487477B2 (en) * 2006-12-15 2009-02-03 International Business Machines Corporation Parametric-based semiconductor design
JP4962790B2 (ja) * 2007-11-13 2012-06-27 横河電機株式会社 Ｌｓｉテスタ
KR100886614B1 (ko) 2008-07-30 2009-03-05 (주)누리시스템 터치패널을 갖는 반도체 제품 테스트 장치
US8598888B2 (en) * 2010-05-04 2013-12-03 Electro Scientific Industries, Inc. System and method for improved testing of electronic devices
CN102393501B (zh) * 2011-10-14 2013-11-13 哈尔滨工业大学 一种mosfet可靠性测试分析系统的mosfet静态参数测试方法
DE102015120734A1 (de) * 2015-11-30 2017-06-01 Endress+Hauser Process Solutions Ag Verfahren und System zur Optimierung der Bedienung von zumindest einem einer Vielzahl von Feldgeräten der Automatisierungstechnik

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020109734A1 (en) * 1997-10-10 2002-08-15 Satoshi Umezu GUI processing system for performing an operation of an application which controls testing equipment
JP2000088919A (ja) 1998-09-17 2000-03-31 Ando Electric Co Ltd Ｉｃ試験システム及びその制御ソフトウェア管理方法
JP2003090864A (ja) * 2001-09-19 2003-03-28 Ando Electric Co Ltd バーンイン試験装置及び試験方法
US7055138B2 (en) * 2001-10-23 2006-05-30 Agilent Technologies, Inc. Test executive system with tree structure for summarizing results
US6839650B2 (en) * 2001-11-19 2005-01-04 Agilent Technologies, Inc. Electronic test system and method
US6966019B2 (en) * 2002-06-28 2005-11-15 Teradyne, Inc. Instrument initiated communication for automatic test equipment

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