JP2006234621A - 半導体測定システムおよびその制御方法 - Google Patents

半導体測定システムおよびその制御方法 Download PDF

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Publication number
JP2006234621A
JP2006234621A JP2005050494A JP2005050494A JP2006234621A JP 2006234621 A JP2006234621 A JP 2006234621A JP 2005050494 A JP2005050494 A JP 2005050494A JP 2005050494 A JP2005050494 A JP 2005050494A JP 2006234621 A JP2006234621 A JP 2006234621A
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JP
Japan
Prior art keywords
application
input
measurement
applications
parameter
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Pending
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JP2005050494A
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English (en)
Japanese (ja)
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JP2006234621A5 (https=
Inventor
Koji Ishizuka
好司 石塚
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Agilent Technologies Inc
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Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Priority to JP2005050494A priority Critical patent/JP2006234621A/ja
Priority to TW095103507A priority patent/TW200630628A/zh
Priority to US11/346,408 priority patent/US7330044B2/en
Priority to CNA2006100074725A priority patent/CN1825129A/zh
Publication of JP2006234621A publication Critical patent/JP2006234621A/ja
Publication of JP2006234621A5 publication Critical patent/JP2006234621A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]

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  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP2005050494A 2005-02-25 2005-02-25 半導体測定システムおよびその制御方法 Pending JP2006234621A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2005050494A JP2006234621A (ja) 2005-02-25 2005-02-25 半導体測定システムおよびその制御方法
TW095103507A TW200630628A (en) 2005-02-25 2006-01-27 Method and apparatus for semiconductor testing
US11/346,408 US7330044B2 (en) 2005-02-25 2006-02-02 Method and apparatus for semiconductor testing
CNA2006100074725A CN1825129A (zh) 2005-02-25 2006-02-14 用于半导体测试的方法和装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005050494A JP2006234621A (ja) 2005-02-25 2005-02-25 半導体測定システムおよびその制御方法

Publications (2)

Publication Number Publication Date
JP2006234621A true JP2006234621A (ja) 2006-09-07
JP2006234621A5 JP2006234621A5 (https=) 2008-04-10

Family

ID=36933163

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005050494A Pending JP2006234621A (ja) 2005-02-25 2005-02-25 半導体測定システムおよびその制御方法

Country Status (4)

Country Link
US (1) US7330044B2 (https=)
JP (1) JP2006234621A (https=)
CN (1) CN1825129A (https=)
TW (1) TW200630628A (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009121869A (ja) * 2007-11-13 2009-06-04 Yokogawa Electric Corp Ｌｓｉテスタ

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7487477B2 (en) * 2006-12-15 2009-02-03 International Business Machines Corporation Parametric-based semiconductor design
KR100886614B1 (ko) 2008-07-30 2009-03-05 (주)누리시스템 터치패널을 갖는 반도체 제품 테스트 장치
US8598888B2 (en) * 2010-05-04 2013-12-03 Electro Scientific Industries, Inc. System and method for improved testing of electronic devices
CN102393501B (zh) * 2011-10-14 2013-11-13 哈尔滨工业大学 一种mosfet可靠性测试分析系统的mosfet静态参数测试方法
DE102015120734A1 (de) * 2015-11-30 2017-06-01 Endress+Hauser Process Solutions Ag Verfahren und System zur Optimierung der Bedienung von zumindest einem einer Vielzahl von Feldgeräten der Automatisierungstechnik

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003090864A (ja) * 2001-09-19 2003-03-28 Ando Electric Co Ltd バーンイン試験装置及び試験方法
US20030097233A1 (en) * 2001-11-19 2003-05-22 Sutton Christopher K. Electronic test system and method
JP2003337718A (ja) * 2001-10-23 2003-11-28 Agilent Technol Inc 電子試験装置及びテスト結果の表示方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020109734A1 (en) * 1997-10-10 2002-08-15 Satoshi Umezu GUI processing system for performing an operation of an application which controls testing equipment
JP2000088919A (ja) 1998-09-17 2000-03-31 Ando Electric Co Ltd Ｉｃ試験システム及びその制御ソフトウェア管理方法
US6966019B2 (en) * 2002-06-28 2005-11-15 Teradyne, Inc. Instrument initiated communication for automatic test equipment

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003090864A (ja) * 2001-09-19 2003-03-28 Ando Electric Co Ltd バーンイン試験装置及び試験方法
JP2003337718A (ja) * 2001-10-23 2003-11-28 Agilent Technol Inc 電子試験装置及びテスト結果の表示方法
US20030097233A1 (en) * 2001-11-19 2003-05-22 Sutton Christopher K. Electronic test system and method
JP2003208330A (ja) * 2001-11-19 2003-07-25 Agilent Technol Inc 電子テストシステム及びそのソフトウエアプログラムの作成方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009121869A (ja) * 2007-11-13 2009-06-04 Yokogawa Electric Corp Ｌｓｉテスタ

Also Published As

Publication number Publication date
US7330044B2 (en) 2008-02-12
US20060195726A1 (en) 2006-08-31
TW200630628A (en) 2006-09-01
CN1825129A (zh) 2006-08-30

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