JP2006234466A - Device for measuring temperature and structure for measuring temperature - Google Patents

Device for measuring temperature and structure for measuring temperature Download PDF

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JP2006234466A
JP2006234466A JP2005046763A JP2005046763A JP2006234466A JP 2006234466 A JP2006234466 A JP 2006234466A JP 2005046763 A JP2005046763 A JP 2005046763A JP 2005046763 A JP2005046763 A JP 2005046763A JP 2006234466 A JP2006234466 A JP 2006234466A
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temperature
measured
temperature sensor
substrate
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Kenichi Horiuchi
憲一 堀内
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Panasonic Holdings Corp
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Matsushita Electric Industrial Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a device and structure for measuring temperature that conducts heat appropriately from an object whose temperature is measured to a temperature sensor at low total manufacturing costs in application to equipment that is manufactured in a small number. <P>SOLUTION: A glass epoxy plate (planar spacer) 4 having a through hole 7 that becomes a gap for arranging a temperature detection IC (temperature sensor) 1 is provided between a printed circuit board (board) 2 for packaging the temperature detection IC (temperature sensor) 1 and the object 3 whose temperature is measured. The printed circuit board (board) 2 is mounted to a condensation curing type silicone (heat transfer material) 10 applied to an opening formed by the object 3 whose temperature is measured and the sidewall surface of the opening of the glass epoxy plate (planar spacer) 4 so that the temperature detection IC (temperature sensor) 1 comes into contact, thus dispensing with molds and heating processes and adhering the heat transfer material to the object whose temperature is measured and the temperature sensor appropriately. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、温度測定装置および温度測定構造に関し、より詳細には、温度測定装置および温度測定構造において、被測温物から基板に取り付けられた温度センサへ良好に熱を伝導する技術に関する。   The present invention relates to a temperature measurement device and a temperature measurement structure, and more particularly to a technique for conducting heat well from a temperature measurement object to a temperature sensor attached to a substrate in the temperature measurement device and the temperature measurement structure.

従来の温度測定装置および構造は、被測温物から温度センサの間に熱伝導率の高い伝熱材を配し、その伝熱材の形状を、被測温物および温度センサに接触する部分の形状に沿ったものとしている。伝熱材をその形状とするために、被測温物の接触部分と同形状の金型を用意し、その金型に温度センサが取り付けられた基板を装着し、金型と基板との間に液状の伝熱材を注入した後、硬化させている。それにより、所望形状の伝熱材で温度センサが覆われた基板を得て、密着性良く被測温物へ取り付けている(例えば、特許文献1参照。特許文献1では、基板に実装された電子部品が発した熱を基台へ伝導し放熱する技術として示されているが、ふたつの物質間の熱伝導を良好に行うという観点からは本質的に同等である。)。
特開2003−101270号公報
The conventional temperature measuring device and structure is a part in which a heat transfer material having high thermal conductivity is arranged between the temperature measurement object and the temperature sensor, and the shape of the heat transfer material is in contact with the temperature measurement object and the temperature sensor. It is assumed to be in line with the shape. In order to make the shape of the heat transfer material, prepare a mold with the same shape as the contact part of the object to be measured, and attach a substrate with a temperature sensor attached to the mold, between the mold and the substrate. After injecting a liquid heat transfer material, it is hardened. Thereby, a substrate in which the temperature sensor is covered with a heat transfer material having a desired shape is obtained and attached to the temperature-measured object with good adhesion (for example, refer to Patent Document 1. In Patent Document 1, it is mounted on the substrate). It is shown as a technology that conducts heat from electronic components to the base and dissipates it, but it is essentially the same from the viewpoint of good heat conduction between the two materials.)
JP 2003-101270 A

しかしながら、前記従来の構成では、被測温物の接触部分と同形状の金型を用意する必要があるので、産業用機器など製作数量の少ないものへの応用では総合的にコスト高となるという課題を有していた。   However, in the conventional configuration, since it is necessary to prepare a mold having the same shape as the contact portion of the object to be measured, it is said that the cost is generally increased in application to an industrial device having a small production quantity. Had problems.

本発明は、前記従来の課題を解決するもので、製作数量の少ない機器への応用において、低いトータル製造コストで、被測温物から温度センサへ良好に熱を伝導する温度測定装置および構造を提供することを目的とする。   The present invention solves the above-mentioned conventional problems, and provides a temperature measuring device and structure that conducts heat from a temperature-measured object to a temperature sensor at a low total manufacturing cost in application to equipment with a small production quantity. The purpose is to provide.

前記従来の課題を解決するために、本発明の温度測定装置は、温度センサが取り付けられた基板と、前記温度センサにより測温すべき被測温物に対向して前記基板との間に設けられ、前記温度センサを配置するための隙間となる貫通穴を有する所定の厚みの板状スペーサと、を備え、前記基板は、前記板状スペーサを介して前記被測温部表面に対向して設けられ、前記被測温物表面と前記板状スペーサの貫通穴にて形成される開口部に、前記温度センサを固定するとともに前記被測温物の熱を伝導するための伝熱材を注入し前記温度センサを前記開口部に収納して前記基板を前記被測温物に固定することを特徴としたものである。   In order to solve the above-described conventional problems, a temperature measuring device according to the present invention is provided between a substrate on which a temperature sensor is attached and a substrate to be measured facing the temperature measurement object to be measured by the temperature sensor. And a plate-like spacer having a predetermined thickness having a through-hole serving as a gap for arranging the temperature sensor, and the substrate faces the surface of the temperature-measured part via the plate-like spacer. A heat transfer material for injecting heat of the object to be measured and fixing the temperature sensor to an opening formed by the surface of the object to be measured and a through hole of the plate-like spacer is provided. The temperature sensor is housed in the opening and the substrate is fixed to the object to be measured.

さらに、温度測定装置において、前記伝熱材が縮合硬化型シリコーンであることを特徴としたものである。   Further, in the temperature measuring device, the heat transfer material is a condensation curable silicone.

さらに、温度測定装置において、前記基板は、前記板状スペーサの開口部に対応する部分に余分な伝熱材を逃がすための貫通穴を有することを特徴としたものである。   Further, in the temperature measuring apparatus, the substrate has a through hole for allowing an excess heat transfer material to escape in a portion corresponding to the opening of the plate-like spacer.

また、本発明は、温度センサが取り付けられた基板と、前記温度センサにより測温すべき被測温物表面に対向して配置される所定の厚みを有する板状スペーサと、を備え、前記基板は、前記板状スペーサを介して前記被測温部表面に対向して設けられ、前記板状スペーサは、前記温度センサを配置するための前記被測温物表面との間で所定の隙間を形成する貫通穴を有し、前記被測温物表面と前記板状スペーサの貫通穴にて形成される開口部に、前記温度センサを固定するとともに前記被測温物の熱を伝導するための伝熱材を注入し前記温度センサを前記開口部に収納して前記基板を前記被測温物に固定する温度測定構造であることを特徴としたものである。   In addition, the present invention includes a substrate on which a temperature sensor is attached, and a plate-like spacer having a predetermined thickness that is disposed to face a surface of a temperature object to be measured by the temperature sensor. Is provided so as to face the surface of the temperature measurement part via the plate-shaped spacer, and the plate-shaped spacer forms a predetermined gap with the surface of the temperature-measured object for arranging the temperature sensor. A through hole to be formed, for fixing the temperature sensor to an opening formed by the surface of the object to be measured and the through hole of the plate spacer, and for conducting the heat of the object to be measured It is a temperature measurement structure in which a heat transfer material is injected, the temperature sensor is housed in the opening, and the substrate is fixed to the object to be measured.

本発明の装置および構造によれば、製作数量の少ない機器への応用において低いトータル製造コストで、被測温物から温度センサへ良好に熱を伝導する温度測定装置および構造を提供することができる。   According to the apparatus and structure of the present invention, it is possible to provide a temperature measuring apparatus and structure that conducts heat from a temperature-measured object to a temperature sensor satisfactorily at a low total manufacturing cost in application to equipment with a small production quantity. .

以下に、本発明の温度測定装置の実施の形態を図面とともに詳細に説明する。   Embodiments of a temperature measuring device according to the present invention will be described below in detail with reference to the drawings.

図1は、本発明の実施例1における温度測定装置の構造を説明するための分解斜視図を示す。   FIG. 1 is an exploded perspective view for explaining the structure of the temperature measuring device according to the first embodiment of the present invention.

図1において、温度検出IC(温度センサ)1は、ICチップの温度に対応する出力がなされる半導体集積回路であり、回路パターンが形成されたプリント回路基板(基板)2にはんだ付けで実装されている。プリント回路基板(基板)2の、温度検出IC(温度センサ)1が実装されている面とは反対側の面には、温度検出IC(温度センサ)1の信号出力や電源供給のためのコネクタや抵抗器などの回路部品(図示せず)が実装されている。   In FIG. 1, a temperature detection IC (temperature sensor) 1 is a semiconductor integrated circuit that outputs an output corresponding to the temperature of an IC chip, and is mounted on a printed circuit board (substrate) 2 on which a circuit pattern is formed by soldering. ing. On the surface of the printed circuit board (substrate) 2 opposite to the surface on which the temperature detection IC (temperature sensor) 1 is mounted, a connector for signal output and power supply of the temperature detection IC (temperature sensor) 1 is provided. Circuit components (not shown) such as resistors and resistors are mounted.

プリント回路基板(基板)2と被測温物3との間には、温度検出IC(温度センサ)1を配置するための隙間となる貫通穴7を有し、さらにねじの軸部を貫通させるための穴を有するガラスエポキシ板(板状スペーサ)4が設けられており、被測温物3に設けられたねじ穴に合わせて位置決めされ、スペーサ固定ねじ5で被測温物3に取り付け固定される。   Between the printed circuit board (board) 2 and the object to be measured 3, there is a through hole 7 that becomes a gap for placing the temperature detection IC (temperature sensor) 1, and further penetrates the shaft portion of the screw. A glass epoxy plate (plate-like spacer) 4 having a hole is provided, positioned according to a screw hole provided in the object to be measured 3, and fixed to the object to be measured 3 with the spacer fixing screw 5. Is done.

被測温物3の表面上で且つ、ガラスエポキシ板(板状スペーサ)4の貫通穴7によって晒されている部分、すなわち、被測温物3とそれに取り付けられたガラスエポキシ板(板状スペーサ)4の貫通穴7の側壁面とで形成され上方が開放された空間に、縮合硬化型シリコーン(伝熱材、図示せず)が塗布される。   A portion of the surface of the object to be measured 3 exposed by the through hole 7 of the glass epoxy plate (plate spacer) 4, that is, the object to be measured 3 and a glass epoxy plate (plate spacer) attached thereto. ) Condensation-curable silicone (heat transfer material, not shown) is applied to a space formed by the side wall surface of the through-hole 7 of 4 and opened upward.

シリコーンは電気特性、耐熱・耐寒性、絶縁性などに優れた特性を持つので、アルミナや窒化ホウ素などのフィラーを添加し熱伝導性を高めて、伝熱材としてよく用いられる。そのうち、縮合硬化型は、室温で空気中の湿気と反応し、アセトンや酢酸など微量の副生成物を放出しながら硬化して、硬化後はゴム弾性体となって優れた接着性を示す。常温で硬化するため、硬化のために加熱する必要がない。   Silicone has excellent electrical properties, heat resistance / cold resistance, insulation properties, and the like, so it is often used as a heat transfer material by adding a filler such as alumina or boron nitride to enhance thermal conductivity. Among them, the condensation-curing type reacts with moisture in the air at room temperature, cures while releasing a small amount of by-products such as acetone and acetic acid, and becomes a rubber elastic body after curing and exhibits excellent adhesion. Since it cures at room temperature, there is no need to heat for curing.

プリント回路基板(基板)2は、温度検出IC(温度センサ)1が実装された面をガラスエポキシ板(板状スペーサ)4側に向け、温度検出IC(温度センサ)1がガラスエポキシ板(板状スペーサ)4の貫通穴7に収まるよう、基板固定ねじ6でガラスエポキシ板(板状スペーサ)4に取り付けられる。このとき、スペーサ固定ねじ5の頭部が干渉しないよう、プリント回路基板(基板)2のふたつの隅に切り欠きを設けているので、プリント回路基板(基板)2とガラスエポキシ板(板状スペーサ)4は隙間が開くことなく、ほぼ密着した状態で取り付けられる。   The printed circuit board (board) 2 has a surface on which the temperature detection IC (temperature sensor) 1 is mounted facing the glass epoxy board (plate spacer) 4 side, and the temperature detection IC (temperature sensor) 1 is a glass epoxy board (board). It is attached to the glass epoxy plate (plate-like spacer) 4 with a substrate fixing screw 6 so as to fit in the through hole 7 of the spacer. At this time, since the notches are provided in the two corners of the printed circuit board (substrate) 2 so that the heads of the spacer fixing screws 5 do not interfere with each other, the printed circuit board (substrate) 2 and the glass epoxy plate (plate spacer) 4) is attached in a state of close contact with no gap.

図2は、本発明の実施例1における温度測定装置の板状スペーサの形状図を示す。   FIG. 2 shows a shape diagram of the plate-like spacer of the temperature measuring device in Embodiment 1 of the present invention.

図2において、貫通穴7は、ガラスエポキシ板(板状スペーサ)4がプリント回路基板(基板)2と被測温物3とで挟まれるように取り付けられた際、温度検出IC(温度センサ)1に対応する位置に設けられており、温度検出IC(温度センサ)1が収まる空間(開口部)となる。   In FIG. 2, the through hole 7 is a temperature detection IC (temperature sensor) when the glass epoxy plate (plate spacer) 4 is attached so as to be sandwiched between the printed circuit board (substrate) 2 and the temperature-measured object 3. 1 is a space (opening) in which the temperature detection IC (temperature sensor) 1 is accommodated.

スペーサ固定ねじ用穴8、基板固定ねじ用穴9は、それぞれスペーサ固定ねじの軸と基板固定ねじの軸が貫通する。   The spacer fixing screw hole 8 and the substrate fixing screw hole 9 penetrate the spacer fixing screw shaft and the substrate fixing screw shaft, respectively.

図3は、本発明の実施例1における温度測定装置の構造を説明するための、基板取り付け前の断面図を示す。   FIG. 3 is a cross-sectional view before mounting the substrate for explaining the structure of the temperature measuring device according to the first embodiment of the present invention.

図3において、縮合硬化型シリコーン(伝熱材)10は、被測温物3とそれに取り付けられたガラスエポキシ板(板状スペーサ)4の貫通穴の側壁面とで形成され上方が開放された空間に塗布されている。   In FIG. 3, the condensation-curing silicone (heat transfer material) 10 is formed by the object to be measured 3 and the side wall surface of the through hole of the glass epoxy plate (plate spacer) 4 attached thereto, and the upper part is opened. It is applied to the space.

図4は、本発明の実施例1における温度測定装置の構造を説明するための、基板取り付け後の断面図を示す。   FIG. 4 is a cross-sectional view after mounting the substrate for explaining the structure of the temperature measuring device according to the first embodiment of the present invention.

図4において、被測温物3と、ガラスエポキシ板(板状スペーサ)4の貫通穴の側壁面と、プリント回路基板(基板)2とで縮合硬化型シリコーン(伝熱材)10を封じ込むような状態となるので、縮合硬化型シリコーン(伝熱材)10は温度検出IC(温度センサ)1および被測温物3に密着している。   In FIG. 4, the condensation-curing silicone (heat transfer material) 10 is sealed by the object to be measured 3, the side wall surface of the through hole of the glass epoxy plate (plate spacer) 4, and the printed circuit board (substrate) 2. In such a state, the condensation curable silicone (heat transfer material) 10 is in close contact with the temperature detection IC (temperature sensor) 1 and the object to be measured 3.

伝熱用シリコーンとしてはシート状に加工されたものやコンパウンド状のものもあるが、縮合硬化型シリコーンを用いれば、塗布時の未硬化状態ではペースト状であるので温度検出IC(温度センサ)1および被測温物3との密着性を良好にすることが可能で、また硬化後はゴム弾性体となるので温度変化時の応力による温度検出IC(温度センサ)1の損傷を防止することができ、伝熱材自体が飛散することもない。また、縮合硬化型であるので空気中の湿気と反応し常温で硬化するため、被測温物3にガラスエポキシ板(板状スペーサ)4およびプリント回路基板(基板)2を取り付けた状態での縮合硬化型シリコーン(伝熱材)10への加熱工程が必要なく、被測温物3等に与える影響も少ない。   The heat transfer silicone may be processed into a sheet or a compound, but if a condensation-curing silicone is used, it is a paste in an uncured state at the time of application, so a temperature detection IC (temperature sensor) 1 It is possible to improve the adhesion to the object to be measured 3 and to become a rubber elastic body after curing, so that damage to the temperature detection IC (temperature sensor) 1 due to stress during temperature change can be prevented. The heat transfer material itself is not scattered. In addition, since it is a condensation-curing type, it reacts with moisture in the air and cures at room temperature, so that the glass epoxy plate (plate spacer) 4 and the printed circuit board (substrate) 2 are attached to the object to be measured 3. There is no need for a heating step to the condensation curable silicone (heat transfer material) 10, and the influence on the temperature-measured object 3 is small.

プリント回路基板(基板)2を取り付ける際の被測温物3との干渉による温度検出IC(温度センサ)1の損傷を避けるため、ガラスエポキシ板(板状スペーサ)4の厚みは、温度検出IC(温度センサ)1自体の高さ(厚み)の最大値と、はんだ付けによるプリント回路基板(基板)2からの温度検出IC(温度センサ)1の浮きの最大値とを足し合わせた寸法よりも大きければよいが、より良好な熱伝導のために、その寸法よりもわずかに大きくすることが好ましい。   In order to avoid damaging the temperature detection IC (temperature sensor) 1 due to interference with the object to be measured 3 when the printed circuit board (substrate) 2 is attached, the thickness of the glass epoxy plate (plate-like spacer) 4 is the temperature detection IC. (Temperature sensor) 1 The maximum value of the height (thickness) itself and the maximum value of the floating value of the temperature detection IC (temperature sensor) 1 from the printed circuit board (substrate) 2 by soldering Although larger, it is preferred that it be slightly larger than its dimensions for better heat conduction.

以上のように、本実施例1においては、温度検出IC(温度センサ)1が実装されたプリント回路基板(基板)2と被測温物3の間に、温度検出IC(温度センサ)1を配置するための隙間となる貫通穴を有するガラスエポキシ板(板状スペーサ)4を設け、被測温物3とガラスエポキシ板(板状スペーサ)4の貫通穴の側壁面とで形成される空間(開口部)に塗布された縮合硬化型シリコーン(伝熱材)10に温度検出IC(温度センサ)1が接触するようにプリント回路基板(基板)2を取り付けることにより、金型および常温で硬化するので加熱工程が不要で且つ、伝熱材と被測温物および伝熱材と温度センサを良好に密着させることが可能となり、製作数量の少ない機器への応用において低いトータル製造コストで、被測温物から温度センサへ良好に熱を伝導する温度測定装置および構造を提供することができる。   As described above, in the first embodiment, the temperature detection IC (temperature sensor) 1 is provided between the printed circuit board (substrate) 2 on which the temperature detection IC (temperature sensor) 1 is mounted and the temperature measurement object 3. A space formed by a glass epoxy plate (plate-like spacer) 4 having a through-hole serving as a gap for placement, and a temperature-measured object 3 and a side wall surface of the through-hole of the glass epoxy plate (plate-like spacer) 4 Curing at mold and room temperature by attaching printed circuit board (substrate) 2 so that temperature detection IC (temperature sensor) 1 is in contact with condensation-curing silicone (heat transfer material) 10 applied to (opening) This eliminates the need for a heating process and allows the heat transfer material and the object to be measured and the heat transfer material and the temperature sensor to be in good contact with each other. Temperature from temperature measurement The good heat to the sensor it is possible to provide a temperature measuring device and a structure for conduction.

なお、本実施例1では、温度センサとして、ICチップの温度に対応する出力がなされる温度検出ICを用いているが、その出力はアナログ、デジタルのいずれでもよい。さらに、温度閾値がIC製造時に設定されているか、または外付け抵抗などで設定可能な温度閾値を持つ温度スイッチ型のものでもよい。さらに、ICでなくサーミスタのような感温素子を用いてもよい。   In the first embodiment, as the temperature sensor, a temperature detection IC that outputs an output corresponding to the temperature of the IC chip is used, but the output may be either analog or digital. Further, the temperature threshold value may be set at the time of manufacturing the IC, or may be a temperature switch type having a temperature threshold value that can be set by an external resistor or the like. Further, a temperature sensitive element such as a thermistor may be used instead of the IC.

また、プリント回路基板(基板)2において、コネクタや抵抗器などの回路部品は、温度検出IC(温度センサ)1が実装されている面とは反対側の面に実装されているが、チップ型抵抗器など、ガラスエポキシ板(板状スペーサ)4の貫通穴と温度検出IC(温度センサ)1の隙間に入るような小型のものであれば、温度検出IC(温度センサ)1が実装されている面の、ガラスエポキシ板(板状スペーサ)4の貫通穴に対応する場所に実装されていてもよい。   In the printed circuit board (board) 2, circuit components such as connectors and resistors are mounted on the surface opposite to the surface on which the temperature detection IC (temperature sensor) 1 is mounted. If it is small, such as a resistor, that fits into the gap between the through hole of the glass epoxy plate (plate spacer) 4 and the temperature detection IC (temperature sensor) 1, the temperature detection IC (temperature sensor) 1 is mounted. It may be mounted at a location corresponding to the through hole of the glass epoxy plate (plate spacer) 4 on the surface.

また、板状スペーサ4としてガラスエポキシ板を用いているが、加工が容易なものであればこれに限定されるものではないけれども、正確な測温のため、被測温物3から熱を奪いにくい、熱伝導率の低いものが望ましい。また、プリント回路基板(基板)2の回路と被測温物3の間に絶縁が必要であれば、絶縁抵抗の大きなものを用いなければならない。   Further, although a glass epoxy plate is used as the plate-like spacer 4, it is not limited to this as long as it can be easily processed. However, for accurate temperature measurement, it takes heat away from the object to be measured 3. Difficult, low thermal conductivity is desirable. Further, if insulation is required between the circuit of the printed circuit board (substrate) 2 and the temperature-measured object 3, one having a large insulation resistance must be used.

また、プリント回路基板(基板)2の形状として、スペーサ固定ねじ5の頭部の干渉を避けるために切り欠きを設けているが、切り欠きは必ずしも必要ではなく、プリント回路基板(基板)2の大きさ自体をスペーサ固定ねじ5の頭部と干渉しないような小型にし、より単純な形状とすることもできる。   Further, as a shape of the printed circuit board (substrate) 2, a notch is provided in order to avoid interference with the head of the spacer fixing screw 5, but the notch is not necessarily required. The size itself can be made small so as not to interfere with the head of the spacer fixing screw 5, and a simpler shape can be obtained.

図5は、本発明の実施例2の温度測定装置の基板の形状図を示す。図5において、基板固定ねじ用穴9が設けられたプリント回路基板(基板)2に温度検出IC(温度センサ)1がはんだ付けされている。実施例1の基板と異なるところは伝熱材緩衝用穴11を設けた点である。   FIG. 5 is a diagram showing the shape of the substrate of the temperature measuring device according to the second embodiment of the present invention. In FIG. 5, a temperature detection IC (temperature sensor) 1 is soldered to a printed circuit board (substrate) 2 provided with a board fixing screw hole 9. The difference from the substrate of Example 1 is that a heat transfer material buffering hole 11 is provided.

伝熱材緩衝用穴11は、プリント回路基板(基板)2と重ねられるガラスエポキシ板(板状スペーサ)4の温度検出IC(温度センサ)1を配置するための隙間となる貫通穴に対応する範囲(破線部の内側)で、温度検出IC(温度センサ)1の実装や回路パターンの邪魔にならない場所に設けられている。   The hole 11 for buffering the heat transfer material corresponds to a through hole that becomes a gap for placing the temperature detection IC (temperature sensor) 1 of the glass epoxy plate (plate-like spacer) 4 that is overlapped with the printed circuit board (substrate) 2. Within the range (inside the broken line portion), the temperature detection IC (temperature sensor) 1 is provided in a place that does not interfere with the mounting or circuit pattern.

縮合硬化型シリコーン(伝熱材)10の塗布量は、ガラスエポキシ板(板状スペーサ)4に重ねてプリント回路基板(基板)2を取り付けた状態で、温度検出IC(温度センサ)1への熱伝導が十分に行われるだけの接触面積が確保できればよく、予め試行などによって適量を決定しておき、組み立て時にはその所定量(適量)を塗布するようにすることが好ましい。   The amount of the condensation curable silicone (heat transfer material) 10 applied to the temperature detection IC (temperature sensor) 1 in a state where the printed circuit board (substrate) 2 is attached to the glass epoxy plate (plate spacer) 4. It is only necessary to ensure a contact area sufficient for heat conduction, and it is preferable to determine an appropriate amount by trial or the like in advance and apply the predetermined amount (appropriate amount) during assembly.

しかし、試行などによる適量決定を予め行わなかったり、何らかの理由で塗布量が多くなり、被測温物3とガラスエポキシ板(板状スペーサ)4の貫通穴の側壁面とプリント回路基板(基板)2と温度検出IC(温度センサ)1とで形成される空間の容量を超えてしまっている場合に、縮合硬化型シリコーン(伝熱材)10がプリント回路基板(基板)2とガラスエポキシ板(板状スペーサ)4の隙間から漏れたり、はみ出したりする恐れがあるが、伝熱材緩衝用穴11から縮合硬化型シリコーン(伝熱材)10の過多分が逃げるので、そのような恐れがない。   However, the appropriate amount is not determined in advance by trial or the like, or the coating amount increases for some reason, and the side wall surface of the through-hole of the object to be measured 3 and the glass epoxy plate (plate spacer) 4 and the printed circuit board (substrate) 2 and the temperature detection IC (temperature sensor) 1, the condensation-curing silicone (heat transfer material) 10 is replaced with a printed circuit board (substrate) 2 and a glass epoxy board ( (Plate-like spacers) 4 may leak or protrude from the gap, but excessive heat of the condensation curable silicone (heat transfer material) 10 escapes from the heat transfer material buffer hole 11, so there is no such fear. .

図6は、本発明の実施例2における伝熱材過多時の状態を説明するための、基板取り付け後の断面図を示す。   FIG. 6 is a cross-sectional view after mounting the substrate for explaining a state when the heat transfer material is excessive in the second embodiment of the present invention.

図6において、縮合硬化型シリコーン(伝熱材)10の過多分は、伝熱材緩衝用穴11を通してプリント回路基板(基板)2側に逃げている。   In FIG. 6, the excess of the condensation curable silicone (heat transfer material) 10 escapes to the printed circuit board (substrate) 2 side through the heat transfer material buffer holes 11.

以上のように、本実施例2においては、プリント回路基板(基板)2に対して、ガラスエポキシ板(板状スペーサ)4の温度検出IC(温度センサ)1を配置するための隙間となる貫通穴に対応する範囲で且つ、温度検出IC(温度センサ)1の実装や回路パターンの邪魔にならない場所に伝熱材緩衝用穴11を設けることにより、縮合硬化型シリコーン(伝熱材)10の過多分の緩衝空間が確保でき、縮合硬化型シリコーン(伝熱材)10を過剰に塗布した場合でもプリント回路基板(基板)2とガラスエポキシ板(板状スペーサ)4の隙間から漏れたり、はみ出したりする恐れのない温度測定装置および構造を提供することができる。   As described above, in the second embodiment, the printed circuit board (substrate) 2 has a through-hole serving as a gap for arranging the temperature detection IC (temperature sensor) 1 of the glass epoxy plate (plate-like spacer) 4. By providing the heat transfer material buffering hole 11 in a range that corresponds to the hole and does not interfere with the mounting of the temperature detection IC (temperature sensor) 1 or the circuit pattern, the condensation curable silicone (heat transfer material) 10 is provided. Excessive buffering space can be secured, and even if the condensation-curing silicone (heat transfer material) 10 is applied excessively, it leaks or protrudes from the gap between the printed circuit board (substrate) 2 and the glass epoxy plate (plate spacer) 4. Therefore, it is possible to provide a temperature measuring device and a structure that are free from the risk of being lost.

本発明にかかる温度測定装置および温度測定構造は、低いトータル製造コストで被測温物と温度センサとを良好に熱的結合させることができ、産業用機器など製作数量の少ない機器へ応用する温度測定装置および構造として有用である。   The temperature measuring device and the temperature measuring structure according to the present invention can satisfactorily thermally couple the temperature-measured object and the temperature sensor at a low total manufacturing cost, and can be applied to equipment with a small production quantity such as industrial equipment. Useful as measuring device and structure.

本発明の実施例1における温度測定装置の構造を説明するための分解斜視図The exploded perspective view for demonstrating the structure of the temperature measuring apparatus in Example 1 of this invention 本発明の実施例1における温度測定装置の板状スペーサの形状図Shape diagram of plate-like spacer of temperature measuring device in Embodiment 1 of the present invention 本発明の実施例1における温度測定装置の構造を説明するための、基板取り付け前の断面図Sectional drawing before board attachment for demonstrating the structure of the temperature measuring apparatus in Example 1 of this invention 本発明の実施例1における温度測定装置の構造を説明するための、基板取り付け後の断面図Sectional drawing after board attachment for demonstrating the structure of the temperature measuring apparatus in Example 1 of this invention 本発明の実施例2における温度測定装置の基板の形状図Shape diagram of substrate of temperature measuring device in embodiment 2 of the present invention 本発明の実施例2における伝熱材過多時の状態を説明するための、基板取り付け後の断面図Sectional drawing after board | substrate attachment for demonstrating the state at the time of excessive heat-transfer material in Example 2 of this invention

符号の説明Explanation of symbols

1 温度検出IC(温度センサ)
2 プリント回路基板(基板)
3 被測温物
4 ガラスエポキシ板(板状スペーサ)
5 スペーサ固定ねじ
6 基板固定ねじ
7 温度検出IC(温度センサ)1を配置するための隙間となる貫通穴
8 スペーサ固定ねじ用穴
9 基板固定ねじ用穴
10 縮合硬化型シリコーン(伝熱材)
11 伝熱材緩衝用穴
1 Temperature detection IC (temperature sensor)
2 Printed circuit board (board)
3 Object to be measured 4 Glass epoxy board (plate spacer)
5 Spacer fixing screw 6 Substrate fixing screw 7 Through hole that becomes a gap for placing temperature detection IC (temperature sensor) 1 8 Spacer fixing screw hole 9 Substrate fixing screw hole 10 Condensation-curing silicone (heat transfer material)
11 Heat transfer material buffer hole

Claims (4)

温度センサが取り付けられた基板と、
前記温度センサにより測温すべき被測温物に対向して前記基板との間に設けられ、前記温度センサを配置するための隙間となる貫通穴を有する所定の厚みの板状スペーサと、
を備え、
前記基板は、前記板状スペーサを介して前記被測温部表面に対向して設けられ、
前記被測温物表面と前記板状スペーサの貫通穴にて形成される開口部に、前記温度センサを固定するとともに前記被測温物の熱を伝導するための伝熱材を注入し前記温度センサを前記開口部に収納して前記基板を前記被測温物に固定することを特徴とする温度測定装置。
A substrate with a temperature sensor attached thereto;
A plate-like spacer having a predetermined thickness, which is provided between the substrate and the substrate to be measured by the temperature sensor, and has a through-hole serving as a gap for arranging the temperature sensor;
With
The substrate is provided to face the surface to be measured through the plate spacer,
The temperature sensor is fixed to an opening formed by the surface of the object to be measured and the through hole of the plate-like spacer, and a heat transfer material for injecting the heat of the object to be measured is injected into the temperature. A temperature measuring apparatus, wherein a sensor is housed in the opening and the substrate is fixed to the object to be measured.
前記伝熱材が縮合硬化型シリコーンであることを特徴とする請求項1に記載の温度測定装置。 The temperature measuring device according to claim 1, wherein the heat transfer material is a condensation curable silicone. 前記基板は、前記板状スペーサの開口部に対応する部分に余分な伝熱材を逃がすための貫通穴を有することを特徴とする請求項1に記載の温度測定装置。 The temperature measurement apparatus according to claim 1, wherein the substrate has a through hole for allowing an excess heat transfer material to escape in a portion corresponding to the opening of the plate-like spacer. 温度センサが取り付けられた基板と、
前記温度センサにより測温すべき被測温物表面に対向して配置される所定の厚みを有する板状スペーサと、
を備え、
前記基板は、前記板状スペーサを介して前記被測温部表面に対向して設けられ、
前記板状スペーサは、前記温度センサを配置するための前記被測温物表面との間で所定の隙間を形成する貫通穴を有し、
前記被測温物表面と前記板状スペーサの貫通穴にて形成される開口部に、前記温度センサを固定するとともに前記被測温物の熱を伝導するための伝熱材を注入し前記温度センサを前記開口部に収納して前記基板を前記被測温物に固定することを特徴とする温度測定構造。
A substrate with a temperature sensor attached thereto;
A plate-like spacer having a predetermined thickness arranged opposite to the temperature-measured object surface to be measured by the temperature sensor;
With
The substrate is provided to face the surface to be measured through the plate spacer,
The plate-like spacer has a through hole that forms a predetermined gap with the surface of the temperature-measured object for arranging the temperature sensor,
The temperature sensor is fixed to an opening formed by the surface of the object to be measured and the through hole of the plate-like spacer, and a heat transfer material for injecting the heat of the object to be measured is injected into the temperature. A temperature measurement structure characterized in that a sensor is housed in the opening and the substrate is fixed to the object to be measured.
JP2005046763A 2005-02-23 2005-02-23 Device for measuring temperature and structure for measuring temperature Pending JP2006234466A (en)

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Country Link
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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017527810A (en) * 2014-09-09 2017-09-21 ライフスキャン・スコットランド・リミテッド Handheld test meter with integrated thermal channel
CN107607215A (en) * 2016-07-11 2018-01-19 泰科电子(上海)有限公司 Temperature survey component, temperature measuring equipment and electric appliance component
KR102042145B1 (en) * 2018-11-21 2019-11-07 엘아이지넥스원 주식회사 Protect Case For Temperature Sensor
KR20220124009A (en) * 2021-03-02 2022-09-13 배성훤 A sensorchip fixture filled with underfill liquid using spacer and the method of it

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2017527810A (en) * 2014-09-09 2017-09-21 ライフスキャン・スコットランド・リミテッド Handheld test meter with integrated thermal channel
CN107607215A (en) * 2016-07-11 2018-01-19 泰科电子(上海)有限公司 Temperature survey component, temperature measuring equipment and electric appliance component
KR102042145B1 (en) * 2018-11-21 2019-11-07 엘아이지넥스원 주식회사 Protect Case For Temperature Sensor
KR20220124009A (en) * 2021-03-02 2022-09-13 배성훤 A sensorchip fixture filled with underfill liquid using spacer and the method of it
KR102544803B1 (en) 2021-03-02 2023-06-20 배성훤 A sensorchip fixture filled with underfill liquid using spacer and the method of it

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