JP2006163676A5 - - Google Patents
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- JP2006163676A5 JP2006163676A5 JP2004352367A JP2004352367A JP2006163676A5 JP 2006163676 A5 JP2006163676 A5 JP 2006163676A5 JP 2004352367 A JP2004352367 A JP 2004352367A JP 2004352367 A JP2004352367 A JP 2004352367A JP 2006163676 A5 JP2006163676 A5 JP 2006163676A5
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- inspection
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Claims (7)
前記検査の実施計画を定量的に評価する評価関数を一つもしくは複数記憶する評価関数記憶装置と、表示手段とを少なくとも有するコンピュータで実行されるプログラムであって、A program executed by a computer having at least an evaluation function storage device that stores one or more evaluation functions for quantitatively evaluating the execution plan of the inspection, and a display means,
前記コンピュータに、In the computer,
前記検査状況データ記憶装置から前記検査状況の情報を所定の条件に従って複数取得し、該取得した検査状況の情報から前記検査の種別ごとに時系列的に当該検査状況が配列化された検査配列を生成し、同一検査種別の検査が繰り返し行われているか否かを示す指標である検査連続度を算出し、該算出された検査連続度を評価関数として前記評価関数記憶装置に記憶し、前記評価関数を最大もしくは最小にする前記検査の実施計画を一つもしくは複数算出して前記表示手段に表示させることを特徴とするプログラム。A plurality of the inspection status information is acquired from the inspection status data storage device according to a predetermined condition, and an inspection arrangement in which the inspection status is arranged in time series for each type of the inspection from the acquired inspection status information Generating and calculating an examination continuity that is an index indicating whether or not examinations of the same examination type are repeatedly performed, storing the calculated examination continuity as an evaluation function in the evaluation function storage device, and the evaluation A program for calculating one or a plurality of execution plans for the inspection that maximize or minimize a function and displaying the calculated plan on the display means.
前記検査の実施計画を定量的に評価する評価関数を一つもしくは複数記憶する評価関数記憶装置と、表示手段とを少なくとも有するコンピュータで実行されるプログラムであって、A program executed by a computer having at least an evaluation function storage device that stores one or more evaluation functions for quantitatively evaluating the execution plan of the inspection, and a display means,
前記コンピュータに、In the computer,
前記検査状況データ記憶装置から前記検査状況の情報を所定の条件に従って複数取得し、該取得した検査状況の情報から前記検査の種別ごとに時系列的に当該検査状況が配列化された検査配列を生成し、前記検査状況の情報のうちの前記検査日時と前記検査配列とから、前記検査配列毎に検査処理時間を予測する検査処理時間予測関数を生成し、該生成された検査処理時間予測関数を評価関数として前記評価関数記憶装置に記憶し、前記評価関数を最大もしくは最小にする前記検査の実施計画を一つもしくは複数算出して前記表示手段に表示させることを特徴とするプログラム。A plurality of the inspection status information is acquired from the inspection status data storage device according to a predetermined condition, and an inspection arrangement in which the inspection status is arranged in time series for each type of the inspection from the acquired inspection status information Generating an inspection processing time prediction function for predicting an inspection processing time for each inspection array from the inspection date and time and the inspection array in the inspection status information, and generating the generated inspection processing time prediction function Is stored in the evaluation function storage device as an evaluation function, and one or a plurality of execution plans for the inspection that maximize or minimize the evaluation function are calculated and displayed on the display means.
前記検査の実施計画を定量的に評価する評価関数を一つもしくは複数記憶する評価関数記憶装置とを有する医療機器稼動計画立案支援システムにおいて、In a medical device operation plan planning support system having an evaluation function storage device that stores one or more evaluation functions for quantitatively evaluating the execution plan of the examination,
前記入力受付手段に入力された検査状況の情報を基に前記評価関数を最大もしくは最小にする前記検査の実施計画を一つもしくは複数生成し、前記検査状況の情報の実施計画を計算する実施計画生成手段と、前記実施計画を編集する実施計画編集手段と、前記編集結果を記憶する実施計画記憶装置とを備え、An execution plan for generating one or a plurality of inspection execution plans for maximizing or minimizing the evaluation function based on inspection state information input to the input receiving means, and calculating an execution plan for the inspection state information Generation means, execution plan editing means for editing the execution plan, and an execution plan storage device for storing the editing result,
前記実施計画生成手段は、The execution plan generation means includes:
前記検査状況データ記憶装置に記憶された前記検査状況の情報から前記検査の種別ごとに時系列的に当該検査状況が配列化された検査配列を生成する検査配列生成手段と、A test array generating means for generating a test array in which the test status is arranged in time series for each type of the test from the information of the test status stored in the test status data storage device;
同一検査種別の検査が繰り返し行われているか否かを示す指標である検査連続度を算出する検査連続度算出手段を少なくとも有することを特徴とする医療機器稼動計画立案支援システム。 A medical device operation plan planning support system comprising at least examination continuity calculation means for calculating examination continuity, which is an index indicating whether or not examinations of the same examination type are repeatedly performed.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004352367A JP4897213B2 (en) | 2004-12-06 | 2004-12-06 | Medical equipment operation planning support system and program |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004352367A JP4897213B2 (en) | 2004-12-06 | 2004-12-06 | Medical equipment operation planning support system and program |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2006163676A JP2006163676A (en) | 2006-06-22 |
JP2006163676A5 true JP2006163676A5 (en) | 2007-11-29 |
JP4897213B2 JP4897213B2 (en) | 2012-03-14 |
Family
ID=36665640
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004352367A Expired - Fee Related JP4897213B2 (en) | 2004-12-06 | 2004-12-06 | Medical equipment operation planning support system and program |
Country Status (1)
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JP (1) | JP4897213B2 (en) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4785771B2 (en) * | 2007-03-02 | 2011-10-05 | 三菱電機株式会社 | Modality use schedule adjustment system |
JP4143110B1 (en) * | 2007-11-27 | 2008-09-03 | 中国電力株式会社 | Service time allocation method and service time allocation device |
JP5142913B2 (en) * | 2008-09-24 | 2013-02-13 | 中国電力株式会社 | Wait time control system, wait time control method, and wait time control program |
JP5268842B2 (en) * | 2008-12-15 | 2013-08-21 | 株式会社東芝 | Radiotherapy planning and radiotherapy reservation scheduling apparatus and method |
JP5004994B2 (en) * | 2009-05-27 | 2012-08-22 | 中国電力株式会社 | Service order determination method and service order determination apparatus |
JP6791727B2 (en) * | 2016-11-14 | 2020-11-25 | キヤノンメディカルシステムズ株式会社 | Inspection reservation system |
JP7190296B2 (en) * | 2018-09-14 | 2022-12-15 | キヤノンメディカルシステムズ株式会社 | Arithmetic unit and medical information processing system |
JP7383391B2 (en) * | 2019-04-17 | 2023-11-20 | キヤノンメディカルシステムズ株式会社 | Medical test management system, ordering system and program |
DE112021006551T5 (en) * | 2020-12-14 | 2023-11-09 | Fujifilm Corporation | MEDICAL SERVICE SUPPORT DEVICE, MEDICAL SERVICE SUPPORT METHOD, AND PROGRAM |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04203935A (en) * | 1990-11-30 | 1992-07-24 | Hitachi Ltd | Monitoring apparatus for operation of equipment |
JPH04240060A (en) * | 1991-01-22 | 1992-08-27 | Hitachi Ltd | Manufacturing system |
JPH05204891A (en) * | 1991-11-29 | 1993-08-13 | Hitachi Ltd | Method and device for schedule planning |
JP2606112B2 (en) * | 1993-11-29 | 1997-04-30 | 日本電気株式会社 | Semiconductor device manufacturing system |
JP3315844B2 (en) * | 1994-12-09 | 2002-08-19 | 株式会社東芝 | Scheduling device and scheduling method |
JP2002159449A (en) * | 2000-11-28 | 2002-06-04 | Toshiba Medical System Co Ltd | Medical examination device |
JP2003058228A (en) * | 2001-08-15 | 2003-02-28 | Fujitsu Ten Ltd | Product progress management method and device |
JP2003085277A (en) * | 2001-09-13 | 2003-03-20 | Olympus Optical Co Ltd | Examination reservation system |
JP4144303B2 (en) * | 2002-09-12 | 2008-09-03 | 株式会社島津製作所 | Test schedule creation program for nuclear medicine examination apparatus and nuclear medicine examination apparatus |
JP2004272416A (en) * | 2003-03-06 | 2004-09-30 | Renesas Technology Corp | Production instruction method in job shop type production line |
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2004
- 2004-12-06 JP JP2004352367A patent/JP4897213B2/en not_active Expired - Fee Related
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