JP2006071449A - 中性子散乱を用いた構造マッピング法 - Google Patents
中性子散乱を用いた構造マッピング法 Download PDFInfo
- Publication number
- JP2006071449A JP2006071449A JP2004255146A JP2004255146A JP2006071449A JP 2006071449 A JP2006071449 A JP 2006071449A JP 2004255146 A JP2004255146 A JP 2004255146A JP 2004255146 A JP2004255146 A JP 2004255146A JP 2006071449 A JP2006071449 A JP 2006071449A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- neutron
- information
- scattering
- mapping method
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
従来の中性子ラジオグラフィやトモグラフィでは実空間構造情報が得られない欠点を解消し、結晶粒又は磁区の方位情報をも含めた測定を可能とする新しい3次元マッピング法を提供する。
【解決手段】
パルス中性子源から導かれた中性子ビーム孔と移動機構を備えた試料部分とコリーメーターとスリットを備えたカウンター部分からなり、試料の一部分に中性子ビーム孔を絞ることで、その部分のみの原子核及びスピンの構造情報を測定し、試料全体の構造分布をマッピングする方法。
【選択図】 図1
Description
M.Strobl,W.Treimer,A.Hilger,「(中性子)電算化トモグラフィ用小角散乱シグナル」Applied PhysicsLetters,2004年7月、85、p.488−490
図1に示すように、比較的大きな試料3に対して、入射コリメーター1及びスリット2を通して入射中性子ビームを0.01から10mmと絞り、試料側をビームに対して正確に3次元的に移動させることで、試料中の特定の箇所にパルス中性子ビームを直線的に通過させる。その状態を、試料と中性子カウンター5との間に置いたコリメーター4により試料の見込み角(試料を見る領域)を絞り、更に必要に応じて中性子カウンター前にスリット6を置くことにより、パルス中性子ビームが通過した線上の特定の箇所のみの散乱中性子をカウントする。
(発明の効果)
以上の説明のとおり、本発明によって、試料中の部分的な構造情報が得られるようになり、アモルファス中の相分離の検出や異なるアモルファス相の分布、又結晶性物質についても、結晶子(グレイン)の方位の分布、同じ組成でも構造が異なる相の分布、磁性体の磁区の分布、超伝導体中の磁束の3次元分布など、今までの中性子ラジオグラフィやトモグラフィでは検出できなかった実空間構造分布に関する情報が得られるようになる。
ア:モノクロメーター、イ:スリット、ウ:試料、エ:アナライザー、オ:中性子カウンター
A:銅、B:鉄
Claims (1)
- パルス中性子源から導かれた中性子ビーム孔と移動機構を備えた試料部分とコリーメーターとスリットを備えたカウンター部分からなり、試料の一部分に中性子ビーム孔を絞ることで、その部分のみの原子核及びスピンの構造情報を測定し、試料全体の構造分布をマッピングする方法。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004255146A JP4565202B2 (ja) | 2004-09-02 | 2004-09-02 | 中性子散乱を用いた構造マッピング法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004255146A JP4565202B2 (ja) | 2004-09-02 | 2004-09-02 | 中性子散乱を用いた構造マッピング法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006071449A true JP2006071449A (ja) | 2006-03-16 |
JP4565202B2 JP4565202B2 (ja) | 2010-10-20 |
Family
ID=36152245
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004255146A Expired - Fee Related JP4565202B2 (ja) | 2004-09-02 | 2004-09-02 | 中性子散乱を用いた構造マッピング法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4565202B2 (ja) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007333663A (ja) * | 2006-06-19 | 2007-12-27 | Japan Atomic Energy Agency | 散乱中性子線を利用した3次元動体可視化計測方法及びその装置 |
JP2009128112A (ja) * | 2007-11-21 | 2009-06-11 | Tohoku Univ | 中性子回折装置 |
JP2011048322A (ja) * | 2009-07-27 | 2011-03-10 | Ricoh Co Ltd | トナー挙動可視化装置 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02118254U (ja) * | 1989-03-07 | 1990-09-21 | ||
JPH0311547A (ja) * | 1989-06-09 | 1991-01-18 | Hitachi Ltd | 表面計測方法および装置 |
JPH0720067A (ja) * | 1993-07-01 | 1995-01-24 | Nec Corp | 結晶構造決定方法 |
JPH0743498A (ja) * | 1993-07-30 | 1995-02-14 | Seiko Seiki Co Ltd | 中性子チョッパのコリメータおよびその製造方法 |
JP2002228604A (ja) * | 2001-01-31 | 2002-08-14 | Rigaku Corp | X線装置 |
JP2003098124A (ja) * | 2001-09-21 | 2003-04-03 | Rikogaku Shinkokai | X線回折方法および中性子線回折方法 |
JP2006010356A (ja) * | 2004-06-22 | 2006-01-12 | Japan Nuclear Cycle Development Inst States Of Projects | パルス中性子透過法による非破壊分析方法及び装置 |
-
2004
- 2004-09-02 JP JP2004255146A patent/JP4565202B2/ja not_active Expired - Fee Related
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02118254U (ja) * | 1989-03-07 | 1990-09-21 | ||
JPH0311547A (ja) * | 1989-06-09 | 1991-01-18 | Hitachi Ltd | 表面計測方法および装置 |
JPH0720067A (ja) * | 1993-07-01 | 1995-01-24 | Nec Corp | 結晶構造決定方法 |
JPH0743498A (ja) * | 1993-07-30 | 1995-02-14 | Seiko Seiki Co Ltd | 中性子チョッパのコリメータおよびその製造方法 |
JP2002228604A (ja) * | 2001-01-31 | 2002-08-14 | Rigaku Corp | X線装置 |
JP2003098124A (ja) * | 2001-09-21 | 2003-04-03 | Rikogaku Shinkokai | X線回折方法および中性子線回折方法 |
JP2006010356A (ja) * | 2004-06-22 | 2006-01-12 | Japan Nuclear Cycle Development Inst States Of Projects | パルス中性子透過法による非破壊分析方法及び装置 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007333663A (ja) * | 2006-06-19 | 2007-12-27 | Japan Atomic Energy Agency | 散乱中性子線を利用した3次元動体可視化計測方法及びその装置 |
JP2009128112A (ja) * | 2007-11-21 | 2009-06-11 | Tohoku Univ | 中性子回折装置 |
JP2011048322A (ja) * | 2009-07-27 | 2011-03-10 | Ricoh Co Ltd | トナー挙動可視化装置 |
Also Published As
Publication number | Publication date |
---|---|
JP4565202B2 (ja) | 2010-10-20 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Smilgies | Scherrer grain-size analysis adapted to grazing-incidence scattering with area detectors | |
Malzer et al. | A model for the confocal volume of 3D micro X-ray fluorescence spectrometer | |
Kardjilov et al. | CONRAD-2: the new neutron imaging instrument at the Helmholtz-Zentrum Berlin | |
Strobl et al. | Wavelength-dispersive dark-field contrast: micrometre structure resolution in neutron imaging with gratings | |
Colombi et al. | Reproducibility in X-ray reflectometry: results from the first world-wide round-robin experiment | |
Kardjilov et al. | New features in cold neutron radiography and tomography Part II: applied energy-selective neutron radiography and tomography | |
Steuwer et al. | Using pulsed neutron transmission for crystalline phase imaging and analysis | |
Das et al. | Simultaneous measurements of X-ray reflectivity and grazing incidence fluorescence at BL-16 beamline of Indus-2 | |
JP2014095673A (ja) | 演算装置、演算プログラム、x線測定システム、およびx線測定方法 | |
Schreyer et al. | ADAM, the new reflectometer at the ILL | |
Nowak et al. | Grazing angle X-ray fluorescence from periodic structures on silicon and silica surfaces | |
Raventós et al. | A Monte Carlo approach for scattering correction towards quantitative neutron imaging of polycrystals | |
Jiang et al. | Micro-imaging of buried layers and interfaces in ultrathin films by X-ray reflectivity | |
Boin et al. | Monte Carlo simulations for the analysis of texture and strain measured with Bragg edge neutron transmission | |
JP4565202B2 (ja) | 中性子散乱を用いた構造マッピング法 | |
Strobl et al. | Advanced neutron imaging methods with a potential to benefit from pulsed sources | |
Sakurai et al. | Neutron visualization of inhomogeneous buried interfaces in thin films | |
JP3968350B2 (ja) | X線回折装置及び方法 | |
Dalgliesh | Application of off-specular scattering of X-rays and neutrons to the study of soft matter | |
JP5825602B2 (ja) | 中性子線イメージングの方法及び装置 | |
Voegeli et al. | A quick convergent-beam laboratory X-ray reflectometer using a simultaneous multiple-angle dispersive geometry | |
EP1514095A1 (en) | Methods and apparatus of sample analysis | |
Shmakov et al. | High-resolution diffractometer for structural studies of polycrystalline materials | |
Eba et al. | Observation of crystalline phase distribution with confocal angle-dispersive X-ray diffractometer | |
Betz et al. | Visualization of bulk magnetic properties by neutron grating interferometry |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A711 | Notification of change in applicant |
Free format text: JAPANESE INTERMEDIATE CODE: A712 Effective date: 20060223 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20070530 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20100210 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20100216 |
|
A521 | Written amendment |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100414 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20100610 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20100709 |
|
R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130813 Year of fee payment: 3 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
S531 | Written request for registration of change of domicile |
Free format text: JAPANESE INTERMEDIATE CODE: R313531 |
|
S533 | Written request for registration of change of name |
Free format text: JAPANESE INTERMEDIATE CODE: R313533 |
|
R350 | Written notification of registration of transfer |
Free format text: JAPANESE INTERMEDIATE CODE: R350 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
LAPS | Cancellation because of no payment of annual fees |