JP2005515441A5 - - Google Patents
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- Publication number
- JP2005515441A5 JP2005515441A5 JP2003560573A JP2003560573A JP2005515441A5 JP 2005515441 A5 JP2005515441 A5 JP 2005515441A5 JP 2003560573 A JP2003560573 A JP 2003560573A JP 2003560573 A JP2003560573 A JP 2003560573A JP 2005515441 A5 JP2005515441 A5 JP 2005515441A5
- Authority
- JP
- Japan
- Prior art keywords
- probe
- flexible
- probe according
- backing
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims 18
- 239000000758 substrate Substances 0.000 claims 6
- 239000011888 foil Substances 0.000 claims 3
- 238000005266 casting Methods 0.000 claims 2
- 230000005294 ferromagnetic effect Effects 0.000 claims 2
- 238000005259 measurement Methods 0.000 claims 2
- 239000011347 resin Substances 0.000 claims 2
- 229920005989 resin Polymers 0.000 claims 2
- 229910000859 α-Fe Inorganic materials 0.000 claims 2
- 239000004642 Polyimide Substances 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 239000000463 material Substances 0.000 claims 1
- 239000004033 plastic Substances 0.000 claims 1
- 229920001721 polyimide Polymers 0.000 claims 1
- 229920000642 polymer Polymers 0.000 claims 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP02001268A EP1329730A1 (de) | 2002-01-17 | 2002-01-17 | Wirbelstromsonde auf einem flexiblen Substrat |
| PCT/EP2002/014738 WO2003060530A1 (de) | 2002-01-17 | 2002-12-23 | Sonde für elektrische messverfahren und verwendung einer flexiblen sonde zur herstellung einer unflexiblen sonde |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005515441A JP2005515441A (ja) | 2005-05-26 |
| JP2005515441A5 true JP2005515441A5 (enExample) | 2005-12-22 |
Family
ID=8185297
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003560573A Pending JP2005515441A (ja) | 2002-01-17 | 2002-12-23 | 電気的測定用プローブとその製造方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US7688067B2 (enExample) |
| EP (2) | EP1329730A1 (enExample) |
| JP (1) | JP2005515441A (enExample) |
| DE (1) | DE50211376D1 (enExample) |
| WO (1) | WO2003060530A1 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1496355A1 (de) * | 2003-07-09 | 2005-01-12 | Siemens Aktiengesellschaft | Sonde für elektrische Messverfahren, insbesondere für Wirbelstrommessungen |
| US7888932B2 (en) * | 2007-11-05 | 2011-02-15 | General Electric Company | Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same |
| US7688089B2 (en) * | 2008-01-25 | 2010-03-30 | International Business Machines Corporation | Compliant membrane thin film interposer probe for intergrated circuit device testing |
| US8269489B2 (en) * | 2008-11-25 | 2012-09-18 | General Electric Company | System and method for eddy current inspection of parts with complex geometries |
Family Cites Families (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58153157A (ja) | 1982-03-05 | 1983-09-12 | Shimadzu Corp | 磁気探傷装置の磁気検出器 |
| GB8513006D0 (en) * | 1985-05-22 | 1985-06-26 | Raychem Gmbh | Encapsulating electrical components |
| EP0228177A3 (en) * | 1985-11-19 | 1988-11-02 | Electric Power Research Institute, Inc | Flexible eddy-current coil and coil array for nondestructive testing |
| US5389876A (en) | 1991-05-06 | 1995-02-14 | General Electric Company | Flexible eddy current surface measurement array for detecting near surface flaws in a conductive part |
| JP3208158B2 (ja) | 1991-09-06 | 2001-09-10 | 株式会社東立エンジニアリング | 溶接棒位置決め装置 |
| DE4204643C1 (enExample) * | 1992-02-15 | 1993-05-19 | Fraunhofer-Gesellschaft Zur Foerderung Der Angewandten Forschung Ev, 8000 Muenchen, De | |
| US5315234A (en) | 1992-04-03 | 1994-05-24 | General Electric Company | Eddy current device for inspecting a component having a flexible support with a plural sensor array |
| JPH0738956A (ja) | 1993-07-14 | 1995-02-07 | Toshiba Corp | 移動無線通信装置 |
| US5510709A (en) * | 1993-09-27 | 1996-04-23 | General Electric Company | Eddy current surface inspection probe for aircraft fastener inspection, and inspection method |
| US5467775A (en) | 1995-03-17 | 1995-11-21 | University Research Engineers & Associates | Modular auscultation sensor and telemetry system |
| JPH0983104A (ja) * | 1995-09-12 | 1997-03-28 | Murata Mfg Co Ltd | コイル内蔵回路基板 |
| US6002251A (en) | 1995-12-15 | 1999-12-14 | Sun; Yu-Shi | Electromagnetic-field-focusing remote-field eddy-current probe system and method for inspecting anomalies in conducting plates |
| JPH10197492A (ja) | 1997-01-08 | 1998-07-31 | Toshiba Corp | 電磁誘導薄膜プローブ |
| JP2001522046A (ja) * | 1997-11-04 | 2001-11-13 | シーメンス アクチエンゲゼルシヤフト | 渦電流検査ヘッド、渦電流検査ヘッドの製造方法および渦電流検査方法 |
| DE19748556A1 (de) | 1997-11-04 | 1999-05-20 | Siemens Ag | Magnetfluß-Meßsystem zur Wirbelstromprüfung und Verfahren zur Wirbelstromprüfung |
| US6198280B1 (en) * | 1998-04-27 | 2001-03-06 | Siemens Westinghouse Power Corporation | Eddy current flexible field probe deployed through a loading platform |
| US6838890B2 (en) * | 2000-02-25 | 2005-01-04 | Cascade Microtech, Inc. | Membrane probing system |
| EP1496355A1 (de) * | 2003-07-09 | 2005-01-12 | Siemens Aktiengesellschaft | Sonde für elektrische Messverfahren, insbesondere für Wirbelstrommessungen |
| JP3812559B2 (ja) * | 2003-09-18 | 2006-08-23 | Ｔｄｋ株式会社 | 渦電流プローブ |
-
2002
- 2002-01-17 EP EP02001268A patent/EP1329730A1/de not_active Withdrawn
- 2002-12-23 US US10/501,724 patent/US7688067B2/en not_active Expired - Fee Related
- 2002-12-23 WO PCT/EP2002/014738 patent/WO2003060530A1/de not_active Ceased
- 2002-12-23 DE DE50211376T patent/DE50211376D1/de not_active Expired - Lifetime
- 2002-12-23 JP JP2003560573A patent/JP2005515441A/ja active Pending
- 2002-12-23 EP EP02801068A patent/EP1466181B1/de not_active Expired - Lifetime
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