JP2005513841A5 - - Google Patents

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Publication number
JP2005513841A5
JP2005513841A5 JP2003553487A JP2003553487A JP2005513841A5 JP 2005513841 A5 JP2005513841 A5 JP 2005513841A5 JP 2003553487 A JP2003553487 A JP 2003553487A JP 2003553487 A JP2003553487 A JP 2003553487A JP 2005513841 A5 JP2005513841 A5 JP 2005513841A5
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JP
Japan
Prior art keywords
deterministic
inverse problem
parameter
parameters
model
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003553487A
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English (en)
Japanese (ja)
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JP2005513841A (ja
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Publication date
Priority claimed from US10/021,895 external-priority patent/US7016805B2/en
Application filed filed Critical
Publication of JP2005513841A publication Critical patent/JP2005513841A/ja
Publication of JP2005513841A5 publication Critical patent/JP2005513841A5/ja
Pending legal-status Critical Current

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JP2003553487A 2001-12-14 2002-12-13 分布を解析する方法及び装置 Pending JP2005513841A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/021,895 US7016805B2 (en) 2001-12-14 2001-12-14 Method and apparatus for analyzing a distribution
PCT/US2002/039827 WO2003052670A1 (en) 2001-12-14 2002-12-13 Method and apparatus for analyzing a distribution

Publications (2)

Publication Number Publication Date
JP2005513841A JP2005513841A (ja) 2005-05-12
JP2005513841A5 true JP2005513841A5 (enExample) 2005-12-22

Family

ID=21806712

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003553487A Pending JP2005513841A (ja) 2001-12-14 2002-12-13 分布を解析する方法及び装置

Country Status (6)

Country Link
US (1) US7016805B2 (enExample)
EP (1) EP1464027A1 (enExample)
JP (1) JP2005513841A (enExample)
KR (1) KR20040083066A (enExample)
AU (1) AU2002359692A1 (enExample)
WO (1) WO2003052670A1 (enExample)

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US20100107009A1 (en) * 2008-10-24 2010-04-29 Advantest Corporation Deterministic component model judging apparatus, judging method, program, recording medium, test system and electronic device
US8379754B2 (en) 2009-03-31 2013-02-19 Infineon Technologies Ag Method and device for predicting a figure of merit from a distribution
US20130156261A1 (en) * 2011-12-16 2013-06-20 Alcatel-Lucent Usa Inc. Method and apparatus for object detection using compressive sensing
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