KR20040083066A - 디스트리뷰션 분석 방법 및 장치 - Google Patents

디스트리뷰션 분석 방법 및 장치 Download PDF

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Publication number
KR20040083066A
KR20040083066A KR10-2004-7009244A KR20047009244A KR20040083066A KR 20040083066 A KR20040083066 A KR 20040083066A KR 20047009244 A KR20047009244 A KR 20047009244A KR 20040083066 A KR20040083066 A KR 20040083066A
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South Korea
Prior art keywords
parameters
deterministic
model
inverse problem
parameter
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KR10-2004-7009244A
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English (en)
Korean (ko)
Inventor
순지에
리펭
월스트럽잔브라이언
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웨이브크레스트 코포레이션
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Publication of KR20040083066A publication Critical patent/KR20040083066A/ko
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G06F17/18—Complex mathematical operations for evaluating statistical data, e.g. average values, frequency distributions, probability functions, regression analysis
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/24—Classification techniques
    • G06F18/241—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches
    • G06F18/2415—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches based on parametric or probabilistic models, e.g. based on likelihood ratio or false acceptance rate versus a false rejection rate
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
    • H04L1/205—Arrangements for detecting or preventing errors in the information received using signal quality detector jitter monitoring

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Data Mining & Analysis (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Pure & Applied Mathematics (AREA)
  • Mathematical Optimization (AREA)
  • Mathematical Analysis (AREA)
  • Computational Mathematics (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Probability & Statistics with Applications (AREA)
  • Evolutionary Biology (AREA)
  • General Engineering & Computer Science (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Algebra (AREA)
  • Operations Research (AREA)
  • Databases & Information Systems (AREA)
  • Software Systems (AREA)
  • Quality & Reliability (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Artificial Intelligence (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Evolutionary Computation (AREA)
  • Complex Calculations (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
KR10-2004-7009244A 2001-12-14 2002-12-13 디스트리뷰션 분석 방법 및 장치 Withdrawn KR20040083066A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10/021,895 2001-12-14
US10/021,895 US7016805B2 (en) 2001-12-14 2001-12-14 Method and apparatus for analyzing a distribution
PCT/US2002/039827 WO2003052670A1 (en) 2001-12-14 2002-12-13 Method and apparatus for analyzing a distribution

Publications (1)

Publication Number Publication Date
KR20040083066A true KR20040083066A (ko) 2004-09-30

Family

ID=21806712

Family Applications (1)

Application Number Title Priority Date Filing Date
KR10-2004-7009244A Withdrawn KR20040083066A (ko) 2001-12-14 2002-12-13 디스트리뷰션 분석 방법 및 장치

Country Status (6)

Country Link
US (1) US7016805B2 (enExample)
EP (1) EP1464027A1 (enExample)
JP (1) JP2005513841A (enExample)
KR (1) KR20040083066A (enExample)
AU (1) AU2002359692A1 (enExample)
WO (1) WO2003052670A1 (enExample)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7016805B2 (en) * 2001-12-14 2006-03-21 Wavecrest Corporation Method and apparatus for analyzing a distribution
EP1265391B1 (en) * 2002-04-05 2004-07-07 Agilent Technologies, Inc. (a Delaware corporation) Jitter histogram approximation method
US7383570B2 (en) 2002-04-25 2008-06-03 Intertrust Technologies, Corp. Secure authentication systems and methods
US7079963B2 (en) * 2003-04-14 2006-07-18 Lsi Logic Corporation Modified binary search for optimizing efficiency of data collection time
RU2253892C1 (ru) * 2003-09-10 2005-06-10 Уфимский государственный авиационный технический университет Устройство для измерения двумерных распределений случайных процессов
US7151367B2 (en) * 2004-03-31 2006-12-19 Teradyne, Inc. Method of measuring duty cycle
DE102004022144B4 (de) * 2004-05-05 2007-08-16 Siemens Ag Verfahren zur rechnergestützten Bewertung von Kenngrößen eines technischen Systems
US7590170B2 (en) * 2004-09-29 2009-09-15 Teradyne, Inc. Method and apparatus for measuring jitter
JP2006258529A (ja) * 2005-03-16 2006-09-28 Fujitsu Ten Ltd 電波到来方向推定装置及び方法
US7149638B2 (en) * 2005-03-29 2006-12-12 Agilent Technologies, Inc. Separation of random and deterministic components of jitter
US7191080B2 (en) * 2005-04-12 2007-03-13 Agilent Technologies, Inc. Separation of a random component of jitter and a deterministic component of jitter
US7890904B2 (en) * 2005-06-06 2011-02-15 Fujitsu Limited Estimating jitter in a clock tree of a circuit and synthesizing a jitter-aware and skew-aware clock tree
EP1938268A4 (en) * 2005-08-29 2010-02-17 Tektronix Inc MEASURE AND DISPLAY FOR VIDEO TIP JITTER WITH EXPECTED PROBABILITY
JP5394060B2 (ja) * 2006-03-21 2014-01-22 株式会社アドバンテスト 確率密度関数分離装置、確率密度関数分離方法、ノイズ分離装置、ノイズ分離方法、試験装置、試験方法、プログラム、及び記録媒体
US7856463B2 (en) * 2006-03-21 2010-12-21 Advantest Corporation Probability density function separating apparatus, probability density function separating method, testing apparatus, bit error rate measuring apparatus, electronic device, and program
US7627841B2 (en) * 2006-04-12 2009-12-01 The Regents Of The University Of California, Santa Cruz Efficient method to predict integrated circuit temperature and power maps
US20070285081A1 (en) * 2006-05-16 2007-12-13 Carole James A Method and system for statistical measurement and processing of a repetitive signal
US7809516B2 (en) * 2006-08-10 2010-10-05 Advantest Corporation Probability density function separating apparatus, probability density function separating method, program, testing apparatus, bit error rate measuring apparatus, electronic device, and jitter transfer function measuring apparatus
JPWO2008018587A1 (ja) * 2006-08-10 2010-01-07 株式会社アドバンテスト ノイズ分離装置、ノイズ分離方法、確率密度関数分離装置、確率密度関数分離方法、試験装置、電子デバイス、プログラム、及び記録媒体
US7289922B1 (en) * 2006-12-06 2007-10-30 Intel Corporation Jitter decomposition for high speed serial interfaces
US8452560B2 (en) * 2006-12-29 2013-05-28 Teradyne, Inc. Identifying periodic jitter in a signal
US7930139B2 (en) * 2007-08-10 2011-04-19 Advantest Corporation Probability density function separating apparatus, probability density function separating method, program, testing apparatus, bit error rate measuring apparatus, electronic device, and jitter transfer function measuring apparatus
US8121815B2 (en) * 2007-08-10 2012-02-21 Advantest Corporation Noise separating apparatus, noise separating method, probability density function separating apparatus, probability density function separating method, testing apparatus, electronic device, program, and recording medium
WO2009058412A1 (en) * 2007-10-29 2009-05-07 Nec Laboratories America, Inc. Discovering optimal system configurations using decentralized probability based active sampling
US20100107009A1 (en) * 2008-10-24 2010-04-29 Advantest Corporation Deterministic component model judging apparatus, judging method, program, recording medium, test system and electronic device
US8379754B2 (en) 2009-03-31 2013-02-19 Infineon Technologies Ag Method and device for predicting a figure of merit from a distribution
US20130156261A1 (en) * 2011-12-16 2013-06-20 Alcatel-Lucent Usa Inc. Method and apparatus for object detection using compressive sensing
CN103616643B (zh) * 2013-11-15 2016-02-10 清华大学 分析电池运行工况的数据处理方法
US20200226305A1 (en) * 2019-01-08 2020-07-16 RTConfidence, Inc. System and method for performing simulations of uncertain future events
US11907300B2 (en) * 2019-07-17 2024-02-20 Schlumberger Technology Corporation Geologic formation operations relational framework

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5955523A (ja) * 1982-09-24 1984-03-30 Advantest Corp デジタルスペクトルアナライザ用信号発生器
US5057992A (en) * 1989-04-12 1991-10-15 Dentonaut Labs Ltd. Method and apparatus for controlling or processing operations of varying characteristics
US5572125A (en) * 1991-03-25 1996-11-05 Dunkel; Reinhard Correction and automated analysis of spectral and imaging data
US5452333A (en) * 1992-06-19 1995-09-19 Advanced Micro Devices, Inc. Digital jitter correction method and signal preconditioner
JP2994926B2 (ja) * 1993-10-29 1999-12-27 松下電器産業株式会社 有限状態機械作成方法とパターン照合機械作成方法とこれらを変形する方法および駆動方法
DE4440964C1 (de) * 1994-11-17 1996-07-11 Inst Rundfunktechnik Gmbh Anordnung zum Entzerren von zwei Datenströmen
US5751766A (en) * 1995-04-27 1998-05-12 Applied Signal Technology, Inc. Non-invasive digital communications test system
US5748491A (en) * 1995-12-20 1998-05-05 The Perkin-Elmer Corporation Deconvolution method for the analysis of data resulting from analytical separation processes
US5761254A (en) * 1996-01-31 1998-06-02 Advanced Micro Devices, Inc. Digital architecture for recovering NRZ/NRZI data
US5751852A (en) * 1996-04-29 1998-05-12 Xerox Corporation Image structure map data structure for spatially indexing an imgage
US6278961B1 (en) * 1997-07-02 2001-08-21 Nonlinear Solutions, Inc. Signal and pattern detection or classification by estimation of continuous dynamical models
US5987444A (en) * 1997-09-23 1999-11-16 Lo; James Ting-Ho Robust neutral systems
US6298315B1 (en) * 1998-12-11 2001-10-02 Wavecrest Corporation Method and apparatus for analyzing measurements
US6285720B1 (en) * 1999-05-28 2001-09-04 W J Communications, Inc. Method and apparatus for high data rate wireless communications over wavefield spaces
AU2755401A (en) * 1999-12-30 2001-07-16 Bandspeed, Inc. Approach for processing data received from a communications channel
US6678386B2 (en) * 2000-03-13 2004-01-13 Resistance Technology, Inc. Programmable module
WO2002010705A2 (en) * 2000-08-01 2002-02-07 Wavecrest Corporation Electromagnetic and optical analyzer
US6622117B2 (en) * 2001-05-14 2003-09-16 International Business Machines Corporation EM algorithm for convolutive independent component analysis (CICA)
US6662140B2 (en) * 2001-06-12 2003-12-09 Rolls-Royce Canada Limited Fuzzy logic estimator for minimizing signal measurement inaccuracy effects in a signal processing system
US6832172B2 (en) * 2001-06-15 2004-12-14 Tektronix, Inc. Apparatus and method for spectrum analysis-based serial data jitter measurement
GB2379016A (en) * 2001-07-27 2003-02-26 Hewlett Packard Co Portable apparatus monitoring reaction of user to music
US7016805B2 (en) * 2001-12-14 2006-03-21 Wavecrest Corporation Method and apparatus for analyzing a distribution
US6853933B2 (en) * 2002-02-26 2005-02-08 Tektronix, Inc. Method of identifying spectral impulses for Rj Dj separation
KR100471006B1 (ko) * 2002-07-24 2005-03-10 삼성전자주식회사 고속 데이터 출력 소자의 지터 측정 장치 및 토탈 지터측정방법
US7254168B2 (en) * 2002-10-29 2007-08-07 Tektronix, Inc. Method for decomposing timing jitter on arbitrary serial data sequences
US6898535B2 (en) * 2003-10-14 2005-05-24 Agilent Technologies, Inc. Method and apparatus for decomposing signal jitter using multiple acquisitions
US7295604B2 (en) * 2003-11-24 2007-11-13 International Business Machines Corporation Method for determining jitter of a signal in a serial link and high speed serial link

Also Published As

Publication number Publication date
JP2005513841A (ja) 2005-05-12
EP1464027A1 (en) 2004-10-06
US7016805B2 (en) 2006-03-21
US20030115017A1 (en) 2003-06-19
WO2003052670A1 (en) 2003-06-26
AU2002359692A1 (en) 2003-06-30

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PA0105 International application

Patent event date: 20040614

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid