JP2005513841A - 分布を解析する方法及び装置 - Google Patents

分布を解析する方法及び装置 Download PDF

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JP2005513841A
JP2005513841A JP2003553487A JP2003553487A JP2005513841A JP 2005513841 A JP2005513841 A JP 2005513841A JP 2003553487 A JP2003553487 A JP 2003553487A JP 2003553487 A JP2003553487 A JP 2003553487A JP 2005513841 A JP2005513841 A JP 2005513841A
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deterministic
parameters
parameter
inverse problem
model
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JP2005513841A5 (enExample
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ジェ・スン
ペン・リ
ジャン・ブライアン・ウィルストラップ
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ウェイブクレスト・コーポレイション
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/10—Complex mathematical operations
    • G06F17/18—Complex mathematical operations for evaluating statistical data, e.g. average values, frequency distributions, probability functions, regression analysis
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F18/00—Pattern recognition
    • G06F18/20—Analysing
    • G06F18/24—Classification techniques
    • G06F18/241—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches
    • G06F18/2415—Classification techniques relating to the classification model, e.g. parametric or non-parametric approaches based on parametric or probabilistic models, e.g. based on likelihood ratio or false acceptance rate versus a false rejection rate
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L1/00—Arrangements for detecting or preventing errors in the information received
    • H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
    • H04L1/205—Arrangements for detecting or preventing errors in the information received using signal quality detector jitter monitoring

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  • Physics & Mathematics (AREA)
  • Data Mining & Analysis (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Mathematical Physics (AREA)
  • Pure & Applied Mathematics (AREA)
  • Mathematical Optimization (AREA)
  • Mathematical Analysis (AREA)
  • Computational Mathematics (AREA)
  • Bioinformatics & Computational Biology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Probability & Statistics with Applications (AREA)
  • Evolutionary Biology (AREA)
  • General Engineering & Computer Science (AREA)
  • Bioinformatics & Cheminformatics (AREA)
  • Algebra (AREA)
  • Operations Research (AREA)
  • Databases & Information Systems (AREA)
  • Software Systems (AREA)
  • Quality & Reliability (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Artificial Intelligence (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Evolutionary Computation (AREA)
  • Complex Calculations (AREA)
  • Maintenance And Management Of Digital Transmission (AREA)
JP2003553487A 2001-12-14 2002-12-13 分布を解析する方法及び装置 Pending JP2005513841A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/021,895 US7016805B2 (en) 2001-12-14 2001-12-14 Method and apparatus for analyzing a distribution
PCT/US2002/039827 WO2003052670A1 (en) 2001-12-14 2002-12-13 Method and apparatus for analyzing a distribution

Publications (2)

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JP2005513841A true JP2005513841A (ja) 2005-05-12
JP2005513841A5 JP2005513841A5 (enExample) 2005-12-22

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JP2003553487A Pending JP2005513841A (ja) 2001-12-14 2002-12-13 分布を解析する方法及び装置

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US (1) US7016805B2 (enExample)
EP (1) EP1464027A1 (enExample)
JP (1) JP2005513841A (enExample)
KR (1) KR20040083066A (enExample)
AU (1) AU2002359692A1 (enExample)
WO (1) WO2003052670A1 (enExample)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006258529A (ja) * 2005-03-16 2006-09-28 Fujitsu Ten Ltd 電波到来方向推定装置及び方法
JP2006276019A (ja) * 2005-03-29 2006-10-12 Agilent Technol Inc ジッタのランダム成分とデタミニスティック成分の分離
WO2007108493A1 (ja) * 2006-03-21 2007-09-27 Advantest Corporation 確率密度関数分離装置、確率密度関数分離方法、試験装置、ビット誤り率測定装置、電子デバイス、及びプログラム
WO2007108492A1 (ja) * 2006-03-21 2007-09-27 Advantest Corporation 確率密度関数分離装置、確率密度関数分離方法、ノイズ分離装置、ノイズ分離方法、試験装置、試験方法、算出装置、算出方法、プログラム、及び記録媒体
WO2008018588A1 (fr) * 2006-08-10 2008-02-14 Advantest Corporation Séparateur de fonction de probabilité de densité, procédé de séparation de fonction de probabilité de densité, et programme, testeur, dispositif de mesure du taux d'erreurs sur bits, dispositif électronique et dispositif de mesure de la fonction de transfert de
US7809516B2 (en) 2006-08-10 2010-10-05 Advantest Corporation Probability density function separating apparatus, probability density function separating method, program, testing apparatus, bit error rate measuring apparatus, electronic device, and jitter transfer function measuring apparatus
US7930139B2 (en) 2007-08-10 2011-04-19 Advantest Corporation Probability density function separating apparatus, probability density function separating method, program, testing apparatus, bit error rate measuring apparatus, electronic device, and jitter transfer function measuring apparatus
US8121815B2 (en) 2007-08-10 2012-02-21 Advantest Corporation Noise separating apparatus, noise separating method, probability density function separating apparatus, probability density function separating method, testing apparatus, electronic device, program, and recording medium

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7016805B2 (en) * 2001-12-14 2006-03-21 Wavecrest Corporation Method and apparatus for analyzing a distribution
EP1265391B1 (en) * 2002-04-05 2004-07-07 Agilent Technologies, Inc. (a Delaware corporation) Jitter histogram approximation method
US7383570B2 (en) 2002-04-25 2008-06-03 Intertrust Technologies, Corp. Secure authentication systems and methods
US7079963B2 (en) * 2003-04-14 2006-07-18 Lsi Logic Corporation Modified binary search for optimizing efficiency of data collection time
RU2253892C1 (ru) * 2003-09-10 2005-06-10 Уфимский государственный авиационный технический университет Устройство для измерения двумерных распределений случайных процессов
US7151367B2 (en) * 2004-03-31 2006-12-19 Teradyne, Inc. Method of measuring duty cycle
DE102004022144B4 (de) * 2004-05-05 2007-08-16 Siemens Ag Verfahren zur rechnergestützten Bewertung von Kenngrößen eines technischen Systems
US7590170B2 (en) * 2004-09-29 2009-09-15 Teradyne, Inc. Method and apparatus for measuring jitter
US7191080B2 (en) * 2005-04-12 2007-03-13 Agilent Technologies, Inc. Separation of a random component of jitter and a deterministic component of jitter
US7890904B2 (en) * 2005-06-06 2011-02-15 Fujitsu Limited Estimating jitter in a clock tree of a circuit and synthesizing a jitter-aware and skew-aware clock tree
EP1938268A4 (en) * 2005-08-29 2010-02-17 Tektronix Inc MEASURE AND DISPLAY FOR VIDEO TIP JITTER WITH EXPECTED PROBABILITY
US7627841B2 (en) * 2006-04-12 2009-12-01 The Regents Of The University Of California, Santa Cruz Efficient method to predict integrated circuit temperature and power maps
US20070285081A1 (en) * 2006-05-16 2007-12-13 Carole James A Method and system for statistical measurement and processing of a repetitive signal
US7289922B1 (en) * 2006-12-06 2007-10-30 Intel Corporation Jitter decomposition for high speed serial interfaces
US8452560B2 (en) * 2006-12-29 2013-05-28 Teradyne, Inc. Identifying periodic jitter in a signal
WO2009058412A1 (en) * 2007-10-29 2009-05-07 Nec Laboratories America, Inc. Discovering optimal system configurations using decentralized probability based active sampling
US20100107009A1 (en) * 2008-10-24 2010-04-29 Advantest Corporation Deterministic component model judging apparatus, judging method, program, recording medium, test system and electronic device
US8379754B2 (en) 2009-03-31 2013-02-19 Infineon Technologies Ag Method and device for predicting a figure of merit from a distribution
US20130156261A1 (en) * 2011-12-16 2013-06-20 Alcatel-Lucent Usa Inc. Method and apparatus for object detection using compressive sensing
CN103616643B (zh) * 2013-11-15 2016-02-10 清华大学 分析电池运行工况的数据处理方法
US20200226305A1 (en) * 2019-01-08 2020-07-16 RTConfidence, Inc. System and method for performing simulations of uncertain future events
US11907300B2 (en) * 2019-07-17 2024-02-20 Schlumberger Technology Corporation Geologic formation operations relational framework

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5955523A (ja) * 1982-09-24 1984-03-30 Advantest Corp デジタルスペクトルアナライザ用信号発生器
US5057992A (en) * 1989-04-12 1991-10-15 Dentonaut Labs Ltd. Method and apparatus for controlling or processing operations of varying characteristics
US5572125A (en) * 1991-03-25 1996-11-05 Dunkel; Reinhard Correction and automated analysis of spectral and imaging data
US5452333A (en) * 1992-06-19 1995-09-19 Advanced Micro Devices, Inc. Digital jitter correction method and signal preconditioner
JP2994926B2 (ja) * 1993-10-29 1999-12-27 松下電器産業株式会社 有限状態機械作成方法とパターン照合機械作成方法とこれらを変形する方法および駆動方法
DE4440964C1 (de) * 1994-11-17 1996-07-11 Inst Rundfunktechnik Gmbh Anordnung zum Entzerren von zwei Datenströmen
US5751766A (en) * 1995-04-27 1998-05-12 Applied Signal Technology, Inc. Non-invasive digital communications test system
US5748491A (en) * 1995-12-20 1998-05-05 The Perkin-Elmer Corporation Deconvolution method for the analysis of data resulting from analytical separation processes
US5761254A (en) * 1996-01-31 1998-06-02 Advanced Micro Devices, Inc. Digital architecture for recovering NRZ/NRZI data
US5751852A (en) * 1996-04-29 1998-05-12 Xerox Corporation Image structure map data structure for spatially indexing an imgage
US6278961B1 (en) * 1997-07-02 2001-08-21 Nonlinear Solutions, Inc. Signal and pattern detection or classification by estimation of continuous dynamical models
US5987444A (en) * 1997-09-23 1999-11-16 Lo; James Ting-Ho Robust neutral systems
US6298315B1 (en) * 1998-12-11 2001-10-02 Wavecrest Corporation Method and apparatus for analyzing measurements
US6285720B1 (en) * 1999-05-28 2001-09-04 W J Communications, Inc. Method and apparatus for high data rate wireless communications over wavefield spaces
AU2755401A (en) * 1999-12-30 2001-07-16 Bandspeed, Inc. Approach for processing data received from a communications channel
US6678386B2 (en) * 2000-03-13 2004-01-13 Resistance Technology, Inc. Programmable module
WO2002010705A2 (en) * 2000-08-01 2002-02-07 Wavecrest Corporation Electromagnetic and optical analyzer
US6622117B2 (en) * 2001-05-14 2003-09-16 International Business Machines Corporation EM algorithm for convolutive independent component analysis (CICA)
US6662140B2 (en) * 2001-06-12 2003-12-09 Rolls-Royce Canada Limited Fuzzy logic estimator for minimizing signal measurement inaccuracy effects in a signal processing system
US6832172B2 (en) * 2001-06-15 2004-12-14 Tektronix, Inc. Apparatus and method for spectrum analysis-based serial data jitter measurement
GB2379016A (en) * 2001-07-27 2003-02-26 Hewlett Packard Co Portable apparatus monitoring reaction of user to music
US7016805B2 (en) * 2001-12-14 2006-03-21 Wavecrest Corporation Method and apparatus for analyzing a distribution
US6853933B2 (en) * 2002-02-26 2005-02-08 Tektronix, Inc. Method of identifying spectral impulses for Rj Dj separation
KR100471006B1 (ko) * 2002-07-24 2005-03-10 삼성전자주식회사 고속 데이터 출력 소자의 지터 측정 장치 및 토탈 지터측정방법
US7254168B2 (en) * 2002-10-29 2007-08-07 Tektronix, Inc. Method for decomposing timing jitter on arbitrary serial data sequences
US6898535B2 (en) * 2003-10-14 2005-05-24 Agilent Technologies, Inc. Method and apparatus for decomposing signal jitter using multiple acquisitions
US7295604B2 (en) * 2003-11-24 2007-11-13 International Business Machines Corporation Method for determining jitter of a signal in a serial link and high speed serial link

Cited By (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006258529A (ja) * 2005-03-16 2006-09-28 Fujitsu Ten Ltd 電波到来方向推定装置及び方法
JP2006276019A (ja) * 2005-03-29 2006-10-12 Agilent Technol Inc ジッタのランダム成分とデタミニスティック成分の分離
WO2007108493A1 (ja) * 2006-03-21 2007-09-27 Advantest Corporation 確率密度関数分離装置、確率密度関数分離方法、試験装置、ビット誤り率測定装置、電子デバイス、及びプログラム
WO2007108492A1 (ja) * 2006-03-21 2007-09-27 Advantest Corporation 確率密度関数分離装置、確率密度関数分離方法、ノイズ分離装置、ノイズ分離方法、試験装置、試験方法、算出装置、算出方法、プログラム、及び記録媒体
US7856463B2 (en) 2006-03-21 2010-12-21 Advantest Corporation Probability density function separating apparatus, probability density function separating method, testing apparatus, bit error rate measuring apparatus, electronic device, and program
US7949484B2 (en) 2006-03-21 2011-05-24 Advantest Corporation Probability density function separating apparatus, probability density function separating method, noise separating apparatus, noise separating method, testing apparatus, testing method, calculating apparatus, calculating method, program, and recording medium
WO2008018588A1 (fr) * 2006-08-10 2008-02-14 Advantest Corporation Séparateur de fonction de probabilité de densité, procédé de séparation de fonction de probabilité de densité, et programme, testeur, dispositif de mesure du taux d'erreurs sur bits, dispositif électronique et dispositif de mesure de la fonction de transfert de
WO2008018587A1 (fr) * 2006-08-10 2008-02-14 Advantest Corporation Séparateur de bruit, procédé de séparation de bruit, séparateur de fonction de densité de probabilité, procédé de séparation de fonction de densité de probabilité, et testeur, dispositif électronique, programme, et support d'enregistr
US7809516B2 (en) 2006-08-10 2010-10-05 Advantest Corporation Probability density function separating apparatus, probability density function separating method, program, testing apparatus, bit error rate measuring apparatus, electronic device, and jitter transfer function measuring apparatus
US7930139B2 (en) 2007-08-10 2011-04-19 Advantest Corporation Probability density function separating apparatus, probability density function separating method, program, testing apparatus, bit error rate measuring apparatus, electronic device, and jitter transfer function measuring apparatus
US8121815B2 (en) 2007-08-10 2012-02-21 Advantest Corporation Noise separating apparatus, noise separating method, probability density function separating apparatus, probability density function separating method, testing apparatus, electronic device, program, and recording medium

Also Published As

Publication number Publication date
EP1464027A1 (en) 2004-10-06
KR20040083066A (ko) 2004-09-30
US7016805B2 (en) 2006-03-21
US20030115017A1 (en) 2003-06-19
WO2003052670A1 (en) 2003-06-26
AU2002359692A1 (en) 2003-06-30

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