JP2005509149A - 自己校正用慣性測定システムの方法及び装置 - Google Patents

自己校正用慣性測定システムの方法及び装置 Download PDF

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Publication number
JP2005509149A
JP2005509149A JP2003542866A JP2003542866A JP2005509149A JP 2005509149 A JP2005509149 A JP 2005509149A JP 2003542866 A JP2003542866 A JP 2003542866A JP 2003542866 A JP2003542866 A JP 2003542866A JP 2005509149 A JP2005509149 A JP 2005509149A
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Prior art keywords
inertial measurement
measurement unit
output
processor
calibration
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JP2003542866A
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Japanese (ja)
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JP2005509149A5 (enExample
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ハンゼ，ジョエル・ジー
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Honeywell International Inc
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Honeywell International Inc
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Publication of JP2005509149A publication Critical patent/JP2005509149A/ja
Publication of JP2005509149A5 publication Critical patent/JP2005509149A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C25/00—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass
    • G01C25/005—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass initial alignment, calibration or starting-up of inertial devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
    • G01P21/00—Testing or calibrating of apparatus or devices covered by the preceding groups

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Indication And Recording Devices For Special Purposes And Tariff Metering Devices (AREA)
  • Navigation (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
JP2003542866A 2001-11-06 2002-11-05 自己校正用慣性測定システムの方法及び装置 Withdrawn JP2005509149A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/011,459 US6778924B2 (en) 2001-11-06 2001-11-06 Self-calibrating inertial measurement system method and apparatus
PCT/US2002/035447 WO2003040656A1 (en) 2001-11-06 2002-11-05 Self-calibrating inertial measurement system method and apparatus

Publications (2)

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JP2005509149A true JP2005509149A (ja) 2005-04-07
JP2005509149A5 JP2005509149A5 (enExample) 2005-12-22

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US (2) US6778924B2 (enExample)
EP (1) EP1442272A1 (enExample)
JP (1) JP2005509149A (enExample)
WO (1) WO2003040656A1 (enExample)

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JP2006514294A (ja) * 2003-03-17 2006-04-27 ノースロップ グルマン コーポレーション 力に依存するジャイロスコープの感度を測定する方法
JP2008514951A (ja) * 2004-10-05 2008-05-08 マイクロインフィニティー、 インコーポレイテッド 動作装置制御方法およびその装置
JP2017533441A (ja) * 2014-09-02 2017-11-09 チャンヂョウ スパイダーセンス インテリジェント テクノロジー リミテッド 慣性センサ装置

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Publication number Priority date Publication date Assignee Title
JP2006514294A (ja) * 2003-03-17 2006-04-27 ノースロップ グルマン コーポレーション 力に依存するジャイロスコープの感度を測定する方法
JP2008514951A (ja) * 2004-10-05 2008-05-08 マイクロインフィニティー、 インコーポレイテッド 動作装置制御方法およびその装置
JP2017533441A (ja) * 2014-09-02 2017-11-09 チャンヂョウ スパイダーセンス インテリジェント テクノロジー リミテッド 慣性センサ装置

Also Published As

Publication number Publication date
US20030084704A1 (en) 2003-05-08
EP1442272A1 (en) 2004-08-04
WO2003040656A1 (en) 2003-05-15
US6778924B2 (en) 2004-08-17
US20040211238A1 (en) 2004-10-28
US6968281B2 (en) 2005-11-22

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