JP2005503016A5 - - Google Patents
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- Publication number
- JP2005503016A5 JP2005503016A5 JP2003527774A JP2003527774A JP2005503016A5 JP 2005503016 A5 JP2005503016 A5 JP 2005503016A5 JP 2003527774 A JP2003527774 A JP 2003527774A JP 2003527774 A JP2003527774 A JP 2003527774A JP 2005503016 A5 JP2005503016 A5 JP 2005503016A5
- Authority
- JP
- Japan
- Prior art keywords
- pressure
- pressure chamber
- substrate holder
- substrate
- assembly
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/951,354 US6666928B2 (en) | 2001-09-13 | 2001-09-13 | Methods and apparatus for holding a substrate in a pressure chamber |
| PCT/US2002/024003 WO2003023826A2 (en) | 2001-09-13 | 2002-07-30 | Methods and apparatus for holding a substrate in a pressure chamber |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005503016A JP2005503016A (ja) | 2005-01-27 |
| JP2005503016A5 true JP2005503016A5 (OSRAM) | 2006-01-05 |
| JP4455880B2 JP4455880B2 (ja) | 2010-04-21 |
Family
ID=25491592
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003527774A Expired - Fee Related JP4455880B2 (ja) | 2001-09-13 | 2002-07-30 | 圧力チャンバ内に基板を保持する方法および装置 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US6666928B2 (OSRAM) |
| EP (1) | EP1425779A2 (OSRAM) |
| JP (1) | JP4455880B2 (OSRAM) |
| KR (1) | KR20040036942A (OSRAM) |
| CN (1) | CN1585998A (OSRAM) |
| TW (1) | TW582070B (OSRAM) |
| WO (1) | WO2003023826A2 (OSRAM) |
Families Citing this family (44)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030139057A1 (en) * | 2002-01-18 | 2003-07-24 | Richard Novak | Process and apparatus for removal of photoresist from semiconductor wafers |
| US20080011421A1 (en) * | 2002-04-26 | 2008-01-17 | Accretech Usa, Inc. | Processing chamber having labyrinth seal |
| JP3995617B2 (ja) * | 2003-03-03 | 2007-10-24 | オルボテック リミテッド | 空気浮上装置 |
| US7108001B2 (en) * | 2003-04-03 | 2006-09-19 | Keith Pope | Method and apparatus for rotation of a workpiece in supercritical fluid solutions for removing photo resist, residues and particles therefrom |
| WO2004103699A2 (en) * | 2003-05-16 | 2004-12-02 | Garlock Sealing Technologies, Inc. | Composite plastic material |
| US20060162740A1 (en) * | 2005-01-21 | 2006-07-27 | Cerionx, Inc. | Method and apparatus for cleaning and surface conditioning objects using non-equilibrium atmospheric pressure plasma |
| US8092644B2 (en) * | 2003-06-16 | 2012-01-10 | Ionfield Systems, Llc | Method and apparatus for cleaning and surface conditioning objects using plasma |
| US8092643B2 (en) * | 2003-06-16 | 2012-01-10 | Ionfield Systems, Llc | Method and apparatus for cleaning and surface conditioning objects using plasma |
| US20060272675A1 (en) * | 2005-06-02 | 2006-12-07 | Cerionx, Inc. | Method and apparatus for cleaning and surface conditioning objects using plasma |
| US20060272674A1 (en) * | 2005-06-02 | 2006-12-07 | Cerionx, Inc. | Method and apparatus for cleaning and surface conditioning objects using plasma |
| EP1631701A4 (en) * | 2003-06-16 | 2009-01-07 | Cerionx Inc | APPARATUS WITH NON-THERMAL ATMOSPHERIC PRESSURE PLASMA FOR CLEANING AND STERILIZING THE SURFACE OF PROBES, CANNULAS, PEN TOOLS, PIPETTES AND SPRAY HEADS |
| US8366871B2 (en) * | 2003-06-16 | 2013-02-05 | Ionfield Holdings, Llc | Method and apparatus for cleaning and surface conditioning objects using plasma |
| US20060162741A1 (en) * | 2005-01-26 | 2006-07-27 | Cerionx, Inc. | Method and apparatus for cleaning and surface conditioning objects with plasma |
| WO2005004256A2 (en) * | 2003-06-27 | 2005-01-13 | Ultracell Corporation | Annular fuel processor and methods |
| WO2005097363A1 (en) * | 2004-04-05 | 2005-10-20 | Sc Fluid Technologies, Inc. | Loadbearing platform with fluid support, isolation and rotation |
| US20060065189A1 (en) * | 2004-09-30 | 2006-03-30 | Darko Babic | Method and system for homogenization of supercritical fluid in a high pressure processing system |
| US7445015B2 (en) * | 2004-09-30 | 2008-11-04 | Lam Research Corporation | Cluster tool process chamber having integrated high pressure and vacuum chambers |
| WO2006091285A2 (en) * | 2005-01-20 | 2006-08-31 | Cerionx, Inc. | Method and apparatus for cleaning and surface conditioning objects using plasma |
| US7380984B2 (en) * | 2005-03-28 | 2008-06-03 | Tokyo Electron Limited | Process flow thermocouple |
| US7524383B2 (en) * | 2005-05-25 | 2009-04-28 | Tokyo Electron Limited | Method and system for passivating a processing chamber |
| WO2006130779A2 (en) * | 2005-06-02 | 2006-12-07 | Cerionx, Inc. | Method and apparatus for cleaning and surface conditioning objects using plasma |
| US10493740B2 (en) * | 2005-06-22 | 2019-12-03 | Roctool | Device and method for compacting and consolidation of a part in composite material with a thermoplastic matrix reinforced by continuous fibers, particularly fibers of natural origin |
| KR100753493B1 (ko) * | 2006-01-21 | 2007-08-31 | 서강대학교산학협력단 | 세정장치 |
| US9117870B2 (en) | 2008-03-27 | 2015-08-25 | Lam Research Corporation | High throughput cleaner chamber |
| JP2010148632A (ja) * | 2008-12-25 | 2010-07-08 | Sharp Corp | 洗浄装置 |
| US9166139B2 (en) * | 2009-05-14 | 2015-10-20 | The Neothermal Energy Company | Method for thermally cycling an object including a polarizable material |
| KR101149333B1 (ko) * | 2009-10-23 | 2012-05-23 | 주성엔지니어링(주) | 기판 처리 장치 |
| US8893642B2 (en) | 2010-03-24 | 2014-11-25 | Lam Research Corporation | Airflow management for low particulate count in a process tool |
| DE102010055675A1 (de) * | 2010-12-22 | 2012-06-28 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Haltevorrichtung für Substrate sowie Verfahren zur Beschichtung eines Substrates |
| TWI500482B (zh) * | 2011-03-24 | 2015-09-21 | Nat Univ Tsing Hua | 利用離心資源之真空裝置 |
| KR101874901B1 (ko) | 2011-12-07 | 2018-07-06 | 삼성전자주식회사 | 기판 건조 장치 및 방법 |
| TWI689004B (zh) * | 2012-11-26 | 2020-03-21 | 美商應用材料股份有限公司 | 用於高深寬比半導體元件結構具有污染物去除之無黏附乾燥處理 |
| US9937475B2 (en) | 2013-03-27 | 2018-04-10 | University Of Washington Through Its Center For Commercialization | Dynamic seal to enable movement of a film or fiber through a pressurized space while maintaining a desired pressure |
| US20150083042A1 (en) * | 2013-09-26 | 2015-03-26 | Applied Materials, Inc. | Rotatable substrate support having radio frequency applicator |
| KR20150064993A (ko) | 2013-12-04 | 2015-06-12 | 삼성전자주식회사 | 반도체 제조 장치 |
| JP6015738B2 (ja) * | 2014-11-25 | 2016-10-26 | 東京エレクトロン株式会社 | 処理装置、処理方法及び記憶媒体 |
| JP6422827B2 (ja) * | 2015-06-15 | 2018-11-14 | 株式会社Screenホールディングス | 基板処理装置 |
| CN106252258B (zh) * | 2015-06-15 | 2018-12-07 | 株式会社思可林集团 | 基板处理装置 |
| KR102580005B1 (ko) | 2016-02-16 | 2023-09-18 | 에베 그룹 에. 탈너 게엠베하 | 기판을 접합하기 위한 방법 및 장치 |
| WO2017176419A1 (en) * | 2016-04-08 | 2017-10-12 | Applied Materials, Inc. | Vacuum chuck pressure control system |
| KR102400894B1 (ko) * | 2017-06-30 | 2022-05-24 | 주식회사 케이씨텍 | 기판 처리용 챔버 및 기판 처리 방법 |
| WO2019210135A1 (en) | 2018-04-28 | 2019-10-31 | Applied Materials, Inc. | In-situ wafer rotation for carousel processing chambers |
| KR102510922B1 (ko) * | 2021-06-24 | 2023-03-16 | 주식회사 테스 | 실링유닛 및 이를 구비한 기판처리장치 |
| NL2033951B1 (en) * | 2023-01-11 | 2024-07-18 | Levitech B V | System for treating an individual wafer manufactured from semiconductor material, and methods |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5496901A (en) | 1992-03-27 | 1996-03-05 | University Of North Carolina | Method of making fluoropolymers |
| US5279926A (en) * | 1992-05-06 | 1994-01-18 | International Business Machines Corporation | Method and apparatus for removing vapor from a pressurized sprayed liquid in the manufacture of semiconductor integrated circuits |
| US5324540A (en) * | 1992-08-17 | 1994-06-28 | Tokyo Electron Limited | System and method for supporting and rotating substrates in a process chamber |
| US5514220A (en) | 1992-12-09 | 1996-05-07 | Wetmore; Paula M. | Pressure pulse cleaning |
| EP0681317B1 (en) | 1994-04-08 | 2001-10-17 | Texas Instruments Incorporated | Method for cleaning semiconductor wafers using liquefied gases |
| US5482564A (en) | 1994-06-21 | 1996-01-09 | Texas Instruments Incorporated | Method of unsticking components of micro-mechanical devices |
| US5705223A (en) * | 1994-07-26 | 1998-01-06 | International Business Machine Corp. | Method and apparatus for coating a semiconductor wafer |
| US5522938A (en) | 1994-08-08 | 1996-06-04 | Texas Instruments Incorporated | Particle removal in supercritical liquids using single frequency acoustic waves |
| JPH08257469A (ja) | 1995-01-24 | 1996-10-08 | Canon Inc | 基板回転装置および基板処理装置 |
| DE19506404C1 (de) | 1995-02-23 | 1996-03-14 | Siemens Ag | Verfahren zum Freiätzen (Separieren) und Trocknen mikromechanischer Komponenten |
| JPH08330266A (ja) | 1995-05-31 | 1996-12-13 | Texas Instr Inc <Ti> | 半導体装置等の表面を浄化し、処理する方法 |
| US5783082A (en) | 1995-11-03 | 1998-07-21 | University Of North Carolina | Cleaning process using carbon dioxide as a solvent and employing molecularly engineered surfactants |
| US5861061A (en) * | 1996-06-21 | 1999-01-19 | Micron Technology, Inc. | Spin coating bowl |
| US5868856A (en) | 1996-07-25 | 1999-02-09 | Texas Instruments Incorporated | Method for removing inorganic contamination by chemical derivitization and extraction |
| US5868862A (en) | 1996-08-01 | 1999-02-09 | Texas Instruments Incorporated | Method of removing inorganic contamination by chemical alteration and extraction in a supercritical fluid media |
| US5908510A (en) | 1996-10-16 | 1999-06-01 | International Business Machines Corporation | Residue removal by supercritical fluids |
| US6149828A (en) | 1997-05-05 | 2000-11-21 | Micron Technology, Inc. | Supercritical etching compositions and method of using same |
| US6500605B1 (en) | 1997-05-27 | 2002-12-31 | Tokyo Electron Limited | Removal of photoresist and residue from substrate using supercritical carbon dioxide process |
| US6030663A (en) | 1997-05-30 | 2000-02-29 | Micell Technologies, Inc. | Surface treatment |
| US6001418A (en) | 1997-12-16 | 1999-12-14 | The University Of North Carolina At Chapel Hill | Spin coating method and apparatus for liquid carbon dioxide systems |
| US6067728A (en) | 1998-02-13 | 2000-05-30 | G.T. Equipment Technologies, Inc. | Supercritical phase wafer drying/cleaning system |
| US6242165B1 (en) | 1998-08-28 | 2001-06-05 | Micron Technology, Inc. | Supercritical compositions for removal of organic material and methods of using same |
| US6277753B1 (en) | 1998-09-28 | 2001-08-21 | Supercritical Systems Inc. | Removal of CMP residue from semiconductors using supercritical carbon dioxide process |
| TW504776B (en) | 1999-09-09 | 2002-10-01 | Mimasu Semiconductor Ind Co | Wafer rotary holding apparatus and wafer surface treatment apparatus with waste liquid recovery mechanism |
| JP5073902B2 (ja) | 1999-11-02 | 2012-11-14 | 東京エレクトロン株式会社 | 多数のワークピースを超臨界処理する方法及び装置 |
-
2001
- 2001-09-13 US US09/951,354 patent/US6666928B2/en not_active Expired - Lifetime
-
2002
- 2002-05-24 TW TW091111044A patent/TW582070B/zh not_active IP Right Cessation
- 2002-07-30 WO PCT/US2002/024003 patent/WO2003023826A2/en not_active Ceased
- 2002-07-30 EP EP02756756A patent/EP1425779A2/en not_active Withdrawn
- 2002-07-30 JP JP2003527774A patent/JP4455880B2/ja not_active Expired - Fee Related
- 2002-07-30 KR KR10-2004-7003687A patent/KR20040036942A/ko not_active Withdrawn
- 2002-07-30 CN CNA028225236A patent/CN1585998A/zh active Pending
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