JP2005310942A5 - - Google Patents
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- Publication number
- JP2005310942A5 JP2005310942A5 JP2004123870A JP2004123870A JP2005310942A5 JP 2005310942 A5 JP2005310942 A5 JP 2005310942A5 JP 2004123870 A JP2004123870 A JP 2004123870A JP 2004123870 A JP2004123870 A JP 2004123870A JP 2005310942 A5 JP2005310942 A5 JP 2005310942A5
- Authority
- JP
- Japan
- Prior art keywords
- exposure apparatus
- projection exposure
- light
- optical system
- projection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 230000003287 optical effect Effects 0.000 claims 13
- 239000000758 substrate Substances 0.000 claims 6
- 210000001747 pupil Anatomy 0.000 claims 4
- 238000005286 illumination Methods 0.000 claims 3
- 238000003491 array Methods 0.000 claims 1
- 239000011521 glass Substances 0.000 claims 1
- 239000000463 material Substances 0.000 claims 1
- 239000010453 quartz Substances 0.000 claims 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims 1
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004123870A JP2005310942A (ja) | 2004-04-20 | 2004-04-20 | 露光装置、露光方法、及びそれを用いたデバイス製造方法 |
| US11/110,350 US7242457B2 (en) | 2004-04-20 | 2005-04-19 | Exposure apparatus and exposure method, and device manufacturing method using the same |
| EP05252428A EP1589378A3 (en) | 2004-04-20 | 2005-04-19 | Exposure apparatus and exposure method and device manufacturing method using the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004123870A JP2005310942A (ja) | 2004-04-20 | 2004-04-20 | 露光装置、露光方法、及びそれを用いたデバイス製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005310942A JP2005310942A (ja) | 2005-11-04 |
| JP2005310942A5 true JP2005310942A5 (enExample) | 2007-05-31 |
Family
ID=34940903
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004123870A Abandoned JP2005310942A (ja) | 2004-04-20 | 2004-04-20 | 露光装置、露光方法、及びそれを用いたデバイス製造方法 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7242457B2 (enExample) |
| EP (1) | EP1589378A3 (enExample) |
| JP (1) | JP2005310942A (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1716458B1 (en) | 2004-02-17 | 2011-06-01 | Carl Zeiss SMT GmbH | Illumination system for a microlithographic projection exposure apparatus |
| US20080225257A1 (en) * | 2007-03-13 | 2008-09-18 | Nikon Corporation | Optical integrator system, illumination optical apparatus, exposure apparatus, and device manufacturing method |
| JP4261591B2 (ja) * | 2007-03-30 | 2009-04-30 | アドバンスド・マスク・インスペクション・テクノロジー株式会社 | 照明光学装置および試料検査装置 |
| JP2009236819A (ja) * | 2008-03-28 | 2009-10-15 | Topcon Corp | 光学装置、フォトマスク検査装置および露光装置 |
| WO2013051147A1 (ja) * | 2011-10-07 | 2013-04-11 | キヤノン株式会社 | 画像取得装置の調整方法、画像取得装置および画像取得装置の製造方法 |
| KR101300733B1 (ko) * | 2012-01-12 | 2013-08-27 | 연세대학교 산학협력단 | 다중 병렬 공초점 시스템 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6404482B1 (en) * | 1992-10-01 | 2002-06-11 | Nikon Corporation | Projection exposure method and apparatus |
| US5724122A (en) | 1995-05-24 | 1998-03-03 | Svg Lithography Systems, Inc. | Illumination system having spatially separate vertical and horizontal image planes for use in photolithography |
| US5684566A (en) | 1995-05-24 | 1997-11-04 | Svg Lithography Systems, Inc. | Illumination system and method employing a deformable mirror and diffractive optical elements |
| JP3641767B2 (ja) | 1996-07-02 | 2005-04-27 | 信越石英株式会社 | 集積回路製造用露光装置 |
| JP3976083B2 (ja) | 1997-03-25 | 2007-09-12 | 信越石英株式会社 | 回路パターン露光用光学系 |
| AU6853598A (en) * | 1997-04-18 | 1998-11-13 | Nikon Corporation | Aligner, exposure method using the aligner, and method of manufacture of circuitdevice |
| DE19855106A1 (de) | 1998-11-30 | 2000-05-31 | Zeiss Carl Fa | Beleuchtungssystem für die VUV-Mikrolithographie |
| US6583937B1 (en) | 1998-11-30 | 2003-06-24 | Carl-Zeiss Stiftung | Illuminating system of a microlithographic projection exposure arrangement |
| DE10062579A1 (de) | 1999-12-15 | 2001-06-21 | Nikon Corp | Optischer Integrierer,optische Beleuchtungseinrichtung, Photolithographie-Belichtungseinrichtung,und Beobachtungseinrichtung |
| US6788389B2 (en) * | 2001-07-10 | 2004-09-07 | Nikon Corporation | Production method of projection optical system |
| JP3634782B2 (ja) * | 2001-09-14 | 2005-03-30 | キヤノン株式会社 | 照明装置、それを用いた露光装置及びデバイス製造方法 |
| JP4324957B2 (ja) * | 2002-05-27 | 2009-09-02 | 株式会社ニコン | 照明光学装置、露光装置および露光方法 |
| JP2004259786A (ja) * | 2003-02-24 | 2004-09-16 | Canon Inc | 露光装置 |
-
2004
- 2004-04-20 JP JP2004123870A patent/JP2005310942A/ja not_active Abandoned
-
2005
- 2005-04-19 EP EP05252428A patent/EP1589378A3/en not_active Withdrawn
- 2005-04-19 US US11/110,350 patent/US7242457B2/en not_active Expired - Fee Related
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