JP2005221373A - 元素分析装置 - Google Patents

元素分析装置 Download PDF

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Publication number
JP2005221373A
JP2005221373A JP2004029417A JP2004029417A JP2005221373A JP 2005221373 A JP2005221373 A JP 2005221373A JP 2004029417 A JP2004029417 A JP 2004029417A JP 2004029417 A JP2004029417 A JP 2004029417A JP 2005221373 A JP2005221373 A JP 2005221373A
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JP
Japan
Prior art keywords
optical system
measured
light
fluorescence
sample
Prior art date
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Pending
Application number
JP2004029417A
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English (en)
Japanese (ja)
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JP2005221373A5 (enExample
Inventor
Yoshio Tanaka
祥夫 田中
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Canon Electron Tubes and Devices Co Ltd
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Toshiba Corp
Toshiba Electron Tubes and Devices Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
Application filed by Toshiba Corp, Toshiba Electron Tubes and Devices Co Ltd filed Critical Toshiba Corp
Priority to JP2004029417A priority Critical patent/JP2005221373A/ja
Publication of JP2005221373A publication Critical patent/JP2005221373A/ja
Publication of JP2005221373A5 publication Critical patent/JP2005221373A5/ja
Pending legal-status Critical Current

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  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2004029417A 2004-02-05 2004-02-05 元素分析装置 Pending JP2005221373A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004029417A JP2005221373A (ja) 2004-02-05 2004-02-05 元素分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004029417A JP2005221373A (ja) 2004-02-05 2004-02-05 元素分析装置

Publications (2)

Publication Number Publication Date
JP2005221373A true JP2005221373A (ja) 2005-08-18
JP2005221373A5 JP2005221373A5 (enExample) 2007-03-22

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ID=34997127

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JP2004029417A Pending JP2005221373A (ja) 2004-02-05 2004-02-05 元素分析装置

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JP (1) JP2005221373A (enExample)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007003510A (ja) * 2005-05-26 2007-01-11 Toshiba Corp 元素分析方法および装置、並びに分析試料作成方法
JP5605372B2 (ja) * 2009-12-09 2014-10-15 株式会社村田製作所 空隙配置構造体が保持された分光測定用デバイス、それに用いられる枠部材、および、分光器
CN104181131A (zh) * 2014-08-15 2014-12-03 中国科学院上海技术物理研究所 红外调制光致发光二维成像光路自动定位校准装置
KR20160065033A (ko) * 2014-11-28 2016-06-08 광주과학기술원 액체 내 오염물질의 화학적 원소 분석장치 및 분석방법
WO2016085313A3 (ko) * 2014-11-28 2016-07-21 광주과학기술원 액체 내 오염물질의 화학적 원소 분석장치 및 분석방법
CN117222090A (zh) * 2023-07-18 2023-12-12 中国人民解放军国防科技大学 可调节高空间分辨率的平面等离子体速度测量系统及方法

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007003510A (ja) * 2005-05-26 2007-01-11 Toshiba Corp 元素分析方法および装置、並びに分析試料作成方法
JP5605372B2 (ja) * 2009-12-09 2014-10-15 株式会社村田製作所 空隙配置構造体が保持された分光測定用デバイス、それに用いられる枠部材、および、分光器
CN104181131A (zh) * 2014-08-15 2014-12-03 中国科学院上海技术物理研究所 红外调制光致发光二维成像光路自动定位校准装置
KR20160065033A (ko) * 2014-11-28 2016-06-08 광주과학기술원 액체 내 오염물질의 화학적 원소 분석장치 및 분석방법
WO2016085313A3 (ko) * 2014-11-28 2016-07-21 광주과학기술원 액체 내 오염물질의 화학적 원소 분석장치 및 분석방법
KR101723535B1 (ko) * 2014-11-28 2017-04-06 광주과학기술원 액체 내 오염물질의 화학적 원소 분석장치 및 분석방법
CN107075944A (zh) * 2014-11-28 2017-08-18 光州科学技术院 液体内污染物质的化学元素分析装置以及分析方法
US20170322162A1 (en) * 2014-11-28 2017-11-09 Gwangju Institute Of Science And Technology Chemical element analysis device and method for contaminants in liquid
US10175173B2 (en) 2014-11-28 2019-01-08 Gwangju Institute Of Science And Technology Chemical element analysis device and method for contaminants in liquid
CN117222090A (zh) * 2023-07-18 2023-12-12 中国人民解放军国防科技大学 可调节高空间分辨率的平面等离子体速度测量系统及方法

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