JP2005203384A5 - - Google Patents
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- Publication number
- JP2005203384A5 JP2005203384A5 JP2005107011A JP2005107011A JP2005203384A5 JP 2005203384 A5 JP2005203384 A5 JP 2005203384A5 JP 2005107011 A JP2005107011 A JP 2005107011A JP 2005107011 A JP2005107011 A JP 2005107011A JP 2005203384 A5 JP2005203384 A5 JP 2005203384A5
- Authority
- JP
- Japan
- Prior art keywords
- sample
- micro
- processing
- sample stage
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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- 239000000523 sample Substances 0.000 claims 132
- 239000004065 semiconductor Substances 0.000 claims 28
- 238000010884 ion-beam technique Methods 0.000 claims 24
- 230000001678 irradiating effect Effects 0.000 claims 19
- 238000000034 method Methods 0.000 claims 18
- 238000010894 electron beam technology Methods 0.000 claims 12
- 230000003287 optical effect Effects 0.000 claims 12
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005107011A JP3904020B2 (ja) | 2005-04-04 | 2005-04-04 | 微小試料加工観察方法及び装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005107011A JP3904020B2 (ja) | 2005-04-04 | 2005-04-04 | 微小試料加工観察方法及び装置 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004317452A Division JP4259454B2 (ja) | 2004-11-01 | 2004-11-01 | 微小試料加工観察装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005203384A JP2005203384A (ja) | 2005-07-28 |
| JP2005203384A5 true JP2005203384A5 (https=) | 2006-12-21 |
| JP3904020B2 JP3904020B2 (ja) | 2007-04-11 |
Family
ID=34824944
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005107011A Expired - Lifetime JP3904020B2 (ja) | 2005-04-04 | 2005-04-04 | 微小試料加工観察方法及び装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP3904020B2 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE102020203580B4 (de) | 2020-03-20 | 2021-10-07 | Carl Zeiss Microscopy Gmbh | Verfahren zum Ändern der Raum-Orientierung einer Mikroprobe in einem Mikroskop-System, sowie Computerprogrammprodukt |
-
2005
- 2005-04-04 JP JP2005107011A patent/JP3904020B2/ja not_active Expired - Lifetime
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