JP2005191503A5 - - Google Patents
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- Publication number
- JP2005191503A5 JP2005191503A5 JP2003434733A JP2003434733A JP2005191503A5 JP 2005191503 A5 JP2005191503 A5 JP 2005191503A5 JP 2003434733 A JP2003434733 A JP 2003434733A JP 2003434733 A JP2003434733 A JP 2003434733A JP 2005191503 A5 JP2005191503 A5 JP 2005191503A5
- Authority
- JP
- Japan
- Prior art keywords
- laser beam
- wafer
- exposure method
- laser
- oscillation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 230000010355 oscillation Effects 0.000 claims 2
- 230000003595 spectral effect Effects 0.000 claims 2
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003434733A JP2005191503A (ja) | 2003-12-26 | 2003-12-26 | レーザ装置、露光方法及び装置 |
| EP04030471A EP1548501A3 (en) | 2003-12-26 | 2004-12-22 | Laser unit, exposure apparatus for micro-lithiographie and associated method |
| US11/022,399 US20050190801A1 (en) | 2003-12-26 | 2004-12-23 | Laser unit, exposure apparatus and method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003434733A JP2005191503A (ja) | 2003-12-26 | 2003-12-26 | レーザ装置、露光方法及び装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005191503A JP2005191503A (ja) | 2005-07-14 |
| JP2005191503A5 true JP2005191503A5 (enExample) | 2007-03-08 |
Family
ID=34545111
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003434733A Withdrawn JP2005191503A (ja) | 2003-12-26 | 2003-12-26 | レーザ装置、露光方法及び装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US20050190801A1 (enExample) |
| EP (1) | EP1548501A3 (enExample) |
| JP (1) | JP2005191503A (enExample) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4580338B2 (ja) * | 2004-12-23 | 2010-11-10 | エーエスエムエル ネザーランズ ビー.ブイ. | リソグラフィ装置、エキシマ・レーザ、およびデバイス製造方法 |
| JP2007250947A (ja) | 2006-03-17 | 2007-09-27 | Canon Inc | 露光装置および像面検出方法 |
| JP2007329432A (ja) * | 2006-06-09 | 2007-12-20 | Canon Inc | 露光装置 |
| KR100809717B1 (ko) * | 2007-01-12 | 2008-03-06 | 삼성전자주식회사 | 더블 패터닝된 패턴의 전기적 특성을 콘트롤할 수 있는반도체 소자 및 그의 패턴 콘트롤방법 |
| JP2009141154A (ja) | 2007-12-06 | 2009-06-25 | Canon Inc | 走査露光装置及びデバイス製造方法 |
| US9715180B2 (en) | 2013-06-11 | 2017-07-25 | Cymer, Llc | Wafer-based light source parameter control |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01106426A (ja) * | 1987-10-19 | 1989-04-24 | Canon Inc | 露光装置 |
| US5191374A (en) * | 1988-11-17 | 1993-03-02 | Nikon Corporation | Exposure control apparatus |
| JP2844696B2 (ja) * | 1989-07-24 | 1999-01-06 | 株式会社ニコン | レーザ処理装置 |
| US5343270A (en) * | 1990-10-30 | 1994-08-30 | Nikon Corporation | Projection exposure apparatus |
| US6252647B1 (en) * | 1990-11-15 | 2001-06-26 | Nikon Corporation | Projection exposure apparatus |
| US5450436A (en) * | 1992-11-20 | 1995-09-12 | Kabushiki Kaisha Komatsu Seisakusho | Laser gas replenishing apparatus and method in excimer laser system |
| JPH07120326A (ja) * | 1993-10-22 | 1995-05-12 | Komatsu Ltd | 波長検出装置 |
| EP1452894A3 (en) * | 1996-09-02 | 2005-02-09 | Nippon Telegraph and Telephone Corporation | Optical signal processing apparatus and optical signal processing method |
| JP4102457B2 (ja) * | 1997-05-09 | 2008-06-18 | 株式会社小松製作所 | 狭帯域化レーザ装置 |
| US6721340B1 (en) * | 1997-07-22 | 2004-04-13 | Cymer, Inc. | Bandwidth control technique for a laser |
| US6529531B1 (en) * | 1997-07-22 | 2003-03-04 | Cymer, Inc. | Fast wavelength correction technique for a laser |
| US6078599A (en) * | 1997-07-22 | 2000-06-20 | Cymer, Inc. | Wavelength shift correction technique for a laser |
| US6496528B2 (en) * | 1999-09-03 | 2002-12-17 | Cymer, Inc. | Line narrowing unit with flexural grating mount |
| JP4497650B2 (ja) * | 2000-04-26 | 2010-07-07 | キヤノン株式会社 | レーザ発振装置、露光装置および半導体デバイス製造方法 |
| DE10146583A1 (de) * | 2001-09-21 | 2003-04-17 | Siemens Ag | Vorrichtung und Verfahren zum optischen Abtasten einer Substratscheibe |
-
2003
- 2003-12-26 JP JP2003434733A patent/JP2005191503A/ja not_active Withdrawn
-
2004
- 2004-12-22 EP EP04030471A patent/EP1548501A3/en not_active Withdrawn
- 2004-12-23 US US11/022,399 patent/US20050190801A1/en not_active Abandoned
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