JP2005129783A - Semiconductor resin sealing die - Google Patents

Semiconductor resin sealing die Download PDF

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JP2005129783A
JP2005129783A JP2003364656A JP2003364656A JP2005129783A JP 2005129783 A JP2005129783 A JP 2005129783A JP 2003364656 A JP2003364656 A JP 2003364656A JP 2003364656 A JP2003364656 A JP 2003364656A JP 2005129783 A JP2005129783 A JP 2005129783A
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substrate
mold
pin
resin sealing
resin
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JP4153862B2 (en
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Makoto Horiike
誠 堀池
Kosaku Masuda
耕作 益田
Taiji Mitani
泰司 三谷
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I Pex Inc
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Dai Ichi Seiko Co Ltd
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  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide an expensive semiconductor resin sealing die which can eliminate the need of a flash removal step and solve problems of scratches in the contact of a substrate caused by resin flashes and a connection failure caused by the deposition of the resin flashes, and can prevent wire damage caused by the warpage of the substrate in a resin filling direction by a simple structure and high versatility, by removing resin flashes resulting from a gap between the die and the substrate. <P>SOLUTION: Approaching pins 1 each having a tilted surface in its lower end are provided to be projected at positions which are located at edges of opposing surfaces of an upper cavity block 23 adjacent to cull blocks 25, and correspond to positioning holes 71a of a substrate 70. When the substrate 70 is clamped by the upper and lower cavity blocks 23, 53, the tilted surface provided in the lower end 1a of the approaching pin 1 is pushed against the opening edge of the positioning hole 71a of the substrate 70 so that the substrate 70 is slidably moved while being pushed. Consequently, the side end face 72 of the substrate 70 is pushed against the inner side surface of the lower cavity block 53. <P>COPYRIGHT: (C)2005,JPO&NCIPI

Description

本発明は、集積回路や大規模集積回路などの半導体装置であるICチップ(以下、「半導体チップ」という。)を、これを搭載した基板と共に樹脂で封止成形する半導体樹脂封止用金型に関する。特に、樹脂封止用金型と基板との隙間に樹脂バリが発生するのを防止できる半導体樹脂封止用金型に関する。なお、本発明における基板には、特に明示しない限り、リードフレーム、サブストレート等の樹脂製基板、TABテープ、セラミック製基板等を含む。   The present invention relates to a semiconductor resin sealing mold for sealing and molding an IC chip (hereinafter referred to as “semiconductor chip”), which is a semiconductor device such as an integrated circuit or a large-scale integrated circuit, with a substrate on which the IC chip is mounted. About. In particular, the present invention relates to a semiconductor resin sealing mold that can prevent the occurrence of resin burrs in the gap between the resin sealing mold and the substrate. The substrates in the present invention include resin substrates such as lead frames and substrates, TAB tapes, ceramic substrates and the like unless otherwise specified.

従来、半導体樹脂封止用金型としては、例えば、特許文献1の従来例を示す図5および図6において、半導体用リードフレーム14のピン穴8を下金型21に植設したゲージピン7に合せ入れて位置決めを行うものがある。しかし、半導体用リードフレーム14のピン穴8を前記下金型21のゲージピン7に合せ入れて位置決めを行うためには、前記ピン穴8と前記ゲージピン7との間にクリアランスを設ける必要があり、位置決め精度が低い。このため、図示しない上金型と半導体用リードフレーム14との間に隙間が発生し、その隙間から樹脂が侵入して樹脂バリが生じるという不具合があった。さらに、特許文献1では、第1図ないし第4図において、下金型11につきあてブロック5あるいはつきあてピン6のいずれか一方を設け、そのいずれか一方に前記半導体用リードフレーム4をつきあてることにより、位置決めする半導体装置用モールド成形機の金型を開示している。   Conventionally, as a semiconductor resin sealing mold, for example, in FIG. 5 and FIG. 6 showing the conventional example of Patent Document 1, the pin hole 8 of the semiconductor lead frame 14 is a gauge pin 7 implanted in the lower mold 21. There are some that perform positioning together. However, in order to align the pin hole 8 of the semiconductor lead frame 14 with the gauge pin 7 of the lower mold 21, it is necessary to provide a clearance between the pin hole 8 and the gauge pin 7. Positioning accuracy is low. For this reason, there is a problem that a gap is generated between the upper mold (not shown) and the semiconductor lead frame 14, and the resin enters from the gap and a resin burr is generated. Further, in Patent Document 1, in FIG. 1 to FIG. 4, either one of the contact block 5 or the contact pin 6 is provided for the lower mold 11, and the semiconductor lead frame 4 is attached to one of them. Accordingly, a mold for a semiconductor device molding machine for positioning is disclosed.

しかしながら、前記金型では、突き当てて位置決めしているにすぎず、位置決め後の微振動等で位置ずれが生じやすく、位置決め精度の低下のおそれがあった。また、特許文献1では、つきあてブロック5あるいはつきあてピン6のいずれか一方に半導体用リードフレーム4をつきあてるための駆動手段を設ける必要があり、自動的に半導体用リードフレーム4を位置決めできなかった。さらに、前記金型11では、つきあてブロック5あるいはつきあてピン6の反対側に配置したゲート2から溶融した樹脂をキャビティ内に充填して成形する。このため、樹脂圧でリードフレームが樹脂注入方向に圧縮されて反りやすく、ワイヤスイープ等によってボンディングワイヤが損傷するという問題点があった。 However, the mold is merely abutted and positioned, and positional deviation is likely to occur due to fine vibration after positioning, which may cause a decrease in positioning accuracy. Further, in Patent Document 1, it is necessary to provide a driving means for applying the semiconductor lead frame 4 to either the contact block 5 or the contact pin 6, and the semiconductor lead frame 4 can be automatically positioned. There wasn't. Further, in the mold 11, the resin melted from the gate 2 disposed on the opposite side of the contact block 5 or the contact pin 6 is filled in the cavity and molded. For this reason, there is a problem that the lead frame is compressed in the resin injection direction by the resin pressure and is easily warped, and the bonding wire is damaged by a wire sweep or the like.

前述の不具合を解消すべく、自動的に突き当てることによる位置決め手段としては、例えば、特許文献2の第1図(a)、(b)に示すように、ピン6にリードフレーム21の位置決め孔22を挿通して粗い位置決めを行った後、フレーム押え具25を回動して前記リードフレーム21を押圧することにより、所定の位置にスライド移動させて位置決めしていた。   For example, as shown in FIGS. 1 (a) and 1 (b) of Patent Document 2, as positioning means by automatically abutting in order to eliminate the above-mentioned problems, positioning holes of the lead frame 21 are provided in the pins 6. After performing the rough positioning by inserting 22, the frame presser 25 is rotated to press the lead frame 21, and is slid to a predetermined position for positioning.

しかしながら、特許文献2にかかる成形装置では、剛性の大きいリードフレームに適用できるだけであり、撓みやすい樹脂製基板に適用することは困難であり、汎用性に乏しかった。さらに、リードフレーム21を移動させるために特別なフレーム押え具25を設ける必要があるので、構造が複雑になり、コストアップするという問題点があった。
実開平3−73442号公報 特開平2−17652号公報
However, the molding apparatus according to Patent Document 2 can only be applied to a lead frame having high rigidity, is difficult to apply to a flexible resin substrate, and lacks versatility. Furthermore, since it is necessary to provide a special frame presser 25 in order to move the lead frame 21, there is a problem that the structure becomes complicated and the cost increases.
Japanese Utility Model Publication No. 3-73442 Japanese Patent Laid-Open No. 2-17652

本発明は、前記問題点に鑑み、金型と基板との間の隙間を原因とする樹脂バリを無くすことにより、バリ処理工程を不要とし、樹脂バリによって発生していた基板接点部の傷、樹脂バリの付着による接続不良を解消するものである。さらに、本発明は、樹脂の充填方向に生じていた基板の反りを原因とするボンディングワイヤの損傷を防止するとともに、構造が簡単で、汎用性の高い安価な半導体樹脂封止用金型を提供することを目的とする。   In view of the above problems, the present invention eliminates the resin burr caused by the gap between the mold and the substrate, thereby eliminating the burr processing step and scratching the substrate contact portion that has occurred due to the resin burr, This eliminates poor connection due to the adhesion of resin burrs. Furthermore, the present invention provides a semiconductor resin sealing mold that has a simple structure and high versatility while preventing damage to the bonding wire caused by the warping of the substrate that has occurred in the resin filling direction. The purpose is to do.

課題を解決するための手段と発明の効果Means for solving the problems and effects of the invention

本発明にかかる半導体樹脂封止用金型は、前記目的に鑑み、半導体素子を搭載した基板を一対の金型で挾持して形成されるキャビティ内に、前記金型のいずれかに隣接するカルブロックのカルからランナーを介して樹脂を充填して前記半導体素子を封止する半導体樹脂封止用金型において、前記カルブロックに隣接する金型の対向面のうち、前記カルブロック側の縁部に位置し、かつ、前記基板の位置決め用孔に対応する位置に、自由端部に傾斜面を有する寄せピンを突設し、一対の前記金型で前記基板をクランプする際に、前記寄せピンの自由端部に設けた傾斜面を前記基板の位置決め用孔の開口縁部に圧接させ、前記基板を押し付けつつスライド移動させることにより、前記基板の側端面を前記キャビティの内側面に圧接させる構成としてある。なお、本願発明において、キャビティとは、樹脂で封止する空間に限らず、基板等を収納する空間をも含む内部空間をいう。   In view of the above-mentioned object, a mold for semiconductor resin sealing according to the present invention includes a cavity adjacent to one of the molds in a cavity formed by holding a substrate on which a semiconductor element is mounted with a pair of molds. In a mold for semiconductor resin sealing, in which a semiconductor element is sealed by filling a resin through a runner from a cull of a block, an edge portion on a side of the cull block among opposed surfaces of the mold adjacent to the cull block At the position corresponding to the positioning hole of the substrate, and a protruding pin having an inclined surface at a free end, and when the substrate is clamped by a pair of the molds, A structure in which the inclined surface provided at the free end of the substrate is brought into pressure contact with the opening edge of the positioning hole of the substrate, and the substrate is slid while being pressed, whereby the side end surface of the substrate is pressed against the inner surface of the cavity. age A. In the present invention, the cavity is not limited to a space sealed with resin, but refers to an internal space including a space for storing a substrate or the like.

または、本発明にかかる半導体樹脂封止用金型は、半導体素子を搭載した基板を下金型および上金型で挾持して形成されるキャビティ内に、前記上金型に隣接するカルブロックのカルからランナーを介して樹脂を充填して前記半導体素子を封止する半導体樹脂封止用金型において、前記カルブロックに隣接する上金型の対向面のうち、前記カルブロック側の縁部に位置し、かつ、前記基板の位置決め用孔に対応する位置に、下端部に傾斜面を有する寄せピンを突設し、前記上,下金型で前記基板をクランプする際に、前記寄せピンの下端部に設けた傾斜面を前記基板の位置決め用孔の開口縁部に圧接させ、前記基板を押し付けつつスライド移動させることにより、前記基板の側端面を前記キャビティの内側面に圧接させる構成であってもよい。   Alternatively, the semiconductor resin sealing mold according to the present invention is a cavity block formed by holding a substrate on which a semiconductor element is mounted with a lower mold and an upper mold, and is adjacent to the upper mold. In a semiconductor resin sealing mold for sealing the semiconductor element by filling a resin through a runner from a cull, on the edge of the upper block adjacent to the cull block on the edge on the calblock side When a clamping pin having an inclined surface is projected at a lower end at a position corresponding to the positioning hole of the substrate and the substrate is clamped by the upper and lower molds, The inclined surface provided at the lower end is brought into pressure contact with the opening edge portion of the positioning hole of the substrate, and the substrate is slid while being pressed, whereby the side end surface of the substrate is pressed against the inner surface of the cavity. May

本発明によれば、基板の側端面とキャビティの内側面との間に隙間が生ぜず、樹脂の侵入による樹脂バリが生じない。このため、樹脂バリの除去処理作業が不要になるとともに、樹脂バリによって発生していた基板接点部の傷、樹脂バリの付着による接続不良を防止できる。
また、本発明によれば、カルブロック近傍に配置した寄せピンで基板の一端側を位置決めするので、基板に従来例のような反りが生じず、ワイヤースイープ等によるボンディングワイヤの損傷を防止できる。
さらに、一方の金型の所定位置に寄せピンを突設するだけで、基板を高い位置決め精度で位置決めでき、構造が簡単で、汎用性の高い安価な半導体樹脂封止用金型が得られるという効果がある。
According to the present invention, no gap is formed between the side end surface of the substrate and the inner side surface of the cavity, and no resin burr is generated due to the intrusion of the resin. This eliminates the need for a resin burr removal process and prevents connection defects due to scratches on the substrate contact portion and resin burr caused by the resin burr.
In addition, according to the present invention, since one end side of the substrate is positioned by the approach pin arranged in the vicinity of the cull block, the substrate is not warped as in the conventional example, and damage to the bonding wire due to wire sweep or the like can be prevented.
Furthermore, it is possible to position the substrate with high positioning accuracy simply by projecting a pin toward a predetermined position of one mold, and to obtain a semiconductor resin sealing mold with a simple structure and high versatility. effective.

本発明の実施形態としては、寄せピンを、筒状弾性部材を介して金型に植設しておいてもよい。
本実施形態によれば、寄せピンが軸心と直交する方向に弾性変形しやすくなり、調整の自由度が大きくなるとともに、過度な負荷による寄せピンの破損を防止できる。
As an embodiment of the present invention, a close pin may be implanted in a mold via a cylindrical elastic member.
According to the present embodiment, the contact pin is easily elastically deformed in a direction orthogonal to the axis, and the degree of freedom of adjustment is increased, and breakage of the contact pin due to an excessive load can be prevented.

他の実施形態としては、寄せピンの下端部を2分割するスリットを形成しておいてもよい。
本実施形態によれば、寄せピンの2分割した下端部の一方がより一層弾性変形しやすくなり、基板を所定の位置にスライド移動させるので、調整の自由度が大きくなるとともに、過度な負荷による寄せピンの破損を防止できる。
As other embodiment, you may form the slit which divides the lower end part of a close-up pin into two.
According to this embodiment, one of the two divided lower ends of the contact pin is more easily elastically deformed, and the substrate is slid to a predetermined position, so that the degree of freedom of adjustment is increased and an excessive load is applied. Breakage of the contact pin can be prevented.

別の実施形態としては、スリット内に弾性材を充填しておいてもよい。
本実施形態によれば、前記スリット内に樹脂等が侵入するおそれがなくなり、寄せピンの破損や成形不良等を未然に防止できるという効果がある。
In another embodiment, the slit may be filled with an elastic material.
According to the present embodiment, there is no possibility that a resin or the like enters the slit, and there is an effect that breakage of the contact pin or defective molding can be prevented in advance.

本発明にかかる半導体樹脂封止用金型の実施形態を図1ないし図10の添付図面にしたがって説明する。
第1実施形態にかかる半導体樹脂封止用金型は、図1ないし図6に示すように、大略、上型チェス20を組み込んだ上型モールドセット10と、下型チェス50を組み込んだ下型モールドセット30とで構成されている。
Embodiments of a semiconductor resin sealing mold according to the present invention will be described with reference to the accompanying drawings of FIGS.
As shown in FIGS. 1 to 6, the mold for semiconductor resin sealing according to the first embodiment is roughly an upper mold set 10 incorporating an upper mold chess 20 and a lower mold incorporating a lower mold chess 50. It consists of a mold set 30.

上型モールドセット10は、上型ベースプレート11の下面両側縁部にサイドブロック12,12を配置したものである。そして、前記サイドブロック12の対向する内向面にガイド用突条13,13をそれぞれ設け、後述する上型チェス20を側方からスライド嵌合できる構造となっている。   In the upper mold set 10, side blocks 12 and 12 are arranged on both side edges of the lower surface of the upper mold base plate 11. And the guide protrusions 13 and 13 are each provided in the inward surface which the said side block 12 opposes, and it has the structure which can carry out the slide fitting of the upper type | mold chess 20 mentioned later from the side.

前記上型チェス20は、ホルダーベースプレート21の上面中央にピンプレート(図示せず)およびエジェクタプレート26を順次積み重ねてあるとともに、その両側にチェス用スペースブロック27,27をそれぞれ配置し、嵌合用ガイド溝28を形成してある。一方、前記ホルダーベースプレート21は、図3に示すように、その下面中央にカル24を備えたカルブロック25を配置してあるとともに、その両側にキャビティ22を備えた上型キャビティブロック23,23をそれぞれ配置してある。そして、図3および図5に示すように、前記上型キャビティブロック23の下面のうち、カルブロック25に隣接する縁部に寄せピン1が所定のピッチで植設されている。前記寄せピン1は、その下端部1aの外周面が略円錐台形であり、かつ、横断面を略台形にカットした形状となっている(図4)。そして、前記下端部1aの巾狭部分がカルブロック25に対向している(図5)。なお、前記キャビティ22と前記カル24とはランナー26,ゲート27(図2)を介して連通する。また、通常、金型のメンテナンス等を考慮し、カルブロックとキャビティとは分割できる部品で構成されているが、これらを一体化しておいても特に問題はない。 The upper chess 20 has a pin plate (not shown) and an ejector plate 26 sequentially stacked at the center of the upper surface of the holder base plate 21, and chess space blocks 27 and 27 are arranged on both sides of the upper chess 20. A groove 28 is formed. On the other hand, as shown in FIG. 3, the holder base plate 21 has a cull block 25 provided with a cull 24 at the center of its lower surface and upper mold cavity blocks 23, 23 provided with cavities 22 on both sides thereof. Each is arranged. As shown in FIGS. 3 and 5, close pins 1 are planted at a predetermined pitch at the edge adjacent to the cull block 25 in the lower surface of the upper mold cavity block 23. The outer pin 1 has a substantially frustoconical outer peripheral surface, and the cross section is cut into a substantially trapezoidal shape (FIG. 4). And the narrow part of the said lower end part 1a is facing the cull block 25 (FIG. 5). The cavity 22 and the cull 24 communicate with each other via a runner 26 and a gate 27 (FIG. 2). In general, the cull block and the cavity are composed of parts that can be separated in consideration of the maintenance of the mold, but there is no particular problem even if they are integrated.

下型モールドセット30は、図1に示すように、下型ベースプレート31の上面両側縁部にそれぞれ配置したスペースブロック32,32を介して下型チェス用ベースプレート33を組み付けたものである。前記下型チェス用ベースプレート33は、その上面両側縁部にサイドブロック36,36を配置するとともに、その上面の一端部にエンドブロック37を配置してある。そして、前記サイドブロック36,36の対向する内側面には、後述する下型チェス50をスライド嵌合させるガイド用突条36a,36aがそれぞれ形成されている。さらに、前記チェス用ベースプレート32,32間の中央にプランジャー用等圧シリンダーブロック34が配置されている。このプランジャー用等圧シリンダーブロック34は、図3に示すように、そのプランジャ35が後述する下型チェス50のセンターブロック56に設けた貫通孔56aを介して軸心方向に往復移動可能である。   As shown in FIG. 1, the lower mold set 30 is obtained by assembling a lower chess base plate 33 via space blocks 32 and 32 arranged on both side edges of the upper surface of the lower mold base plate 31. The lower chess base plate 33 has side blocks 36 and 36 disposed on both side edges of the upper surface thereof, and an end block 37 disposed on one end portion of the upper surface thereof. Further, guide ridges 36a and 36a for slidingly fitting a lower chess 50, which will be described later, are formed on the opposing inner side surfaces of the side blocks 36 and 36, respectively. Further, a plunger isobaric cylinder block 34 is arranged in the center between the chess base plates 32 and 32. As shown in FIG. 3, the plunger isobaric cylinder block 34 can reciprocate in the axial direction through a through hole 56 a provided in a center block 56 of the lower chess 50 described later. .

前記下型チェス50は、対向する両側面にガイド溝51,51(奥側のガイド溝51は図示せず)をそれぞれ形成する一方、その中央にセンターブロック56を配置してある。このセンターブロック56には所定のピッチで貫通孔56aが形成され、この貫通孔56aに挿入された成形用樹脂タブレット60を前記プランジャ35が押出可能となっている(図3)。さらに、前記センターブロック56の両側には、基板搭載面52を形成する下型キャビティブロック53がそれぞれ配置されている。そして、前記下型キャビティブロック53の上面のうち、前記センターブロック56に隣接する縁部に粗い位置決めを行うための位置決め用ピン54を突出している(図3)。
なお、図1には、上型チェス20の上型セットブロック20aを下型チェス50に位置決めするための下型セットブロック50aが図示されている。
The lower mold chess 50 have guide grooves 51 and 51 (the inner side guide grooves 51 are not shown) formed on opposite side surfaces, respectively, and a center block 56 is disposed in the center thereof. Through holes 56a are formed in the center block 56 at a predetermined pitch, and the plunger 35 can extrude the molding resin tablet 60 inserted into the through holes 56a (FIG. 3). Further, on both sides of the center block 56, a lower mold cavity block 53 for forming a substrate mounting surface 52 is disposed. A positioning pin 54 for rough positioning is projected from the upper surface of the lower mold cavity block 53 to the edge adjacent to the center block 56 (FIG. 3).
In FIG. 1, a lower mold set block 50 a for positioning the upper mold set block 20 a of the upper mold chess 20 on the lower mold chess 50 is illustrated.

次に、前述の構成部品からなる樹脂封止用金型装置による封止工程について説明する。
図3に示すように、下型キャビテブロック53から突出する位置決め用ピン54に、半導体チップを搭載した樹脂製基板70(図2)の位置決め孔71を遊嵌して搭載面52に配置するとともに、貫通孔56aに固形タブレット60を挿入する。そして、下型モールドセット30を図示しない駆動機構を介して押し上げることにより、下型チェス50を押し上げる。これにより、上型チェス20の上型キャビティブロック23と下型チェス50の下型キャビティブロック53とが基板70をクランプする。
Next, the sealing process by the resin sealing mold apparatus comprising the above-described components will be described.
As shown in FIG. 3, a positioning hole 71 of a resin substrate 70 (FIG. 2) on which a semiconductor chip is mounted is loosely fitted on a positioning pin 54 protruding from the lower mold cavity block 53, and is disposed on the mounting surface 52. The solid tablet 60 is inserted into the through hole 56a. Then, the lower mold chess 50 are pushed up by pushing up the lower mold set 30 via a drive mechanism (not shown). Thereby, the upper mold cavity block 23 of the upper mold chess 20 and the lower mold cavity block 53 of the lower mold chess 50 clamp the substrate 70.

特に、下型モールドセット30に組み込んだ下型チェス50が上昇すると、図5Aないし図5Cに示すように、クランプする直前、寄せピン1の傾斜面である巾狭の下端部1aが基板70の位置決め用孔71aの開口縁部に圧接し、調心しつつ、その分力で基板70を押し付けながら前記センターブロック56側にスライド移動させる。このため、基板70の側端面72を前記センターブロック56の外側面に圧接させながら、下端部1aがピン孔57まで下降する。ついで、下型キャビテイブロック53と上型キャビテイブロック23とが基板70をクランプし、貫通孔56a、カル24、ランナー26、ゲート27およびキャビテイ22が連通する。   In particular, when the lower mold chess 50 incorporated in the lower mold set 30 is raised, the narrow lower end 1a, which is the inclined surface of the shifting pin 1, immediately before clamping, is formed on the substrate 70 as shown in FIGS. 5A to 5C. The substrate 70 is slid and moved toward the center block 56 while pressing the substrate 70 with its component force while pressing and contacting the opening edge of the positioning hole 71a. Therefore, the lower end 1 a is lowered to the pin hole 57 while the side end surface 72 of the substrate 70 is pressed against the outer surface of the center block 56. Next, the lower mold block 53 and the upper mold block 23 clamp the substrate 70, and the through hole 56a, the cull 24, the runner 26, the gate 27, and the cavity 22 communicate with each other.

そして、等圧シリンダーブロック34のプランジャ35を上昇させることにより、固形タブレット60を加熱圧縮して流動体化し、溶融した樹脂をキャビテイ22に注入して基板70を封止,成形する。ついで、下モールドセット30全体を下降させ、金型を開く。さらに、等圧シリンダーブロック34のプランジャ35を再度、上昇させることにより、成形品を下型キャビティブロック53から持ち上げた後、図示しないキャリアで成形品を把持し、製品を取り出す。
なお、下型モールドセット30の一部に逃げ(図示せず)を形成し、プランジャ35を上昇させずにキャリアだけで成形品を取り出すようにしてもよい。また、通常使用されるエジェクタ機構を設けてエジェクタしてもよい。
Then, by raising the plunger 35 of the isobaric cylinder block 34, the solid tablet 60 is heated and compressed to form a fluid, and the molten resin is injected into the cavity 22 to seal and mold the substrate 70. Next, the entire lower mold set 30 is lowered and the mold is opened. Further, the plunger 35 of the isobaric cylinder block 34 is raised again to lift the molded product from the lower mold cavity block 53, and then the molded product is gripped by a carrier (not shown) and the product is taken out.
Note that a relief (not shown) may be formed in a part of the lower mold set 30, and the molded product may be taken out only by the carrier without raising the plunger 35. Further, an ejector mechanism that is normally used may be provided and ejected.

本実施形態によれば、基板70とセンターブロック56,下型キャビテイブロック53との間に隙間が発生せず、樹脂バリが発生しない。このため、樹脂バリの除去作業が不要となり、樹脂バリに基因する基板接点部の傷、樹脂バリ付着による接続不良等の不具合を防止できる。また、カルブロック25の近傍に配置した寄せピン1で基板70を位置決めし、寄せピン1の反対側に位置する基板70の縁部を拘束しない。このため、溶融した樹脂がキャビティ22内に流入しても、基板70に板厚方向の単純な圧縮力が負荷されるだけであり、半導体チップのボンディングワイヤにワイヤースイ―プ等が生ぜず、ボンディングワイヤが損傷しないという利点がある。   According to the present embodiment, no gap is generated between the substrate 70, the center block 56, and the lower mold block 53, and no resin burr is generated. This eliminates the need to remove the resin burrs, and can prevent defects such as scratches on the substrate contact portions due to the resin burrs and poor connection due to adhesion of the resin burrs. Further, the substrate 70 is positioned by the contact pin 1 disposed in the vicinity of the cull block 25 and the edge portion of the substrate 70 located on the opposite side of the contact pin 1 is not restrained. For this reason, even if the molten resin flows into the cavity 22, only a simple compressive force in the thickness direction is applied to the substrate 70, and no wire sweep or the like occurs in the bonding wires of the semiconductor chip. There is an advantage that the bonding wire is not damaged.

第2実施形態は、図7に示すように、前記上型チェス用スペースブロック23の下面のうち、カルブロック25に隣接する縁部に筒状弾性部材3を介して寄せピン2を所定のピッチで植設した場合である。前記寄せピン2は、その下端部2aの外周面が略円錐台形である。このため、図8に示すように、基板70が所定の位置から距離βだけズレている場合であっても、前記寄せピン2の下端部2aが基板70の位置決め用孔71aの開口縁部に圧接し、その分力で基板70を押し付けつつ、スライド移動させる。このため、基板70の側端面72が前記センターブロック56の内側面に圧接する。他は前述の第1実施形態と同様であるので、同一部分には同一番号を附して説明を省略する。   As shown in FIG. 7, in the second embodiment, the lower end of the upper chess space block 23 has an edge adjacent to the cull block 25, and the pin 2 is placed at a predetermined pitch via the cylindrical elastic member 3. This is the case of planting in As for the said approach pin 2, the outer peripheral surface of the lower end part 2a is a substantially truncated cone shape. For this reason, as shown in FIG. 8, even when the substrate 70 is displaced from the predetermined position by the distance β, the lower end portion 2a of the shift pin 2 is located at the opening edge of the positioning hole 71a of the substrate 70. The substrate 70 is slid while being pressed and pressed against the substrate 70 by the component force. Therefore, the side end surface 72 of the substrate 70 is in pressure contact with the inner surface of the center block 56. The other parts are the same as those in the first embodiment, and the same parts are denoted by the same reference numerals and the description thereof is omitted.

なお、本実施形態にかかる筒状弾性部材としては、例えば、シリコン、ウレタン、ポリフッ化エチレン(商品名 テフロン)からなるものが考えられる。
また、前記下端部2aの形状は前述の第1実施形態の下端部1aと同一形状としてもよいことは勿論である。
In addition, as a cylindrical elastic member concerning this embodiment, what consists of silicon | silicone, urethane, a polyfluorinated ethylene (brand name Teflon) can be considered, for example.
Of course, the shape of the lower end 2a may be the same as that of the lower end 1a of the first embodiment.

第3実施形態は、図9ないし図11に示すように、前記寄せピン4の下端側にスリット5を設けて2分割することにより、下端部4a,4bを形成してより一層、弾性変形しやすくした場合である。このため、図11に示すように、基板70が所定の位置から距離Γだけズレている場合であっても、前述の第1実施形態と同様にスライド移動する。
すなわち、図10Aないし図10Cに示すように、クランプする直前、寄せピン4の一方の下端部4aが基板70の位置決め用孔70aの開口縁部に圧接し、その分力で基板70を押し付けながら前記センターブロック56側に距離Γだけスライド移動させる。そして、基板70の側端面72を前記センターブロック56の内側面に圧接させつつ、下端部4a,4bがピン孔57に嵌合する。他は前述の第1実施形態と同様であるので、同一部分には同一番号を附して説明を省略する。
In the third embodiment, as shown in FIGS. 9 to 11, the slit 5 is provided on the lower end side of the shifting pin 4 and divided into two, thereby forming the lower end portions 4a and 4b and further elastically deforming. This is the case. For this reason, as shown in FIG. 11, even when the substrate 70 is displaced from the predetermined position by the distance Γ, the substrate 70 slides in the same manner as in the first embodiment.
That is, as shown in FIGS. 10A to 10C, immediately before clamping, one lower end portion 4a of the contact pin 4 is in pressure contact with the opening edge of the positioning hole 70a of the substrate 70, and the substrate 70 is pressed by the component force. The center block 56 is slid by a distance Γ. Then, the lower end portions 4 a and 4 b are fitted into the pin holes 57 while the side end surface 72 of the substrate 70 is pressed against the inner surface of the center block 56. The other parts are the same as those in the first embodiment, and the same parts are denoted by the same reference numerals and the description thereof is omitted.

なお、本実施形態では、スリット5中に樹脂等が侵入することによる不具合を防止すべく、シリコンゴム等の弾性材を充填しておいてもよい。また、下端部5bは必ずしも必要ではなく、切取っておいてもよい。   In the present embodiment, an elastic material such as silicon rubber may be filled in order to prevent a problem caused by resin or the like entering the slit 5. Moreover, the lower end part 5b is not necessarily required and may be cut off.

本発明にかかる半導体樹脂封止用金型は、半導体を搭載した基板に限らず、通常の基板にも適用できる。   The mold for semiconductor resin sealing according to the present invention can be applied not only to a substrate on which a semiconductor is mounted but also to a normal substrate.

本発明にかかる半導体樹脂封止用金型の第1実施形態を示す分解斜視図である。It is a disassembled perspective view which shows 1st Embodiment of the metal mold | die for semiconductor resin sealing concerning this invention. 第1実施形態にかかる基板の配置を示す平面図である。It is a top view which shows arrangement | positioning of the board | substrate concerning 1st Embodiment. 第1実施形態の半導体封止用金型を示す断面図である。It is sectional drawing which shows the metal mold | die for semiconductor sealing of 1st Embodiment. 図4A,4Bおよび4Cは第1実施形態にかかる寄せピンを示す正面図,右側面図および部分平面図である。4A, 4B, and 4C are a front view, a right side view, and a partial plan view showing a closing pin according to the first embodiment. 図5A,5Bおよび5Cは第1実施形態にかかる型締め前、型締め中および型締め後を示す樹脂封止工程説明図である。5A, 5B and 5C are explanatory diagrams of a resin sealing process showing before, during and after mold clamping according to the first embodiment. 第1実施形態にかかる寄せピンと基板の位置決め孔との位置関係を示す説明図である。It is explanatory drawing which shows the positional relationship of the approach pin concerning 1st Embodiment, and the positioning hole of a board | substrate. 図7A,7Bおよび7Cは第2実施形態にかかる型締め前、型締め中および型締め後を示す樹脂封止工程説明図である。7A, 7B and 7C are explanatory diagrams of a resin sealing process showing before, during and after mold clamping according to the second embodiment. 第2実施形態にかかる寄せピンと基板の位置決め孔との位置関係を示す説明図である。It is explanatory drawing which shows the positional relationship of the approach pin concerning 2nd Embodiment, and the positioning hole of a board | substrate. 図9A,9Bおよび9Cは第3実施形態にかかる寄せピンを示す正面図,右側面図および部分平面図である。9A, 9B, and 9C are a front view, a right side view, and a partial plan view showing a closing pin according to a third embodiment. 図10A,10Bおよび10Cは第3実施形態にかかる型締め前、型締め中および型締め後を示す樹脂封止工程説明図である。10A, 10B, and 10C are explanatory diagrams of a resin sealing process showing before, during, and after mold clamping according to the third embodiment. 第3実施形態にかかる寄せピンと基板の位置決め孔との位置関係を示す説明図である。It is explanatory drawing which shows the positional relationship of the approach pin concerning 3rd Embodiment, and the positioning hole of a board | substrate.

符号の説明Explanation of symbols

1,2,4:寄せピン
1a,2a,4a,4b:下端部
3:筒状弾性部材
5:スリット
10:上型モールドセット
20:上型チェス
22:キャビティ
23:上型キャビティブロック
24:カル
25:カルブロック
30:上型モールドセット
50:下型チェス
52:搭載面
53:下型キャビテイブロック
54:位置決め用ピン
56:センターブロック
56a:貫通孔
57:ピン孔
60:タブレット
70:基板
71:位置決め用孔
71a:位置決め用孔
72:側端面
1, 2, 4: Leading pins 1a, 2a, 4a, 4b: Lower end portion 3: Cylindrical elastic member 5: Slit 10: Upper mold set 20: Upper mold chess 22: Cavity 23: Upper mold cavity block 24: Cull 25: Cull block 30: Upper mold set 50: Lower mold chess 52: Mounting surface 53: Lower mold cavity block 54: Positioning pin 56: Center block 56a: Through hole 57: Pin hole 60: Tablet 70: Substrate 71: Positioning hole 71a: Positioning hole 72: Side end face

Claims (5)

半導体素子を搭載した基板を一対の金型で挾持して形成されるキャビティ内に、前記金型のいずれかに隣接するカルブロックのカルからランナーを介して樹脂を充填して前記半導体素子を封止する半導体樹脂封止用金型において、
前記カルブロックに隣接する金型の対向面のうち、前記カルブロック側の縁部に位置し、かつ、前記基板の位置決め用孔に対応する位置に、自由端部に傾斜面を有する寄せピンを突設し、一対の前記金型で前記基板をクランプする際に、前記寄せピンの自由端部に設けた傾斜面を前記基板の位置決め用孔の開口縁部に圧接させ、前記基板を押し付けつつスライド移動させることにより、前記基板の側端面を前記キャビティの内側面に圧接させることを特徴とする半導体樹脂封止用金型。
A cavity formed by holding a substrate on which a semiconductor element is mounted with a pair of molds is filled with resin from a cull of a cull block adjacent to one of the molds via a runner to seal the semiconductor element. In the mold for semiconductor resin sealing to stop,
Of the opposing surfaces of the mold adjacent to the cull block, a close-up pin having an inclined surface at a free end is located at the edge on the cull block side and at a position corresponding to the positioning hole of the substrate. When projecting and clamping the substrate with the pair of molds, the inclined surface provided at the free end of the leading pin is brought into pressure contact with the opening edge of the positioning hole of the substrate while pressing the substrate A mold for semiconductor resin sealing, wherein the side end surface of the substrate is brought into pressure contact with the inner side surface of the cavity by sliding.
半導体素子を搭載した基板を下金型および上金型で挾持して形成されるキャビティ内に、前記上金型に隣接するカルブロックのカルからランナーを介して樹脂を充填して前記半導体素子を封止する半導体樹脂封止用金型において、
前記カルブロックに隣接する上金型の対向面のうち、前記カルブロック側の縁部に位置し、かつ、前記基板の位置決め用孔に対応する位置に、下端部に傾斜面を有する寄せピンを突設し、前記上,下金型で前記基板をクランプする際に、前記寄せピンの下端部に設けた傾斜面を前記基板の位置決め用孔の開口縁部に圧接させ、前記基板を押し付けつつスライド移動させることにより、前記基板の側端面を前記キャビティの内側面に圧接させることを特徴とする半導体樹脂封止用金型。
Filling a cavity formed by holding a substrate on which a semiconductor element is mounted with a lower mold and an upper mold from a cull block adjacent to the upper mold through a runner, the resin is filled. In the semiconductor resin sealing mold to be sealed,
Among the opposing surfaces of the upper mold adjacent to the cull block, a close pin having an inclined surface at the lower end is located at the edge on the cull block side and at a position corresponding to the positioning hole of the substrate. When projecting and clamping the substrate with the upper and lower molds, the inclined surface provided at the lower end portion of the leading pin is pressed against the opening edge of the positioning hole of the substrate while pressing the substrate A mold for semiconductor resin sealing, wherein the side end surface of the substrate is brought into pressure contact with the inner side surface of the cavity by sliding.
寄せピンを、筒状弾性部材を介して金型に植設したことを特徴とする請求項1または2に記載の半導体樹脂封止用金型。   The mold for semiconductor resin sealing according to claim 1 or 2, wherein the close-up pin is implanted in the mold through a cylindrical elastic member. 寄せピンの下端部を2分割するスリットを設けたことを特徴とする請求項1ないし3のいずれか1項に記載の半導体樹脂封止用金型。   The semiconductor resin sealing mold according to any one of claims 1 to 3, further comprising a slit that divides the lower end portion of the closing pin into two. スリット内に弾性材を充填したことを特徴とする請求項4に記載の半導体樹脂封止用金型。
The mold for semiconductor resin sealing according to claim 4, wherein an elastic material is filled in the slit.
JP2003364656A 2003-10-24 2003-10-24 Mold for semiconductor resin sealing Expired - Fee Related JP4153862B2 (en)

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