JP2005108578A - 質量分析装置 - Google Patents

質量分析装置 Download PDF

Info

Publication number
JP2005108578A
JP2005108578A JP2003339157A JP2003339157A JP2005108578A JP 2005108578 A JP2005108578 A JP 2005108578A JP 2003339157 A JP2003339157 A JP 2003339157A JP 2003339157 A JP2003339157 A JP 2003339157A JP 2005108578 A JP2005108578 A JP 2005108578A
Authority
JP
Japan
Prior art keywords
ions
precursor ions
mass spectrometer
mass
precursor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003339157A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005108578A5 (enExample
Inventor
Yasuaki Takada
安章 高田
Hisashi Nagano
久志 永野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP2003339157A priority Critical patent/JP2005108578A/ja
Priority to EP04014529A priority patent/EP1521290A1/en
Priority to US10/873,107 priority patent/US7078685B2/en
Publication of JP2005108578A publication Critical patent/JP2005108578A/ja
Publication of JP2005108578A5 publication Critical patent/JP2005108578A5/ja
Pending legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/424—Three-dimensional ion traps, i.e. comprising end-cap and ring electrodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • H01J49/0063—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction by applying a resonant excitation voltage
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/426—Methods for controlling ions
    • H01J49/427—Ejection and selection methods
    • H01J49/428—Applying a notched broadband signal

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2003339157A 2003-09-30 2003-09-30 質量分析装置 Pending JP2005108578A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2003339157A JP2005108578A (ja) 2003-09-30 2003-09-30 質量分析装置
EP04014529A EP1521290A1 (en) 2003-09-30 2004-06-21 Mass spectrometer
US10/873,107 US7078685B2 (en) 2003-09-30 2004-06-23 Mass spectrometer

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003339157A JP2005108578A (ja) 2003-09-30 2003-09-30 質量分析装置

Publications (2)

Publication Number Publication Date
JP2005108578A true JP2005108578A (ja) 2005-04-21
JP2005108578A5 JP2005108578A5 (enExample) 2006-06-29

Family

ID=34309007

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003339157A Pending JP2005108578A (ja) 2003-09-30 2003-09-30 質量分析装置

Country Status (3)

Country Link
US (1) US7078685B2 (enExample)
EP (1) EP1521290A1 (enExample)
JP (1) JP2005108578A (enExample)

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005310610A (ja) * 2004-04-23 2005-11-04 Shimadzu Corp イオン蓄積装置におけるイオン選別の方法
JP2006294582A (ja) * 2005-03-18 2006-10-26 Hitachi High-Technologies Corp 質量分析計及び質量分析方法
JP2007046966A (ja) * 2005-08-09 2007-02-22 Hitachi High-Technologies Corp 質量分析システム
US7375318B2 (en) 2006-03-09 2008-05-20 Hitachi High-Technologies Corporation Mass spectrometer
JP2009507310A (ja) * 2005-09-06 2009-02-19 インフレジス， インコーポレイテッド 統合ディスプレイシステムを有する、脅威の検出およびモニタリング装置
JP2009510691A (ja) * 2005-09-30 2009-03-12 バリアン・インコーポレイテッド 広帯域波形信号を利用する高分解能イオン分離
WO2014208336A1 (ja) * 2013-06-27 2014-12-31 株式会社日立ハイテクノロジーズ 質量分析方法
US11776800B2 (en) 2019-06-20 2023-10-03 Hitachi High-Tech Corporation Substance analyzer and substance analysis method

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005108578A (ja) * 2003-09-30 2005-04-21 Hitachi Ltd 質量分析装置
JP4284167B2 (ja) * 2003-12-24 2009-06-24 株式会社日立ハイテクノロジーズ イオントラップ／飛行時間型質量分析計による精密質量測定方法
US8334503B2 (en) * 2005-05-09 2012-12-18 Purdue Research Foundation Parallel ion parking in ion traps
DE102006056931B4 (de) * 2006-12-04 2011-07-21 Bruker Daltonik GmbH, 28359 Stoßfragmentierung von Ionen in Hochfrequenz-Ionenfallen
JP5262010B2 (ja) * 2007-08-01 2013-08-14 株式会社日立製作所 質量分析計及び質量分析方法
US8334506B2 (en) 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
JP5111123B2 (ja) * 2008-01-16 2012-12-26 株式会社日立製作所 質量分析計及び質量分析方法
GB2463633B (en) * 2008-05-15 2013-02-27 Thermo Fisher Scient Bremen MS/MS data processing
US7973277B2 (en) 2008-05-27 2011-07-05 1St Detect Corporation Driving a mass spectrometer ion trap or mass filter
US8935101B2 (en) 2010-12-16 2015-01-13 Thermo Finnigan Llc Method and apparatus for correlating precursor and product ions in all-ions fragmentation experiments
EP2807669A2 (en) 2012-01-24 2014-12-03 Thermo Finnigan LLC Multinotch isolation for ms3 mass analysis
CA2932661A1 (en) * 2013-12-31 2015-07-09 Dh Technologies Development Pte. Ltd. Jet injector inlet for a differential mobility spectrometer
GB2554202B (en) 2015-03-06 2021-08-18 Micromass Ltd Imaging guided ambient ionisation mass spectrometry
GB2556994B (en) 2015-03-06 2021-05-12 Micromass Ltd Identification of bacterial strains in biological samples using mass spectrometry
CA2978048A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Liquid trap or separator for electrosurgical applications
GB2551669B (en) 2015-03-06 2021-04-14 Micromass Ltd Physically guided rapid evaporative ionisation mass spectrometry ("Reims")
KR102017409B1 (ko) 2015-03-06 2019-10-21 마이크로매스 유케이 리미티드 기체성 샘플의 개선된 이온화 방법
CA3234867A1 (en) * 2015-03-06 2016-09-15 Micromass Uk Limited Improved ionisation of gaseous samples
EP3265797B1 (en) 2015-03-06 2022-10-05 Micromass UK Limited Inlet instrumentation for ion analyser coupled to rapid evaporative ionisation mass spectrometry ("reims") device
WO2016142681A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Spectrometric analysis of microbes
EP3726562B1 (en) 2015-03-06 2023-12-20 Micromass UK Limited Ambient ionization mass spectrometry imaging platform for direct mapping from bulk tissue
GB2556436B (en) 2015-03-06 2022-01-26 Micromass Ltd Cell population analysis
US11139156B2 (en) 2015-03-06 2021-10-05 Micromass Uk Limited In vivo endoscopic tissue identification tool
KR102158736B1 (ko) 2015-03-06 2020-09-23 마이크로매스 유케이 리미티드 개선된 이온화용 충돌 표면
WO2016142679A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Chemically guided ambient ionisation mass spectrometry
WO2016142691A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Rapid evaporative ionisation mass spectrometry ("reims") and desorption electrospray ionisation mass spectrometry ("desi-ms") analysis of swabs and biopsy samples
US10777398B2 (en) 2015-03-06 2020-09-15 Micromass Uk Limited Spectrometric analysis
GB201517195D0 (en) 2015-09-29 2015-11-11 Micromass Ltd Capacitively coupled reims technique and optically transparent counter electrode
WO2017178833A1 (en) 2016-04-14 2017-10-19 Micromass Uk Limited Spectrometric analysis of plants

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5206507A (en) * 1991-02-28 1993-04-27 Teledyne Mec Mass spectrometry method using filtered noise signal
US5196699A (en) * 1991-02-28 1993-03-23 Teledyne Mec Chemical ionization mass spectrometry method using notch filter
US5449905A (en) * 1992-05-14 1995-09-12 Teledyne Et Method for generating filtered noise signal and broadband signal having reduced dynamic range for use in mass spectrometry
DE4316737C1 (de) * 1993-05-19 1994-09-01 Bruker Franzen Analytik Gmbh Verfahren zur digitalen Erzeugung einer zusätzlichen Wechselspannung für die resonante Anregung von Ionen in Ionenfallen
US5324939A (en) * 1993-05-28 1994-06-28 Finnigan Corporation Method and apparatus for ejecting unwanted ions in an ion trap mass spectrometer
JP3367719B2 (ja) 1993-09-20 2003-01-20 株式会社日立製作所 質量分析計および静電レンズ
JP2981093B2 (ja) 1993-11-09 1999-11-22 株式会社日立製作所 大気圧イオン化質量分析計
DE19501835C2 (de) * 1995-01-21 1998-07-02 Bruker Franzen Analytik Gmbh Verfahren zur Anregung der Schwingungen von Ionen in Ionenfallen mit Frequenzgemischen
WO1998052209A1 (en) * 1997-05-12 1998-11-19 Mds Inc. Rf-only mass spectrometer with auxiliary excitation
DE59907300D1 (de) * 1998-04-21 2003-11-13 Siemens Ag Turbinenschaufel
JP3876554B2 (ja) 1998-11-25 2007-01-31 株式会社日立製作所 化学物質のモニタ方法及びモニタ装置並びにそれを用いた燃焼炉
JP3756365B2 (ja) * 1999-12-02 2006-03-15 株式会社日立製作所 イオントラップ質量分析方法
US7060972B2 (en) * 2000-07-21 2006-06-13 Mds Inc. Triple quadrupole mass spectrometer with capability to perform multiple mass analysis steps
WO2002025265A1 (en) * 2000-09-20 2002-03-28 Hitachi, Ltd. Probing method using ion trap mass spectrometer and probing device
JP4631219B2 (ja) * 2001-06-26 2011-02-16 株式会社島津製作所 イオントラップ型質量分析装置
JP3620479B2 (ja) * 2001-07-31 2005-02-16 株式会社島津製作所 イオン蓄積装置におけるイオン選別の方法
WO2003056604A1 (en) * 2001-12-21 2003-07-10 Mds Inc., Doing Business As Mds Sciex Use of notched broadband waveforms in a linear ion trap
US6570151B1 (en) * 2002-02-21 2003-05-27 Hitachi Instruments, Inc. Methods and apparatus to control charge neutralization reactions in ion traps
US20030189168A1 (en) * 2002-04-05 2003-10-09 Frank Londry Fragmentation of ions by resonant excitation in a low pressure ion trap
US7049580B2 (en) * 2002-04-05 2006-05-23 Mds Inc. Fragmentation of ions by resonant excitation in a high order multipole field, low pressure ion trap
JP3791455B2 (ja) * 2002-05-20 2006-06-28 株式会社島津製作所 イオントラップ型質量分析装置
US7123431B2 (en) * 2002-07-30 2006-10-17 International Business Machines Corporation Precise positioning of media
GB2449760B (en) * 2003-03-19 2009-01-14 Thermo Finnigan Llc Obtaining tandem mass spectrometry data for multiple parent lons in an ion population
JP2005108578A (ja) * 2003-09-30 2005-04-21 Hitachi Ltd 質量分析装置
JP4284167B2 (ja) * 2003-12-24 2009-06-24 株式会社日立ハイテクノロジーズ イオントラップ／飛行時間型質量分析計による精密質量測定方法

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005310610A (ja) * 2004-04-23 2005-11-04 Shimadzu Corp イオン蓄積装置におけるイオン選別の方法
JP2006294582A (ja) * 2005-03-18 2006-10-26 Hitachi High-Technologies Corp 質量分析計及び質量分析方法
JP2007046966A (ja) * 2005-08-09 2007-02-22 Hitachi High-Technologies Corp 質量分析システム
JP2009507310A (ja) * 2005-09-06 2009-02-19 インフレジス， インコーポレイテッド 統合ディスプレイシステムを有する、脅威の検出およびモニタリング装置
JP2009510691A (ja) * 2005-09-30 2009-03-12 バリアン・インコーポレイテッド 広帯域波形信号を利用する高分解能イオン分離
US7375318B2 (en) 2006-03-09 2008-05-20 Hitachi High-Technologies Corporation Mass spectrometer
US7645986B2 (en) 2006-03-09 2010-01-12 Hitachi High-Technologies Corporation Mass spectrometer
WO2014208336A1 (ja) * 2013-06-27 2014-12-31 株式会社日立ハイテクノロジーズ 質量分析方法
US11776800B2 (en) 2019-06-20 2023-10-03 Hitachi High-Tech Corporation Substance analyzer and substance analysis method
DE112019007341B4 (de) 2019-06-20 2024-06-13 Hitachi High-Tech Corporation Substanzanalysator und substanzanalyseverfahren

Also Published As

Publication number Publication date
US7078685B2 (en) 2006-07-18
EP1521290A1 (en) 2005-04-06
US20050067565A1 (en) 2005-03-31

Similar Documents

Publication Publication Date Title
JP2005108578A (ja) 質量分析装置
JP3894118B2 (ja) イオントラップ質量分析計を用いた探知方法及び探知装置
US7138626B1 (en) Method and device for non-contact sampling and detection
US7820965B2 (en) Apparatus for detecting chemical substances and method therefor
CN111105979B (zh) 使用单颗粒电感耦合等离子体质谱(sp-icp-ms)自动检测纳米颗粒
EP1580794B1 (en) Mass spectrometric apparatus and ion source
EP1166085A2 (en) Sampling and analysis of airborne particulate matter by glow discharge atomic emission and mass spectrometries
US20050161596A1 (en) Faims apparatus and method using carrier gases that contain a trace amount of a dopant species
US20180294149A1 (en) Ion source and method for generating elemental ions from aerosol particles
WO2008054393A1 (en) Method and device for non-contact sampling and detection
US6943343B2 (en) Chemical agent detection apparatus and method
JP4054493B2 (ja) イオン源
JP4212629B2 (ja) 質量分析計
JP4823794B2 (ja) 質量分析装置及び探知方法
JP2007010683A (ja) イオントラップ質量分析計を用いた探知方法及び探知装置
JP4291398B2 (ja) 質量分析装置および危険物探知装置
JP2010014726A (ja) イオントラップ質量分析計を用いた探知方法及び探知装置
JP2006058318A (ja) 試料ガス採取装置及び危険物探知装置
JP4062341B2 (ja) イオン化質量分析計，分析方法およびそれを用いた計測システム
JP4197676B2 (ja) モニタリングシステム
JP3981127B2 (ja) 質量分析計

Legal Events

Date Code Title Description
RD01 Notification of change of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7421

Effective date: 20060421

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20060511

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20060511

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20071121

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20071204

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20080204

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20080715