JP2004527741A5 - - Google Patents

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Publication number
JP2004527741A5
JP2004527741A5 JP2002572385A JP2002572385A JP2004527741A5 JP 2004527741 A5 JP2004527741 A5 JP 2004527741A5 JP 2002572385 A JP2002572385 A JP 2002572385A JP 2002572385 A JP2002572385 A JP 2002572385A JP 2004527741 A5 JP2004527741 A5 JP 2004527741A5
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JP
Japan
Prior art keywords
electromagnetic radiation
scanning
radiation
transparent body
beams
Prior art date
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Application number
JP2002572385A
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English (en)
Japanese (ja)
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JP4341810B2 (ja
JP2004527741A (ja
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Publication date
Priority claimed from SE0100889A external-priority patent/SE0100889D0/xx
Application filed filed Critical
Priority claimed from PCT/SE2002/000482 external-priority patent/WO2002073171A1/en
Publication of JP2004527741A publication Critical patent/JP2004527741A/ja
Publication of JP2004527741A5 publication Critical patent/JP2004527741A5/ja
Application granted granted Critical
Publication of JP4341810B2 publication Critical patent/JP4341810B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2002572385A 2001-03-14 2002-03-14 内部全反射分光法のための装置及び方法 Expired - Fee Related JP4341810B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
SE0100889A SE0100889D0 (sv) 2001-03-14 2001-03-14 Method and apparatus for attenuated total reflection spectrosopy
US27663701P 2001-03-16 2001-03-16
PCT/SE2002/000482 WO2002073171A1 (en) 2001-03-14 2002-03-14 Apparatus and method for total internal reflection spectroscopy

Publications (3)

Publication Number Publication Date
JP2004527741A JP2004527741A (ja) 2004-09-09
JP2004527741A5 true JP2004527741A5 (enExample) 2007-11-22
JP4341810B2 JP4341810B2 (ja) 2009-10-14

Family

ID=26655412

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002572385A Expired - Fee Related JP4341810B2 (ja) 2001-03-14 2002-03-14 内部全反射分光法のための装置及び方法

Country Status (4)

Country Link
EP (1) EP1370850B1 (enExample)
JP (1) JP4341810B2 (enExample)
AU (1) AU2002243130B2 (enExample)
WO (1) WO2002073171A1 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0320925D0 (en) 2003-09-06 2003-10-08 Smiths Group Plc Spectrometer apparatus
WO2005029150A1 (de) 2003-09-25 2005-03-31 Leica Microsystems Cms Gmbh Objektiv zur evaneszenten beleuchtung und mikroskop
JP3890362B2 (ja) * 2004-06-17 2007-03-07 国立大学法人室蘭工業大学 表面プラズモン共鳴現象測定装置
JP4843543B2 (ja) 2007-03-28 2011-12-21 株式会社日立ハイテクノロジーズ 蛍光検出装置及び方法
JP5067754B2 (ja) * 2007-08-03 2012-11-07 独立行政法人理化学研究所 近接場顕微装置とその分光・画像取得方法
CA2758113A1 (en) 2009-04-07 2010-10-14 Rare Light, Inc. Peri-critical reflection spectroscopy devices, systems, and methods
WO2011147879A1 (en) 2010-05-27 2011-12-01 Episentec Ab Improved method of sensor measurement
US9006686B2 (en) 2010-09-30 2015-04-14 Konica Minolta Holdings, Inc. Surface plasmon resonance fluorescence analysis device and surface plasmon resonance fluorescence analysis method
WO2012042807A1 (ja) * 2010-09-30 2012-04-05 コニカミノルタホールディングス株式会社 表面プラズモン共鳴蛍光分析装置及び表面プラズモン共鳴蛍光分析方法
US8970838B2 (en) 2011-04-29 2015-03-03 Avolonte Health LLC Method and apparatus for evaluating a sample through variable angle Raman spectroscopy
US20140350868A1 (en) 2011-11-22 2014-11-27 Episentec Ab Method for sensor calibration
JP6286028B2 (ja) * 2014-04-03 2018-02-28 株式会社日立ハイテクノロジーズ 蛍光分析器
EP4137799B1 (en) * 2015-11-11 2024-08-28 Otsuka Pharmaceutical Co., Ltd. Optical sample detection system
CN107356566B (zh) * 2017-03-30 2019-07-30 浙江大学 宽场三维超高分辨定位和成像方法与装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2940999B2 (ja) * 1990-05-09 1999-08-25 三井化学株式会社 光共振器
GB9019999D0 (en) * 1990-09-13 1990-10-24 Amersham Int Plc Biological sensors
GB9308728D0 (en) * 1993-04-27 1993-06-09 Fisons Plc Analytical device
GB9623820D0 (en) * 1996-11-16 1997-01-08 Secr Defence Surface plasma resonance sensor
SE9700384D0 (sv) * 1997-02-04 1997-02-04 Biacore Ab Analytical method and apparatus
JP3692523B2 (ja) * 1999-12-28 2005-09-07 横河電機株式会社 分光装置

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