JP4341810B2 - 内部全反射分光法のための装置及び方法 - Google Patents

内部全反射分光法のための装置及び方法 Download PDF

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Publication number
JP4341810B2
JP4341810B2 JP2002572385A JP2002572385A JP4341810B2 JP 4341810 B2 JP4341810 B2 JP 4341810B2 JP 2002572385 A JP2002572385 A JP 2002572385A JP 2002572385 A JP2002572385 A JP 2002572385A JP 4341810 B2 JP4341810 B2 JP 4341810B2
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Japan
Prior art keywords
electromagnetic radiation
scanning
angle
incident
radiation
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Expired - Fee Related
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JP2002572385A
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English (en)
Japanese (ja)
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JP2004527741A (ja
JP2004527741A5 (enExample
Inventor
ベント イヴァーソン，
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Cytiva Sweden AB
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Amersham Bioscience AB
GE Healthcare Bio Sciences Corp
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Priority claimed from SE0100889A external-priority patent/SE0100889D0/xx
Application filed by Amersham Bioscience AB, GE Healthcare Bio Sciences Corp filed Critical Amersham Bioscience AB
Publication of JP2004527741A publication Critical patent/JP2004527741A/ja
Publication of JP2004527741A5 publication Critical patent/JP2004527741A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G01N21/552—Attenuated total reflection
    • G01N21/553—Attenuated total reflection and using surface plasmons

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  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2002572385A 2001-03-14 2002-03-14 内部全反射分光法のための装置及び方法 Expired - Fee Related JP4341810B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
SE0100889A SE0100889D0 (sv) 2001-03-14 2001-03-14 Method and apparatus for attenuated total reflection spectrosopy
US27663701P 2001-03-16 2001-03-16
PCT/SE2002/000482 WO2002073171A1 (en) 2001-03-14 2002-03-14 Apparatus and method for total internal reflection spectroscopy

Publications (3)

Publication Number Publication Date
JP2004527741A JP2004527741A (ja) 2004-09-09
JP2004527741A5 JP2004527741A5 (enExample) 2007-11-22
JP4341810B2 true JP4341810B2 (ja) 2009-10-14

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Family Applications (1)

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JP2002572385A Expired - Fee Related JP4341810B2 (ja) 2001-03-14 2002-03-14 内部全反射分光法のための装置及び方法

Country Status (4)

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EP (1) EP1370850B1 (enExample)
JP (1) JP4341810B2 (enExample)
AU (1) AU2002243130B2 (enExample)
WO (1) WO2002073171A1 (enExample)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0320925D0 (en) * 2003-09-06 2003-10-08 Smiths Group Plc Spectrometer apparatus
EP1668395A1 (de) 2003-09-25 2006-06-14 Leica Microsystems Heidelberg GmbH Objektiv zur evaneszenten beleuchtung und mikroskop
JP3890362B2 (ja) * 2004-06-17 2007-03-07 国立大学法人室蘭工業大学 表面プラズモン共鳴現象測定装置
JP4843543B2 (ja) 2007-03-28 2011-12-21 株式会社日立ハイテクノロジーズ 蛍光検出装置及び方法
JP5067754B2 (ja) * 2007-08-03 2012-11-07 独立行政法人理化学研究所 近接場顕微装置とその分光・画像取得方法
MX2011010635A (es) 2009-04-07 2012-04-02 Rare Light Inc Dispositivos, sistemas y metodos de espectroscopia de reflexion peri-critica.
CN103097875B (zh) 2010-05-27 2015-11-25 艾皮森泰克公司 改进的传感器测量方法
JP5835223B2 (ja) * 2010-09-30 2015-12-24 コニカミノルタ株式会社 表面プラズモン共鳴蛍光分析装置及び表面プラズモン共鳴蛍光分析方法
US9006686B2 (en) 2010-09-30 2015-04-14 Konica Minolta Holdings, Inc. Surface plasmon resonance fluorescence analysis device and surface plasmon resonance fluorescence analysis method
US8970838B2 (en) 2011-04-29 2015-03-03 Avolonte Health LLC Method and apparatus for evaluating a sample through variable angle Raman spectroscopy
CN103988067A (zh) 2011-11-22 2014-08-13 艾皮森泰克公司 用于传感器校准的方法
GB2538209B (en) * 2014-04-03 2020-08-26 Hitachi High-Tech Corp Fluorescence Spectrometer
US10648914B2 (en) 2015-11-11 2020-05-12 Konica Minolta, Inc. Optical sample detection system
CN107356566B (zh) * 2017-03-30 2019-07-30 浙江大学 宽场三维超高分辨定位和成像方法与装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2940999B2 (ja) * 1990-05-09 1999-08-25 三井化学株式会社 光共振器
GB9019999D0 (en) * 1990-09-13 1990-10-24 Amersham Int Plc Biological sensors
GB9308728D0 (en) * 1993-04-27 1993-06-09 Fisons Plc Analytical device
GB9623820D0 (en) * 1996-11-16 1997-01-08 Secr Defence Surface plasma resonance sensor
SE9700384D0 (sv) * 1997-02-04 1997-02-04 Biacore Ab Analytical method and apparatus
JP3692523B2 (ja) * 1999-12-28 2005-09-07 横河電機株式会社 分光装置

Also Published As

Publication number Publication date
AU2002243130B2 (en) 2006-06-29
WO2002073171A8 (en) 2004-05-13
JP2004527741A (ja) 2004-09-09
EP1370850B1 (en) 2013-07-24
WO2002073171A1 (en) 2002-09-19
EP1370850A1 (en) 2003-12-17

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