JP2004206933A5 - - Google Patents

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Publication number
JP2004206933A5
JP2004206933A5 JP2002372200A JP2002372200A JP2004206933A5 JP 2004206933 A5 JP2004206933 A5 JP 2004206933A5 JP 2002372200 A JP2002372200 A JP 2002372200A JP 2002372200 A JP2002372200 A JP 2002372200A JP 2004206933 A5 JP2004206933 A5 JP 2004206933A5
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JP
Japan
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JP2002372200A
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JP3936908B2 (ja
JP2004206933A (ja
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Priority to JP2002372200A priority Critical patent/JP3936908B2/ja
Priority claimed from JP2002372200A external-priority patent/JP3936908B2/ja
Priority to US10/608,263 priority patent/US6888134B2/en
Publication of JP2004206933A publication Critical patent/JP2004206933A/ja
Publication of JP2004206933A5 publication Critical patent/JP2004206933A5/ja
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Publication of JP3936908B2 publication Critical patent/JP3936908B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2002372200A 2002-12-24 2002-12-24 質量分析装置及び質量分析方法 Expired - Fee Related JP3936908B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2002372200A JP3936908B2 (ja) 2002-12-24 2002-12-24 質量分析装置及び質量分析方法
US10/608,263 US6888134B2 (en) 2002-12-24 2003-06-30 Mass spectrometer and mass spectrometric method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002372200A JP3936908B2 (ja) 2002-12-24 2002-12-24 質量分析装置及び質量分析方法

Publications (3)

Publication Number Publication Date
JP2004206933A JP2004206933A (ja) 2004-07-22
JP2004206933A5 true JP2004206933A5 (ja) 2005-12-02
JP3936908B2 JP3936908B2 (ja) 2007-06-27

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Family Applications (1)

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JP2002372200A Expired - Fee Related JP3936908B2 (ja) 2002-12-24 2002-12-24 質量分析装置及び質量分析方法

Country Status (2)

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US (1) US6888134B2 (ja)
JP (1) JP3936908B2 (ja)

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JP4214925B2 (ja) * 2004-02-26 2009-01-28 株式会社島津製作所 質量分析装置
US7102129B2 (en) * 2004-09-14 2006-09-05 Thermo Finnigan Llc High-Q pulsed fragmentation in ion traps
FR2879744B1 (fr) * 2004-12-16 2007-04-20 Univ Claude Bernard Lyon Dispositif et analyse en masse de molecules mettant en oeuvre une photodissociation par faisceau laser uv ou visible
DE102005025497B4 (de) * 2005-06-03 2007-09-27 Bruker Daltonik Gmbh Leichte Bruckstückionen mit Ionenfallen messen
US7351955B2 (en) * 2005-09-09 2008-04-01 Thermo Finnigan Llc Reduction of chemical noise in a MALDI mass spectrometer by in-trap photodissociation of matrix cluster ions
JP2007179865A (ja) * 2005-12-28 2007-07-12 Hitachi High-Technologies Corp イオントラップ質量分析方法および装置
JP5486149B2 (ja) * 2007-02-07 2014-05-07 株式会社島津製作所 質量分析装置及び方法
US8334506B2 (en) 2007-12-10 2012-12-18 1St Detect Corporation End cap voltage control of ion traps
EP2240953B1 (en) * 2008-01-31 2019-10-23 DH Technologies Development Pte. Ltd. Methods for cooling ions in a linear ion trap
WO2009094762A1 (en) * 2008-01-31 2009-08-06 Mds Analytical Technologies, A Business Unit Of Mds Inc., Doing Business Through Its Sciex Division Methods for fragmenting ions in a linear ion trap
WO2009094760A1 (en) 2008-01-31 2009-08-06 Mds Analytical Technologies, A Business Unit Of Mds Inc., Doing Business Through Its Sciex Divison Method of operating a linear ion trap to provide low pressure short time high amplitude excitation with pulsed pressure
US7888634B2 (en) * 2008-01-31 2011-02-15 Dh Technologies Development Pte. Ltd. Method of operating a linear ion trap to provide low pressure short time high amplitude excitation
US7973277B2 (en) 2008-05-27 2011-07-05 1St Detect Corporation Driving a mass spectrometer ion trap or mass filter
US8754368B2 (en) 2008-06-20 2014-06-17 Shimadzu Corporation Mass spectrometer
GB0817433D0 (en) 2008-09-23 2008-10-29 Thermo Fisher Scient Bremen Ion trap for cooling ions
US9202678B2 (en) * 2008-11-14 2015-12-01 Board Of Trustees Of Michigan State University Ultrafast laser system for biological mass spectrometry
US20100154568A1 (en) * 2008-11-19 2010-06-24 Roth Michael J Analytical Instruments, Assemblies, and Methods
DE102009020886B4 (de) * 2009-05-12 2012-08-30 Bruker Daltonik Gmbh Einspeichern von Ionen in Kíngdon-Ionenfallen
JP2011014195A (ja) 2009-07-02 2011-01-20 Toshiba Corp フラッシュメモリ
JP5360150B2 (ja) * 2011-07-22 2013-12-04 株式会社島津製作所 質量分析装置
CN102495266B (zh) * 2011-12-04 2013-11-20 中国航天科技集团公司第五研究院第五一〇研究所 一种磁偏转质谱计离子流检测装置
WO2014096917A1 (en) * 2012-12-20 2014-06-26 Dh Technologies Development Pte. Ltd. Parsing events during ms3 experiments
CN107946166B (zh) * 2012-12-31 2020-02-18 九零八图案公司 质谱仪和使用质谱仪测量关于样品的信息的方法
EP2797105B1 (en) * 2013-04-26 2018-08-15 Amsterdam Scientific Instruments Holding B.V. Detection of ions in an ion trap
US9978578B2 (en) * 2016-02-03 2018-05-22 Fasmatech Science & Technology Ltd. Segmented linear ion trap for enhanced ion activation and storage
JP6593243B2 (ja) * 2016-04-14 2019-10-23 株式会社島津製作所 イオントラップ質量分析装置
JP2019035607A (ja) * 2017-08-10 2019-03-07 株式会社島津製作所 分析装置
CN113748488A (zh) * 2019-05-15 2021-12-03 株式会社岛津制作所 离子分析装置

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US4650999A (en) 1984-10-22 1987-03-17 Finnigan Corporation Method of mass analyzing a sample over a wide mass range by use of a quadrupole ion trap
DE3650304T2 (de) 1985-05-24 1995-10-12 Finnigan Corp Betriebsverfahren für eine Ionenfalle.
EP0336990B1 (en) * 1988-04-13 1994-01-05 Bruker Franzen Analytik GmbH Method of mass analyzing a sample by use of a quistor and a quistor designed for performing this method
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US5399857A (en) * 1993-05-28 1995-03-21 The Johns Hopkins University Method and apparatus for trapping ions by increasing trapping voltage during ion introduction
JP3294106B2 (ja) * 1996-05-21 2002-06-24 株式会社日立製作所 三次元四重極質量分析法および装置
US6469298B1 (en) * 1999-09-20 2002-10-22 Ut-Battelle, Llc Microscale ion trap mass spectrometer
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WO2003041116A1 (fr) * 2001-11-07 2003-05-15 Hitachi High-Technologies Corporation Spectrometrie de masse et spectrometre de masse a piege a ions
US6570151B1 (en) * 2002-02-21 2003-05-27 Hitachi Instruments, Inc. Methods and apparatus to control charge neutralization reactions in ion traps

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