JP2004101194A5 - - Google Patents
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- JP2004101194A5 JP2004101194A5 JP2002259166A JP2002259166A JP2004101194A5 JP 2004101194 A5 JP2004101194 A5 JP 2004101194A5 JP 2002259166 A JP2002259166 A JP 2002259166A JP 2002259166 A JP2002259166 A JP 2002259166A JP 2004101194 A5 JP2004101194 A5 JP 2004101194A5
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Claims (10)
光源からの光を前記被観察体の前面に導く第1の光学手段と、
前記観察体の裏面側に配置された再帰反射部材と、
前記観察体の前面で反射された反射光と前記再帰反射部材で反射され前記被観察体を透過した透過光とを受光する第2の光学手段と、
前記被観察体の裏面側に配置され、前記再帰反射部材から前記被観察体に入射する光の偏光状態を変化させる偏光手段を備え、
前記第2の光学手段は受光した前記反射光と前記透過光の偏光状態の違いに基づいて、前記反射光の光量もしくは前記透過光の光量を変化させる光学観察装置。 An optical observation device for observing the observation object using light reflected by the observation object and light transmitted through the observation object,
First optical means for guiding light from a light source to the front surface of the object to be observed;
A retroreflective member disposed on the back side of the observation body;
Second optical means for receiving reflected light reflected by the front surface of the observation body and transmitted light reflected by the retroreflective member and transmitted through the observation body;
A polarizing unit disposed on the back side of the object to be observed, and changing a polarization state of light incident on the object to be observed from the retroreflective member;
The second optical means is an optical observation device that changes the light amount of the reflected light or the light amount of the transmitted light based on a difference in polarization state between the received reflected light and the transmitted light.
前記被観察体と前記再帰反射部材との間に前記偏光手段として配置された1/4波長板と、
前記光源からの前記被観察体への光を直線偏光にする偏光板とを備え、
前記第2の光学手段は回転可能に配置された偏光板を有する請求項1記載の光学観察装置。further,
A quarter-wave plate disposed as the polarizing means between the object to be observed and the retroreflective member;
A polarizing plate for linearly polarized light from the light source to the object to be observed;
The optical observation apparatus according to claim 1, wherein the second optical means has a polarizing plate that is rotatably arranged.
前記被観察体と前記再帰性反射部材との間に前記偏光手段として配置された第1の1/4波長板と、
前記光源からの前記被観察体への光を直線偏光にする偏光板と、
前記被観察体と前記第2の光学手段との間に光路上へ移動可能な第2の1/4波長板とを備え、
前記第1の光学手段と第2の光学手段は前記偏光板からの光を前記被観察体への光路へ反射し、前記被観察体からの光を当該光の偏光軸に基づいて分離する偏光ビームスプリッタを有する請求項1記載の光学観察装置。further,
A first quarter-wave plate disposed as the polarizing means between the object to be observed and the retroreflective member;
A polarizing plate for linearly polarized light from the light source to the object to be observed;
A second quarter-wave plate movable between the object to be observed and the second optical means on the optical path;
The first optical means and the second optical means reflect the light from the polarizing plate to the optical path to the object to be observed, and separate the light from the object to be observed based on the polarization axis of the light. The optical observation apparatus according to claim 1, further comprising a beam splitter.
前記第2の光学手段は第1の振動方向を有する光を透過し、第1の振動方向と直交する第2の振動方向を有する光を遮る偏光分離手段を備え、
前記偏光手段は入射した光の2軸の偏光成分間の位相を1/4波長ずらす請求項1記載の光学観察装置。The light incident on the object to be observed is linearly polarized light,
The second optical means includes polarization separation means for transmitting light having a first vibration direction and blocking light having a second vibration direction orthogonal to the first vibration direction;
The optical observation apparatus according to claim 1, wherein the polarization unit shifts the phase between the biaxial polarization components of incident light by a quarter wavelength.
前記被観察体と前記第2の光学手段との間の光路上へ移動可能に設置され、入射した光の2軸の偏光成分間の位相を1/4波長ずらす第3の光学手段を備えた請求項4記載の光学観察装置。further,
A third optical unit that is movably installed on the optical path between the object to be observed and the second optical unit, and that shifts the phase between the biaxial polarization components of the incident light by a quarter wavelength; The optical observation apparatus according to claim 4.
前記第2の光学手段は、偏光角を調整できるように可動設置された偏光板を備え、
前記偏光手段は入射した光の2軸の偏光成分間の位相を1/4波長ずらす請求項1記載の光学観察装置。The light incident on the object to be observed is linearly polarized light,
The second optical means includes a polarizing plate that is movably installed so that the polarization angle can be adjusted,
The optical observation apparatus according to claim 1, wherein the polarization unit shifts the phase between the biaxial polarization components of incident light by a quarter wavelength.
光源と、
前記光源からの光を前記被検体の前面に導く第1の光学手段と、
前記被検体の裏面側に配置され、前記被検体を透過した光を再帰反射する再帰反射手段と、
前記被検体の裏面側に配置され、前記再帰反射手段から前記被検体に入射する光の偏光状態を変化させる偏光手段と、
前記被検体の前面で反射された反射光と前記再帰反射手段で反射され前記被検体を再度透過した透過光とを受光する第2の光学手段と、
前記反射光と前記透過光とを用いて前記被検体を撮像する撮像手段とを備え、
前記第2の光学手段は、受光した前記反射光と前記透過光の偏光状態の違いに基づいて、前記反射光の光量もしくは前記透過光の光量を変化させる検査装置。 An inspection apparatus that images and inspects the subject using light reflected by the subject and light transmitted through the subject,
A light source;
First optical means for guiding light from the light source to the front surface of the subject;
Retroreflective means disposed on the back side of the subject and retroreflects the light transmitted through the subject;
A polarizing means that is disposed on the back side of the subject and changes a polarization state of light incident on the subject from the retroreflective means;
Second optical means for receiving reflected light reflected by the front surface of the subject and transmitted light reflected by the retroreflecting means and transmitted again through the subject;
An imaging means for imaging the subject using the reflected light and the transmitted light;
The second optical unit is an inspection apparatus that changes the light amount of the reflected light or the light amount of the transmitted light based on a difference in polarization state between the received reflected light and the transmitted light.
光源からの光を被検体に導くステップと、
前記被検体を透過した光を前記被検体の裏面で再帰反射するステップと、
前記被検体の裏面で再帰反射され前記被検体を再度透過した透過光の偏光状態を、前記被検体の前面で反射された反射光の偏光状態と異なる偏光状態に変化させるステップと、
前記反射光と前記透過光の偏光状態の違いに基づいて、前記反射光の光量若しくは前記透過光の光量を変化させるステップと、
前記反射光を撮像するステップと、
前記被検体の裏面で再帰反射され、前記被検体を再度透過した透過光を撮像するステップを有する検査方法。An inspection method for imaging and inspecting the subject using light reflected by the subject and light transmitted through the subject,
Directing light from the light source to the subject;
Retroreflecting the light transmitted through the subject on the back surface of the subject;
Changing the polarization state of the transmitted light retroreflected on the back surface of the subject and transmitted again through the subject to a polarization state different from the polarization state of the reflected light reflected on the front surface of the subject;
Changing the amount of reflected light or the amount of transmitted light based on the difference in polarization state between the reflected light and the transmitted light; and
Imaging the reflected light;
An inspection method comprising a step of imaging the transmitted light that is retroreflected on the back surface of the subject and transmitted again through the subject.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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JP2002259166A JP3762952B2 (en) | 2002-09-04 | 2002-09-04 | Optical apparatus and image measuring apparatus and inspection apparatus using the same |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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JP2002259166A JP3762952B2 (en) | 2002-09-04 | 2002-09-04 | Optical apparatus and image measuring apparatus and inspection apparatus using the same |
Publications (3)
Publication Number | Publication Date |
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JP2004101194A JP2004101194A (en) | 2004-04-02 |
JP2004101194A5 true JP2004101194A5 (en) | 2005-10-06 |
JP3762952B2 JP3762952B2 (en) | 2006-04-05 |
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JP2002259166A Expired - Fee Related JP3762952B2 (en) | 2002-09-04 | 2002-09-04 | Optical apparatus and image measuring apparatus and inspection apparatus using the same |
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Families Citing this family (20)
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---|---|---|---|---|
JP4487042B2 (en) * | 2003-12-16 | 2010-06-23 | レーザーテック株式会社 | Optical apparatus, inspection apparatus, and inspection method |
WO2006012551A1 (en) * | 2004-07-23 | 2006-02-02 | Nextech Solutions, Inc. | Large substrate flat panel inspection system |
FR2902877B1 (en) * | 2006-06-22 | 2008-09-12 | Centre Nat Rech Scient | METHOD FOR CHARACTERIZING ANISOTROPY OF A DIFFUSING MEDIUM AND DEVICE FOR IMPLEMENTING SUCH A METHOD |
KR101114362B1 (en) * | 2009-03-09 | 2012-02-14 | 주식회사 쓰리비 시스템 | optical apparatus for inspection |
KR101074101B1 (en) | 2009-05-27 | 2011-10-17 | 주식회사 고영테크놀러지 | Image formation optical system |
JP2011085569A (en) | 2009-09-15 | 2011-04-28 | Toshiba Corp | Pattern inspection apparatus and method |
JP5556212B2 (en) * | 2010-02-08 | 2014-07-23 | 住友化学株式会社 | Defect inspection method for liquid crystal panel with polarizing plate |
TW201132963A (en) * | 2010-02-08 | 2011-10-01 | Sumitomo Chemical Co | An inspection method for defect in a liquid crystal panel laminated with polarizing plates |
KR101268300B1 (en) | 2011-04-11 | 2013-05-28 | 갤럭시아포토닉스 주식회사 | Optical mesurement apparatus |
JP2013073021A (en) * | 2011-09-28 | 2013-04-22 | Fujifilm Corp | Article having latent image |
JP2013142635A (en) * | 2012-01-11 | 2013-07-22 | Sumitomo Chemical Co Ltd | Inspection device and manufacturing apparatus of optical member laminated body |
KR20130125631A (en) * | 2012-05-09 | 2013-11-19 | 주식회사 탑 엔지니어링 | Device for inspecting liquid crystal dispensing state, and liquid crystal dispenser having the device |
WO2014174574A1 (en) * | 2013-04-22 | 2014-10-30 | 株式会社島津製作所 | Material testing device, and test piece holder and inspection method used in same |
JP6056692B2 (en) * | 2013-07-16 | 2017-01-11 | 株式会社デンソー | Inspection device |
TWI663394B (en) * | 2014-12-05 | 2019-06-21 | 美商克萊譚克公司 | Apparatus, method and computer program product for defect detection in work pieces |
KR101608942B1 (en) * | 2015-12-08 | 2016-04-20 | 홍예은 | Optical microscope using a retroreflective sheet and its operation method |
JP7105150B2 (en) * | 2018-04-12 | 2022-07-22 | 浜松ホトニクス株式会社 | Non-contact spectroscopic measurement device and non-contact spectroscopic measurement method |
US20210231939A1 (en) * | 2018-06-04 | 2021-07-29 | Jenoptik Optical Systems Gmbh | Microscope and method for capturing a microscopic image and use of a planar reflector |
CN110285948B (en) * | 2019-06-10 | 2022-04-01 | 北京航天计量测试技术研究所 | Retro-reflective sphere optical sphere center aiming device and aiming method thereof |
CN113391459B (en) * | 2021-04-28 | 2022-08-05 | 北京邮电大学 | Suspended three-dimensional display equipment based on turn-back suspended device array |
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2002
- 2002-09-04 JP JP2002259166A patent/JP3762952B2/en not_active Expired - Fee Related
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