JP2004093661A5 - - Google Patents

Download PDF

Info

Publication number
JP2004093661A5
JP2004093661A5 JP2002251444A JP2002251444A JP2004093661A5 JP 2004093661 A5 JP2004093661 A5 JP 2004093661A5 JP 2002251444 A JP2002251444 A JP 2002251444A JP 2002251444 A JP2002251444 A JP 2002251444A JP 2004093661 A5 JP2004093661 A5 JP 2004093661A5
Authority
JP
Japan
Prior art keywords
optically effective
orthogonal
reference surface
effective surface
measured
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002251444A
Other languages
English (en)
Japanese (ja)
Other versions
JP4125074B2 (ja
JP2004093661A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2002251444A priority Critical patent/JP4125074B2/ja
Priority claimed from JP2002251444A external-priority patent/JP4125074B2/ja
Publication of JP2004093661A publication Critical patent/JP2004093661A/ja
Publication of JP2004093661A5 publication Critical patent/JP2004093661A5/ja
Application granted granted Critical
Publication of JP4125074B2 publication Critical patent/JP4125074B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2002251444A 2002-08-29 2002-08-29 三次元形状測定方法 Expired - Fee Related JP4125074B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002251444A JP4125074B2 (ja) 2002-08-29 2002-08-29 三次元形状測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002251444A JP4125074B2 (ja) 2002-08-29 2002-08-29 三次元形状測定方法

Publications (3)

Publication Number Publication Date
JP2004093661A JP2004093661A (ja) 2004-03-25
JP2004093661A5 true JP2004093661A5 (zh) 2005-04-21
JP4125074B2 JP4125074B2 (ja) 2008-07-23

Family

ID=32058023

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002251444A Expired - Fee Related JP4125074B2 (ja) 2002-08-29 2002-08-29 三次元形状測定方法

Country Status (1)

Country Link
JP (1) JP4125074B2 (zh)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005337921A (ja) * 2004-05-27 2005-12-08 Olympus Corp 3次元形状測定方法及び3次元形状測定装置
JP4510520B2 (ja) * 2004-06-01 2010-07-28 キヤノン株式会社 形状測定方法および形状測定装置
JP5286699B2 (ja) * 2007-06-21 2013-09-11 日本精工株式会社 物品の形状測定方法及び測定装置
KR101673994B1 (ko) * 2014-04-02 2016-11-08 (주)비에스텍 3차원 측정기
JP2017181807A (ja) * 2016-03-30 2017-10-05 富士フイルム株式会社 レンズ及びレンズの形状測定方法
JP7327299B2 (ja) * 2019-07-11 2023-08-16 Jfeスチール株式会社 破面形状評価方法、破面形状データ格納方法、及び破面形状評価装置

Similar Documents

Publication Publication Date Title
CN103453849B (zh) 多光学传感器协同的复杂曲面零件三维测量方法与系统
CN100561120C (zh) 一种三维测量系统的成像方法
WO2007046820A3 (en) Interferometric analysis for the manufacture of nano-scale devices
CN106153074B (zh) 一种惯性测量组合动态导航性能的光学标定系统和方法
CN107816942A (zh) 一种基于十字结构光视觉系统的平面二维尺寸测量方法
CN104183010A (zh) 多视角三维在线重建的方法
JP2011527764A5 (zh)
KR20130042282A (ko) 물체 및 공간을 삼차원 모델링을 할 수 있는 시스템을 지닌 병렬형 머니퓰레이터
CN101782374A (zh) 基于模板近场光投影扫描的齿轮和成型结构轮廓测量方法
CN110174072B (zh) 一种融入光纤光栅并实现形状测量的软体翅膀及制作方法
CN104613897A (zh) 汽车外覆盖件模具自由曲面自适应采样装置及测量方法
Franceschini et al. The evolution of large-scale dimensional metrology from the perspective of scientific articles and patents
US20190154429A1 (en) Method for determining a position and orientation of an object using a profilometer
CN106885590A (zh) 一种内腔式光纤法布里珀罗测量滑移的传感器
JP2004093661A5 (zh)
Hussein et al. Novel retroreflective micro-optical structure for automotive lighting applications
Lai et al. 2D and 3D shape sensing based on 7-core fiber Bragg gratings
JP5364092B2 (ja) 大きい部品を製造する方法及びシステム
CN108682035B (zh) 一种单步光刀系统激光空间平面方程计算方法
KR101801148B1 (ko) 초정밀 위치 제어 장치 및 그 6자유도 스테이지의 위치 및 자세 정보 산출 방법
CN105352441A (zh) 一种采用多芯光纤测量多方向位移的方法
CN108692806A (zh) 固体中功率超声强度分布的测量方法
Kong et al. Measuring optical freeform surfaces using a coupled reference data method
JP2007225289A (ja) コーナーアール定規
CN107515014B (zh) 一种惯性器件的校准装置及校准方法