JP2004020567A - 光デバイスの散乱パラメータ割り出し方法および装置 - Google Patents

光デバイスの散乱パラメータ割り出し方法および装置 Download PDF

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Publication number
JP2004020567A
JP2004020567A JP2003165854A JP2003165854A JP2004020567A JP 2004020567 A JP2004020567 A JP 2004020567A JP 2003165854 A JP2003165854 A JP 2003165854A JP 2003165854 A JP2003165854 A JP 2003165854A JP 2004020567 A JP2004020567 A JP 2004020567A
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port
field
polarization
optical
optical device
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JP2003165854A
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Japanese (ja)
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JP2004020567A5 (enExample
Inventor
Rodney S Tucker
ロドニー・エス・タッカー
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Agilent Technologies Inc
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Agilent Technologies Inc
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Publication of JP2004020567A publication Critical patent/JP2004020567A/ja
Publication of JP2004020567A5 publication Critical patent/JP2004020567A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/30—Testing of optical devices, constituted by fibre optics or optical waveguides
    • G01M11/33—Testing of optical devices, constituted by fibre optics or optical waveguides with a light emitter being disposed at one fibre or waveguide end-face, and a light receiver at the other end-face

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  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP2003165854A 2002-06-18 2003-06-11 光デバイスの散乱パラメータ割り出し方法および装置 Pending JP2004020567A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/174,778 US6894780B2 (en) 2002-06-18 2002-06-18 Pilot tone multiplexing of polarization states in heterodyne optical component analysis

Publications (2)

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JP2004020567A true JP2004020567A (ja) 2004-01-22
JP2004020567A5 JP2004020567A5 (enExample) 2006-07-20

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JP2003165854A Pending JP2004020567A (ja) 2002-06-18 2003-06-11 光デバイスの散乱パラメータ割り出し方法および装置

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US (1) US6894780B2 (enExample)
EP (1) EP1376091B1 (enExample)
JP (1) JP2004020567A (enExample)
DE (1) DE60307934T2 (enExample)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006337060A (ja) * 2005-05-31 2006-12-14 Yokogawa Electric Corp 光学特性測定装置
US7538885B2 (en) 2005-05-31 2009-05-26 Yokogawa Electric Corporation Optical characteristic measuring apparatus
JP2010197575A (ja) * 2009-02-24 2010-09-09 Hitachi Ltd 投写型映像表示装置
WO2010131323A1 (ja) * 2009-05-11 2010-11-18 三菱電機株式会社 偏波多重分離装置

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7924025B2 (en) * 2005-07-25 2011-04-12 University Of Florida Research Foundation, Inc. System, device, and method for embedded S-parameter measurement
JP5186993B2 (ja) * 2008-04-30 2013-04-24 富士通株式会社 偏波多重光送受信装置
CN102045127B (zh) * 2009-10-23 2014-12-10 华为技术有限公司 光解偏振复用的接收装置、发送装置、系统及方法
US9473948B2 (en) 2012-05-28 2016-10-18 Huawei Technologies Co., Ltd. Method and apparatus for analyzing pilot pollution
JP2017026989A (ja) * 2015-07-28 2017-02-02 富士通オプティカルコンポーネンツ株式会社 光送信機、及び光変調器の制御方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05273082A (ja) * 1992-01-31 1993-10-22 Hewlett Packard Co <Hp> 光装置の偏光モード分散判定装置および方法
US6144450A (en) * 1999-09-13 2000-11-07 Lucent Technologies Apparatus and method for improving the accuracy of polarization mode dispersion measurements
JP2001296207A (ja) * 2000-03-08 2001-10-26 Lucent Technol Inc 位相感応側波帯検出を用いた偏光モード分散測定

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01147334A (ja) 1987-12-03 1989-06-09 Sumitomo Electric Ind Ltd 偏波保持光ファイバの複屈折率測定装置
US5371597A (en) 1993-11-23 1994-12-06 At&T Corp. System and method for measuring polarization dependent loss
US6380533B1 (en) 1999-02-19 2002-04-30 Lucent Technologies Inc. Method for measurement of first-and second-order polarization mode dispersion vectors in optical fibers
US6239873B1 (en) * 2000-11-13 2001-05-29 The United States Of America As Represented By The Secretary Of The Army Apparatus for simultaneous measurement of two polarization states of scattered light

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05273082A (ja) * 1992-01-31 1993-10-22 Hewlett Packard Co <Hp> 光装置の偏光モード分散判定装置および方法
US6144450A (en) * 1999-09-13 2000-11-07 Lucent Technologies Apparatus and method for improving the accuracy of polarization mode dispersion measurements
JP2001296207A (ja) * 2000-03-08 2001-10-26 Lucent Technol Inc 位相感応側波帯検出を用いた偏光モード分散測定

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006337060A (ja) * 2005-05-31 2006-12-14 Yokogawa Electric Corp 光学特性測定装置
US7538885B2 (en) 2005-05-31 2009-05-26 Yokogawa Electric Corporation Optical characteristic measuring apparatus
US7609386B2 (en) 2005-05-31 2009-10-27 Yokogawa Electric Corporation Optical characteristic measuring apparatus
US7692796B2 (en) 2005-05-31 2010-04-06 Yokogawa Electric Corporation Optical characteristic measuring apparatus
JP2010197575A (ja) * 2009-02-24 2010-09-09 Hitachi Ltd 投写型映像表示装置
WO2010131323A1 (ja) * 2009-05-11 2010-11-18 三菱電機株式会社 偏波多重分離装置

Also Published As

Publication number Publication date
US20030231311A1 (en) 2003-12-18
DE60307934T2 (de) 2007-04-26
EP1376091A2 (en) 2004-01-02
EP1376091A3 (en) 2004-12-29
DE60307934D1 (de) 2006-10-12
EP1376091B1 (en) 2006-08-30
US6894780B2 (en) 2005-05-17

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