JP2003508764A - 非理想的な信号源からの出力ステップを処理する分光計における分解能を改善する方法及びその装置 - Google Patents

非理想的な信号源からの出力ステップを処理する分光計における分解能を改善する方法及びその装置

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Publication number
JP2003508764A
JP2003508764A JP2001520938A JP2001520938A JP2003508764A JP 2003508764 A JP2003508764 A JP 2003508764A JP 2001520938 A JP2001520938 A JP 2001520938A JP 2001520938 A JP2001520938 A JP 2001520938A JP 2003508764 A JP2003508764 A JP 2003508764A
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output
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JP2003508764A5 (https=
Inventor
ウィリアム ケイ ウォーバートン
マイケル モメイエジ
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/02Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Measurement Of Radiation (AREA)
JP2001520938A 1999-08-27 2000-08-24 非理想的な信号源からの出力ステップを処理する分光計における分解能を改善する方法及びその装置 Pending JP2003508764A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US15102099P 1999-08-27 1999-08-27
US60/151,020 1999-08-27
PCT/US2000/023333 WO2001017103A1 (en) 1999-08-27 2000-08-24 Method and apparatus for improving resolution in spectrometers processing output steps from non-ideal signal sources

Publications (2)

Publication Number Publication Date
JP2003508764A true JP2003508764A (ja) 2003-03-04
JP2003508764A5 JP2003508764A5 (https=) 2007-12-27

Family

ID=22537001

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001520938A Pending JP2003508764A (ja) 1999-08-27 2000-08-24 非理想的な信号源からの出力ステップを処理する分光計における分解能を改善する方法及びその装置

Country Status (5)

Country Link
US (1) US6587814B1 (https=)
EP (1) EP1206832A4 (https=)
JP (1) JP2003508764A (https=)
AU (1) AU7072400A (https=)
WO (1) WO2001017103A1 (https=)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004093383A (ja) * 2002-08-30 2004-03-25 Toshiba Corp 波形弁別装置
JP2008501954A (ja) * 2004-06-04 2008-01-24 ウィリアム ケイ ウォーバートン X線及び核分光システムにおける検出限界を向上するための方法及び装置
JP2020148689A (ja) * 2019-03-14 2020-09-17 株式会社堀場製作所 検出装置及びスペクトル生成装置

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7065473B2 (en) * 1999-08-27 2006-06-20 William K. Warburton Method and apparatus for improving resolution in spectrometers processing output steps from non-ideal signal sources
US6609075B1 (en) 2001-06-04 2003-08-19 William K. Warburton Method and apparatus for baseline correction in x-ray and nuclear spectroscopy systems
US7174279B2 (en) * 2004-03-31 2007-02-06 Teradyne, Inc. Test system with differential signal measurement
FR2879305B1 (fr) * 2004-12-15 2007-06-29 Commissariat Energie Atomique Traitement d'un signal representatif de rayonnement
US7430481B2 (en) * 2007-01-12 2008-09-30 R. J. Lee Group, Inc. Methods for detecting and analyzing piled-up X-rays in an X-ray spectrometry system
WO2009036337A2 (en) * 2007-09-12 2009-03-19 University Of Florida Research Foundation, Inc. Method and apparatus for spectral deconvolution of detector spectra
US8884233B2 (en) 2009-11-05 2014-11-11 Lawrence Livermore National Security, Llc. Gamma ray spectroscopy employing divalent europium-doped alkaline earth halides and digital readout for accurate histogramming
JP2016061614A (ja) * 2014-09-16 2016-04-25 株式会社東芝 信号処理装置、放射線検出装置および信号処理方法

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US4314343A (en) 1980-01-25 1982-02-02 Spectra-Physics, Inc. Method and apparatus for detecting and integrating chromatographic peaks
US4529308A (en) * 1982-05-28 1985-07-16 Hunter Associates Laboratory, Inc. Spectrophotometer apparatus and method including scale drift correction feature
US4554633A (en) * 1982-09-30 1985-11-19 General Electric Company Sampled data CT system including analog filter and compensating digital filter
US4658216A (en) * 1983-07-14 1987-04-14 The United States Of America As Represented By The Department Of Energy High resolution, high rate X-ray spectrometer
US4727256A (en) 1984-06-30 1988-02-23 Shimadzu Corporation Semiconductor radiation detector
US4893018A (en) 1986-05-21 1990-01-09 Kabushiki Kaisha Toshiba Radiation detecting circuit including positional error calibrator
GB2207501A (en) * 1987-07-31 1989-02-01 Philips Electronic Associated Radiation detector arrangements and methods using resistors with high positive temperature coefficients
US4937452A (en) 1988-11-04 1990-06-26 Ortec Incorporated Charge trapping correction in photon detector systems
US4968889A (en) 1989-02-01 1990-11-06 The United States Of America As Represented By The United States Department Of Energy Pulser injection with subsequent removal for gamma-ray spectrometry
DE68924261T2 (de) * 1989-06-22 1996-03-21 Ibm Echokompensationseinrichtung mit Anpassung der Echokompensationskoeffizienten während der Vollduplexübertragung.
US5021664A (en) 1990-06-22 1991-06-04 Tennelec/Nucleus, Inc. Method and apparatus for correcting the energy resolution of ionizing radiation spectrometers
US5347129A (en) 1993-04-14 1994-09-13 University Of Missouri-Columbia System for determining the type of nuclear radiation from detector output pulse shape
US5684850A (en) 1995-08-14 1997-11-04 William K. Warburton Method and apparatus for digitally based high speed x-ray spectrometer
DE69631165T2 (de) 1995-08-14 2004-09-02 Warburton, William K., Menlo Park Verfahren und vorrichtung für digitales hochgeschwindigkeits-röntgenspektrometer
US5873054A (en) * 1995-08-14 1999-02-16 William K. Warburton Method and apparatus for combinatorial logic signal processor in a digitally based high speed x-ray spectrometer
US5774522A (en) 1995-08-14 1998-06-30 Warburton; William K. Method and apparatus for digitally based high speed x-ray spectrometer for direct coupled use with continuous discharge preamplifiers
CA2179794A1 (en) * 1996-06-24 1997-12-25 Radamis Botros Invisible acoustic screen for open-plan offices and the like
US5872363A (en) * 1997-01-14 1999-02-16 Eg&G Instruments, Inc. Automatic pole zero adjustment circuit for an ionizing radiation spectroscopy system
US5912825A (en) * 1997-02-27 1999-06-15 Eg&G Instruments, Inc. Gated base line restorer system
US5821533A (en) * 1997-01-14 1998-10-13 Eg&G Instruments, Inc. Automatic pulse top optimization circuit for an ionizing radiation spectroscopy system
WO1998050802A1 (en) * 1997-05-07 1998-11-12 Board Of Regents, The University Of Texas System Method and apparatus to prevent pile-up when detecting the energy of incoming signals
JP2000316072A (ja) * 1999-04-30 2000-11-14 Hitachi Ltd 帳票読み取り装置
US6374192B1 (en) * 1999-09-23 2002-04-16 Constellation Technology Corp. Apparatus and method for automatic correction of pole-zero error in a spectroscopy system

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004093383A (ja) * 2002-08-30 2004-03-25 Toshiba Corp 波形弁別装置
JP2008501954A (ja) * 2004-06-04 2008-01-24 ウィリアム ケイ ウォーバートン X線及び核分光システムにおける検出限界を向上するための方法及び装置
JP2020148689A (ja) * 2019-03-14 2020-09-17 株式会社堀場製作所 検出装置及びスペクトル生成装置
JP6999593B2 (ja) 2019-03-14 2022-01-18 株式会社堀場製作所 検出装置及びスペクトル生成装置

Also Published As

Publication number Publication date
US6587814B1 (en) 2003-07-01
WO2001017103A1 (en) 2001-03-08
EP1206832A1 (en) 2002-05-22
AU7072400A (en) 2001-03-26
EP1206832A4 (en) 2010-01-20

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