JP2003508764A - 非理想的な信号源からの出力ステップを処理する分光計における分解能を改善する方法及びその装置 - Google Patents
非理想的な信号源からの出力ステップを処理する分光計における分解能を改善する方法及びその装置Info
- Publication number
- JP2003508764A JP2003508764A JP2001520938A JP2001520938A JP2003508764A JP 2003508764 A JP2003508764 A JP 2003508764A JP 2001520938 A JP2001520938 A JP 2001520938A JP 2001520938 A JP2001520938 A JP 2001520938A JP 2003508764 A JP2003508764 A JP 2003508764A
- Authority
- JP
- Japan
- Prior art keywords
- region
- filter
- cmos
- time
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/02—Measuring characteristics of individual pulses, e.g. deviation from pulse flatness, rise time or duration
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Current Or Voltage (AREA)
- Measurement Of Radiation (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US15102099P | 1999-08-27 | 1999-08-27 | |
| US60/151,020 | 1999-08-27 | ||
| PCT/US2000/023333 WO2001017103A1 (en) | 1999-08-27 | 2000-08-24 | Method and apparatus for improving resolution in spectrometers processing output steps from non-ideal signal sources |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2003508764A true JP2003508764A (ja) | 2003-03-04 |
| JP2003508764A5 JP2003508764A5 (https=) | 2007-12-27 |
Family
ID=22537001
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2001520938A Pending JP2003508764A (ja) | 1999-08-27 | 2000-08-24 | 非理想的な信号源からの出力ステップを処理する分光計における分解能を改善する方法及びその装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US6587814B1 (https=) |
| EP (1) | EP1206832A4 (https=) |
| JP (1) | JP2003508764A (https=) |
| AU (1) | AU7072400A (https=) |
| WO (1) | WO2001017103A1 (https=) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004093383A (ja) * | 2002-08-30 | 2004-03-25 | Toshiba Corp | 波形弁別装置 |
| JP2008501954A (ja) * | 2004-06-04 | 2008-01-24 | ウィリアム ケイ ウォーバートン | X線及び核分光システムにおける検出限界を向上するための方法及び装置 |
| JP2020148689A (ja) * | 2019-03-14 | 2020-09-17 | 株式会社堀場製作所 | 検出装置及びスペクトル生成装置 |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7065473B2 (en) * | 1999-08-27 | 2006-06-20 | William K. Warburton | Method and apparatus for improving resolution in spectrometers processing output steps from non-ideal signal sources |
| US6609075B1 (en) | 2001-06-04 | 2003-08-19 | William K. Warburton | Method and apparatus for baseline correction in x-ray and nuclear spectroscopy systems |
| US7174279B2 (en) * | 2004-03-31 | 2007-02-06 | Teradyne, Inc. | Test system with differential signal measurement |
| FR2879305B1 (fr) * | 2004-12-15 | 2007-06-29 | Commissariat Energie Atomique | Traitement d'un signal representatif de rayonnement |
| US7430481B2 (en) * | 2007-01-12 | 2008-09-30 | R. J. Lee Group, Inc. | Methods for detecting and analyzing piled-up X-rays in an X-ray spectrometry system |
| WO2009036337A2 (en) * | 2007-09-12 | 2009-03-19 | University Of Florida Research Foundation, Inc. | Method and apparatus for spectral deconvolution of detector spectra |
| US8884233B2 (en) | 2009-11-05 | 2014-11-11 | Lawrence Livermore National Security, Llc. | Gamma ray spectroscopy employing divalent europium-doped alkaline earth halides and digital readout for accurate histogramming |
| JP2016061614A (ja) * | 2014-09-16 | 2016-04-25 | 株式会社東芝 | 信号処理装置、放射線検出装置および信号処理方法 |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4314343A (en) | 1980-01-25 | 1982-02-02 | Spectra-Physics, Inc. | Method and apparatus for detecting and integrating chromatographic peaks |
| US4529308A (en) * | 1982-05-28 | 1985-07-16 | Hunter Associates Laboratory, Inc. | Spectrophotometer apparatus and method including scale drift correction feature |
| US4554633A (en) * | 1982-09-30 | 1985-11-19 | General Electric Company | Sampled data CT system including analog filter and compensating digital filter |
| US4658216A (en) * | 1983-07-14 | 1987-04-14 | The United States Of America As Represented By The Department Of Energy | High resolution, high rate X-ray spectrometer |
| US4727256A (en) | 1984-06-30 | 1988-02-23 | Shimadzu Corporation | Semiconductor radiation detector |
| US4893018A (en) | 1986-05-21 | 1990-01-09 | Kabushiki Kaisha Toshiba | Radiation detecting circuit including positional error calibrator |
| GB2207501A (en) * | 1987-07-31 | 1989-02-01 | Philips Electronic Associated | Radiation detector arrangements and methods using resistors with high positive temperature coefficients |
| US4937452A (en) | 1988-11-04 | 1990-06-26 | Ortec Incorporated | Charge trapping correction in photon detector systems |
| US4968889A (en) | 1989-02-01 | 1990-11-06 | The United States Of America As Represented By The United States Department Of Energy | Pulser injection with subsequent removal for gamma-ray spectrometry |
| DE68924261T2 (de) * | 1989-06-22 | 1996-03-21 | Ibm | Echokompensationseinrichtung mit Anpassung der Echokompensationskoeffizienten während der Vollduplexübertragung. |
| US5021664A (en) | 1990-06-22 | 1991-06-04 | Tennelec/Nucleus, Inc. | Method and apparatus for correcting the energy resolution of ionizing radiation spectrometers |
| US5347129A (en) | 1993-04-14 | 1994-09-13 | University Of Missouri-Columbia | System for determining the type of nuclear radiation from detector output pulse shape |
| US5684850A (en) | 1995-08-14 | 1997-11-04 | William K. Warburton | Method and apparatus for digitally based high speed x-ray spectrometer |
| DE69631165T2 (de) | 1995-08-14 | 2004-09-02 | Warburton, William K., Menlo Park | Verfahren und vorrichtung für digitales hochgeschwindigkeits-röntgenspektrometer |
| US5873054A (en) * | 1995-08-14 | 1999-02-16 | William K. Warburton | Method and apparatus for combinatorial logic signal processor in a digitally based high speed x-ray spectrometer |
| US5774522A (en) | 1995-08-14 | 1998-06-30 | Warburton; William K. | Method and apparatus for digitally based high speed x-ray spectrometer for direct coupled use with continuous discharge preamplifiers |
| CA2179794A1 (en) * | 1996-06-24 | 1997-12-25 | Radamis Botros | Invisible acoustic screen for open-plan offices and the like |
| US5872363A (en) * | 1997-01-14 | 1999-02-16 | Eg&G Instruments, Inc. | Automatic pole zero adjustment circuit for an ionizing radiation spectroscopy system |
| US5912825A (en) * | 1997-02-27 | 1999-06-15 | Eg&G Instruments, Inc. | Gated base line restorer system |
| US5821533A (en) * | 1997-01-14 | 1998-10-13 | Eg&G Instruments, Inc. | Automatic pulse top optimization circuit for an ionizing radiation spectroscopy system |
| WO1998050802A1 (en) * | 1997-05-07 | 1998-11-12 | Board Of Regents, The University Of Texas System | Method and apparatus to prevent pile-up when detecting the energy of incoming signals |
| JP2000316072A (ja) * | 1999-04-30 | 2000-11-14 | Hitachi Ltd | 帳票読み取り装置 |
| US6374192B1 (en) * | 1999-09-23 | 2002-04-16 | Constellation Technology Corp. | Apparatus and method for automatic correction of pole-zero error in a spectroscopy system |
-
2000
- 2000-08-21 US US09/643,705 patent/US6587814B1/en not_active Expired - Lifetime
- 2000-08-24 WO PCT/US2000/023333 patent/WO2001017103A1/en not_active Ceased
- 2000-08-24 EP EP00959390A patent/EP1206832A4/en not_active Withdrawn
- 2000-08-24 JP JP2001520938A patent/JP2003508764A/ja active Pending
- 2000-09-24 AU AU70724/00A patent/AU7072400A/en not_active Abandoned
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004093383A (ja) * | 2002-08-30 | 2004-03-25 | Toshiba Corp | 波形弁別装置 |
| JP2008501954A (ja) * | 2004-06-04 | 2008-01-24 | ウィリアム ケイ ウォーバートン | X線及び核分光システムにおける検出限界を向上するための方法及び装置 |
| JP2020148689A (ja) * | 2019-03-14 | 2020-09-17 | 株式会社堀場製作所 | 検出装置及びスペクトル生成装置 |
| JP6999593B2 (ja) | 2019-03-14 | 2022-01-18 | 株式会社堀場製作所 | 検出装置及びスペクトル生成装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| US6587814B1 (en) | 2003-07-01 |
| WO2001017103A1 (en) | 2001-03-08 |
| EP1206832A1 (en) | 2002-05-22 |
| AU7072400A (en) | 2001-03-26 |
| EP1206832A4 (en) | 2010-01-20 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20070824 |
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| A621 | Written request for application examination |
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| A521 | Request for written amendment filed |
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