JP2003303736A - Electronic component with outer metal terminal - Google Patents

Electronic component with outer metal terminal

Info

Publication number
JP2003303736A
JP2003303736A JP2002106275A JP2002106275A JP2003303736A JP 2003303736 A JP2003303736 A JP 2003303736A JP 2002106275 A JP2002106275 A JP 2002106275A JP 2002106275 A JP2002106275 A JP 2002106275A JP 2003303736 A JP2003303736 A JP 2003303736A
Authority
JP
Japan
Prior art keywords
solder
electronic component
metal terminal
external metal
layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002106275A
Other languages
Japanese (ja)
Inventor
Akitoshi Yoshii
彰敏 吉井
Kazuhiko Kikuchi
和彦 菊地
Takashi Kamiya
貴志 神谷
Hiromi Kikuchi
博美 菊地
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TDK Corp
Original Assignee
TDK Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TDK Corp filed Critical TDK Corp
Priority to JP2002106275A priority Critical patent/JP2003303736A/en
Priority to US10/404,664 priority patent/US6704189B2/en
Priority to TW092107600A priority patent/TW591675B/en
Priority to DE60328327T priority patent/DE60328327D1/en
Priority to EP09158351A priority patent/EP2085983B1/en
Priority to EP03007915A priority patent/EP1353343B1/en
Priority to CNB031103502A priority patent/CN1295721C/en
Publication of JP2003303736A publication Critical patent/JP2003303736A/en
Pending legal-status Critical Current

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  • Ceramic Capacitors (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide an electronic component that has large tensile strength between the terminal electrode and the outer metal terminals, i.e., has strong adhesion, and is superior in reflow soldering and in environmental distribution measures without containing lead. <P>SOLUTION: This electronic component with outer metal terminals is characterized in that the terminal electrodes 12 of a ceramic capacitor element 1 are electrically connected through a solder layer 5 to the outer metal terminals 3 and the conductive content in the terminal electrode 12 diffuses into the solder layers 4, 5 and forms a diffused layer 5 μm thick or thicker when the terminal electrodes 12 are connected to the outer metal terminals 3. <P>COPYRIGHT: (C)2004,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、例えば複合型積層
コンデンサのような外部金属端子付き電子部品に関する
ものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an electronic component with an external metal terminal such as a composite type multilayer capacitor.

【0002】[0002]

【従来の技術】一般に、複合型積層コンデンサのような
電子部品は、回路基板等との電気的接合を取るために端
部電極に接合した外部金属端子を具備している。このよ
うな電子部品の外部金属端子を回路基板等に接合する方
法としては、はんだ付けによる方法が多用されている。
そして、電子部品の外部金属端子は、はんだを用いて回
路基板上に実装されることから、はんだ耐熱性を持ち、
かつ、はんだ濡れ性を兼ね備えている。
2. Description of the Related Art Generally, an electronic component such as a composite type multilayer capacitor is provided with an external metal terminal joined to an end electrode for electrical connection with a circuit board or the like. As a method of joining the external metal terminal of such an electronic component to a circuit board or the like, a soldering method is often used.
The external metal terminal of the electronic component has solder heat resistance because it is mounted on the circuit board using solder.
It also has solder wettability.

【0003】上述した外部金属端子の構造は、外部金属
端子の素材にペースト塗布等を行い焼き付け形成するC
u等からなる下地電極を備え、はんだ耐熱性を持たせる
ためにニッケルメッキを施し、さらにはんだ濡れ性を持
たせるために錫メッキを施している。そして、従来にお
いてはこれらのメッキ層と電子部品の端部電極との間を
はんだ付けにより接合している。
The structure of the external metal terminal described above is formed by applying paste to the material of the external metal terminal and baking it.
A base electrode made of u or the like is provided, and nickel plating is performed to provide solder heat resistance, and tin plating is provided to provide solder wettability. Then, conventionally, these plated layers and the end electrodes of the electronic component are joined by soldering.

【0004】[0004]

【発明が解決しようとする課題】ところで、近年、環境
問題への対策が重要視されるようになってきているが、
従来から多用されているはんだに含まれている鉛も問題
の一つとされている。このため、はんだの鉛フリー化が
行われるようになり、電子部品も無鉛はんだを用いて外
部金属端子に接合され、さらに回路基板等に実装される
ようになっきている。
By the way, in recent years, measures for environmental problems have come to be emphasized.
Lead contained in solder, which has been frequently used, is also a problem. For this reason, lead-free solders have come to be used, and electronic parts are also being joined to external metal terminals using lead-free solder and further mounted on circuit boards and the like.

【0005】しかし、複合型積層コンデンサや、回路モ
ジュール等の電子部品は、一般にははんだ接合を行う場
合、高温はんだを用いることが多いが、例えば固相線が
200℃以上の中高温無鉛はんだの場合、接合強度等の
問題で十分なものが得られていないのが現状である。
However, for electronic parts such as composite type multilayer capacitors and circuit modules, high temperature solder is generally used when soldering is used. In this case, the current situation is that sufficient materials have not been obtained due to problems such as bonding strength.

【0006】すなわち、従来の電子部品と、外部金属端
子とのはんだ接合は、外部金属端子のはんだ耐熱用に形
成されているニッケルメッキよりも外側(電子部品側)
での溶融反応による接合であり、このため電子部品、外
部金属端子間の接合強度が十分でなく実使用上問題があ
った。
That is, the conventional solder joint between the electronic component and the external metal terminal is located outside the nickel plating formed for heat resistance of the external metal terminal (on the electronic component side).
However, the bonding strength between the electronic component and the external metal terminal was not sufficient, and there was a problem in practical use.

【0007】本発明は、上記事情に鑑みてなされたもの
であり、端部電極、外部金属端子間の引っ張り強度、す
なわち、接合強度が大きく、かつ、リフロー性に優れ、
さらに鉛を含まず環境問題への対策も万全な電子部品の
接合構造及びかかる接合構造を有する外部金属端子付き
電子部品を提供するものである。
The present invention has been made in view of the above circumstances, and has a large tensile strength between the end electrodes and the external metal terminals, that is, a high bonding strength and an excellent reflowability.
Further, the present invention provides a joint structure of electronic components which does not contain lead and which is also suitable for environmental problems, and an electronic component with an external metal terminal having such a joint structure.

【0008】[0008]

【課題を解決するための手段】請求項1記載の発明は、
外部金属端子付き電子部品において、電子部品本体の端
部電極と外部金属端子とをはんだ層を介して電気的に接
合し、かつ、電子部品本体の端部電極と外部金属端子と
を接合する際に、電子部品本体の端部電極の導電成分が
はんだ層に拡散してはんだ接合部分に5μm以上の厚さ
の拡散層が形成されていることを特徴とするものであ
る。
The invention according to claim 1 is
In an electronic component with an external metal terminal, when electrically connecting the end electrode of the electronic component body and the external metal terminal via a solder layer, and when joining the end electrode of the electronic component body and the external metal terminal In addition, the conductive component of the end electrode of the electronic component body diffuses into the solder layer, and a diffusion layer having a thickness of 5 μm or more is formed at the solder joint portion.

【0009】請求項1記載の発明によれば、端部電極と
外部金属端子とを接合するはんだ層に5μm以上の厚さ
の拡散層が形成されていることから、端部電極、外部金
属端子間の引っ張り強度に優れた高品質の外部金属端子
付き電子部品を得ることができる。
According to the invention of claim 1, since the diffusion layer having a thickness of 5 μm or more is formed in the solder layer for joining the end electrode and the external metal terminal, the end electrode and the external metal terminal are formed. It is possible to obtain a high-quality electronic component with an external metal terminal that is excellent in tensile strength between.

【0010】請求項2記載の発明は、請求項1記載の外
部金属端子付き電子部品において、前記はんだ層は、固
相線温度が230℃以上であるSn−Sb系高温はんだ
からなり、電子部品本体の端部電極はCuを主成分とし
ており、かつはんだ層に拡散する金属成分がCuである
ことを特徴とするものである。
According to a second aspect of the present invention, in the electronic component with an external metal terminal according to the first aspect, the solder layer is made of Sn-Sb type high temperature solder having a solidus temperature of 230 ° C. or higher. The end electrode of the main body is characterized in that Cu is the main component, and the metal component diffused in the solder layer is Cu.

【0011】請求項2記載の発明によれば、端部電極と
外部金属端子とを接合するSn−Sb系高温はんだから
なるはんだ層に金属成分がCuである拡散層が形成され
ているため、引っ張り強度に優れ、また、固相線温度が
高く耐リフロー性に優れ、鉛を含まないことから環境汚
染の心配がない高品質の外部金属端子付き電子部品を得
ることができる。
According to the second aspect of the invention, since the diffusion layer having a metal component of Cu is formed in the solder layer made of Sn—Sb type high temperature solder for joining the end electrode and the external metal terminal, It is possible to obtain a high-quality electronic component with an external metal terminal that is excellent in tensile strength, has a high solidus temperature, is excellent in reflow resistance, and does not contain lead because it does not contain environmental pollution.

【0012】請求項3記載の発明は、請求項1又は2記
載の外部金属端子付き電子部品において、前記電子部品
本体の端部電極は導電成分をCu主成分としており、か
つ端部電極の端面にはNiメッキが形成されており、は
んだ層に拡散するCuはNiメッキ層を通して拡散し、
はんだ層部分に拡散層を形成していることを特徴とする
ものである。
According to a third aspect of the present invention, in the electronic component with an external metal terminal according to the first or second aspect, the end electrode of the electronic component body has a conductive component as a main component of Cu, and the end face of the end electrode. Is plated with Ni, and Cu diffused into the solder layer diffuses through the Ni plated layer.
It is characterized in that a diffusion layer is formed in the solder layer portion.

【0013】請求項3記載の発明によれば、端部電極と
外部金属端子とを接合するはんだ層に、Niメッキ層を
通したCuの拡散層が形成されているため、請求項1記
載の発明と同様、端部電極、外部金属端子間の引っ張り
強度に優れた高品質の外部金属端子付き電子部品を得る
ことができる。
According to the third aspect of the present invention, since the Cu diffusion layer through the Ni plating layer is formed in the solder layer joining the end electrode and the external metal terminal, the first aspect of the present invention is described. Similar to the invention, it is possible to obtain a high-quality electronic component with an external metal terminal which is excellent in tensile strength between the end electrode and the external metal terminal.

【0014】[0014]

【発明の実施の形態】以下に本発明の実施の形態につい
て詳細に説明する。
BEST MODE FOR CARRYING OUT THE INVENTION Embodiments of the present invention will be described in detail below.

【0015】図1は本発明の実施の形態の外部金属端子
付き部品である複合型積層コンデンサの正面図、図2は
図1に示した複合型積層コンデンサの縦断面図である。
FIG. 1 is a front view of a composite multilayer capacitor which is a component with external metal terminals according to an embodiment of the present invention, and FIG. 2 is a vertical cross-sectional view of the composite multilayer capacitor shown in FIG.

【0016】図1、図2に示す複合型積層コンデンサ
は、例えば電子部品本体である直方体形状のセラミック
コンデンサ素子1と、このセラミックコンデンサ素子1
に接合した一対の外部金属端子2、3とを有している。
セラミックコンデンサ素子1は、長さLの方向において
相対する両側端面に端部電極11、12を具備してい
る。
The composite type multilayer capacitor shown in FIGS. 1 and 2 is, for example, a rectangular parallelepiped ceramic capacitor element 1 which is an electronic component body, and the ceramic capacitor element 1.
It has a pair of external metal terminals 2 and 3 joined to.
The ceramic capacitor element 1 is provided with end electrodes 11 and 12 on both end surfaces facing each other in the direction of the length L.

【0017】図2に示すように、前記セラミックコンデ
ンサ素子1は、セラミック誘電体基体100の内部に多
数(例えば100層)の内部電極101、102を有す
る。内部電極101は一端が端部電極11に接続され、
他端が開放端になっており、内部電極102は一端が端
部電極12に接続され、他端が開放端になっている。端
部電極11、12、内部電極101、102及びセラミ
ック誘電体基体100の構成材料及びその製造方法等は
周知である。
As shown in FIG. 2, the ceramic capacitor element 1 has a large number (for example, 100 layers) of internal electrodes 101 and 102 inside a ceramic dielectric substrate 100. One end of the internal electrode 101 is connected to the end electrode 11,
The other end is an open end, one end of the internal electrode 102 is connected to the end electrode 12, and the other end is an open end. The constituent materials of the end electrodes 11 and 12, the internal electrodes 101 and 102, the ceramic dielectric substrate 100, and the manufacturing method thereof are well known.

【0018】前記外部金属端子2は、一端21が端部電
極11に接合(接続)され、中間部に折り返し部22を
有し、折り返し部22の突出端側はL状に折曲されて外
部導体(回路基板等)と接続される端子部23となって
いる。
The external metal terminal 2 has one end 21 joined (connected) to the end electrode 11 and has a folded-back portion 22 at an intermediate portion. The protruding end side of the folded-back portion 22 is bent into an L shape to be externally connected. The terminal portion 23 is connected to a conductor (circuit board or the like).

【0019】前記外部金属端子3も、一端31が端部電
極12に接合され、中間部に折り返し部32を有し、折
り返し部32の突出端側は逆L状に折曲されて外部導体
(回路基板等)と接続される端子部33となっている。
The external metal terminal 3 also has one end 31 joined to the end electrode 12 and a folded-back portion 32 at an intermediate portion. The protruding end side of the folded-back portion 32 is bent in an inverted L shape to form an external conductor ( The terminal portion 33 is connected to a circuit board or the like).

【0020】前記外部金属端子2、3の素材は、電気抵
抗が低く、しかもバネ性に優れた材料によって形成す
る。材料の代表例としては、燐青銅の板材がある。板厚
は、特に限定するものではないが、代表的には0.1m
m程度である。
The material of the external metal terminals 2 and 3 is formed of a material having low electric resistance and excellent spring property. A plate material of phosphor bronze is a typical example of the material. The plate thickness is not particularly limited, but is typically 0.1 m.
It is about m.

【0021】前記外部金属端子2、3の一端21、31
は、各々詳細は後述するはんだからなるはんだ層4、5
によって端部電極11、12の端面に接合されている。
One ends 21, 31 of the external metal terminals 2, 3
Are solder layers 4 and 5 made of solder, each of which will be described in detail later.
Are joined to the end faces of the end electrodes 11 and 12.

【0022】図3は図1及び図2に示した複合型積層コ
ンデンサを回路基板70上に実装した状態を示す部分断
面図である。この複合型積層コンデンサは、例えば回路
基板70の上にはんだ81を介して搭載される。回路基
板70の表面には、導体パターン71、72が設けられ
ている。複合型積層コンデンサに備えられた外部金属端
子2の端子部23がはんだ81によって導体パターン7
1にはんだ付けされ、また、外部金属端子3の端子部3
3もはんだ81によって導体パターン72にはんだ付け
されている。
FIG. 3 is a partial sectional view showing a state in which the composite type multilayer capacitor shown in FIGS. 1 and 2 is mounted on the circuit board 70. This composite type multilayer capacitor is mounted, for example, on the circuit board 70 via solder 81. Conductor patterns 71 and 72 are provided on the surface of the circuit board 70. The terminal portion 23 of the external metal terminal 2 provided in the composite type multilayer capacitor is formed by the solder 81 into the conductor pattern 7
1 is soldered to the external metal terminal 3
3 is also soldered to the conductor pattern 72 by the solder 81.

【0023】本実施の形態において、前記はんだ層5を
形成する場合には、例えばリフロー温度200℃以上の
範囲で溶融しない、又は溶融しにくい(すなわち耐リフ
ロー性を有する)高温無鉛はんだを使用する。高温無鉛
はんだとしては、具体的には、金属組成がSn−Sb系
であり、Sn/Sbが重量%比で例えば90/10、固
相線が230℃以上、液相線が268℃のものが好適で
ある。
In the present embodiment, when the solder layer 5 is formed, a high temperature lead-free solder that does not melt or is difficult to melt (that is, has reflow resistance) at a reflow temperature of 200 ° C. or higher is used. . As the high temperature lead-free solder, specifically, the metal composition is Sn-Sb system, and Sn / Sb has a weight% ratio of, for example, 90/10, a solidus line of 230 ° C or higher, and a liquidus line of 268 ° C Is preferred.

【0024】同様に、前記外部金属端子2の端子部23
と導体パターン71、外部金属端子3の端子部33と導
体パターン72とのはんだ付けに各々使用するはんだ8
1も、上述した高温無鉛はんだを使用することができ
る。
Similarly, the terminal portion 23 of the external metal terminal 2
And the conductor pattern 71, and the solder 8 used for soldering the terminal portion 33 of the external metal terminal 3 and the conductor pattern 72, respectively.
1 can also use the above-mentioned high temperature lead-free solder.

【0025】次に、本実施の形態の前記はんだ層5を使
用した端部電極12と、外部金属端子3の一端31との
接合構造(他方の端部電極11外部金属端子2の一端2
1との接合構造も同様)について図4を参照して詳述す
る。
Next, a joining structure of the end electrode 12 using the solder layer 5 of the present embodiment and the one end 31 of the external metal terminal 3 (the other end electrode 11 and the one end 2 of the external metal terminal 2).
The same applies to the joint structure with 1) with reference to FIG.

【0026】図4に示すように、端部電極12は、Cu
を主成分とする下地電極12aと、はんだ耐熱性を持た
せるためのニッケル(Ni)メッキ層42と、はんだ濡
れ性を持たせるための錫(Sn)メッキ層43とから構
成される。
As shown in FIG. 4, the end electrodes 12 are made of Cu.
Is used as a main component, a nickel (Ni) plating layer 42 for providing solder heat resistance, and a tin (Sn) plating layer 43 for providing solder wettability.

【0027】そして、端部電極12と外部金属端子3の
一端31とは、前記Sn−Sb系の高温無鉛はんだであ
るはんだ層5により接合される。尚、錫メッキ層43に
ついては、はんだ付け加熱時Sn−Sb系の高温無鉛は
んだであるはんだ層5に拡散混合する状態となる。
Then, the end electrode 12 and the one end 31 of the external metal terminal 3 are joined by the solder layer 5 which is the Sn—Sb type high temperature lead-free solder. The tin-plated layer 43 is in a state of diffusively mixed with the solder layer 5 which is a Sn—Sb-based high temperature lead-free solder during heating for soldering.

【0028】すなわち、本実施の形態の接合構造を具体
的に表すと、図4の左側からセラミックコンデンサ素子
1、下地電極12a、ニッケルメッキ層42、錫メッキ
層43、Sn−Sb系の高温無鉛はんだ5、外部金属端
子3の一端31の順となる。ここで、上述した高温無鉛
はんだを使用し、リフロー炉によるリフロー処理を行っ
て構成した4種の複合型積層コンデンサの端部電極1
1、12と外部金属端子2、3に関する試料(試料1乃
至試料4)について、リフロー炉によるリフロー時の温
度条件(雰囲気温度)、通炉時間条件及び公知のEPM
Aにより分析した下地電極12a周辺のCu成分のはん
だ拡散層45について、図5、図6を参照して説明す
る。尚、図6の(A)乃至(D)は、はんだ拡散層45
が発生しない前記試料1及び前記試料2乃至試料4に発
生するはんだ拡散層45の構造を模式的に表したもので
ある。
That is, when the bonding structure of this embodiment is specifically described, from the left side of FIG. 4, the ceramic capacitor element 1, the base electrode 12a, the nickel plating layer 42, the tin plating layer 43, and the Sn—Sb system high temperature lead-free. The solder 5 and the one end 31 of the external metal terminal 3 are arranged in this order. Here, the end electrodes 1 of the four types of composite type multilayer capacitors configured by performing the reflow process in the reflow furnace using the above-mentioned high temperature lead-free solder
Regarding samples 1 to 12 and external metal terminals 2 and 3 (samples 1 to 4), temperature conditions (atmosphere temperature) during reflow in the reflow furnace, passage time conditions, and known EPM
The Cu component solder diffusion layer 45 around the base electrode 12a analyzed by A will be described with reference to FIGS. 6A to 6D show the solder diffusion layer 45.
3 schematically shows the structure of the solder diffusion layer 45 generated in the sample 1 and the samples 2 to 4 in which the solder does not occur.

【0029】試料1の場合、温度条件325℃、通炉時
間条件5分で、図6(A)に示すようにはんだ拡散層4
5は見出せなかった。
In the case of sample 1, the solder diffusion layer 4 was formed under the temperature condition of 325 ° C. and the passing time condition of 5 minutes as shown in FIG. 6 (A).
5 was not found.

【0030】試料2の場合、温度条件325℃、通炉時
間条件7分で、図6(B)に示すようにニッケルメッキ
層42を通してはんだ層5中に厚さ5乃至10μmのは
んだ拡散層45(クロス斜線で示す)が発生した。
In the case of Sample 2, under the temperature condition of 325 ° C. and the furnace time condition of 7 minutes, the solder diffusion layer 45 having a thickness of 5 to 10 μm is introduced into the solder layer 5 through the nickel plating layer 42 as shown in FIG. 6B. (Indicated by cross hatching) occurred.

【0031】試料3の場合、温度条件350℃、通炉時
間条件5分で、図6(C)に示すようにニッケルメッキ
層42を通してはんだ層5中に厚さ5乃至20μmのは
んだ拡散層45(クロス斜線で示す)が発生した。
In the case of Sample 3, under the temperature condition of 350 ° C. and the furnace time condition of 5 minutes, the solder diffusion layer 45 having a thickness of 5 to 20 μm is introduced into the solder layer 5 through the nickel plating layer 42 as shown in FIG. 6C. (Indicated by cross hatching) occurred.

【0032】試料4の場合、温度条件350℃、通炉時
間条件7分で、図6(D)に示すようにニッケルメッキ
層42を通してはんだ層5中に厚さ5乃至40μmのは
んだ拡散層45(クロス斜線で示す)が発生した。
In the case of Sample 4, under the temperature condition of 350 ° C. and the passing time condition of 7 minutes, the solder diffusion layer 45 having a thickness of 5 to 40 μm is introduced into the solder layer 5 through the nickel plating layer 42 as shown in FIG. 6D. (Indicated by cross hatching) occurred.

【0033】試料1乃至試料4の端部電極11と外部金
属端子2の一端21との接合構造に関しても上述した場
合と同様であった。
The joining structure between the end electrode 11 of each of the samples 1 to 4 and the one end 21 of the external metal terminal 2 was similar to that described above.

【0034】次に、前記試料1乃至試料4について、引
っ張り強度試験による引っ張り強度についての判定結果
について説明する。
Next, with respect to the above-mentioned Samples 1 to 4, the judgment results of the tensile strength by the tensile strength test will be described.

【0035】引っ張り強度試験は、図7に示すように、
ピアノ線51を使用し、各試料1乃至試料4の外部金属
端子2、3の端子部23、33を各々外側に開き、カギ
状に屈曲させたピアノ線51を外部金属端子2、3の穴
部分に引っかけ、通常の引っ張り強度試験機により引っ
張り強度を測定するものである。
The tensile strength test is as shown in FIG.
Using the piano wire 51, the terminal portions 23 and 33 of the external metal terminals 2 and 3 of each of the samples 1 to 4 are opened to the outside, and the piano wire 51 bent in a key shape is provided in the holes of the external metal terminals 2 and 3. It is hooked on a part and the tensile strength is measured by a normal tensile strength tester.

【0036】引っ張り強度試験の結果、試料1の場合、
はんだ拡散層45が存在せず、引っ張り強度1.1kg
fであり、実使用上引っ張り強度が小さすぎて判定結果
は不可であった。
As a result of the tensile strength test, in the case of sample 1,
There is no solder diffusion layer 45, and the tensile strength is 1.1 kg.
It was f, and the tensile strength was too small for practical use, and the judgment result was unacceptable.

【0037】試料2、3、4の場合、引っ張り強度は各
々7.5kgf、9.2kgf、9.1kgfと実使用
上十分な値を示した。
In the case of Samples 2, 3, and 4, the tensile strengths were 7.5 kgf, 9.2 kgf, and 9.1 kgf, which were sufficient values for practical use.

【0038】以上から、金属組成がSn−Sb系で、S
n/Sbが重量%比で90/10、固相線が240℃以
上、液相線が268℃の高温無鉛はんだをはんだ層4、
5として使用し、上述した試料2、3、4のようなリフ
ロー処理を行い下地電極12a中に厚さ5乃至40μm
のはんだ拡散層45を発生させることで、引っ張り強度
に優れ、さらに耐リフロー性も有し、鉛を含まないこと
から環境汚染の心配がない端部電極12と外部金属端子
3、端部電極11と外部金属端子2との接合構造を備え
た複合型積層コンデンサを得ることができる。
From the above, the metal composition is Sn-Sb system and S
n / Sb is 90/10 by weight ratio, the solid phase line is 240 ° C. or higher, and the liquidus line is 268 ° C.
5 and subjected to the reflow treatment as in Samples 2, 3 and 4 described above and having a thickness of 5 to 40 μm in the base electrode 12a.
By generating the solder diffusion layer 45, the end electrode 12, the external metal terminal 3, and the end electrode 11 are excellent in tensile strength, have reflow resistance, and do not contain lead because they do not contain environmental pollution. It is possible to obtain a composite type multilayer capacitor having a joint structure between the external metal terminal 2 and the external metal terminal 2.

【0039】同様に、前記外部金属端子2の端子部23
と導体パターン71、外部金属端子3の端子部33と導
体パターン72とのはんだ付けに各々使用するはんだ8
1として上述したSn−Sb系の高温無鉛はんだを使用
する。この場合にも、上述した場合と同様、引っ張り強
度に優れ、さらに、耐リフロー性も有し、はんだの溶融
のため外部回路へブリッジ等を発生させる等の悪影響を
及ぼす惧れもない接合構造を得ることができる。
Similarly, the terminal portion 23 of the external metal terminal 2
And the conductor pattern 71, and the solder 8 used for soldering the terminal portion 33 of the external metal terminal 3 and the conductor pattern 72, respectively.
The above-mentioned Sn-Sb-based high temperature lead-free solder is used as 1. Also in this case, as in the case described above, a joining structure that has excellent tensile strength, has reflow resistance, and is unlikely to adversely affect the external circuit due to melting of the solder, etc. Obtainable.

【0040】本発明は、上述した実施の形態の他、一対
の外部金属端子間に2個、3個等さらに多段にセラミッ
クコンデンサ素子1を接続配置する構造の複合型積層コ
ンデンサにも同様に適用できる。
In addition to the above-mentioned embodiment, the present invention is similarly applied to a composite type multilayer capacitor having a structure in which two or three ceramic capacitor elements 1 are connected and arranged between a pair of external metal terminals. it can.

【0041】また、本発明の複合型積層コンデンサは、
主に、スイッチング電源用の平滑用コンデンサとして用
いて好適である。
Further, the composite multilayer capacitor of the present invention is
It is mainly suitable for use as a smoothing capacitor for a switching power supply.

【0042】さらに本発明は、コイル部品や抵抗部品等
の電極接合構造にも適用可能である。
Further, the present invention can be applied to an electrode joining structure such as a coil component or a resistance component.

【0043】[0043]

【発明の効果】以上説明した本発明によれば、端部電
極、外部金属端子間の引っ張り強度に優れ、さらに耐リ
フロー性に優れ、鉛を含まないことから環境汚染の心配
がない高品質の外部金属端子付き電子部品を提供するこ
とができる。
As described above, according to the present invention, the tensile strength between the end electrodes and the external metal terminals is excellent, the reflow resistance is excellent, and since lead is not contained, there is no fear of environmental pollution. An electronic component with an external metal terminal can be provided.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施の形態の複合型積層コンデンサの
正面図である。
FIG. 1 is a front view of a composite multilayer capacitor according to an embodiment of the present invention.

【図2】本実施の形態の複合型積層コンデンサの縦断面
図である。
FIG. 2 is a vertical cross-sectional view of the composite multilayer capacitor of the present embodiment.

【図3】本実施の形態の複合型積層コンデンサの回路基
板への接続状態を示す部分断面図である。
FIG. 3 is a partial cross-sectional view showing a connection state of the composite multilayer capacitor of the present embodiment with a circuit board.

【図4】本実施の形態の端部電極、外部金属端子間の接
合構造を示す部分拡大断面図である。
FIG. 4 is a partial enlarged cross-sectional view showing a joint structure between an end electrode and an external metal terminal according to the present embodiment.

【図5】本実施の形態の試料1乃至4のリフロー処理時
の温度条件、通炉時間条件及び引っ張り強度試験結果を
示す図である。
FIG. 5 is a diagram showing temperature conditions, reflow furnace time conditions, and tensile strength test results during reflow processing of samples 1 to 4 of the present embodiment.

【図6】本実施の形態の試料1乃至試料4における端部
電極、外部金属端子間に発生するはんだ拡散層を模式的
に示す説明図である。
FIG. 6 is an explanatory view schematically showing a solder diffusion layer generated between an end electrode and an external metal terminal in Samples 1 to 4 of the present embodiment.

【図7】本実施の形態の試料1乃至4の引っ張り強度試
験の状態を示す説明図である。
FIG. 7 is an explanatory diagram showing a state of a tensile strength test of Samples 1 to 4 of the present embodiment.

【符号の説明】[Explanation of symbols]

1 セラミックコンデンサ素子 2 外部金属端子 3 外部金属端子 4 はんだ層 5 はんだ層 11 端部電極 12 端部電極 12a 下地電極 21 一端 22 折り返し部 23 端子部 31 一端 32 折り返し部 33 端子部 42 ニッケルメッキ層 43 錫メッキ層 45 はんだ拡散層 51 ピアノ線 70 回路基板 71 導体パターン 72 導体パターン 100 セラミック誘電体基体 101 内部電極 102 内部電極 1 Ceramic capacitor element 2 External metal terminal 3 External metal terminal 4 Solder layer 5 Solder layer 11 Edge electrode 12 end electrodes 12a Base electrode 21 One end 22 Folding part 23 Terminal 31 one end 32 Folding part 33 terminal 42 Nickel plating layer 43 Tin plating layer 45 Solder diffusion layer 51 piano wire 70 circuit board 71 conductor pattern 72 conductor pattern 100 ceramic dielectric substrate 101 internal electrode 102 internal electrode

───────────────────────────────────────────────────── フロントページの続き (72)発明者 神谷 貴志 東京都中央区日本橋一丁目13番1号 ティ ーディーケイ株式会社内 (72)発明者 菊地 博美 東京都中央区日本橋一丁目13番1号 ティ ーディーケイ株式会社内   ─────────────────────────────────────────────────── ─── Continued front page    (72) Takashi Kamiya, inventor             1-13-1, Nihonbashi, Chuo-ku, Tokyo             -In DC Inc. (72) Inventor Hiromi Kikuchi             1-13-1, Nihonbashi, Chuo-ku, Tokyo             -In DC Inc.

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 外部金属端子付き電子部品において、電
子部品本体の端部電極と外部金属端子とをはんだ層を介
して電気的に接合し、かつ、電子部品本体の端部電極と
外部金属端子とを接合する際に、電子部品本体の端部電
極の導電成分がはんだ層に拡散してはんだ接合部分に5
μm以上の厚さの拡散層が形成されていることを特徴と
する外部金属端子付き電子部品。
1. In an electronic component with an external metal terminal, an end electrode of an electronic component body and an external metal terminal are electrically joined via a solder layer, and an end electrode of the electronic component body and the external metal terminal are electrically connected. When joining and, the conductive component of the end electrode of the electronic component body diffuses into the solder layer and
An electronic component with an external metal terminal, wherein a diffusion layer having a thickness of μm or more is formed.
【請求項2】 前記はんだ層は、固相線温度が230℃
以上であるSn−Sb系高温はんだからなり、電子部品
本体の端部電極はCuを主成分としており、かつはんだ
層に拡散する金属成分がCuであることを特徴とする請
求項1記載の外部金属端子付き電子部品。
2. The solidus temperature of the solder layer is 230 ° C.
The above-mentioned Sn-Sb-based high-temperature solder, the end electrode of the electronic component body has Cu as a main component, and the metal component diffused into the solder layer is Cu. Electronic components with metal terminals.
【請求項3】 前記電子部品本体の端部電極は導電成分
をCu主成分としており、かつ端部電極の端面にはNi
メッキが形成されており、はんだ層に拡散するCuはN
iメッキ層を通して拡散し、はんだ層部分に拡散層を形
成していることを特徴とする請求項1又は請求項2記載
の外部金属端子付き電子部品。
3. An end electrode of the electronic component body has a Cu main component as a conductive component, and Ni is formed on an end surface of the end electrode.
Since the plating is formed and Cu that diffuses into the solder layer is N
The electronic component with an external metal terminal according to claim 1 or 2, wherein the electronic component is diffused through the i-plated layer and a diffusion layer is formed in a solder layer portion.
JP2002106275A 2002-04-09 2002-04-09 Electronic component with outer metal terminal Pending JP2003303736A (en)

Priority Applications (7)

Application Number Priority Date Filing Date Title
JP2002106275A JP2003303736A (en) 2002-04-09 2002-04-09 Electronic component with outer metal terminal
US10/404,664 US6704189B2 (en) 2002-04-09 2003-04-02 Electronic device with external terminals and method of production of the same
TW092107600A TW591675B (en) 2002-04-09 2003-04-03 Electronic device with external terminals and method of production of the same
DE60328327T DE60328327D1 (en) 2002-04-09 2003-04-07 Electronic component with external connections and its manufacturing process
EP09158351A EP2085983B1 (en) 2002-04-09 2003-04-07 Electronic device with external terminals
EP03007915A EP1353343B1 (en) 2002-04-09 2003-04-07 Electronic device with external terminals and method of production of the same
CNB031103502A CN1295721C (en) 2002-04-09 2003-04-09 Electronic device with extenal terminals and mfg method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002106275A JP2003303736A (en) 2002-04-09 2002-04-09 Electronic component with outer metal terminal

Publications (1)

Publication Number Publication Date
JP2003303736A true JP2003303736A (en) 2003-10-24

Family

ID=29390636

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002106275A Pending JP2003303736A (en) 2002-04-09 2002-04-09 Electronic component with outer metal terminal

Country Status (1)

Country Link
JP (1) JP2003303736A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2131374A1 (en) 2008-06-02 2009-12-09 Murata Manufacturing Co., Ltd. Ceramic electronic component with diffusion bonding between external electrode and metal terminal, and method for manufacturing the same
CN114311688A (en) * 2021-12-31 2022-04-12 宜兴市惠华复合材料有限公司 Low-cost diffusion welding system and method
US11443897B2 (en) 2020-05-15 2022-09-13 Tdk Corporation Electronic component

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2131374A1 (en) 2008-06-02 2009-12-09 Murata Manufacturing Co., Ltd. Ceramic electronic component with diffusion bonding between external electrode and metal terminal, and method for manufacturing the same
US8134825B2 (en) 2008-06-02 2012-03-13 Murata Manufacturing Co., Ltd. Ceramic electronic component and method for manufacturing the same
US11443897B2 (en) 2020-05-15 2022-09-13 Tdk Corporation Electronic component
CN114311688A (en) * 2021-12-31 2022-04-12 宜兴市惠华复合材料有限公司 Low-cost diffusion welding system and method
CN114311688B (en) * 2021-12-31 2024-03-26 宜兴市惠华复合材料有限公司 Low-cost diffusion welding system and method

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