JP2003198213A - Wiring board for high frequency - Google Patents

Wiring board for high frequency

Info

Publication number
JP2003198213A
JP2003198213A JP2001392764A JP2001392764A JP2003198213A JP 2003198213 A JP2003198213 A JP 2003198213A JP 2001392764 A JP2001392764 A JP 2001392764A JP 2001392764 A JP2001392764 A JP 2001392764A JP 2003198213 A JP2003198213 A JP 2003198213A
Authority
JP
Japan
Prior art keywords
conductor
ground
layer
line
conductor layer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001392764A
Other languages
Japanese (ja)
Inventor
Tamio Kusano
民男 草野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP2001392764A priority Critical patent/JP2003198213A/en
Publication of JP2003198213A publication Critical patent/JP2003198213A/en
Pending legal-status Critical Current

Links

Abstract

<P>PROBLEM TO BE SOLVED: To provide a high frequency board which can transmit a high frequency signal at a higher frequency band, by reducing a the distance between ground-penetrating conductor and penetrating conductor, and preventing short- circuit between an inner conductor layer and an inner ground conductor layer. <P>SOLUTION: A first and a second coplanar lines are formed on the upper and a lower surfaces of a dielectric board 1, which is provided with a penetrating conductor 4 penetrating a central part of an almost circular inner conductor layer 4a and a plurality of ground-penetrating conductors 5 penetrating central parts of a plurality of almost circular inner ground conductor layers 5a, which are formed at an almost constant interval on a circumference D, having the inner conductor layer 4a as a center. Around the ground-penetrating conductor 5, the inner ground conductor layer 5a is formed in configuration with an annular conductor layer cutting out a part of the penetrating conductor 4 side along a radius R. An angle on the conductor layer side, which a line L passing a center C1 of the penetrating conductor 4 and a center C2 of the ground penetrating conductor 5 makes with respect to the radius R, is 90-120°, a distance between the center C1 and the center C2 is 0.5-0.64 mm and a thickness T of the dielectric layer is 0.1-0.8 mm. <P>COPYRIGHT: (C)2003,JPO

Description

【発明の詳細な説明】 【0001】 【発明の属する技術分野】本発明は、電気的特性を向上
させた高周波入出力部を具備した高周波用配線基板に関
する。 【0002】 【従来の技術】従来の高周波用配線基板(以下、高周波
基板という)を図4〜図6に示す。図4は高周波基板の
斜視図、図5は図4のA−A’線における断面図、図6
は図5のB−B’線における部分拡大平面図である。こ
の高周波基板は、誘電体基板11から成り、高周波回路
用基板、高周波用半導体素子収納用パッケージまたは高
周波用半導体素子搭載用チップキャリア等に用いられ
る。また、高周波基板の上面に搭載される高周波用半導
体素子等の高周波用部品を電気的に接続するものであ
り、第1の線路導体12aと第1の同一面接地導体層13a
とから成る第1のコプレーナ線路と、高周波基板が実装
される外部電気回路基板の回路に電気的に接続されるも
のであり、第2の線路導体12bと第2の同一面接地導体
層13bとから成る第2のコプレーナ線路とが、それぞれ
上下面に形成されている。 【0003】そして、第1の線路導体12aと第2の線路
導体12bとを電気的に接続する貫通導体14、および第1
の同一面接地導体層13aと第2の同一面接地導体層13b
とを電気的に接続する接地貫通導体15から構成される高
周波入出力部が設けられている。貫通導体14は、平面視
形状が略円形の内層導体層14aの略中心部を貫通すると
ともに第1の線路導体12aから第2の線路導体12bにか
けて形成されている。また、図6に示すように、接地貫
通導体15は、内層導体層14aの中心C1を中心とした円
周D上に略一定間隔で形成された略円形の内層接地導体
層15aの中心C2部を貫通するとともに第1の同一面接
地導体層13aから第2の同一面接地導体層13bにかけて
形成されている。 【0004】上記の高周波基板は、第1の線路導体12a
と第2の線路導体12bとを電気的に接続する貫通導体14
の部位で高周波信号の反射損失を抑制するために、貫通
導体14の周囲に接地貫通導体15が形成されている。ま
た、誘電体基板11の各誘電体層に形成された内層導体層
14a,内層接地導体層15aは所定の幅を有しており、こ
れにより積層時に位置ずれが起こったとしても、各誘電
体層に形成された貫通導体14,接地貫通導体15を確実に
電気的に接続することができる。 【0005】 【発明が解決しようとする課題】しかしながら、上記従
来の高周波基板においては、近時の高周波用半導体素子
等を作動させる高周波信号のさらなる高周波化に伴い、
第1の線路導体12aと第2の線路導体12bとにより高周
波の高周波信号を伝送させた場合、接地貫通導体15同士
の間から高周波信号が漏れ、反射損失が増大して高周波
信号の伝送特性が劣化するという問題点を有していた。 【0006】そこで、それぞれの接地貫通導体15を所謂
導波管の如く成るように電気的に接続して高周波信号の
伝送特性を向上させることも考えられるが、この場合、
貫通導体14と接地貫通導体15との間の誘電体層の強度が
低下して脆くなり易い。即ち、高周波基板に熱衝撃等が
印加されると、貫通導体14と接地貫通導体15との間の誘
電体基板11にクラック等の破損が発生し易い。 【0007】また、貫通導体14と接地貫通導体15との間
の距離を極力短くするとともに、接地貫通導体15同士が
電気的に接続されないように形成することも考えられ
る。しかし、この場合、内層導体層14aと内層接地導体
層15aとが電気的に接続される場合がある。即ち、高周
波信号が伝送される部位と、接地用の部位が電気的に短
絡され伝送特性が劣化するという問題が生じ易い。 【0008】従って、本発明は上記問題点に鑑み完成さ
れたものであり、その目的は、接地貫通導体と貫通導体
との距離を短くするとともに、内層導体層と内層接地導
体層との短絡を防止することにより、より高い周波数帯
域の高周波信号を伝送できる高周波基板を提供すること
にある。 【0009】 【課題を解決するための手段】本発明の高周波基板は、
複数の誘電体層が積層されて成る誘電体基板の上面に第
1の線路導体および該第1の線路導体の両側に略一定間
隔をもって形成された第1の同一面接地導体層から成る
第1のコプレーナ線路が設けられ、前記誘電体基板の下
面の前記第1の線路導体に対向する部位に形成された第
2の線路導体および該第2の線路導体の両側に略一定間
隔をもって形成された第2の同一面接地導体層から成る
第2のコプレーナ線路が設けられており、前記第1の線
路導体の端部から前記第2の線路導体の端部にかけて形
成されるとともに両端部間に設けられた略円形の内層導
体層の中心部を貫通して形成された貫通導体と、前記内
層導体層を中心とした円周上に略一定間隔で形成された
複数の内層接地導体層の中心部をそれぞれ貫通するとと
もに前記第1の同一面接地導体層から前記第2の同一面
接地導体層にかけて形成された複数の接地貫通導体とを
具備した高周波用配線基板において、前記内層接地導体
層は、前記接地貫通導体の周囲に環状の導体層が前記貫
通導体側の一部を半径に沿って切り取った形状となるよ
うに形成されており、前記貫通導体の中心および前記接
地貫通導体の中心を通る直線と前記半径とのなす前記導
体層側の角度が90〜120°であり、前記貫通導体の中心
と前記接地貫通導体の中心との間の距離が0.5〜0.64m
mであり、かつ前記誘電体層の厚さが0.1〜0.8mmであ
ることを特徴とする。 【0010】本発明は、上記の構成により、接地貫通導
体と貫通導体との距離を非常に短くできるとともに内層
導体層と内層接地導体層との短絡を防止できるため、よ
り高い周波数帯域の高周波信号を低損失で伝送できる。 【0011】 【発明の実施の形態】本発明の高周波基板について以下
に詳細に説明する。図1は本発明の高周波基板の斜視
図、図2は図1のA−A’線における断面図、図3は図
2のB−B’線のおける部分拡大平面図である。これら
の図において、1は誘電体基板、2a,2bは、誘電体
基板1の上下面に形成され、高周波信号が伝送される第
1の線路導体,第2の線路導体、3a,3bは、誘電体
基板1の上下面に第1の線路導体2aの両側および第2
の線路導体2bの両側に略一定間隔をもってそれぞれ形
成された第1の同一面接地導体層,第2の同一面接地導
体層である。 【0012】そして、第1の線路導体2aと第1の同一
面接地導体層3aとで第1のコプレーナ線路が形成さ
れ、第2の線路導体2bと第2の同一面接地導体層3b
とで第2のコプレーナ線路が形成される。なお、第1の
線路導体2aと第1の同一面接地導体層3aとは電気的
に短絡しないように、また、第2の線路導体2bと第2
の同一面接地導体層3bも電気的に短絡しないように形
成される。 【0013】また、4は第1の線路導体2aの端部と第
2の線路導体2bの端部とを電気的に接続する貫通導
体、5は第1の同一面接地導体層3aと第2の同一面接
地導体層3bとを接続する接地貫通導体、4aは各誘電
体層に形成されて各誘電体層の貫通導体4を接続する内
層導体層、5aは各誘電体層に形成されて各誘電体層の
接地貫通導体5を接続する内層接地導体層である。これ
ら貫通導体4,内層導体層4a,接地貫通導体5,内層
接地導体層5aとで、第1のコプレーナ線路と第2のコ
プレーナ線路とが電気的に接続され、上面に高周波用半
導体素子等の高周波用部品が搭載される高周波基板が構
成される。 【0014】貫通導体4は、第1の線路導体2aの端部
から第2の線路導体2bの端部にかけて形成されるとと
もに平面視形状が略円形の内層導体層4aの略中心部を
貫通して形成されている。また、複数の接地貫通導体5
が、内層導体層4aの周囲に略一定間隔で内層導体層4
aを中心とした円周D(図3)上に形成された複数の内
層接地導体層5aの略中心部を第1の同一面接地導体層
3aから第2の同一面接地導体層3bにかけてそれぞれ
貫通するように形成される。内層接地導体層5a同士の
間隔は、図3の場合、貫通導体4の中心C1に対する接
地貫通導体5の中心C2間の角度でいえば72°であり、
接地貫通導体5の中心C2間の円周D上の間隔でいえば
0.64mm程度(接地貫通導体5の直径が0.2mm程度)
以上がよく、内層接地導体層5a同士の間の円周D上の
間隔でいえば0.25mm程度以上がよい。この場合、誘電
体基板1の破損を有効に防止し得る。また、より好まし
くは、内層接地導体層5a同士の間の円周D上の間隔は
0.5mm程度(接地貫通導体5の直径が0.1mm程度)以
上がよく、0.5mm未満になると、接地貫通導体5間の
誘電体層にクラックが発生し易くなる。 【0015】貫通導体4,接地貫通導体5以外の、第1
の線路導体2a,第2の線路導体2b,第1の同一面接
地導体層3a,第2の同一面接地導体層3b,内層導体
層4a,内層接地導体層5aは、タングステン(W),
モリブデン(Mo),マンガン(Mn)等の粉末に有機
溶剤,溶媒を添加混合して得た金属ペーストを、誘電体
基板1となる原料粉末に適当な有機バインダや溶剤等を
添加混合しペースト状と成し、このペーストをドクター
ブレード法やカレンダーロール法によって形成されたセ
ラミックグリーンシートに、予め従来周知のスクリーン
印刷法により所望の形状に印刷塗布し、約1600℃の高温
で焼結することにより製作される。 【0016】一方、貫通導体4,接地貫通導体5は、各
セラミックグリーンシートの所望の位置に貫通導体4,
接地貫通導体5となる貫通孔を形成し、この貫通孔に、
W,Mo,Mn等の粉末に有機溶剤,溶媒を添加混合し
て得た金属ペーストを充填し、第1の線路導体2a,第
2の線路導体2b,第1の同一面接地導体層3a,第2
の同一面接地導体層3b,内層導体層4a,内層接地導
体層5aとなる金属ペーストと同時焼結することにより
製作される。 【0017】また、誘電体基板1は、その誘電率や熱膨
張係数等の特性に応じて、アルミナ(Al23)セラミ
ックスや窒化アルミニウム(AlN)セラミックス等が
適宜選定される。 【0018】本発明において、図3に示すように、内層
接地導体層5aは、接地貫通導体5の周囲に環状の導体
層が貫通導体4側の一部を半径Rに沿って切り取った形
状となるように形成されており、かつ貫通導体4の中心
C1および接地貫通導体5の中心C2を通る直線Lと上
記半径Rとのなす導体層側の角度が90〜120°である。
なお、図3でL1は直線Lのうち導体層側の線分であ
り、本発明では換言すると線分L1と半径Rとの角度が
90〜120°である。これにより、接地貫通導体5と貫通
導体4との距離を非常に短くし得るとともに、内層導体
層4aと内層接地導体層5aとの短絡を防止し得るた
め、より高い周波数帯域の高周波信号を伝送できる。 【0019】上記角度が90°未満の場合、内層接地導体
層5aの導体層が小さいため、誘電体基板1の各誘電体
層に形成されている接地貫通導体5に少しでも位置ずれ
があると、接地貫通導体5と内層接地導体層5aとが電
気的に接続されず、接地電位が強化されなくなる。120
°を超えると、内層導体層4aと内層接地導体層5aと
が電気的に短絡する場合があり、高周波信号の伝送特性
が劣化する。 【0020】また、内層接地導体層5a同士は一部が短
絡しても高周波信号の伝送特性が劣化することは無い
が、貫通導体4と接地貫通導体5との間の強度が低下し
て脆くなり易い。即ち、この場合に高周波基板1に熱衝
撃等が加わると、貫通導体4と接地貫通導体5との間の
誘電体基板1にクラック等の破損が発生し易い。 【0021】また、接地貫通導体5は、内層導体層4a
に短絡しないように、かつ貫通導体4の周囲に略一定間
隔で円周D上に形成される必要がある。接地貫通導体5
間の間隔が略一定でないと、高周波信号の伝送特性が劣
化し易くなる。即ち、接地貫通導体5は貫通導体4の周
囲に接地電位の壁を強固に形成するものであり、同軸構
造に近い擬似同軸構造とすることで、高周波信号の伝送
特性を向上させ、伝送損失を小さくできる。 【0022】本発明においては、貫通導体4の中心C1
と接地貫通導体5の中心C2との間の距離は0.5〜0.64
mmである。これにより、接地貫通導体5と貫通導体4
との距離を非常に短くすることができ、高い周波数帯域
の高周波信号をより低損失で伝送できる。0.5mm未満
になると、貫通導体4と接地貫通導体5との距離が非常
に近くなるため、穴あけ加工の際に接地貫通導体5間の
誘電体層にクラックが発生し易くなる。また、0.64mm
を超えると、貫通導体4から接地貫通導体5までの距離
が大きくなるため、従来の貫通導体4から接地貫通導体
5までの距離と同じになり、高い周波数帯域の高周波信
号の伝送特性が向上しなくなる。 【0023】また、1層の誘電体層の厚さTは0.1〜0.8
mmである。0.1mm未満になると、誘電体層自体の作
製や導体パターンの印刷および積層が困難になる。ま
た、0.8mmを超えると、誘電体層の厚さTが厚くなり
すぎて穴あけ加工が困難になる。 【0024】また本発明では、貫通導体4の周囲にある
接地貫通導体5同士の隙間をメタライズ層で埋めるよう
に、内層接地導体層5aとは別の接地導体層を内層に形
成して接地貫通導体5同士を内層で電気的に接続しても
よい。つまり、上記メタライズ層で埋めて形成する部分
は、接地貫通導体5の周囲の内層接地導体層5aがある
円周上Dから外側部分に形成するのがよい。その結果、
高周波基板1全体の接地機能がより強化されるため、高
い高周波帯域での高周波特性を安定させることができ
る。 【0025】そして、本発明の高周波基板1の上面にI
C,LSI,半導体レーザ(LD)等の高周波用部品を
半田等の接着剤を介して搭載するとともに、高周波用部
品の電極パッドと第1の線路導体2aとをボンディング
ワイヤにより電気的に接続し、さらに高周波基板1の下
面の第2の線路導体2b,第2の同一面接地導体層3b
を、それぞれ外部電気回路基板の接続用線路導体,接地
導体層に半田等の接着剤を介して接続することにより、
高周波用部品が高周波基板1を介して外部電気回路基板
に接続され、より高周波帯域での高周波信号の入出力を
行うことができる。 【0026】本発明でいう高周波帯域とは1〜100GH
z(ギガヘルツ)程度の高周波帯域およびミリ波帯域で
あり、好ましくは1〜80GHz程度の帯域で使用するの
が好ましい。それは、80GHzを超える高周波帯域では
高周波信号が外部磁場の影響を受け易くなり、ノイズお
よび損失の増大をもたらすからである。より好ましくは
1〜40GHz程度が良い。 【0027】なお、本発明は上記実施の形態に限定され
ず、本発明の要旨を逸脱しない範囲内で変更や改良を施
すことは何等差し支えない。例えば、本発明の高周波基
板1を半導体パッケージの一部である高周波信号入出力
部として用いても良い。 【0028】 【発明の効果】本発明は、複数の誘電体層が積層されて
成る誘電体基板の上面に第1の線路導体および第1の線
路導体の両側に略一定間隔をもって形成された第1の同
一面接地導体層から成る第1のコプレーナ線路が設けら
れ、誘電体基板の下面の第1の線路導体に対向する部位
に形成された第2の線路導体および第2の線路導体の両
側に略一定間隔をもって形成された第2の同一面接地導
体層から成る第2のコプレーナ線路が設けられており、
第1の線路導体の端部から第2の線路導体の端部にかけ
て形成されるとともに両端部間に設けられた略円形の内
層導体層の中心部を貫通して形成された貫通導体と、内
層導体層を中心とした円周上に略一定間隔で形成された
複数の内層接地導体層の中心部をそれぞれ貫通するとと
もに第1の同一面接地導体層から第2の同一面接地導体
層にかけて形成された複数の接地貫通導体とを具備して
おり、内層接地導体層は、接地貫通導体の周囲に環状の
導体層が貫通導体側の一部を半径に沿って切り取った形
状となるように形成されており、貫通導体の中心および
接地貫通導体の中心を通る直線と上記半径とのなす導体
層側の角度が90〜120°であり、貫通導体の中心と接地
貫通導体の中心との間の距離が0.5〜0.64mmであり、
かつ誘電体層の厚さが0.1〜0.8mmであることにより、
接地貫通導体と貫通導体との距離を非常に短くできると
ともに内層導体層と内層接地導体層との短絡を防止でき
るため、より高い周波数帯域の高周波信号を低損失で伝
送できる。
Description: BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a high-frequency wiring board provided with a high-frequency input / output unit having improved electrical characteristics. 2. Description of the Related Art A conventional high-frequency wiring board (hereinafter referred to as a high-frequency board) is shown in FIGS. FIG. 4 is a perspective view of the high-frequency substrate, FIG. 5 is a cross-sectional view taken along line AA ′ of FIG.
FIG. 6 is a partially enlarged plan view taken along line BB ′ of FIG. 5. This high-frequency substrate is composed of a dielectric substrate 11 and is used as a high-frequency circuit substrate, a high-frequency semiconductor element storage package, a high-frequency semiconductor element mounting chip carrier, or the like. The first line conductor 12a is electrically connected to a high-frequency component such as a high-frequency semiconductor element mounted on the upper surface of the high-frequency substrate.
A first coplanar line comprising: a first line conductor 12b; a second line conductor 12b; a second coplanar ground conductor layer 13b; Are formed on the upper and lower surfaces, respectively. A through conductor 14 for electrically connecting the first line conductor 12a and the second line conductor 12b,
The same plane ground conductor layer 13a and the second plane ground conductor layer 13b
And a high-frequency input / output unit composed of a ground through conductor 15 that electrically connects the input and output terminals. The through conductor 14 penetrates a substantially central portion of the inner conductor layer 14a having a substantially circular shape in plan view, and is formed from the first line conductor 12a to the second line conductor 12b. As shown in FIG. 6, the ground through conductor 15 is formed at a center C2 of a substantially circular inner-layer ground conductor layer 15a formed at substantially constant intervals on a circumference D centered on the center C1 of the inner-layer conductor layer 14a. And is formed from the first same-plane ground conductor layer 13a to the second same-plane ground conductor layer 13b. [0004] The high-frequency substrate described above comprises a first line conductor 12a.
Through conductor 14 for electrically connecting the second line conductor 12b to the second line conductor 12b
A ground through conductor 15 is formed around the through conductor 14 in order to suppress the reflection loss of the high-frequency signal at the portion. Also, an inner conductor layer formed on each dielectric layer of the dielectric substrate 11
The inner conductor 14a and the inner ground conductor layer 15a have a predetermined width, so that even if misalignment occurs during lamination, the through conductors 14 and the ground through conductors 15 formed on the respective dielectric layers are reliably electrically connected. Can be connected to [0005] However, in the above-mentioned conventional high-frequency board, the recent high-frequency signal for operating a high-frequency semiconductor element or the like has recently become higher in frequency.
When a high-frequency high-frequency signal is transmitted by the first line conductor 12a and the second line conductor 12b, the high-frequency signal leaks from between the ground through conductors 15, the reflection loss increases, and the transmission characteristic of the high-frequency signal increases. There was a problem of deterioration. Therefore, it is conceivable to improve the transmission characteristics of high-frequency signals by electrically connecting the respective ground through conductors 15 so as to form a so-called waveguide.
The strength of the dielectric layer between the penetrating conductor 14 and the ground penetrating conductor 15 is reduced, and the dielectric layer tends to be brittle. That is, when a thermal shock or the like is applied to the high-frequency substrate, the dielectric substrate 11 between the penetrating conductor 14 and the ground penetrating conductor 15 is likely to be damaged such as a crack. It is also conceivable that the distance between the through conductor 14 and the ground through conductor 15 is made as short as possible and the ground through conductors 15 are formed so as not to be electrically connected to each other. However, in this case, the inner conductor layer 14a and the inner ground conductor layer 15a may be electrically connected. In other words, a portion where a high-frequency signal is transmitted and a portion for grounding are electrically short-circuited, so that a problem that transmission characteristics are deteriorated is likely to occur. Accordingly, the present invention has been completed in view of the above problems, and has as its object to shorten the distance between the ground through conductor and the short circuit between the inner conductor layer and the inner ground conductor layer. An object of the present invention is to provide a high-frequency board capable of transmitting a high-frequency signal in a higher frequency band by preventing the high-frequency signal. [0009] The high-frequency substrate of the present invention comprises:
A first line conductor is formed on the upper surface of a dielectric substrate formed by laminating a plurality of dielectric layers, and a first ground conductor layer is formed on both sides of the first line conductor at substantially constant intervals. And a second line conductor formed at a portion of the lower surface of the dielectric substrate facing the first line conductor, and formed on both sides of the second line conductor at substantially constant intervals. A second coplanar line comprising a second coplanar ground conductor layer is provided, and is formed from an end of the first line conductor to an end of the second line conductor and provided between both ends. A through conductor formed through the center of the substantially circular inner conductor layer formed, and a plurality of inner ground conductor layers formed at substantially constant intervals on a circumference centered on the inner conductor layer. And each of the first A high-frequency wiring board comprising a plurality of grounded through-conductors formed from the surface grounded conductor layer to the second same-plane grounded conductor layer, wherein the inner-layer grounded conductor layer has an annular conductor around the grounded through-conductor. The conductor layer is formed so that a layer has a shape obtained by cutting a part of the through conductor side along a radius, and a straight line passing through a center of the through conductor and a center of the ground through conductor and the radius. And the distance between the center of the through conductor and the center of the ground through conductor is 0.5 to 0.64 m.
m, and the thickness of the dielectric layer is 0.1 to 0.8 mm. According to the present invention, since the distance between the ground through conductor and the through conductor can be made extremely short and the short circuit between the inner conductor layer and the inner ground conductor layer can be prevented by the above configuration, a high frequency signal of a higher frequency band can be obtained. Can be transmitted with low loss. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS The high-frequency substrate of the present invention will be described in detail below. 1 is a perspective view of a high-frequency substrate according to the present invention, FIG. 2 is a cross-sectional view taken along line AA ′ of FIG. 1, and FIG. 3 is a partially enlarged plan view taken along line BB ′ of FIG. In these figures, 1 is a dielectric substrate, 2a and 2b are formed on the upper and lower surfaces of the dielectric substrate 1, and a first line conductor, a second line conductor, and 3a and 3b through which a high-frequency signal is transmitted are: On both upper and lower surfaces of the dielectric substrate 1, both sides of the first line conductor 2a and the second
A first ground conductor layer and a second ground conductor layer formed on both sides of the line conductor 2b at substantially constant intervals. The first line conductor 2a and the first coplanar ground conductor layer 3a form a first coplanar line, and the second line conductor 2b and the second coplanar ground conductor layer 3b.
Thus, a second coplanar line is formed. Note that the first line conductor 2a and the first same-plane ground conductor layer 3a are not electrically short-circuited, and the second line conductor 2b and the second
Is also formed so as not to be electrically short-circuited. Reference numeral 4 denotes a through conductor for electrically connecting an end of the first line conductor 2a and an end of the second line conductor 2b, and 5 denotes a first same-plane ground conductor layer 3a and a second The ground through conductors 4a connecting to the same plane ground conductor layer 3b are formed on each dielectric layer, and the inner conductor layers connecting the through conductors 4 of each dielectric layer are formed on each dielectric layer. This is an inner ground conductor layer that connects the ground through conductors 5 of each dielectric layer. The first coplanar line and the second coplanar line are electrically connected to the through conductor 4, the inner conductor layer 4a, the ground through conductor 5, and the inner ground conductor layer 5a. A high-frequency board on which high-frequency components are mounted is configured. The through conductor 4 is formed from the end of the first line conductor 2a to the end of the second line conductor 2b, and penetrates substantially the center of the inner conductor layer 4a having a substantially circular shape in plan view. It is formed. In addition, a plurality of ground through conductors 5
Are formed at substantially constant intervals around the inner conductor layer 4a.
The substantially central portions of the plurality of inner-layer ground conductor layers 5a formed on the circumference D (FIG. 3) around the center a are respectively extended from the first same-plane ground conductor layer 3a to the second same-plane ground conductor layer 3b. It is formed so as to penetrate. In the case of FIG. 3, the interval between the inner ground conductor layers 5a is 72 ° in terms of the angle between the center C2 of the ground through conductor 5 with respect to the center C1 of the through conductor 4.
In terms of the interval on the circumference D between the centers C2 of the ground through conductors 5,
About 0.64mm (diameter of ground through conductor 5 is about 0.2mm)
The distance is preferably about 0.25 mm or more on the circumference D between the inner ground conductor layers 5a. In this case, breakage of the dielectric substrate 1 can be effectively prevented. More preferably, the interval on the circumference D between the inner-layer ground conductor layers 5a is
The thickness is preferably about 0.5 mm (the diameter of the ground through conductor 5 is about 0.1 mm) or more, and if it is less than 0.5 mm, cracks easily occur in the dielectric layer between the ground through conductors 5. The first, other than the through conductor 4 and the ground through conductor 5,
Line conductor 2a, second line conductor 2b, first same-plane ground conductor layer 3a, second same-plane ground conductor layer 3b, inner-layer conductor layer 4a, and inner-layer ground conductor layer 5a are made of tungsten (W),
A metal paste obtained by adding and mixing an organic solvent and a solvent to a powder of molybdenum (Mo), manganese (Mn), etc. is mixed with a raw material powder to be a dielectric substrate 1 by adding and mixing an appropriate organic binder and a solvent. The paste is applied to a ceramic green sheet formed by a doctor blade method or a calender roll method in a desired shape in advance by a conventionally known screen printing method, and then sintered at a high temperature of about 1600 ° C. Be produced. On the other hand, the through conductors 4 and the ground through conductors 5 are provided at desired positions on the ceramic green sheets.
A through hole serving as the ground through conductor 5 is formed.
An organic solvent is added to a powder of W, Mo, Mn, or the like, and a metal paste obtained by adding and mixing the solvent is filled, and the first line conductor 2a, the second line conductor 2b, the first same-plane ground conductor layer 3a, Second
Of the same plane ground conductor layer 3b, inner conductor layer 4a, and inner ground conductor layer 5a. The dielectric substrate 1 is appropriately selected from alumina (Al 2 O 3 ) ceramics, aluminum nitride (AlN) ceramics, and the like according to characteristics such as the dielectric constant and the coefficient of thermal expansion. In the present invention, as shown in FIG. 3, the inner ground conductor layer 5a has a shape in which an annular conductor layer is formed by cutting a part of the through conductor 4 side along the radius R around the ground through conductor 5. The angle between the straight line L passing through the center C1 of the through conductor 4 and the center C2 of the ground through conductor 5 and the radius R on the conductor layer side is 90 to 120 °.
In FIG. 3, L1 is a line segment on the conductor layer side of the straight line L. In other words, in the present invention, the angle between the line segment L1 and the radius R is
90-120 °. Thereby, the distance between the ground through conductor 5 and the through conductor 4 can be made extremely short, and a short circuit between the inner conductor layer 4a and the inner ground conductor layer 5a can be prevented, so that a high frequency signal in a higher frequency band is transmitted. it can. When the angle is less than 90 °, the conductor layer of the inner ground conductor layer 5a is small, so that if there is any displacement of the ground through conductor 5 formed on each dielectric layer of the dielectric substrate 1, it is possible to displace it. In addition, the ground through conductor 5 and the inner ground conductor layer 5a are not electrically connected, and the ground potential is not strengthened. 120
When the angle exceeds °, the inner conductor layer 4a and the inner ground conductor layer 5a may be electrically short-circuited, and the transmission characteristics of high-frequency signals deteriorate. Even if the inner ground conductor layers 5a are partially short-circuited, the transmission characteristics of high-frequency signals do not deteriorate, but the strength between the penetrating conductor 4 and the ground penetrating conductor 5 is reduced to make them brittle. Easy to be. That is, when a thermal shock or the like is applied to the high-frequency substrate 1 in this case, the dielectric substrate 1 between the penetrating conductor 4 and the ground penetrating conductor 5 is liable to be damaged such as a crack. The ground through conductor 5 is formed on the inner conductor layer 4a.
It should be formed on the circumference D at substantially constant intervals around the through conductor 4 so as not to cause a short circuit. Ground through conductor 5
If the interval is not substantially constant, the transmission characteristics of the high-frequency signal tend to deteriorate. In other words, the ground through conductor 5 has a strong ground potential wall around the through conductor 4, and has a pseudo-coaxial structure close to a coaxial structure to improve the transmission characteristics of high-frequency signals and reduce transmission loss. Can be smaller. In the present invention, the center C1 of the through conductor 4
And the distance between the center C2 of the ground through conductor 5 is 0.5 to 0.64.
mm. Thereby, the ground through conductor 5 and the through conductor 4
Can be made very short, and a high-frequency signal in a high frequency band can be transmitted with lower loss. If the distance is less than 0.5 mm, the distance between the through conductor 4 and the ground through conductor 5 becomes very short, so that cracks easily occur in the dielectric layer between the ground through conductors 5 during drilling. Also, 0.64mm
When the distance exceeds the distance, the distance from the through conductor 4 to the ground through conductor 5 becomes large, which is the same as the distance from the conventional through conductor 4 to the ground through conductor 5, and the transmission characteristics of high frequency signals in a high frequency band are improved. Disappears. The thickness T of one dielectric layer is 0.1 to 0.8.
mm. If the thickness is less than 0.1 mm, it becomes difficult to fabricate the dielectric layer itself and print and laminate the conductor pattern. On the other hand, when the thickness exceeds 0.8 mm, the thickness T of the dielectric layer becomes too large, so that it becomes difficult to form a hole. Further, in the present invention, a ground conductor layer different from the inner ground conductor layer 5a is formed in the inner layer so as to fill the gap between the ground conductors 5 around the through conductor 4 with the metallized layer. The conductors 5 may be electrically connected to each other in the inner layer. In other words, the portion formed by filling with the metallization layer is preferably formed from the circumference D where the inner ground conductor layer 5a around the ground through conductor 5 is located to the outer portion. as a result,
Since the grounding function of the entire high-frequency substrate 1 is further enhanced, high-frequency characteristics in a high-frequency band can be stabilized. Then, I is placed on the upper surface of the high-frequency substrate 1 of the present invention.
A high-frequency component such as a C, LSI, or semiconductor laser (LD) is mounted via an adhesive such as solder, and an electrode pad of the high-frequency component and the first line conductor 2a are electrically connected by a bonding wire. , A second line conductor 2b on the lower surface of the high-frequency substrate 1, and a second ground conductor layer 3b on the same plane.
Are connected to the connection line conductor and the ground conductor layer of the external electric circuit board via an adhesive such as solder, respectively.
The high-frequency component is connected to the external electric circuit board via the high-frequency board 1 so that high-frequency signals can be input and output in a higher-frequency band. The high frequency band referred to in the present invention is 1 to 100 GHz.
It is a high frequency band of about z (gigahertz) and a millimeter wave band, and is preferably used in a band of about 1 to 80 GHz. This is because in a high-frequency band exceeding 80 GHz, a high-frequency signal is easily affected by an external magnetic field, resulting in an increase in noise and loss. More preferably, the frequency is about 1 to 40 GHz. It should be noted that the present invention is not limited to the above-described embodiment, and that changes and improvements can be made without departing from the scope of the present invention. For example, the high-frequency substrate 1 of the present invention may be used as a high-frequency signal input / output unit that is a part of a semiconductor package. According to the present invention, a first line conductor and a first line conductor formed on both sides of the first line conductor at substantially constant intervals on the upper surface of a dielectric substrate formed by laminating a plurality of dielectric layers are provided. A first coplanar line made of one ground conductor layer on the same plane is provided, and both sides of the second line conductor and the second line conductor formed at a portion of the lower surface of the dielectric substrate facing the first line conductor; A second coplanar line formed of a second same-surface ground conductor layer formed at substantially constant intervals,
A through conductor formed from an end of the first line conductor to an end of the second line conductor and penetrating a center portion of a substantially circular inner layer conductor layer provided between both ends; Each of the plurality of inner-layer ground conductor layers formed at substantially constant intervals on the circumference centered on the conductor layer penetrates the center portion thereof, and is formed from the first same-plane ground conductor layer to the second same-plane ground conductor layer. A plurality of grounded through conductors, and the inner ground conductor layer is formed so that an annular conductor layer has a shape obtained by cutting a part of the through conductor side along the radius around the grounded through conductor. The angle of the conductor layer side between the straight line passing through the center of the through conductor and the center of the ground through conductor and the radius is 90 to 120 °, and the angle between the center of the through conductor and the center of the ground through conductor is The distance is 0.5 ~ 0.64mm,
And by the thickness of the dielectric layer is 0.1 to 0.8 mm,
Since the distance between the ground through conductor and the through conductor can be made very short and the short circuit between the inner conductor layer and the inner ground conductor layer can be prevented, a high-frequency signal in a higher frequency band can be transmitted with low loss.

【図面の簡単な説明】 【図1】本発明の高周波基板の斜視図である。 【図2】図1のA−A’線における高周波基板の断面図
である。 【図3】図2のB−B’線における高周波基板の部分拡
大平面図である。 【図4】従来の高周波基板の斜視図である。 【図5】図4のA−A’線における高周波基板の断面図
である。 【図6】図5のB−B’線における高周波基板の部分拡
大平面図である。 【符号の説明】 1:誘電体基板 2a:第1の線路導体 2b:第2の線路導体 3a:第1の同一面接地導体層 3b:第2の同一面接地導体層 4:貫通導体 4a:内層導体層 5:接地貫通導体 5a:内層接地導体層
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a perspective view of a high-frequency board according to the present invention. FIG. 2 is a cross-sectional view of the high-frequency substrate taken along line AA ′ in FIG. FIG. 3 is a partially enlarged plan view of the high-frequency board taken along line BB ′ of FIG. 2; FIG. 4 is a perspective view of a conventional high-frequency board. FIG. 5 is a sectional view of the high-frequency substrate taken along line AA ′ of FIG. 4; FIG. 6 is a partially enlarged plan view of the high-frequency board taken along line BB ′ of FIG. 5; [Description of Signs] 1: Dielectric substrate 2a: First line conductor 2b: Second line conductor 3a: First same-plane ground conductor layer 3b: Second same-plane ground conductor layer 4: Through conductor 4a: Inner layer conductor layer 5: Ground through conductor 5a: Inner layer ground conductor layer

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) H05K 3/46 H05K 3/46 Z ──────────────────────────────────────────────────続 き Continued on the front page (51) Int.Cl. 7 Identification symbol FI Theme coat ゛ (Reference) H05K 3/46 H05K 3/46 Z

Claims (1)

【特許請求の範囲】 【請求項1】 複数の誘電体層が積層されて成る誘電体
基板の上面に第1の線路導体および該第1の線路導体の
両側に略一定間隔をもって形成された第1の同一面接地
導体層から成る第1のコプレーナ線路が設けられ、前記
誘電体基板の下面の前記第1の線路導体に対向する部位
に形成された第2の線路導体および該第2の線路導体の
両側に略一定間隔をもって形成された第2の同一面接地
導体層から成る第2のコプレーナ線路が設けられてお
り、前記第1の線路導体の端部から前記第2の線路導体
の端部にかけて形成されるとともに両端部間に設けられ
た略円形の内層導体層の中心部を貫通して形成された貫
通導体と、前記内層導体層を中心とした円周上に略一定
間隔で形成された複数の内層接地導体層の中心部をそれ
ぞれ貫通するとともに前記第1の同一面接地導体層から
前記第2の同一面接地導体層にかけて形成された複数の
接地貫通導体とを具備した高周波用配線基板において、
前記内層接地導体層は、前記接地貫通導体の周囲に環状
の導体層が前記貫通導体側の一部を半径に沿って切り取
った形状となるように形成されており、前記貫通導体の
中心および前記接地貫通導体の中心を通る直線と前記半
径とのなす前記導体層側の角度が90〜120°であり、前
記貫通導体の中心と前記接地貫通導体の中心との間の距
離が0.5〜0.64mmであり、かつ前記誘電体層の厚さが
0.1〜0.8mmであることを特徴とする高周波用配線基
板。
1. A first line conductor and a first line conductor formed on both sides of the first line conductor at substantially constant intervals on an upper surface of a dielectric substrate formed by laminating a plurality of dielectric layers. A first coplanar line formed of one coplanar ground conductor layer, a second line conductor formed at a portion of the lower surface of the dielectric substrate opposed to the first line conductor, and the second line; A second coplanar line composed of a second coplanar ground conductor layer formed at substantially constant intervals on both sides of the conductor is provided, and an end of the first line conductor is connected to an end of the second line conductor. And a through conductor formed through the center of a substantially circular inner conductor layer provided between both ends and formed at substantially constant intervals on a circumference centered on the inner conductor layer. The center of the multiple inner conductor layers In high frequency wiring board and a plurality of ground vias formed toward the second identical plane ground conductor layer from the first same plane ground conductor layer with which penetrates,
The inner-layer ground conductor layer is formed so that an annular conductor layer has a shape obtained by cutting a part of the through conductor side along a radius around the ground through conductor, and the center of the through conductor and the An angle on the conductor layer side between the straight line passing through the center of the ground through conductor and the radius is 90 to 120 °, and a distance between the center of the through conductor and the center of the ground through conductor is 0.5 to 0.64 mm. And the thickness of the dielectric layer is
A high-frequency wiring board having a thickness of 0.1 to 0.8 mm.
JP2001392764A 2001-12-25 2001-12-25 Wiring board for high frequency Pending JP2003198213A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001392764A JP2003198213A (en) 2001-12-25 2001-12-25 Wiring board for high frequency

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001392764A JP2003198213A (en) 2001-12-25 2001-12-25 Wiring board for high frequency

Publications (1)

Publication Number Publication Date
JP2003198213A true JP2003198213A (en) 2003-07-11

Family

ID=27599959

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001392764A Pending JP2003198213A (en) 2001-12-25 2001-12-25 Wiring board for high frequency

Country Status (1)

Country Link
JP (1) JP2003198213A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005108893A (en) * 2003-09-26 2005-04-21 Kyocera Corp Wiring board
JP2008283622A (en) * 2007-05-14 2008-11-20 Mitsubishi Electric Corp High-frequency transmission line
KR101133147B1 (en) 2010-08-19 2012-04-06 연세대학교 산학협력단 Differential-fed Power combine/divide device
WO2020045528A1 (en) * 2018-08-31 2020-03-05 株式会社村田製作所 Wiring substrate and module

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005108893A (en) * 2003-09-26 2005-04-21 Kyocera Corp Wiring board
JP2008283622A (en) * 2007-05-14 2008-11-20 Mitsubishi Electric Corp High-frequency transmission line
KR101133147B1 (en) 2010-08-19 2012-04-06 연세대학교 산학협력단 Differential-fed Power combine/divide device
WO2020045528A1 (en) * 2018-08-31 2020-03-05 株式会社村田製作所 Wiring substrate and module
JPWO2020045528A1 (en) * 2018-08-31 2021-08-10 株式会社村田製作所 Wiring boards and modules
US11324108B2 (en) 2018-08-31 2022-05-03 Murata Manufacturing Co., Ltd. Wiring substrate and module
JP7124874B2 (en) 2018-08-31 2022-08-24 株式会社村田製作所 module

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