JP2003046030A - Wiring board with pin, and electronic device using the same - Google Patents

Wiring board with pin, and electronic device using the same

Info

Publication number
JP2003046030A
JP2003046030A JP2001228423A JP2001228423A JP2003046030A JP 2003046030 A JP2003046030 A JP 2003046030A JP 2001228423 A JP2001228423 A JP 2001228423A JP 2001228423 A JP2001228423 A JP 2001228423A JP 2003046030 A JP2003046030 A JP 2003046030A
Authority
JP
Japan
Prior art keywords
pin
pins
solder
lead pin
lead
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001228423A
Other languages
Japanese (ja)
Inventor
Kenji Nakamura
憲志 中村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP2001228423A priority Critical patent/JP2003046030A/en
Publication of JP2003046030A publication Critical patent/JP2003046030A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15312Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a pin array, e.g. PGA

Abstract

PROBLEM TO BE SOLVED: To provide a wiring board with pins, where loaded electronic components can normally be connected to an outer electric circuit the load pins of which will not come off easily, and to provide an electronic device. SOLUTION: In the wiring board with pins, pads having pins 2b, which are electrically connected to wiring conductors 2 are arranged at the lower face of the insulation board 1 of an organic material system, having the wiring conductors 2. The lead pins 3, in which almost disk-like large diameter parts 3b are formed at the upper ends of the cylindrical shaft parts 3a and are constituted of copper alloy, are erected on the pads with pins 2b, by making solder 9 interpose in between the large diameter parts 3b and the pads with pins 2b. In the lead pins 3, elastic modulus is 90 to 120 GPa, and in addition Vickers hardness is 110 to 160 Hv.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、半導体素子等の電
子部品を搭載するために用いられるピン付き配線基板お
よびこのピン付き配線基板上に半導体素子等の電子部品
を搭載して成る電子装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring board with pins used for mounting electronic parts such as semiconductor elements, and an electronic device having the electronic parts such as semiconductor elements mounted on the wiring board with pins. It is a thing.

【0002】[0002]

【従来の技術】近時、半導体素子等の電子部品を搭載す
るために用いられるピン付き配線基板として、例えばガ
ラス−エポキシ板等から成る絶縁板やエポキシ樹脂等か
ら成る絶縁層を複数層積層して成る絶縁基板の上面から
下面にかけて銅箔等から成る複数の配線導体を設けると
ともにこれらの配線導体の絶縁基板下面に導出した部位
に複数のピン付けパッドを形成し、これらのピン付けパ
ッドに、円柱状の軸部の上端にこの軸部の1.5倍程度の
直径を有する円板状の径大部を設けて成るリードピンを
その径大部を突き当てて半田付けすることにより立設し
て成る有機材料系のピン付き配線基板が採用されるよう
になってきている。このような有機材料系のピン付き配
線基板は、セラミック材料系のピン付き配線基板と比較
して軽量であり、かつ配線導体の電気抵抗が小さいとい
う有利な面を有している。そして、このような有機材料
系のピン付き配線基板においては絶縁基板の上面に電子
部品を搭載するとともに電子部品の電極と配線導体とを
半田バンプやボンディングワイヤ等を介して電気的に接
続した後、電子部品を金属やセラミックから成る蓋体や
ポッティング樹脂等から成る封止部材により封止するこ
とによって製品としての電子装置となり、この電子装置
においては、絶縁基板下面のリードピンを外部電気回路
基板の配線導体にソケットや半田等を介して接続するこ
とにより外部電気回路基板上に実装されるとともに搭載
する電子部品が外部電気回路に電気的に接続されること
となる。
2. Description of the Related Art Recently, as a wiring board with a pin used for mounting electronic parts such as semiconductor elements, for example, a plurality of insulating layers made of glass-epoxy board or insulating layers made of epoxy resin are laminated. A plurality of wiring conductors made of copper foil or the like are provided from the upper surface to the lower surface of the insulating substrate made of, and a plurality of pin-bonding pads are formed at the portions of these wiring conductors led to the lower surface of the insulating substrate, and these pin-bonding pads are The lead pin is formed by arranging the disk-shaped large-diameter portion having a diameter of about 1.5 times the diameter of this shaft-shaped portion on the upper end of the cylindrical shaft portion by abutting the large-diameter portion and soldering. Wiring boards with pins made of organic materials have been adopted. Such an organic-material-based wiring board with pins has the advantages that it is lighter in weight than the ceramic-material-based wiring board and that the electrical resistance of the wiring conductor is small. In such an organic material-based wiring board with pins, electronic components are mounted on the upper surface of the insulating substrate, and electrodes of the electronic components and wiring conductors are electrically connected via solder bumps or bonding wires. By sealing the electronic component with a lid member made of metal or ceramic or a sealing member made of potting resin, an electronic device as a product is obtained. In this electronic device, the lead pins on the lower surface of the insulating substrate are connected to the external electric circuit board. By connecting to the wiring conductor via a socket, solder, or the like, the electronic component mounted and mounted on the external electric circuit board is electrically connected to the external electric circuit.

【0003】なお、このような配線基板におけるリード
ピンとしては、樹脂製の絶縁基体と熱膨張係数が近い銅
合金製のリードピンが使用されるようになってきてお
り、またリードピンとピン付けパッドとを半田付けする
半田としては、樹脂製の絶縁基体に半田付け時の熱によ
るダメージを与えないために、さらに外部リードピンに
外力が印加された際等に外部リードピンからの応力が半
田を介して半田付けパッドに大きく印加されて半田付け
パッドが剥離するのを防止するために例えば鉛−錫−ア
ンチモン合金等の融点が270℃以下で弾性率が50GPa
以下の半田が使用されるようになってきている。
As lead pins in such a wiring board, lead pins made of a copper alloy having a thermal expansion coefficient close to that of an insulating base made of resin have come to be used, and a lead pin and a pin pad are used. As the solder to be soldered, the stress from the external lead pins is soldered through the solder when external force is applied to the external lead pins in order to prevent the resin insulating base from being damaged by heat during soldering. In order to prevent the soldering pad from being peeled off due to a large voltage applied to the pad, for example, a lead-tin-antimony alloy or the like has a melting point of 270 ° C. or less and an elastic modulus of 50 GPa.
The following solders are being used.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、この従
来の有機材料系のピン付き配線基板およびこれを用いた
電子装置によると、銅合金から成るリードピンは、通
常、これを製作する際にその加工性を良好とするために
約700℃程度の温度で熱処理を受けており、それにより
弾性率が約80GPa程度、そのビッカース硬度が約80H
v程度となるように大きく軟化されていること、および
このリードピンとピン付けパッドとを接合する鉛−錫−
アンチモン合金等から成る半田の降伏応力が小さいこと
から、リードピンを例えば30N程度の力で垂直あるいは
斜め方向に引っ張ると、その力によりリードピンの径大
部が過度に弾性変形および塑性変形してしまい、それに
よりリードピンの径大部を介してリードピンとピン付け
パッドとを接合する鉛−錫−アンチモン合金等から成る
半田の表面や内部の一部に大きな応力が集中して作用
し、その結果、降伏応力が小さい半田に破断が発生して
リードピンが絶縁基板から取れてしまい、そのようにリ
ードピンが絶縁基板から取れてしまうと搭載する電子部
品を外部電気回路に正常に接続することができなくなっ
てしまうという問題点を有していた。
However, according to the conventional wiring board with a pin made of an organic material and the electronic device using the same, the lead pin made of a copper alloy is usually workable when it is manufactured. Heat treatment at a temperature of about 700 ° C to improve the heat resistance, resulting in an elastic modulus of about 80 GPa and a Vickers hardness of about 80H.
The lead-tin-which joins the lead pin and the pin-bonding pad with the lead-tin-
Since the yield stress of solder made of antimony alloy or the like is small, if the lead pin is pulled vertically or obliquely with a force of about 30 N, the large diameter portion of the lead pin is excessively elastically and plastically deformed by the force, As a result, a large amount of stress concentrates and acts on the surface and a part of the inside of the solder made of lead-tin-antimony alloy or the like that joins the lead pin and the pin-attaching pad through the large diameter portion of the lead pin, and as a result, yielding occurs. Breakage occurs in solder with low stress and lead pins are removed from the insulating substrate.If the lead pins are removed from the insulating substrate in this way, the mounted electronic components cannot be normally connected to the external electric circuit. Had the problem.

【0005】本発明はかかる従来の問題点に鑑み完成さ
れたものであり、その目的は、50N程度の力でリードピ
ンを引っ張ったとしてもリードピンが取れることがな
く、搭載する電子部品を外部電気回路に正常に接続する
ことができる信頼性の高いピン付き配線基板および電子
装置を提供することにある。
The present invention has been completed in view of the above conventional problems, and an object thereof is to prevent the lead pin from being removed even if the lead pin is pulled with a force of about 50 N, and to mount an electronic component mounted on an external electric circuit. An object of the present invention is to provide a highly reliable wiring board with a pin and an electronic device that can be normally connected to the wiring board.

【0006】[0006]

【課題を解決するための手段】本発明のピン付き配線基
板は、配線導体を有する有機材料系の絶縁基板の下面に
配線導体と電気的に接続されたピン付けパッドを設ける
とともに、このピン付けパッドに略円柱状の軸部の上端
に略円板状の径大部を形成して成るリードピンを径大部
とピン付けパッドとの間に半田を介在させて立設して成
るピン付き配線基板であって、前記リードピンは、その
弾性率が90〜120GPaであり、かつそのビッカース硬
度が110〜160Hvであることを特徴とするものである。
A wiring board with pins according to the present invention is provided with pinning pads electrically connected to wiring conductors on the lower surface of an insulating substrate made of an organic material having wiring conductors, and the pinning is performed. Wiring with pins in which a lead pin formed by forming a substantially disk-shaped large-diameter portion on the upper end of a substantially cylindrical shaft portion on a pad is erected with solder interposed between the large-diameter portion and the pin-attaching pad The substrate is characterized in that the lead pin has an elastic modulus of 90 to 120 GPa and a Vickers hardness of 110 to 160 Hv.

【0007】また、本発明の電子装置は、配線導体を有
する有機材料系の絶縁基板の下面に配線導体と電気的に
接続されたピン付けパッドを設けるとともに、このピン
付けパッドに略円柱状の軸部の上端に略円板状の径大部
を設けて成るリードピンを径大部とピン付けパッドとの
間に半田を介在させて立設して成るピン付き配線基板に
電子部品を搭載するとともに、電子部品の電極と配線導
体とを電気的に接続して成る電子装置であって、前記リ
ードピンは、その弾性率が90〜120GPaであり、かつ
そのビッカース硬度が110〜160Hvであることを特徴と
するものである。
In the electronic device of the present invention, a pin pad electrically connected to the wiring conductor is provided on the lower surface of the insulating substrate made of an organic material having a wiring conductor, and the pin pad has a substantially cylindrical shape. An electronic component is mounted on a wiring board with a pin, in which a lead pin formed by providing a substantially disk-shaped large-diameter portion at the upper end of a shaft portion is erected with a solder interposed between the large-diameter portion and a pin attachment pad. At the same time, an electronic device electrically connecting an electrode of an electronic component and a wiring conductor, wherein the lead pin has an elastic modulus of 90 to 120 GPa and a Vickers hardness of 110 to 160 Hv. It is a feature.

【0008】本発明のピン付き配線基板およびこれを用
いた電子装置によれば、銅合金から成るリードピンは、
その弾性率が90〜120GPaであり、かつそのビッカー
ス硬度が110〜160Hvであることから、リードピンにこ
れを引っ張る力が印加された際、径大部が過度に弾性変
形および塑性変形することはなく適度に弾性変形および
塑性変形するため、リードピンを引っ張る力による応力
はリードピンの径大部が適度に弾性変形および塑性変形
することにより良好に分散されて半田の表面や内部の一
部に大きく集中して作用することを有効に防止すること
ができる。
According to the wiring board with a pin of the present invention and the electronic device using the same, the lead pin made of a copper alloy is
Since its elastic modulus is 90-120 GPa and its Vickers hardness is 110-160 Hv, the large diameter portion will not be excessively elastically or plastically deformed when a force for pulling it is applied to the lead pin. Since it is elastically and plastically deformed moderately, the stress caused by the pulling force of the lead pin is well dispersed due to the elastic and plastic deformation of the large diameter part of the lead pin, and the stress is largely concentrated on the solder surface and a part of the inside. Can effectively be prevented.

【0009】[0009]

【発明の実施の形態】つぎに、本発明を添付の図面に基
づき詳細に説明する。図1は、本発明を半導体素子を搭
載するためのピン付き配線基板およびこれに半導体素子
を搭載した電子装置に適用した場合の実施の形態の一例
を示す断面図であり、1は絶縁基板、2は配線導体、3
はリードピンである。この絶縁基板1と配線導体2とリ
ードピン3とで本発明のピン付き配線基板が構成され、
これに電子部品としての半導体素子4を搭載することに
より本発明の電子装置が形成される。
BEST MODE FOR CARRYING OUT THE INVENTION Next, the present invention will be described in detail with reference to the accompanying drawings. FIG. 1 is a sectional view showing an example of an embodiment in which the present invention is applied to a wiring board with pins for mounting a semiconductor element and an electronic device mounting a semiconductor element on the wiring board. 2 is a wiring conductor, 3
Is a lead pin. The insulating substrate 1, the wiring conductor 2, and the lead pin 3 constitute the wiring substrate with pins of the present invention.
The electronic device of the present invention is formed by mounting the semiconductor element 4 as an electronic component on this.

【0010】絶縁基板1は、例えばガラス繊維を縦横に
織り込んだガラス織物にエポキシ樹脂やビスマレイミド
トリアジン樹脂等の熱硬化性樹脂を含浸させて成る板状
の芯体1aの上下面にエポキシ樹脂やビスマレイミドト
リアジン樹脂等の熱硬化性樹脂から成る絶縁層1bをそ
れぞれ複数層ずつ積層して成る有機材料系の多層板であ
り、その上面から下面にかけては銅箔や銅めっき膜等か
ら成る複数の配線導体2が形成されている。
The insulating substrate 1 is formed by impregnating a glass woven fabric in which glass fibers are woven vertically and horizontally with a thermosetting resin such as epoxy resin or bismaleimide triazine resin. It is an organic material-based multi-layered plate formed by laminating a plurality of insulating layers 1b each made of a thermosetting resin such as a bismaleimide triazine resin. The wiring conductor 2 is formed.

【0011】絶縁基板1を構成する芯体1aは、厚みが
0.3〜1.5mm程度であり、その上面から下面にかけて直
径が0.1〜1.0mm程度の複数の貫通孔5を有している。
そして、その上下面および各貫通孔5の内壁には配線導
体2の一部が被着されており、上下面の配線導体2が貫
通孔5を介して電気的に接続されている。
The core 1a constituting the insulating substrate 1 has a thickness
It has a diameter of about 0.3 to 1.5 mm and has a plurality of through holes 5 having a diameter of about 0.1 to 1.0 mm from its upper surface to its lower surface.
A part of the wiring conductor 2 is attached to the upper and lower surfaces and the inner wall of each through hole 5, and the upper and lower wiring conductors 2 are electrically connected through the through hole 5.

【0012】このような芯体1aは、ガラス織物に未硬
化の熱硬化性樹脂を含浸させたシートを熱硬化させた
後、これに上面から下面にかけてドリル加工を施すこと
により製作される。なお、芯体1a上下面の配線導体2
は、芯体1a用のシートの上下全面に厚みが3〜50μm
程度の銅箔を貼着しておくとともにこの銅箔をシートの
硬化後にエッチング加工することにより所定のパターン
に形成される。また、貫通孔5内壁の配線導体2は、芯
体1aに貫通孔5を設けた後に、この貫通孔5内壁に無
電解めっき法および電解めっき法により厚みが3〜50μ
m程度の銅めっき膜を析出させることにより形成され
る。
Such a core 1a is manufactured by heat-curing a sheet obtained by impregnating a glass fabric with an uncured thermosetting resin, and then drilling the sheet from the upper surface to the lower surface. The wiring conductors 2 on the upper and lower surfaces of the core body 1a
Has a thickness of 3 to 50 μm on the entire upper and lower surfaces of the core 1a sheet.
A certain amount of copper foil is attached and the copper foil is etched to form a predetermined pattern after curing. The wiring conductor 2 on the inner wall of the through hole 5 has a thickness of 3 to 50 μm formed by electroless plating and electrolytic plating on the inner wall of the through hole 5 after the through hole 5 is provided in the core body 1a.
It is formed by depositing a copper plating film of about m.

【0013】さらに、芯体1aは、その貫通孔5の内部
にエポキシ樹脂やビスマレイミドトリアジン樹脂等の熱
硬化性樹脂から成る樹脂柱6が充填されている。樹脂柱
6は、貫通孔5を塞ぐことにより貫通孔5の直上および
直下に絶縁層1bを形成可能とするためのものであり、
未硬化のペースト状の熱硬化性樹脂を貫通孔5内にスク
リーン印刷法により充填し、これを熱硬化させた後、そ
の上下面を略平坦に研磨することにより形成される。そ
して、この樹脂柱6を含む芯体1aの上下面に絶縁層1
bが積層されている。
Further, the core 1a is filled with a resin column 6 made of a thermosetting resin such as an epoxy resin or a bismaleimide triazine resin inside the through hole 5. The resin column 6 is for closing the through hole 5 so that the insulating layer 1b can be formed immediately above and immediately below the through hole 5.
It is formed by filling an uncured paste-like thermosetting resin into the through holes 5 by a screen printing method, thermally curing the resin, and polishing the upper and lower surfaces thereof to be substantially flat. Then, the insulating layer 1 is formed on the upper and lower surfaces of the core 1a including the resin columns 6.
b are stacked.

【0014】芯体1aの上下面に積層された絶縁層1b
は、それぞれの厚みが20〜60μm程度であり、各層の上
面から下面にかけて直径が30〜100μm程度の複数の貫
通孔7を有している。これらの絶縁層1bは、配線導体
2を高密度に配線するための絶縁間隔を提供するための
ものである。そして、上層の配線導体2と下層の配線導
体2とを貫通孔7を介して電気的に接続することにより
高密度配線を立体的に形成可能としている。このような
絶縁層1bは、厚みが20〜60μm程度の未硬化の熱硬化
性樹脂のフィルムを芯体1a上下面に貼着し、これを熱
硬化させるとともにレーザー加工により貫通孔7を穿孔
し、さらにその上に同様にして次の絶縁層1bを順次積
み重ねることによって形成される。なお、各絶縁層1b
表面および貫通孔7内に被着された配線導体2は、各絶
縁層1bを形成する毎に各絶縁層1bの表面および貫通
孔7内に5〜50μm程度の厚みの銅めっき膜を公知のセ
ミアディティブ法やサブトラクティブ法等のパターン形
成法により所定のパターンに被着させることによって形
成される。
Insulating layer 1b laminated on the upper and lower surfaces of the core 1a
Has a thickness of about 20 to 60 μm, and has a plurality of through holes 7 having a diameter of about 30 to 100 μm from the upper surface to the lower surface of each layer. These insulating layers 1b serve to provide an insulating space for wiring the wiring conductors 2 at high density. Then, by electrically connecting the upper layer wiring conductor 2 and the lower layer wiring conductor 2 through the through holes 7, it is possible to three-dimensionally form high-density wiring. For such an insulating layer 1b, an uncured thermosetting resin film having a thickness of about 20 to 60 μm is adhered to the upper and lower surfaces of the core body 1a, which is heat-cured and the through holes 7 are punched by laser processing. Further, it is formed by successively stacking the next insulating layer 1b thereon in the same manner. In addition, each insulating layer 1b
The wiring conductor 2 deposited on the surface and in the through holes 7 has a known copper plating film having a thickness of about 5 to 50 μm on the surface of each insulating layer 1b and in the through holes 7 each time each insulating layer 1b is formed. It is formed by applying a predetermined pattern by a pattern forming method such as a semi-additive method or a subtractive method.

【0015】絶縁基板1の上面から下面にかけて形成さ
れた配線導体2は、半導体素子4の各電極を外部電気回
路基板に接続するための導電路として機能し、絶縁基板
1の上面に設けられた部位の一部が半導体素子4の各電
極に例えば鉛−錫共晶合金から成る半田バンプ8を介し
て接合される電子部品接続パッド2aを、絶縁基板1の
下面に露出した部位の一部が外部接続端子としてのリー
ドピン3を接合するためのピン付けパッド2bを形成し
ており、ピン付けパッド2bにはリードピン3が鉛−錫
−アンチモン合金等の半田9を介して立設されている。
このような電子部品接続パッド2aおよびピン付けパッ
ド2bは、図2に要部拡大平面図で示すように、配線導
体2に接続された略円形のパターンの外周部をソルダー
レジストと呼ばれる最外層の絶縁層1bにより15〜150
μm程度の幅で被覆してその外周縁を画定することによ
りその直径φが、電子部品接続パッド2aであれば略70
〜200μm程度に、ピン付けパッド2bであれば略0.5〜
2.5mm程度になるように形成されている。なお、この
ようなソルダーレジスト1bにより電子部品接続パッド
2a同士あるいはピン付けパッド2b同士の半田8や9
による電気的な短絡が有効に防止されるとともに電子部
品接続パッド2aおよびピン付けパッド2bの絶縁基板
1に対する接合強度が高いものとなっている。
The wiring conductor 2 formed from the upper surface to the lower surface of the insulating substrate 1 functions as a conductive path for connecting each electrode of the semiconductor element 4 to an external electric circuit board, and is provided on the upper surface of the insulating substrate 1. Part of the portion exposed on the lower surface of the insulating substrate 1 is an electronic component connection pad 2a joined to each electrode of the semiconductor element 4 via a solder bump 8 made of, for example, a lead-tin eutectic alloy. A pin attachment pad 2b for joining the lead pin 3 as an external connection terminal is formed, and the lead pin 3 is erected on the pin attachment pad 2b via a solder 9 such as a lead-tin-antimony alloy.
Such an electronic component connection pad 2a and a pin attachment pad 2b have an outer peripheral portion of a substantially circular pattern connected to the wiring conductor 2 as an outermost layer called a solder resist, as shown in FIG. 15 to 150 depending on insulating layer 1b
If the diameter φ of the electronic component connection pad 2a is approximately 70 by covering with a width of about μm and defining the outer peripheral edge thereof,
Approximately 200 μm, approximately 0.5 for pinned pad 2b
It is formed to be about 2.5 mm. It should be noted that the solder resist 1b as described above is used to solder the electronic component connecting pads 2a or the solder 8 or 9 between the pinning pads 2b.
This effectively prevents an electrical short circuit due to the above, and the bonding strength of the electronic component connection pad 2a and the pin attachment pad 2b to the insulating substrate 1 is high.

【0016】また、ピン付けパッド2bに接合されたリ
ードピン3は搭載する半導体素子4を外部電気回路に接
続するための外部接続端子として機能する。
Further, the lead pin 3 joined to the pin attachment pad 2b functions as an external connection terminal for connecting the mounted semiconductor element 4 to an external electric circuit.

【0017】そして、この配線基板においては、電子部
品接続パッド2aに半導体素子4の各電極を半田バンプ
8を介して接合して半導体素子4を搭載するとともにこ
の半導体素子4を図示しない蓋体やポッティング樹脂に
より封止することによって電子装置となり、この電子装
置におけるリードピン3をソケットや半田を介して外部
電気回路基板の配線導体に接続することにより本発明の
電子装置が外部電気回路基板に実装されることとなる。
In this wiring board, the electrodes of the semiconductor element 4 are bonded to the electronic component connection pads 2a through the solder bumps 8 to mount the semiconductor element 4, and the semiconductor element 4 is covered with a lid or a cover (not shown). An electronic device is formed by sealing with potting resin, and the electronic device of the present invention is mounted on the external electric circuit board by connecting the lead pin 3 in the electronic device to the wiring conductor of the external electric circuit board via a socket or solder. The Rukoto.

【0018】なお、リードピン3は、図3に要部拡大断
面図で示すように、例えば銅97.57重量%/鉄2.3重量%
/亜鉛0.1重量%/リン0.03重量%を含有する銅合金か
ら成り、直径Aが0.25〜0.5mm程度で長さが1〜3.5m
m程度の略円柱状の軸部3aの上端に直径Bが0.45〜1.
25mmで厚みCが0.05〜0.3mm程度のネールヘッドと
呼ばれる略円板状の径大部3bを形成して成る。そし
て、この径大部3bをピン付けパッド2bに鉛82重量%
/錫10重量%/アンチモン8重量%を含有する弾性率が
50GPa以下の半田を介して接合することによりリード
ピン3がピン付けパッド2bに立設されている。このよ
うに、本発明のピン付き配線基板およびそれを用いた電
子装置によれば、リードピン3が銅合金から成ることか
ら、絶縁基体1とリードピン3の熱膨張係数が15ppm
/℃程度と近似したものとなり、これらの間に熱膨張係
数の相違に起因する大きな応力が発生することを有効に
防止することができる。また、半田9の弾性率が50GP
a以下であり弾性変形しやすいことから、リードピン3
に外力が印加された際にその力によってリードピン3と
ピン付けパッド2bとの間に発生する応力を半田9で良
好に吸収することができる。
The lead pin 3 is, for example, 97.57% by weight of copper / 2.3% by weight of iron, as shown in the enlarged cross-sectional view of the main part in FIG.
/ Copper alloy containing 0.1% by weight of zinc / 0.03% by weight of phosphorus, diameter A is about 0.25-0.5 mm and length is 1-3.5 m
The diameter B is 0.45 to 1. at the upper end of the substantially cylindrical shaft portion 3a of about m.
It is formed by forming a substantially disk-shaped large-diameter portion 3b called a nail head having a thickness of 25 mm and a thickness C of about 0.05 to 0.3 mm. Then, 82% by weight of lead is attached to the pad 2b with the large diameter portion 3b.
/ Elastic content containing 10% by weight of tin / 8% by weight of antimony
The lead pins 3 are erected on the pin attachment pads 2b by joining them via solder of 50 GPa or less. As described above, according to the wiring board with a pin and the electronic device using the same of the present invention, since the lead pins 3 are made of a copper alloy, the thermal expansion coefficient of the insulating substrate 1 and the lead pins 3 is 15 ppm.
It becomes close to about / ° C, and it is possible to effectively prevent generation of a large stress due to a difference in thermal expansion coefficient between them. Also, the elastic modulus of the solder 9 is 50 GP.
Since it is a or less and is easily elastically deformed, the lead pin 3
The stress generated between the lead pin 3 and the pin attachment pad 2b due to the external force applied to the solder 9 can be favorably absorbed by the solder 9.

【0019】なお、このようなリードピン3は、軸部3
aと実質的に同じ直径を有する銅合金から成る線材を準
備するとともにこれに熱処理を施した後、この線材の一
端部をプレスにより潰して径大部3bを形成することに
より製作される。
Incidentally, such a lead pin 3 has a shaft portion 3
It is manufactured by preparing a wire made of a copper alloy having a diameter substantially the same as that of a, subjecting the wire to heat treatment, and then crushing one end of the wire by a press to form a large-diameter portion 3b.

【0020】また、リードピン3をピン付けパッド2b
に半田9を介して接合するには、ピン付けパッド2bに
半田9用の半田ペーストを例えばメタルマスクを用いた
スクリーン印刷法により所定量印刷塗布するとともにそ
の上にリードピン3の径大部3b上端面を突き当てて当
接させ、これらを加熱して半田9を溶融させた後、常温
に冷却する方法が採用される。
Further, the lead pin 3 is attached to the pin pad 2b.
In order to bond to the pin via the solder 9, a predetermined amount of a solder paste for the solder 9 is applied to the pin attachment pad 2b by screen printing using a metal mask, and on the large diameter portion 3b of the lead pin 3 is applied thereon. A method of abutting the end faces against each other, heating them to melt the solder 9 and then cooling to room temperature is adopted.

【0021】さらに、本発明においては、リードピン3
の弾性率が90〜120GPaであり、かつビッカース硬度
が110〜160Hvとなっている。そして、そのことが重要
である。このように、リードピン3の弾性率が90〜120
GPaであり、かつビッカース硬度が110〜160Hvとな
っていることから、リードピン3に引っ張りの力が印加
されたときにその引っ張りの力による応力を径大部3b
が適度に弾性変形および塑性変形することにより半田9
の表面および内部に略均一に分散させることができ、例
えば50N程度の力でリードピン3を引っ張ったとしても
半田9がその表面または内部から破断されてリードピン
3が取れてしまうようなことはなく、搭載する電子部品
4を外部電気回路に正常に接続することができる。
Further, in the present invention, the lead pin 3
Has an elastic modulus of 90 to 120 GPa and a Vickers hardness of 110 to 160 Hv. And that is important. In this way, the elastic modulus of the lead pin 3 is 90 to 120.
Since it is GPa and the Vickers hardness is 110 to 160 Hv, when the pulling force is applied to the lead pin 3, the stress due to the pulling force is applied to the large diameter portion 3b.
Is appropriately elastically and plastically deformed so that the solder 9
Can be dispersed substantially evenly on the surface and inside, and even if the lead pin 3 is pulled with a force of about 50 N, the solder 9 will not be broken from the surface or inside and the lead pin 3 will be removed. The mounted electronic component 4 can be normally connected to an external electric circuit.

【0022】なお、リードピン3の弾性率が90GPa未
満またはビッカース硬度が110Hv未満であると、リー
ドピン3に引っ張りの力が印加されたときにリードピン
3を引っ張る力による応力で径大部3bが大きく弾性変
形および塑性変形し、そのため径大部3b頂面とピン付
けパッド2bとの間に存在する半田9に大きな応力が作
用し、リードピン3を例えば30N程度の力で引っ張った
場合であっても径大部3b頂面とピン付けパッド2bと
の間に存在する半田9の内部から半田9が破断してしま
いやすくなる。他方、弾性率が120GPaを超える、ま
たはビッカース硬度が160Hvを超えると、リードピン
3を垂直あるいは斜めに引っ張ったときに、リードピン
3を引っ張る力が径大部3bの外周部に大きく印加さ
れ、その結果、その力が径大部3b側面とピン付けパッ
ド2bとの間に存在する半田9の表面に大きく集中して
作用し、例えば30N程度の力でリードピン3を引っ張っ
た場合であっても径大部3b側面とピン付けパッド2b
との間に存在する半田9の表面から半田9が破断してし
まいやすくなる。したがって、リードピン3の弾性率は
90〜120GPaの範囲に、ビッカース硬度は110〜160H
vの範囲に特定される。
When the elastic modulus of the lead pin 3 is less than 90 GPa or the Vickers hardness is less than 110 Hv, the large diameter portion 3b is largely elastic due to the stress caused by pulling the lead pin 3 when the pulling force is applied to the lead pin 3. Deformation and plastic deformation cause a large stress to act on the solder 9 existing between the top surface of the large-diameter portion 3b and the pinning pad 2b, and even if the lead pin 3 is pulled with a force of, for example, about 30N, The solder 9 easily breaks from the inside of the solder 9 existing between the top surface of the large portion 3b and the pinning pad 2b. On the other hand, when the elastic modulus exceeds 120 GPa or the Vickers hardness exceeds 160 Hv, when the lead pin 3 is pulled vertically or diagonally, the pulling force of the lead pin 3 is largely applied to the outer peripheral portion of the large diameter portion 3b. , The force acts largely on the surface of the solder 9 existing between the side surface of the large diameter portion 3b and the pin attachment pad 2b, and even if the lead pin 3 is pulled by a force of about 30N, the large diameter Part 3b side surface and pin attachment pad 2b
The solder 9 is likely to break from the surface of the solder 9 existing between and. Therefore, the elastic modulus of the lead pin 3 is
Vickers hardness of 110-160H in the range of 90-120GPa
It is specified in the range of v.

【0023】なお、リードピン3の弾性率を90〜120G
Pa、ビッカース硬度を110〜160Hvの範囲とするに
は、例えばリードピン3が銅97.57重量%/鉄2.3重量%
/亜鉛0.1重量%/リン0.03重量%を含有する銅合金か
ら成る場合であれば、リードピン3用の線材を予め350
〜450℃の温度で5分間程度熱処理すればよい。この場
合、熱処理の温度が350℃未満ではリードピン3の弾性
率を120GPa以下あるいはビッカース硬度を160Hv以
下とすることが困難となり、450℃を超えると弾性率を9
0GPa以上あるいはビッカース硬度を110Hv以上とす
ることが困難となる。
The elastic modulus of the lead pin 3 is 90 to 120G.
To set the Pa and Vickers hardness to the range of 110 to 160 Hv, for example, the lead pin 3 has 97.57% by weight of copper / 2.3% by weight of iron.
If it is made of a copper alloy containing 0.1% by weight of zinc / 0.1% by weight of phosphorus / 0.03% by weight of phosphorus, 350
The heat treatment may be performed at a temperature of ~ 450 ° C for about 5 minutes. In this case, if the heat treatment temperature is lower than 350 ° C, it becomes difficult to set the elastic modulus of the lead pin 3 to 120 GPa or less or the Vickers hardness to 160 Hv or less.
It becomes difficult to set 0 GPa or more or the Vickers hardness to 110 Hv or more.

【0024】また、リードピン3の軸部3aの直径Aと
径大部3bの直径Bとの比率B/Aが1.8未満である
と、リードピン3を垂直あるいは斜めに引っ張ったとき
に、リードピン3を引っ張る力が径大部3bの外周部に
大きく印加され、その結果、その力が径大部3b側面と
ピン付けパッド2bとの間に存在する半田9の表面に大
きく集中して作用し、例えば50N未満の力でリードピン
3を引っ張った場合であっても径大部3b側面とピン付
けパッド2bとの間に存在する半田9の表面から半田9
が破断してしまう危険性があり、他方、B/Aが2.5を
超えるとリードピン3を垂直あるいは斜めに引っ張った
ときに、リードピン3を引っ張る力が径大部3bの中央
部に大きく印加され、その結果、その力が径大部3b頂
面を介して径大部3b頂面とピン付けパッド2bとの間
に存在する半田9内部に大きく集中して作用し、例えば
50N未満の力でリードピン3を引っ張った場合であって
も径大部3b頂面とピン付けパッド2bとの間に存在す
る半田9の内部から半田9が破断してしまう危険性があ
る。したがって、リードピン3の軸部3aの直径Aと径
大部3bの直径Bとの比率B/Aは1.8≦B/A≦2.5の
範囲が好ましい。
If the ratio B / A of the diameter A of the shaft portion 3a of the lead pin 3 to the diameter B of the large diameter portion 3b is less than 1.8, the lead pin 3 is pulled when the lead pin 3 is pulled vertically or diagonally. A large pulling force is applied to the outer peripheral portion of the large-diameter portion 3b, and as a result, the force is largely concentrated and acts on the surface of the solder 9 existing between the side surface of the large-diameter portion 3b and the pinning pad 2b. Even when the lead pin 3 is pulled with a force of less than 50 N, the solder 9 exists from the surface of the solder 9 existing between the side surface of the large diameter portion 3b and the pin attachment pad 2b.
On the other hand, when B / A exceeds 2.5, when the lead pin 3 is pulled vertically or diagonally, the pulling force of the lead pin 3 is largely applied to the central portion of the large diameter portion 3b, As a result, the force largely acts on the inside of the solder 9 existing between the top surface of the large-diameter portion 3b and the pinning pad 2b via the top surface of the large-diameter portion 3b.
Even if the lead pin 3 is pulled with a force of less than 50 N, there is a risk that the solder 9 will break from the inside of the solder 9 existing between the top surface of the large diameter portion 3b and the pinning pad 2b. Therefore, the ratio B / A between the diameter A of the shaft portion 3a of the lead pin 3 and the diameter B of the large diameter portion 3b is preferably in the range of 1.8 ≦ B / A ≦ 2.5.

【0025】また、径大部3bの直径Bと径大部3bの
厚みCとの比率B/Cが3.4未満であると、リードピン
3を垂直あるいは斜めに引っ張ったときに、リードピン
3を引っ張る力が径大部3bの外周部に大きく印加さ
れ、その結果、その力が径大部3b側面とピン付けパッ
ド2bとの間に存在する半田9の表面に大きく集中して
作用し、例えば50N未満の力でリードピン3を引っ張っ
た場合であっても径大部3b側面とピン付けパッド2b
との間に存在する半田9の表面から半田9が破断してし
まう危険性があり、他方B/Cが4.4を超えると、リー
ドピン3を垂直あるいは斜めに引っ張ったときに、リー
ドピン3を引っ張る力が径大部3bの中央部に大きく印
加され、その結果、その力が径大部3b頂面を介して径
大部3b頂面とピン付けパッド2bとの間に存在する半
田9内部に大きく集中して作用し、例えば50N未満の力
でリードピン3を引っ張った場合であっても径大部3b
頂面とピン付けパッド2bとの間に存在する半田9の内
部から半田9が破断してしまう危険性がある。したがっ
て、径大部3bの直径Bと径大部3bの厚みCとの比率
B/Cは3.4≦B/C≦4.4の範囲が好ましい。。
If the ratio B / C of the diameter B of the large diameter portion 3b and the thickness C of the large diameter portion 3b is less than 3.4, the force for pulling the lead pin 3 when pulling the lead pin 3 vertically or obliquely. Is largely applied to the outer peripheral portion of the large diameter portion 3b, and as a result, the force is largely concentrated and acts on the surface of the solder 9 existing between the side surface of the large diameter portion 3b and the pinning pad 2b. Even if the lead pin 3 is pulled by the force of the
There is a risk that the solder 9 will break from the surface of the solder 9 existing between the lead pin 3 and the lead pin 3. If B / C exceeds 4.4, the force for pulling the lead pin 3 when pulling the lead pin 3 vertically or diagonally Is largely applied to the central portion of the large-diameter portion 3b, and as a result, the force is large inside the solder 9 existing between the top surface of the large-diameter portion 3b and the pinning pad 2b via the top surface of the large-diameter portion 3b. The large diameter portion 3b acts in a concentrated manner, for example, even when the lead pin 3 is pulled with a force of less than 50N.
There is a risk that the solder 9 will break from the inside of the solder 9 existing between the top surface and the pinning pad 2b. Therefore, the ratio B / C between the diameter B of the large diameter portion 3b and the thickness C of the large diameter portion 3b is preferably in the range of 3.4 ≦ B / C ≦ 4.4. .

【0026】さらに、径大部3bの直径Bとピン付けパ
ッド2bの露出する外周縁から径大部3bまでの距離D
との比率D/Bが0.01未満であると、ピン付けパッド2
bと半田9との接合面積が狭いものとなり、ピン付けパ
ッド2bと半田9とを強固に接合することが困難となる
とともに、リードピン3に引っ張りの力が印加されたと
きに、この力によって発生する応力がピン付けパッド2
bの外周縁と絶縁基板1との接合部に大きく作用してピ
ン付けパッド2bが絶縁基板1から剥離してしまいやす
くなり、他方、D/Bが0.5を超えると、ピン付けパッ
ド2b上に多量の半田が流れるため、径大部3bとピン
付けパッド2bとの間に適度な大きさの半田9の溜まり
を形成するために多量の半田9が必要となり、そのよう
な多量の半田9を使ってリードピン3とピン付けパッド
2bとを半田付けすると、半田9の一部が径大部3bを
越えてリードピン3の下端部まで流れてしまい、リード
ピン3をソケットや半田を介して外部電気回路基板の配
線導体に電気的に接続する際にその接続が困難となる。
したがって、径大部3bの直径Bとピン付けパッド2b
の外周縁から径大部3bまでの距離Dとの比率D/Bは
0.01≦D/B≦0.5の範囲が好ましい。
Further, the diameter B of the large diameter portion 3b and the distance D from the exposed outer peripheral edge of the pin attachment pad 2b to the large diameter portion 3b.
If the ratio D / B with is less than 0.01, the pin pad 2
Since the joint area between b and the solder 9 becomes small, it becomes difficult to firmly join the pin attachment pad 2b and the solder 9, and when a pulling force is applied to the lead pin 3, this force is generated. The stress that causes pin 2
When the D / B exceeds 0.5, the pin attachment pad 2b is likely to be peeled off from the insulation substrate 1 due to a large effect on the joint between the outer peripheral edge of b and the insulation substrate 1. Since a large amount of solder flows, a large amount of solder 9 is required to form a pool of a suitable size of solder 9 between the large diameter portion 3b and the pin attachment pad 2b. If the lead pin 3 and the pin attachment pad 2b are soldered together, a part of the solder 9 will flow over the large diameter portion 3b to the lower end portion of the lead pin 3, and the lead pin 3 will be connected to the external electrical circuit via a socket or solder. When electrically connecting to the wiring conductor of the substrate, the connection becomes difficult.
Therefore, the diameter B of the large diameter portion 3b and the pin attachment pad 2b
The ratio D / B with the distance D from the outer peripheral edge to the large diameter portion 3b is
The range of 0.01 ≦ D / B ≦ 0.5 is preferable.

【0027】かくして、本発明のピン付き配線基板およ
びこれを用いた電子装置によれば、リードピン3を垂直
あるいは斜めに50N程度の力で引っ張ったとしてもリー
ドピン3が絶縁基板1から取れることがなく、搭載する
電子部品を正常に作動させることが可能なピン付き配線
基板および電子装置を提供することができる。
Thus, according to the wiring board with a pin and the electronic device using the same of the present invention, even if the lead pin 3 is pulled vertically or diagonally with a force of about 50 N, the lead pin 3 is not removed from the insulating substrate 1. It is possible to provide a wiring board with a pin and an electronic device capable of normally operating the mounted electronic components.

【0028】なお、本発明は、上述の実施の形態の一例
に限定されるものではなく、本発明の要旨を逸脱しない
範囲であれば種々の変更が可能であることはいうまでも
ない。
It is needless to say that the present invention is not limited to the above-mentioned example of the embodiment, and various modifications can be made without departing from the scope of the present invention.

【0029】[0029]

【発明の効果】本発明のピン付き配線基板およびこれを
用いた電子装置によれば、リードピンの弾性率が90〜12
0GPaであり、かつビッカース硬度が110〜160Hvで
あることから、リードピンに引っ張りの力が印加された
ときにその引っ張りの力による応力を径大部が適度に弾
性変形および塑性変形することにより半田の表面および
内部に略均一に分散させることができ、その結果、例え
ば50N程度の力でリードピンを引っ張ったとしても半田
がその表面または内部から破断されてリードピンが取れ
てしまうようなことはなく、搭載する電子部品を外部電
気回路に正常に接続することが可能である。
According to the wiring board with a pin and the electronic device using the same of the present invention, the elastic modulus of the lead pin is 90 to 12;
Since it is 0 GPa and the Vickers hardness is 110 to 160 Hv, when the pulling force is applied to the lead pin, the stress due to the pulling force causes the large-diameter portion to be appropriately elastically and plastically deformed, and It can be dispersed almost uniformly on the surface and inside. As a result, even if the lead pin is pulled with a force of about 50 N, the solder will not be broken from the surface or inside and the lead pin will not be removed, and mounting It is possible to normally connect the electronic components to the external electric circuit.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明のピン付き配線基板および電子装置の実
施の形態の一例の断面図である。
FIG. 1 is a cross-sectional view of an example of an embodiment of a wiring board with pins and an electronic device according to the present invention.

【図2】本発明のピン付き配線基板および電子装置の実
施の形態の一例の要部拡大平面図である。
FIG. 2 is an enlarged plan view of an essential part of an example of an embodiment of a wiring board with pins and an electronic device according to the present invention.

【図3】本発明のピン付き配線基板および電子装置の実
施の形態の一例の要部拡大断面図である。
FIG. 3 is an enlarged sectional view of an essential part of an example of an embodiment of a wiring board with pins and an electronic device according to the present invention.

【符号の説明】[Explanation of symbols]

1・・・・・絶縁基体 2・・・・・配線導体 2b・・・・ピン付けパッド 3・・・・・リードピン 3a・・・・軸部 3b・・・・径大部 4・・・・・電子部品としての半導体素子 9・・・・・半田 1 ... Insulating substrate 2 ... Wiring conductor 2b ... Pinning pad 3 ... Lead pin 3a ... Shaft 3b ... Large diameter part 4 ... Semiconductor element as an electronic component 9: Solder

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.7 識別記号 FI テーマコート゛(参考) H01L 23/50 H01L 23/12 P ─────────────────────────────────────────────────── ─── Continuation of front page (51) Int.Cl. 7 Identification code FI theme code (reference) H01L 23/50 H01L 23/12 P

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 配線導体を有する有機材料系の絶縁基板
の下面に前記配線導体と電気的に接続されたピン付けパ
ッドを設けるとともに、該ピン付けパッドに略円柱状の
軸部の上端に略円板状の径大部を形成して成る銅合金か
ら成るリードピンを前記径大部と前記ピン付けパッドと
の間に半田を介在させて立設して成るピン付き配線基板
であって、前記リードピンは、その弾性率が90〜12
0GPaであり、かつそのビッカース硬度が110〜1
60Hvであることを特徴とするピン付き配線基板。
1. A pin attachment pad electrically connected to the wiring conductor is provided on a lower surface of an insulating substrate made of an organic material having a wiring conductor, and the pin attachment pad has a substantially cylindrical upper end at an upper end thereof. A wiring board with a pin, wherein a lead pin made of a copper alloy forming a disk-shaped large-diameter portion is erected upright with solder interposed between the large-diameter portion and the pin attachment pad, The elastic modulus of the lead pin is 90 to 12
0 GPa and Vickers hardness of 110-1
A wiring board with a pin, which is 60 Hv.
【請求項2】 配線導体を有する有機材料系の絶縁基板
の下面に前記配線導体と電気的に接続されたピン付けパ
ッドを設けるとともに、該ピン付けパッドに略円柱状の
軸部の上端に略円板状の径大部を設けて成るリードピン
を前記径大部と前記ピン付けパッドとの間に半田を介在
させて立設して成るピン付き配線基板に電子部品を搭載
するとともに、該電子部品の電極と前記配線導体とを電
気的に接続して成る電子装置であって、前記リードピン
は、その弾性率が90〜120GPaであり、かつその
ビッカース硬度が110〜160Hvであることを特徴
とする電子装置。
2. A pin attachment pad electrically connected to the wiring conductor is provided on a lower surface of an insulating substrate made of an organic material having a wiring conductor, and the pin attachment pad has a substantially cylindrical upper end at an upper end thereof. An electronic component is mounted on a wiring board with a pin in which a lead pin formed by providing a disk-shaped large-diameter portion is erected with solder interposed between the large-diameter portion and the pin-attaching pad, and the electronic component is mounted on the wiring board. It is an electronic device which electrically connects an electrode of a component and the wiring conductor, wherein the lead pin has an elastic modulus of 90 to 120 GPa and a Vickers hardness of 110 to 160 Hv. Electronic device to do.
JP2001228423A 2001-07-27 2001-07-27 Wiring board with pin, and electronic device using the same Pending JP2003046030A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001228423A JP2003046030A (en) 2001-07-27 2001-07-27 Wiring board with pin, and electronic device using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001228423A JP2003046030A (en) 2001-07-27 2001-07-27 Wiring board with pin, and electronic device using the same

Publications (1)

Publication Number Publication Date
JP2003046030A true JP2003046030A (en) 2003-02-14

Family

ID=19060935

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001228423A Pending JP2003046030A (en) 2001-07-27 2001-07-27 Wiring board with pin, and electronic device using the same

Country Status (1)

Country Link
JP (1) JP2003046030A (en)

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