JP2003017611A - Circuit board with pin and electronic device using the same - Google Patents

Circuit board with pin and electronic device using the same

Info

Publication number
JP2003017611A
JP2003017611A JP2001197640A JP2001197640A JP2003017611A JP 2003017611 A JP2003017611 A JP 2003017611A JP 2001197640 A JP2001197640 A JP 2001197640A JP 2001197640 A JP2001197640 A JP 2001197640A JP 2003017611 A JP2003017611 A JP 2003017611A
Authority
JP
Japan
Prior art keywords
pin
diameter portion
solder
lead
pad
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001197640A
Other languages
Japanese (ja)
Inventor
Kenji Nakamura
憲志 中村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Original Assignee
Kyocera Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kyocera Corp filed Critical Kyocera Corp
Priority to JP2001197640A priority Critical patent/JP2003017611A/en
Publication of JP2003017611A publication Critical patent/JP2003017611A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/15Structure, shape, material or disposition of the bump connectors after the connecting process
    • H01L2224/16Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
    • H01L2224/161Disposition
    • H01L2224/16151Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/16221Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/16225Disposition the bump connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/153Connection portion
    • H01L2924/1531Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface
    • H01L2924/15312Connection portion the connection portion being formed only on the surface of the substrate opposite to the die mounting surface being a pin array, e.g. PGA

Abstract

PROBLEM TO BE SOLVED: To provide a circuit board with a pin capable of normally connecting an electronic component to be mounted to an external electric circuit without easily taking a lead pin, and to provide an electronic device. SOLUTION: The circuit board with the pin comprises a pad 2b with the pin electrically connected to a wiring conductor 2 provided on a lower surface of an insulating base 1 made of an organic material having the conductor 2, and the lead pin 3 made of a copper alloy and having a substantially truncated conical large-diameter part 3b formed at an upper end of a substantially columnar shaft 3a and stood via a solder 9 interposed between the part 3b and the pad 2b. In this case, 2.4<=A/B<=4.4 is satisfied, wherein A is a diameter of the part 3b, and B is a thickness of the part 3b, and a side face of the part 3b has an angle of 20 to 45 deg. to a direction of the shaft 3a.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、半導体素子等の電
子部品を搭載するために用いられるピン付き配線基板お
よびこのピン付き配線基板上に半導体素子等の電子部品
を搭載して成る電子装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wiring board with pins used for mounting electronic parts such as semiconductor elements, and an electronic device having the electronic parts such as semiconductor elements mounted on the wiring board with pins. It is a thing.

【0002】[0002]

【従来の技術】近時、半導体素子等の電子部品を搭載す
るために用いられるピン付き配線基板として、例えばガ
ラス−エポキシ板等から成る絶縁板やエポキシ樹脂等か
ら成る絶縁層を複数層積層して成る絶縁基板の上面から
下面にかけて銅箔等から成る複数の配線導体を設けると
ともにこれらの配線導体の絶縁基板下面に導出した部位
に複数のピン付けパッドを形成し、これらのピン付けパ
ッドに、円柱状の軸部の上端に厚みがこの軸部の直径の
半分程度で直径が厚みの3倍程度の円板状の径大部を設
けて成るリードピンをその径大部を突き当てて半田付け
することにより立設して成る有機材料系のピン付き配線
基板が採用されるようになってきている。このような有
機材料系のピン付き配線基板は、セラミック材料系のピ
ン付き配線基板と比較して軽量であり、かつ配線導体の
電気抵抗が小さいという有利な面を有している。そし
て、このような有機材料系のピン付き配線基板において
は絶縁基板の上面に電子部品を搭載するとともに電子部
品の電極と配線導体とを半田バンプやボンディングワイ
ヤ等を介して電気的に接続した後、電子部品を金属やセ
ラミックから成る蓋体やポッティング樹脂等から成る封
止部材により封止することによって製品としての電子装
置となり、この電子装置においては、絶縁基板下面のリ
ードピンを外部電気回路基板の配線導体にソケットや半
田等を介して接続することにより外部電気回路基板上に
実装されるとともに搭載する電子部品が外部電気回路に
電気的に接続されることとなる。
2. Description of the Related Art Recently, as a wiring board with a pin used for mounting electronic parts such as semiconductor elements, for example, a plurality of insulating layers made of glass-epoxy board or insulating layers made of epoxy resin are laminated. A plurality of wiring conductors made of copper foil or the like are provided from the upper surface to the lower surface of the insulating substrate formed by, and a plurality of pin-bonding pads are formed at the portions of these wiring conductors led to the lower surface of the insulating substrate, and these pin-bonding pads are formed. A lead pin formed by providing a disk-shaped large-diameter portion having a thickness of about half the diameter of the shaft portion and a diameter of about 3 times the thickness at the upper end of the cylindrical shaft portion is abutted to the large-diameter portion and soldered. As a result, an organic material-based wiring board with pins, which is vertically installed, has been adopted. Such an organic-material-based wiring board with pins has the advantages that it is lighter in weight than the ceramic-material-based wiring board and that the electrical resistance of the wiring conductor is small. In such an organic material-based wiring board with pins, electronic components are mounted on the upper surface of the insulating substrate, and electrodes of the electronic components and wiring conductors are electrically connected via solder bumps or bonding wires. By sealing the electronic component with a lid member made of metal or ceramic or a sealing member made of potting resin, an electronic device as a product is obtained. In this electronic device, the lead pins on the lower surface of the insulating substrate are connected to the external electric circuit board. By connecting to the wiring conductor via a socket, solder, or the like, the electronic component mounted and mounted on the external electric circuit board is electrically connected to the external electric circuit.

【0003】なお、このような配線基板におけるリード
ピンとしては、樹脂製の絶縁基体と熱膨張係数が近い銅
合金製のリードピンが使用されるようになってきてお
り、またリードピンとピン付けパッドとを半田付けする
半田としては、樹脂製の絶縁基体に半田付け時の熱によ
るダメージを与えないために、さらに外部リードピンに
外力が印加された際等に外部リードピンからの応力が半
田を介して半田付けパッドに大きく印加されて半田付け
パッドが剥離するのを防止するために例えば鉛−錫−ア
ンチモン合金等の融点が270℃以下で弾性率が50GPa
以下の半田が使用されるようになってきている。
As lead pins in such a wiring board, lead pins made of a copper alloy having a thermal expansion coefficient close to that of an insulating base made of resin have come to be used, and a lead pin and a pin pad are used. As the solder to be soldered, the stress from the external lead pins is soldered through the solder when external force is applied to the external lead pins in order to prevent the resin insulating base from being damaged by heat during soldering. In order to prevent the soldering pad from being peeled off due to a large voltage applied to the pad, for example, a lead-tin-antimony alloy or the like has a melting point of 270 ° C. or less and an elastic modulus of 50 GPa.
The following solders are being used.

【0004】[0004]

【発明が解決しようとする課題】しかしながら、この従
来の有機材料系のピン付き配線基板およびこれを用いた
電子装置によると、銅合金から成るリードピンが柔らか
く径大部の剛性が低いことから、リードピンを例えば30
N程度の力で垂直あるいは斜め方向に引っ張ると、その
力により径大部が変形してリードピンとピン付けパッド
とを接合する鉛−錫−アンチモン合金等から成る半田に
大きな応力が作用してしまい、その結果、降伏応力が小
さい半田に破断が発生してリードピンが絶縁基板から取
れてしまい、そのようにリードピンが絶縁基板から取れ
てしまうと搭載する電子部品を外部電気回路に正常に接
続することができなくなってしまうという問題点を有し
ていた。
However, according to this conventional wiring board with a pin made of an organic material and an electronic device using the same, since the lead pin made of a copper alloy is soft and the rigidity of the large diameter portion is low, the lead pin is low. For example 30
When it is pulled vertically or obliquely with a force of about N, the large diameter portion is deformed by the force, and a large stress acts on the solder made of lead-tin-antimony alloy or the like that joins the lead pin and the pin attachment pad. , As a result, the solder with low yield stress breaks and the lead pins come off from the insulating substrate, and if the lead pins come off from the insulating substrate in this way, the electronic components to be mounted must be properly connected to the external electric circuit. It had a problem that it could not be done.

【0005】本発明はかかる従来の問題点に鑑み完成さ
れたものであり、その目的は、50N程度の力でリードピ
ンを引っ張ったとしてもリードピンが取れることがな
く、搭載する電子部品を外部電気回路に正常に接続する
ことができる信頼性の高いピン付き配線基板および電子
装置を提供することにある。
The present invention has been completed in view of the above conventional problems, and an object thereof is to prevent the lead pin from being removed even if the lead pin is pulled with a force of about 50 N, and to mount an electronic component mounted on an external electric circuit. An object of the present invention is to provide a highly reliable wiring board with a pin and an electronic device that can be normally connected to the wiring board.

【0006】[0006]

【課題を解決するための手段】本発明のピン付き配線基
板は、配線導体を有する有機材料系の絶縁基板の下面に
配線導体と電気的に接続されたピン付けパッドを設ける
とともにこのピン付けパッドに、略円柱状の軸部の上端
に略円錐台状の径大部を形成した銅から成るリードピン
を径大部とピン付けパッドとの間に半田を介在させて立
設して成るピン付き配線基板であって、リードピンの径
大部の直径をA、径大部の厚みをBとしたときに2.4≦
A/B≦4.4であるとともにリードピンの径大部側面が
軸部の方向に対して20〜45゜の角度を有することを特徴
とするものである。
A wiring board with a pin according to the present invention is provided with a pinning pad electrically connected to the wiring conductor on the lower surface of an insulating substrate made of an organic material having a wiring conductor. In addition, a lead pin made of copper with a substantially circular truncated cone-shaped large-diameter portion formed on the upper end of the substantially cylindrical shaft portion is erected with solder interposed between the large-diameter portion and the pin attachment pad. If the diameter of the large diameter portion of the lead pin is A and the thickness of the large diameter portion is B, then 2.4 ≦
A / B ≦ 4.4 and the side surface of the large diameter portion of the lead pin has an angle of 20 to 45 ° with respect to the direction of the shaft portion.

【0007】また、本発明の電子装置は、上記構成のピ
ン付き配線基板に電子部品を搭載するとともに電子部品
の電極と配線基板の配線導体とを電気的に接続して成る
ことを特徴とするものである。
Further, the electronic device of the present invention is characterized in that the electronic component is mounted on the pin-equipped wiring board having the above-mentioned structure, and the electrodes of the electronic component and the wiring conductors of the wiring board are electrically connected. It is a thing.

【0008】本発明のピン付き配線基板およびこれを用
いた電子装置によれば、上述の構成としたことから、リ
ードピンにこれを引っ張る力が印加されたとしても、そ
の力による応力がリードピンの径大部を介して半田の表
面や内部の一部に大きく集中して作用することを有効に
防止することができ、その結果、リードピンを絶縁基板
に強固に接合することができる。
Since the wiring board with a pin and the electronic device using the same according to the present invention have the above-mentioned structure, even if a force for pulling the lead pin is applied, the stress caused by the force causes the diameter of the lead pin. It is possible to effectively prevent the solder from being largely concentrated and acting on the surface or a part of the inside of the solder through the large portion, and as a result, the lead pin can be firmly bonded to the insulating substrate.

【0009】[0009]

【発明の実施の形態】つぎに、本発明を添付の図面に基
づき詳細に説明する。図1は、本発明を半導体素子を搭
載するためのピン付き配線基板およびこれに半導体素子
を搭載した電子装置に適用した場合の実施の形態の一例
を示す断面図であり、1は絶縁基板、2は配線導体、3
はリードピンである。この絶縁基板1と配線導体2とリ
ードピン3とで本発明のピン付き配線基板が構成され、
これに電子部品としての半導体素子4を搭載することに
より本発明の電子装置が形成される。
BEST MODE FOR CARRYING OUT THE INVENTION Next, the present invention will be described in detail with reference to the accompanying drawings. FIG. 1 is a sectional view showing an example of an embodiment in which the present invention is applied to a wiring board with pins for mounting a semiconductor element and an electronic device mounting a semiconductor element on the wiring board. 2 is a wiring conductor, 3
Is a lead pin. The insulating substrate 1, the wiring conductor 2, and the lead pin 3 constitute the wiring substrate with pins of the present invention.
The electronic device of the present invention is formed by mounting the semiconductor element 4 as an electronic component on this.

【0010】絶縁基板1は、例えばガラス繊維を縦横に
織り込んだガラス織物にエポキシ樹脂やビスマレイミド
トリアジン樹脂等の熱硬化性樹脂を含浸させて成る板状
の芯体1aの上下面にエポキシ樹脂やビスマレイミドト
リアジン樹脂等の熱硬化性樹脂から成る絶縁層1bをそ
れぞれ複数層ずつ積層して成る有機材料系の多層板であ
り、その上面から下面にかけては銅箔や銅めっき膜等か
ら成る複数の配線導体2が形成されている。
The insulating substrate 1 is formed by impregnating a glass woven fabric in which glass fibers are woven vertically and horizontally with a thermosetting resin such as epoxy resin or bismaleimide triazine resin. It is an organic material-based multi-layered plate formed by laminating a plurality of insulating layers 1b each made of a thermosetting resin such as a bismaleimide triazine resin. The wiring conductor 2 is formed.

【0011】絶縁基板1を構成する芯体1aは、厚みが
0.3〜1.5mm程度であり、その上面から下面にかけて直
径が0.1〜1.0mm程度の複数の貫通孔5を有している。
そして、その上下面および各貫通孔5の内壁には配線導
体2の一部が被着されており、上下面の配線導体2が貫
通孔5を介して電気的に接続されている。
The core 1a constituting the insulating substrate 1 has a thickness
It has a diameter of about 0.3 to 1.5 mm and has a plurality of through holes 5 having a diameter of about 0.1 to 1.0 mm from its upper surface to its lower surface.
A part of the wiring conductor 2 is attached to the upper and lower surfaces and the inner wall of each through hole 5, and the upper and lower wiring conductors 2 are electrically connected through the through hole 5.

【0012】このような芯体1aは、ガラス織物に未硬
化の熱硬化性樹脂を含浸させたシートを熱硬化させた
後、これに上面から下面にかけてドリル加工を施すこと
により製作される。なお、芯体1a上下面の配線導体2
は、芯体1a用のシートの上下全面に厚みが3〜50μm
程度の銅箔を貼着しておくとともにこの銅箔をシートの
硬化後にエッチング加工することにより所定のパターン
に形成される。また、貫通孔5内壁の配線導体2は、芯
体1aに貫通孔5を設けた後に、この貫通孔5内壁に無
電解めっき法および電解めっき法により厚みが3〜50μ
m程度の銅めっき膜を析出させることにより形成され
る。
Such a core 1a is manufactured by heat-curing a sheet obtained by impregnating a glass fabric with an uncured thermosetting resin, and then drilling the sheet from the upper surface to the lower surface. The wiring conductors 2 on the upper and lower surfaces of the core body 1a
Has a thickness of 3 to 50 μm on the entire upper and lower surfaces of the core 1a sheet.
A certain amount of copper foil is attached and the copper foil is etched to form a predetermined pattern after curing. The wiring conductor 2 on the inner wall of the through hole 5 has a thickness of 3 to 50 μm formed by electroless plating and electrolytic plating on the inner wall of the through hole 5 after the through hole 5 is provided in the core body 1a.
It is formed by depositing a copper plating film of about m.

【0013】さらに、芯体1aは、その貫通孔5の内部
にエポキシ樹脂やビスマレイミドトリアジン樹脂等の熱
硬化性樹脂から成る樹脂柱6が充填されている。樹脂柱
6は、貫通孔5を塞ぐことにより貫通孔5の直上および
直下に絶縁層1bを形成可能とするためのものであり、
未硬化のペースト状の熱硬化性樹脂を貫通孔5内にスク
リーン印刷法により充填し、これを熱硬化させた後、そ
の上下面を略平坦に研磨することにより形成される。そ
して、この樹脂柱6を含む芯体1aの上下面に絶縁層1
bが積層されている。
Further, the core 1a is filled with a resin column 6 made of a thermosetting resin such as an epoxy resin or a bismaleimide triazine resin inside the through hole 5. The resin column 6 is for closing the through hole 5 so that the insulating layer 1b can be formed immediately above and immediately below the through hole 5.
It is formed by filling an uncured paste-like thermosetting resin into the through holes 5 by a screen printing method, thermally curing the resin, and polishing the upper and lower surfaces thereof to be substantially flat. Then, the insulating layer 1 is formed on the upper and lower surfaces of the core 1a including the resin columns 6.
b are stacked.

【0014】芯体1aの上下面に積層された絶縁層1b
は、それぞれの厚みが20〜60μm程度であり、各層の上
面から下面にかけて直径が30〜100μm程度の複数の貫
通孔7を有している。これらの絶縁層1bは、配線導体
2を高密度に配線するための絶縁間隔を提供するための
ものである。そして、上層の配線導体2と下層の配線導
体2とを貫通孔7を介して電気的に接続することにより
高密度配線を立体的に形成可能としている。このような
絶縁層1bは、厚みが20〜60μm程度の未硬化の熱硬化
性樹脂のフィルムを芯体1a上下面に貼着し、これを熱
硬化させるとともにレーザー加工により貫通孔7を穿孔
し、さらにその上に同様にして次の絶縁層1bを順次積
み重ねることによって形成される。なお、各絶縁層1b
表面および貫通孔7内に被着された配線導体2は、各絶
縁層1bを形成する毎に各絶縁層1bの表面および貫通
孔7内に5〜50μm程度の厚みの銅めっき膜を公知のセ
ミアディティブ法やサブトラクティブ法等のパターン形
成法により所定のパターンに被着させることによって形
成される。
Insulating layer 1b laminated on the upper and lower surfaces of the core 1a
Has a thickness of about 20 to 60 μm, and has a plurality of through holes 7 having a diameter of about 30 to 100 μm from the upper surface to the lower surface of each layer. These insulating layers 1b serve to provide an insulating space for wiring the wiring conductors 2 at high density. Then, by electrically connecting the upper layer wiring conductor 2 and the lower layer wiring conductor 2 through the through holes 7, it is possible to three-dimensionally form high-density wiring. For such an insulating layer 1b, an uncured thermosetting resin film having a thickness of about 20 to 60 μm is adhered to the upper and lower surfaces of the core body 1a, which is heat-cured and the through holes 7 are punched by laser processing. Further, it is formed by successively stacking the next insulating layer 1b thereon in the same manner. In addition, each insulating layer 1b
The wiring conductor 2 deposited on the surface and in the through holes 7 has a known copper plating film having a thickness of about 5 to 50 μm on the surface of each insulating layer 1b and in the through holes 7 each time each insulating layer 1b is formed. It is formed by applying a predetermined pattern by a pattern forming method such as a semi-additive method or a subtractive method.

【0015】絶縁基板1の上面から下面にかけて形成さ
れた配線導体2は、半導体素子4の各電極を外部電気回
路基板に接続するための導電路として機能し、絶縁基板
1の上面に設けられた部位の一部が半導体素子4の各電
極に例えば鉛−錫共晶合金から成る半田バンプ8を介し
て接合される電子部品接続パッド2aを、絶縁基板1の
下面に露出した部位の一部が外部接続端子としてのリー
ドピン3を接合するためのピン付けパッド2bを形成し
ており、ピン付けパッド2bにはリードピン3が鉛−錫
−アンチモン合金等の弾性率が50GPa以下の半田9を
介して立設されている。このような電子部品接続パッド
2aおよびピン付けパッド2bは、図2に要部拡大平面
図で示すように、配線導体2に接続された略円形のパタ
ーンの外周部をソルダーレジストと呼ばれる最外層の絶
縁層1bにより15〜150μm程度の幅で被覆してその外
周縁を画定することによりその直径φが、電子部品接続
パッド2aであれば略70〜200μm程度に、ピン付けパ
ッド2bであれば略0.5〜2.5mm程度になるように形成
されている。なお、このようなソルダーレジスト1bに
より電子部品接続パッド2a同士あるいはピン付けパッ
ド2b同士の半田8や9による電気的な短絡が有効に防
止されるとともに電子部品接続パッド2aおよびピン付
けパッド2bの絶縁基板1に対する接合強度が高いもの
となっている。
The wiring conductor 2 formed from the upper surface to the lower surface of the insulating substrate 1 functions as a conductive path for connecting each electrode of the semiconductor element 4 to an external electric circuit board, and is provided on the upper surface of the insulating substrate 1. Part of the portion exposed on the lower surface of the insulating substrate 1 is an electronic component connection pad 2a joined to each electrode of the semiconductor element 4 via a solder bump 8 made of, for example, a lead-tin eutectic alloy. A pin attachment pad 2b for connecting the lead pin 3 as an external connection terminal is formed, and the lead pin 3 is formed on the pin attachment pad 2b via a solder 9 such as a lead-tin-antimony alloy having an elastic modulus of 50 GPa or less. It is erected. Such an electronic component connection pad 2a and a pin attachment pad 2b have an outer peripheral portion of a substantially circular pattern connected to the wiring conductor 2 as an outermost layer called a solder resist, as shown in FIG. By covering the outer peripheral edge by covering the insulating layer 1b with a width of about 15 to 150 μm, the diameter φ thereof is about 70 to 200 μm for the electronic component connection pad 2a, and substantially for the pin attachment pad 2b. It is formed to be about 0.5 to 2.5 mm. It should be noted that such a solder resist 1b effectively prevents an electrical short circuit between the electronic component connection pads 2a or the pin attachment pads 2b due to the solder 8 or 9 and also insulates the electronic component connection pad 2a and the pin attachment pad 2b. The bonding strength with respect to the substrate 1 is high.

【0016】また、ピン付けパッド2bに接合されたリ
ードピン3は搭載する半導体素子4を外部電気回路に接
続するための外部接続端子として機能する。
Further, the lead pin 3 joined to the pin attachment pad 2b functions as an external connection terminal for connecting the mounted semiconductor element 4 to an external electric circuit.

【0017】そして、この配線基板においては、電子部
品接続パッド2aに半導体素子4の各電極を半田バンプ
8を介して接合して半導体素子4を搭載するとともにこ
の半導体素子4を図示しない蓋体やポッティング樹脂に
より封止することによって電子装置となり、この電子装
置におけるリードピン3をソケットや半田を介して外部
電気回路基板の配線導体に接続することにより本発明の
電子装置が外部電気回路基板に実装されることとなる。
In this wiring board, the electrodes of the semiconductor element 4 are bonded to the electronic component connection pads 2a through the solder bumps 8 to mount the semiconductor element 4, and the semiconductor element 4 is covered with a lid or a cover (not shown). An electronic device is formed by sealing with potting resin, and the electronic device of the present invention is mounted on the external electric circuit board by connecting the lead pin 3 in the electronic device to the wiring conductor of the external electric circuit board via a socket or solder. The Rukoto.

【0018】なお、リードピン3は、図3に要部拡大断
面図で示すように、例えば銅97.57重量%/鉄2.3重量%
/亜鉛0.1重量%/リン0.03重量%を含有する銅合金か
ら成り、直径がAが0.25〜0.5mm程度で長さが1〜3.5
mm程度の略円柱状の軸部3aの上端に直径Bが0.45〜
1.25mmで厚みCが0.05〜0.3mm程度のネールヘッド
と呼ばれる略円錐台状の径大部3bを形成して成る。そ
して、この径大部3bをピン付けパッド2bに鉛82重量
%/錫10重量%/アンチモン8重量%を含有する弾性率
が50GPa以下の半田を介して接合することによりリー
ドピン3がピン付けパッド2bに立設されている。この
ように、本発明のピン付き配線基板およびそれを用いた
電子装置によれば、リードピン3が銅合金から成ること
から、絶縁基体1とリードピン3の熱膨張係数が15pp
m/℃程度と近似したものとなり、これらの間に熱膨張
係数の相違に起因する大きな応力が発生することを有効
に防止することができる。また、半田9の弾性率が50G
Pa以下であり弾性変形しやすいことから、リードピン
3に外力が印加された際にその力によってリードピン3
とピン付けパッド2bとの間に発生する応力を半田9で
良好に吸収することができる。
The lead pin 3 is, for example, 97.57% by weight of copper / 2.3% by weight of iron, as shown in the enlarged cross-sectional view of the main part in FIG.
/ A copper alloy containing 0.1% by weight of zinc / 0.03% by weight of phosphorus, with a diameter A of about 0.25 to 0.5 mm and a length of 1 to 3.5.
mm has a diameter B of 0.45 to the upper end of the substantially cylindrical shaft 3a.
It is formed by forming a substantially frustoconical large-diameter portion 3b called a nail head having a thickness C of about 0.25 mm and a thickness C of about 0.05 to 0.3 mm. Then, the large diameter portion 3b is bonded to the pin pad 2b through a solder containing 82% by weight of lead / 10% by weight of tin / 8% by weight of antimony and having an elastic modulus of 50 GPa or less. It is erected on 2b. As described above, according to the wiring board with a pin and the electronic device using the same of the present invention, since the lead pins 3 are made of a copper alloy, the thermal expansion coefficient of the insulating substrate 1 and the lead pins 3 is 15 pp.
It becomes close to about m / ° C., and it is possible to effectively prevent generation of a large stress due to a difference in thermal expansion coefficient between them. Also, the elastic modulus of the solder 9 is 50 G
Since it is Pa or less and is easily elastically deformed, when an external force is applied to the lead pin 3, the lead pin 3 is affected by the external force.
The stress generated between the pin 9 and the pad 2b can be well absorbed by the solder 9.

【0019】さらに、本発明においては、リードピン3
の径大部3bの直径をA、径大部3bの厚みをBとした
ときに、2.4≦A/B≦4.4となっているとともに径大
部3b側面の軸部3a方向に対する角度θが20〜45゜と
なっている。そして、そのことが重要である。このよう
に、リードピン3の径大部3bの直径をA、径大部3b
の厚みをBとしたときに、2.4≦A/B≦4.4となって
いることから、径大部3bの直径に対する厚みの比率が
十分に大きなものとなり、そのため径大部3bの剛性が
高いものとなる。したがって、リードピン3を例えば50
N程度の力で引っ張ったとしても径大部3bが変形して
半田9に大きな力が作用することを有効に防止すること
ができる。
Further, in the present invention, the lead pin 3
Where A is the diameter of the large-diameter portion 3b and B is the thickness of the large-diameter portion 3b, 2.4 ≦ A / B ≦ 4.4 and the angle θ of the side surface of the large-diameter portion 3b with respect to the direction of the shaft portion 3a. Is 20 to 45 °. And that is important. Thus, the diameter of the large diameter portion 3b of the lead pin 3 is A, and the large diameter portion 3b is
Since the thickness B is 2.4 ≦ A / B ≦ 4.4, the ratio of the thickness to the diameter of the large diameter portion 3b is sufficiently large, so that the rigidity of the large diameter portion 3b is It will be expensive. Therefore, the lead pin 3 is, for example, 50
Even if it is pulled with a force of about N, it is possible to effectively prevent the large-diameter portion 3b from being deformed and exerting a large force on the solder 9.

【0020】また、径大部3b側面の軸部3a方向に対
する角度θが20〜45゜となっていることから、リードピ
ン3に引っ張りの力が印加されたときにその引っ張りの
力による応力を径大部3bの側面を介して半田9の表面
および内部に略均一に分散させることができ、例えば50
N程度の力でリードピン3を引っ張ったとしても半田9
がその表面または内部から破断されてリードピン3が取
れてしまうようなことはなく、搭載する電子部品4を外
部電気回路に正常に接続することができる。
Further, since the angle θ of the side surface of the large diameter portion 3b with respect to the direction of the shaft portion 3a is 20 to 45 °, when the pulling force is applied to the lead pin 3, the stress due to the pulling force is It can be dispersed almost uniformly on the surface and inside of the solder 9 through the side surface of the large portion 3b.
Even if the lead pin 3 is pulled with a force of about N, the solder 9
However, the lead pin 3 is not detached from the surface or inside thereof, and the mounted electronic component 4 can be normally connected to the external electric circuit.

【0021】なお、リードピン3の径大部3bの直径A
と径大部3bの厚みBとの比率A/Bが2.4未満である
と、径大部3bの厚みが厚いものとなりすぎて、本発明
のピン付き配線基板および電子装置を外部電気回路基板
に接続する際に径大部3bが邪魔になるとともにリード
ピン3の重量バランスが悪くなり、リードピン3をピン
付けパッド2bに半田付けする際の作業性が悪くなって
しまい、他方、A/Bが4.4を超えると、径大部3bの
剛性が低くなってしまい、リードピン3を垂直あるいは
斜めに引っ張ったときに、径大部3bがその力によって
変形して径大部3b頂面とピン付けパッド2bとの間に
存在する半田9に大きな応力が作用し、リードピン3を
例えば30N程度の力で引っ張った場合であっても径大部
3b頂面とピン付けパッド2bとの間に存在する半田9
の内部から半田9が破断してしまいやすくなる。したが
って、リードピン3の径大部3bの直径Aと径大部3b
の厚みとの比率A/Bは2.4≦A/B≦4.4の範囲に特定
される。
The diameter A of the large diameter portion 3b of the lead pin 3
If the ratio A / B between the large diameter portion 3b and the thickness B of the large diameter portion 3b is less than 2.4, the thickness of the large diameter portion 3b becomes too large, and the wiring board with a pin and the electronic device of the present invention can be used as an external electric circuit board. When connecting, the large-diameter portion 3b becomes an obstacle and the weight balance of the lead pin 3 becomes poor, so that the workability at the time of soldering the lead pin 3 to the pin attaching pad 2b becomes poor, while the A / B is 4.4. When the lead pin 3 is pulled vertically or obliquely, the large-diameter portion 3b is deformed by the force and the top surface of the large-diameter portion 3b and the pinning pad 2b are exceeded. A large stress acts on the solder 9 existing between the lead 9 and the solder 9 existing between the top surface of the large diameter portion 3b and the pinning pad 2b even when the lead pin 3 is pulled by a force of about 30N, for example.
The solder 9 easily breaks from the inside of the. Therefore, the diameter A of the large diameter portion 3b of the lead pin 3 and the large diameter portion 3b
The ratio A / B with the thickness of is specified in the range of 2.4 ≦ A / B ≦ 4.4.

【0022】また、径大部3bの側面の軸部3a方向に
対する角度θが20゜未満であると、リードピン3を垂直
あるいは斜めに引っ張ったときに、リードピン3を引っ
張る力が径大部3bの側面を介して径大部3b側面とピ
ン付けパッド2bとの間に存在する半田9の表面に大き
く集中して作用し、例えば30N程度の力でリードピン3
を引っ張った場合であっても径大部3b側面とピン付け
パッド2bとの間に存在する半田9の表面から半田9が
破断してしまいやすくなり、他方θが45゜を超えると、
リードピン3を垂直あるいは斜めに引っ張ったときに、
径大部3bの側面を介して径大部3bの側面とピン付け
パッド2bとの間に存在する半田9の内部に応力が集中
して作用し、例えば30N程度の力でリードピン3を引っ
張った場合であっても径大部3b側面とピン付けパッド
2bとの間に存在する半田9の内部から半田9が破断し
てしまいやすくなる。したがって、径大部3bの側面の
軸部3a方向に対する角度θは20゜〜40゜の範囲に特定
される。
If the angle θ of the side surface of the large diameter portion 3b with respect to the direction of the shaft portion 3a is less than 20 °, when the lead pin 3 is pulled vertically or obliquely, the pulling force of the lead pin 3 is larger than that of the large diameter portion 3b. It acts on the surface of the solder 9 existing between the side surface of the large diameter portion 3b and the pin attaching pad 2b via the side surface in a largely concentrated manner, and for example, with a force of about 30 N, the lead pin 3
Even when pulling, the solder 9 easily breaks from the surface of the solder 9 existing between the side surface of the large-diameter portion 3b and the pinning pad 2b, and when θ exceeds 45 °,
When pulling the lead pin 3 vertically or diagonally,
The stress concentrates and acts on the inside of the solder 9 existing between the side surface of the large-diameter portion 3b and the pinning pad 2b via the side surface of the large-diameter portion 3b, and the lead pin 3 is pulled by a force of, for example, about 30N. Even in such a case, the solder 9 is easily broken from the inside of the solder 9 existing between the side surface of the large diameter portion 3b and the pin attachment pad 2b. Therefore, the angle θ of the side surface of the large diameter portion 3b with respect to the direction of the shaft portion 3a is specified in the range of 20 ° to 40 °.

【0023】さらに、径大部3bの直径Aとピン付けパ
ッド2bの露出する外周縁から径大部3bまでの距離C
との比率C/Aが0.01未満であると、ピン付けパッド2
bと半田9との接合面積が狭いものとなり、ピン付けパ
ッド2bと半田9とを強固に接合することが困難となる
とともに、リードピン3に引っ張りの力が印加されたと
きに、この力によって発生する応力がピン付けパッド2
bの外周縁と絶縁基板1との接合部に大きく作用してピ
ン付けパッド2bが絶縁基板1から剥離してしまいやす
くなり、他方、C/Aが0.5を超えると、ピン付けパッ
ド2b上に多量の半田が流れるため、径大部3bとピン
付けパッド2bとの間に適度な大きさの半田9の溜まり
を形成するために多量の半田9が必要となり、そのよう
な多量の半田9を使ってリードピン3とピン付けパッド
2bとを半田付けすると、半田9の一部が径大部3bを
越えてリードピン3の下端部まで流れてしまい、リード
ピン3をソケットや半田を介して外部電気回路基板の配
線導体に電気的に接続する際にその接続が困難となる。
したがって、径大部3bの直径Aとピン付けパッド2b
の外周縁から径大部3bまでの距離Cとの比率C/Aは
0.01≦C/A≦0.5の範囲が好ましい。
Further, the diameter A of the large diameter portion 3b and the distance C from the exposed outer peripheral edge of the pin attachment pad 2b to the large diameter portion 3b.
If the ratio C / A with is less than 0.01, the pin attachment pad 2
Since the joint area between b and the solder 9 becomes small, it becomes difficult to firmly join the pin attachment pad 2b and the solder 9, and when a pulling force is applied to the lead pin 3, this force is generated. The stress that causes pin 2
When the C / A exceeds 0.5, the pinning pad 2b is likely to be peeled off from the insulating substrate 1 due to a large effect on the joint between the outer peripheral edge of b and the insulating substrate 1. Since a large amount of solder flows, a large amount of solder 9 is required to form a pool of a suitable size of solder 9 between the large diameter portion 3b and the pin attachment pad 2b. If the lead pin 3 and the pin attachment pad 2b are soldered together, a part of the solder 9 will flow over the large diameter portion 3b to the lower end portion of the lead pin 3, and the lead pin 3 will be connected to the external electrical circuit via a socket or solder. When electrically connecting to the wiring conductor of the substrate, the connection becomes difficult.
Therefore, the diameter A of the large diameter portion 3b and the pin attachment pad 2b
The ratio C / A with the distance C from the outer peripheral edge to the large diameter portion 3b is
The range of 0.01 ≦ C / A ≦ 0.5 is preferable.

【0024】なお、リードピン3をピン付けパッド2b
に半田9を介して接合するには、ピン付けパッド2bに
半田9用の半田ペーストを例えばメタルマスクを用いた
スクリーン印刷法により所定量印刷塗布するとともにそ
の上にリードピン3の径大部3b頂面を突き当てて当接
させ、これらを加熱して半田9を溶融させた後、常温に
冷却する方法が採用される。
The lead pin 3 is attached to the pin pad 2b.
In order to bond to the pin via the solder 9, a predetermined amount of solder paste for the solder 9 is applied to the pin attachment pad 2b by screen printing using a metal mask, and the large diameter portion 3b of the lead pin 3 is added to the top. A method is adopted in which the surfaces are abutted against each other, heated to melt the solder 9 and then cooled to room temperature.

【0025】[0025]

【実施例】試験用基板としてガラス織物にエポキシ樹脂
を含浸させて成る厚みが0.8mmの芯体上にエポキシ樹
脂から成る厚みが40μmの絶縁層を2層積層するととも
に、最上層の絶縁層上に厚みが15μmの銅めっき層から
成る直径が1.6mmのピン付けパッドを形成し、その上
にエポキシ樹脂から成る厚みが30μmのソルダーレジス
ト層をピン付けパッド上に直径が1.4mmの開口を有す
るように被着させ、さらにソルダーレジスト層の開口か
ら露出したピン付けパッドの表面に厚みが5μmのニッ
ケルめっき層および厚みが0.03μmの金めっき層を順次
被着させたものを用意した。
[Example] As a test substrate, two insulating layers of 40 μm in thickness made of epoxy resin were laminated on a core body of 0.8 mm in thickness made of glass fabric impregnated with epoxy resin, and on the uppermost insulating layer. , A pin-bonding pad with a diameter of 1.6 mm consisting of a copper-plated layer with a thickness of 15 μm is formed, and a solder resist layer with a thickness of 30 μm consisting of epoxy resin is formed on the pin-bonding pad with an opening with a diameter of 1.4 mm. Thus, a nickel plating layer having a thickness of 5 μm and a gold plating layer having a thickness of 0.03 μm were sequentially deposited on the surface of the pinning pad exposed from the opening of the solder resist layer.

【0026】また、試験用のリードピンとして、銅97.5
7重量%/鉄2.3重量%/亜鉛0.1重量%/リン0.03重量
%を含有する銅合金から成り、軸部の直径が0.46mm・
軸部の長さが3mm・径大部の直径が1.1mmであっ
て、径大部の厚みを0.25〜0.45mm、径大部3bの軸部
3a方向に対する角度を20〜45゜の範囲で異ならせたも
のの表面に厚みが2.5μmのニッケルめっき層および厚
みが0.03μmの金めっき層を順次被着させたものを各10
本ずつ用意し、これらの試験用リードピンの径大部と試
験用基板のピン付けパッドとを鉛82重量%/錫10重量%
/アンチモン8重量%から成る弾性率が21GPaで体積
が0.11mm3の半田を介して半田付けすることによって
本発明による評価用試料を得た。
As a lead pin for testing, copper 97.5
Made of a copper alloy containing 7% by weight / 2.3% by weight iron / 0.1% by weight zinc / 0.03% by weight phosphorus, with a shaft diameter of 0.46 mm
The shaft has a length of 3 mm, the diameter of the large diameter portion is 1.1 mm, the thickness of the large diameter portion is 0.25 to 0.45 mm, and the angle of the large diameter portion 3b with respect to the direction of the shaft portion 3a is in the range of 20 to 45 °. 10 different layers, each with a 2.5 μm thick nickel plating layer and a 0.03 μm thick gold plating layer sequentially deposited on the surface
Prepare one by one, and set the large diameter part of these test lead pins and the pin pad of the test board to 82% by weight lead / 10% by weight tin.
A sample for evaluation according to the present invention was obtained by soldering with a solder having an elastic modulus of 21 GPa and a volume of 0.11 mm 3 consisting of 8% by weight of antimony.

【0027】比較例として、同じく銅97.57重量%/鉄
2.3重量%/亜鉛0.1重量%/リン0.03重量%を含有する
銅合金から成り、軸部の直径が0.46mm・軸部の長さが
3mm・径大部の直径が1.1mmであって、径大部の厚
みを0.24mm、径大部3bの軸部3a方向に対する角度
を20゜としたもの、径大部の厚みを0.3mm、径大部3
bの軸部3a方向に対する角度を10゜としたもの、およ
び径大部の厚みを0.45mm、径大部3bの軸部3a方向
に対する角度を50゜としたものの表面に厚みが2.5μm
のニッケルめっき層および厚みが0.03μmの金めっき層
を順次被着させた試験用のリードピンを各10本ずつ用意
し、これらの試験用リードピンの径大部と試験用基板の
ピン付けパッドとを鉛82重量%/錫10重量%/アンチモ
ン8重量%から成る弾性率が21GPaで体積が0.11mm
3の半田を介して半田付けすることによって比較用の評
価用試料を得た。
As a comparative example, 97.57% by weight of copper / iron
It consists of a copper alloy containing 2.3% by weight / 0.1% by weight zinc / 0.03% by weight phosphorus, the diameter of the shaft is 0.46 mm, the length of the shaft is 3 mm, and the diameter of the large diameter is 1.1 mm. The thickness of the large portion is 0.24 mm, the angle of the large diameter portion 3b with respect to the direction of the shaft portion 3a is 20 °, the thickness of the large diameter portion is 0.3 mm, and the large diameter portion 3
The angle of b is 10 ° with respect to the direction of the shaft 3a, and the thickness of the large diameter portion is 0.45 mm, and the angle of the large diameter portion 3b with respect to the direction of the shaft 3a is 50 °.
10 test lead pins each having a nickel plating layer and a gold plating layer with a thickness of 0.03 μm sequentially deposited are prepared, and the large diameter part of these test lead pins and the pin pad of the test board are used. 82 wt% lead / 10 wt% tin / 8 wt% antimony with an elastic modulus of 21 GPa and a volume of 0.11 mm
The evaluation sample for comparison was obtained by soldering with the solder of 3 .

【0028】かくして得られた各評価用試料を引っ張り
試験機のステージに20゜の角度をつけて固定し、リード
ピンの軸部を引っ張り治具にチャッキングした後、毎分
15mmの速さで引っ張ることにより破断時の荷重を測定
し評価した。その結果を表1に示す。なお、表1におい
て試料番号1・3・7は本発明の範囲外の比較例であ
る。
Each of the evaluation samples thus obtained was fixed on a stage of a tensile tester at an angle of 20 °, and the shaft portion of the lead pin was chucked by a tensile jig, and then every minute.
The load at break was measured and evaluated by pulling at a speed of 15 mm. The results are shown in Table 1. In Table 1, sample numbers 1, 3, and 7 are comparative examples outside the scope of the present invention.

【0029】[0029]

【表1】 [Table 1]

【0030】表1に示すように、本発明による評価用試
料(試料番号2・4・5・6・8)では全てのリードピ
ンにおいて1ピンあたり50〜63Nの接合強度が得られ
た。また、破断はいずれもリードピンの軸部のチャッキ
ング位置から発生し、半田から破断されることはなかっ
た。これに対し、比較用の評価試料(試料番号1・3・
7)では、いずれの試料番号においても50N未満で半田
から破断されるものがあり、十分な強度が得られなかっ
た。
As shown in Table 1, in the evaluation samples according to the present invention (Sample Nos. 2, 4, 5, 6, and 8), a bonding strength of 50 to 63 N per pin was obtained for all the lead pins. In addition, the breakage occurred from the chucking position of the lead pin shaft, and was not broken from the solder. On the other hand, a comparative evaluation sample (Sample No. 1, 3 ,.
In 7), in all of the sample numbers, there were some that were broken from the solder with less than 50 N, and sufficient strength could not be obtained.

【0031】かくして、本発明のピン付き配線基板およ
びこれを用いた電子装置によれば、リードピン3を垂直
あるいは斜めに50N程度の力で引っ張ったとしてもリー
ドピン3が絶縁基板1から取れることがなく、搭載する
電子部品を正常に作動させることが可能なピン付き配線
基板および電子装置を提供することができる。
Thus, according to the wiring board with a pin of the present invention and the electronic device using the same, even if the lead pin 3 is pulled vertically or obliquely with a force of about 50 N, the lead pin 3 is not removed from the insulating substrate 1. It is possible to provide a wiring board with a pin and an electronic device capable of normally operating the mounted electronic components.

【0032】なお、本発明は、上述の実施の形態の一例
に限定されるものではなく、本発明の要旨を逸脱しない
範囲であれば種々の変更が可能であることはいうまでも
ない。
It is needless to say that the present invention is not limited to the above-described example of the embodiment, and various modifications can be made without departing from the scope of the present invention.

【0033】[0033]

【発明の効果】本発明のピン付き配線基板およびこれを
用いた電子装置によれば、リードピンの径大部の直径を
A、径大部の厚みをBとしたときに、2.4≦A/B≦4.4
であるとともにリードピンの径大部側面が軸部の方向に
対して20〜45゜の角度を有することから径大部の剛性が
充分高いものとなり、その結果、リードピンにこれを引
っ張る力が印加されたとしても、その力により径大部が
変形することはなく、かつ径大部側面の傾斜により径大
部からの応力がリードピンとピン付けパッドとを接合す
る半田の表面および内部に良好に分散され、その結果、
リードピンが絶縁基板に強固に接合され、搭載する電子
部品を外部電気回路に正常に接続することが可能なピン
付き配線基板を提供することができる。
According to the wiring board with a pin and the electronic device using the same of the present invention, when the diameter of the large diameter portion of the lead pin is A and the thickness of the large diameter portion is B, 2.4 ≦ A / B ≤4.4
In addition, since the side surface of the large diameter part of the lead pin has an angle of 20 to 45 ° with respect to the direction of the shaft part, the rigidity of the large diameter part is sufficiently high, and as a result, the force to pull it is applied to the lead pin. Even if it does, the large-diameter portion is not deformed by the force, and due to the inclination of the side surface of the large-diameter portion, the stress from the large-diameter portion is well dispersed on the surface and inside of the solder that joins the lead pin and the pin attachment pad. And as a result,
It is possible to provide a wiring board with a pin in which lead pins are firmly joined to an insulating substrate and an electronic component to be mounted can be normally connected to an external electric circuit.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明のピン付き配線基板および電子装置の実
施形態例の断面図である。
FIG. 1 is a cross-sectional view of an embodiment of a wiring board with pins and an electronic device according to the present invention.

【図2】本発明のピン付き配線基板および電子装置の実
施形態例の要部拡大平面図である。
FIG. 2 is an enlarged plan view of an essential part of an embodiment of a wiring board with pins and an electronic device according to the present invention.

【図3】本発明のピン付き配線基板および電子装置の実
施形態例の要部拡大断面図である。
FIG. 3 is an enlarged sectional view of an essential part of an embodiment of a wiring board with pins and an electronic device according to the present invention.

【符号の説明】[Explanation of symbols]

1・・・・・絶縁基体 2・・・・・配線導体 2b・・・・ピン付けパッド 3・・・・・リードピン 3a・・・・軸部 3b・・・・径大部 4・・・・・電子部品としての半導体素子 9・・・・・半田 A・・・・・径大部3bの直径 B・・・・・径大部3bの厚み θ・・・・・径大部3b側面の軸部3a方向に対する角
1 ... Insulating base 2 ... Wiring conductor 2b ... Pin attaching pad 3 ... Lead pin 3a ... Shaft portion 3b ... Large diameter portion 4 ... ..Semiconductor element as electronic component 9 ... Solder A ... Diameter B of large diameter portion 3b ... Thickness θ of large diameter portion 3b ... Side surface of large diameter portion 3b Angle with respect to the shaft 3a direction

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 配線導体を有する有機材料系の絶縁基板
の下面に前記配線導体と電気的に接続されたピン付けパ
ッドを設けるとともに該ピン付けパッドに、略円柱状の
軸部の上端に略円錐台状の径大部を形成した銅合金から
成るリードピンを前記径大部と前記ピン付けパッドとの
間に半田を介在させて立設して成るピン付き配線基板で
あって、前記径大部の直径をA、前記径大部の厚みをB
としたときに、2.4≦A/B≦4.4であるとともに
前記径大部側面が前記軸部の方向に対して20〜45゜
の角度を有することを特徴とするピン付き配線基板。
1. A pin attachment pad electrically connected to the wiring conductor is provided on the lower surface of an insulating substrate made of an organic material having a wiring conductor, and the pin attachment pad is provided on the upper end of a substantially cylindrical shaft portion. A wiring board with a pin, wherein a lead pin made of a copper alloy having a truncated cone-shaped large-diameter portion is erected with solder interposed between the large-diameter portion and the pin attachment pad. A is the diameter of the portion and B is the thickness of the large diameter portion.
And 2.4 ≦ A / B ≦ 4.4, and the side surface of the large-diameter portion has an angle of 20 to 45 ° with respect to the direction of the shaft portion. .
【請求項2】 請求項1記載の配線基板に電子部品を搭
載するとともに該電子部品の電極と前記配線導体とを電
気的に接続して成る電子装置。
2. An electronic device comprising an electronic component mounted on the wiring board according to claim 1, and an electrode of the electronic component electrically connected to the wiring conductor.
JP2001197640A 2001-06-29 2001-06-29 Circuit board with pin and electronic device using the same Pending JP2003017611A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001197640A JP2003017611A (en) 2001-06-29 2001-06-29 Circuit board with pin and electronic device using the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001197640A JP2003017611A (en) 2001-06-29 2001-06-29 Circuit board with pin and electronic device using the same

Publications (1)

Publication Number Publication Date
JP2003017611A true JP2003017611A (en) 2003-01-17

Family

ID=19035206

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001197640A Pending JP2003017611A (en) 2001-06-29 2001-06-29 Circuit board with pin and electronic device using the same

Country Status (1)

Country Link
JP (1) JP2003017611A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009043844A (en) * 2007-08-07 2009-02-26 Shinko Electric Ind Co Ltd Wiring board with lead pin and the lead pin
JP2011100836A (en) * 2009-11-05 2011-05-19 Shinko Electric Ind Co Ltd Lead pin and wiring substrate with lead pin, and method of manufacturing the same
US8153900B2 (en) 2007-08-30 2012-04-10 Shinko Electric Industries Co., Ltd. Wiring substrate with lead pin and lead pin

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009043844A (en) * 2007-08-07 2009-02-26 Shinko Electric Ind Co Ltd Wiring board with lead pin and the lead pin
US8153900B2 (en) 2007-08-30 2012-04-10 Shinko Electric Industries Co., Ltd. Wiring substrate with lead pin and lead pin
JP2011100836A (en) * 2009-11-05 2011-05-19 Shinko Electric Ind Co Ltd Lead pin and wiring substrate with lead pin, and method of manufacturing the same

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