JP2003035524A - 3次元測定装置 - Google Patents

3次元測定装置

Info

Publication number
JP2003035524A
JP2003035524A JP2001221801A JP2001221801A JP2003035524A JP 2003035524 A JP2003035524 A JP 2003035524A JP 2001221801 A JP2001221801 A JP 2001221801A JP 2001221801 A JP2001221801 A JP 2001221801A JP 2003035524 A JP2003035524 A JP 2003035524A
Authority
JP
Japan
Prior art keywords
information
sample
reflected light
objective lens
dimensional measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001221801A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003035524A5 (enExample
Inventor
Akihiro Kitahara
章広 北原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Priority to JP2001221801A priority Critical patent/JP2003035524A/ja
Publication of JP2003035524A publication Critical patent/JP2003035524A/ja
Publication of JP2003035524A5 publication Critical patent/JP2003035524A5/ja
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
  • Image Input (AREA)
JP2001221801A 2001-07-23 2001-07-23 3次元測定装置 Pending JP2003035524A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001221801A JP2003035524A (ja) 2001-07-23 2001-07-23 3次元測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001221801A JP2003035524A (ja) 2001-07-23 2001-07-23 3次元測定装置

Publications (2)

Publication Number Publication Date
JP2003035524A true JP2003035524A (ja) 2003-02-07
JP2003035524A5 JP2003035524A5 (enExample) 2005-09-22

Family

ID=19055416

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001221801A Pending JP2003035524A (ja) 2001-07-23 2001-07-23 3次元測定装置

Country Status (1)

Country Link
JP (1) JP2003035524A (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004358662A (ja) * 2003-05-30 2004-12-24 Tatsuta Kagaku Kk 凹凸模様及び押型の作成方法並びに押型
JP2007526457A (ja) * 2004-03-01 2007-09-13 イアティア イメージング プロプライアタリー リミティド 深度情報を含む画像の生成方法と装置
JP2009204425A (ja) * 2008-02-27 2009-09-10 Pulstec Industrial Co Ltd 3次元形状測定装置および3次元形状測定方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004358662A (ja) * 2003-05-30 2004-12-24 Tatsuta Kagaku Kk 凹凸模様及び押型の作成方法並びに押型
JP2007526457A (ja) * 2004-03-01 2007-09-13 イアティア イメージング プロプライアタリー リミティド 深度情報を含む画像の生成方法と装置
JP2009204425A (ja) * 2008-02-27 2009-09-10 Pulstec Industrial Co Ltd 3次元形状測定装置および3次元形状測定方法

Similar Documents

Publication Publication Date Title
JP4565115B2 (ja) 多焦点撮像装置
JP4521155B2 (ja) 顕微鏡画像処理装置
TWI509220B (zh) 採用表面顏色之表面形貌干涉儀
CN102961120B (zh) 眼科分析仪器和方法
US11143857B2 (en) Microscope and microscopy method for imaging an object involving changing size of depth-of-field region
JP2001194321A (ja) 半導体ウエハの検査装置
JP7679826B2 (ja) 顕微鏡システム、撮像方法、および撮像装置
CN211270678U (zh) 眼底相机的光学系统及眼底相机
US11954766B2 (en) Method for carrying out a shading correction and optical observation device system
JPH10513287A (ja) 物体のイメージ、画像を記録、撮像のための方法及び装置
JP2002517742A (ja) 軸方向照明による形状の光電獲得方法および装置
CN120265965A (zh) 用于测定试样的至少一个影像的成像质量的装置和方法
JP6756516B2 (ja) 眼科撮影装置
US6590612B1 (en) Optical system and method for composing color images from chromatically non-compensated optics
JP2008116900A (ja) 干渉対物レンズと、その干渉対物レンズを備える干渉顕微鏡装置
CN112869703A (zh) 眼底相机的光学系统及眼底相机
JP2003035524A (ja) 3次元測定装置
JP4136635B2 (ja) 分析装置
JP4572898B2 (ja) プリズムユニットの評価方法及びプリズムユニットの製造方法
US7929824B2 (en) Optical image recording and image evaluation system
JP4826124B2 (ja) 位置測定装置
JP2006105926A (ja) 検査装置
JP2004145153A (ja) 光量飽和表示機能付共焦点顕微鏡
JP7582882B2 (ja) 画像キャリブレーション装置
JP2008299210A (ja) 干渉対物レンズと、その干渉対物レンズを備える干渉顕微鏡装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20050414

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20050414

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20061006

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20061024

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20061220

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20070130

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070328

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20080226