JP2002528724A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2002528724A5 JP2002528724A5 JP2000578665A JP2000578665A JP2002528724A5 JP 2002528724 A5 JP2002528724 A5 JP 2002528724A5 JP 2000578665 A JP2000578665 A JP 2000578665A JP 2000578665 A JP2000578665 A JP 2000578665A JP 2002528724 A5 JP2002528724 A5 JP 2002528724A5
- Authority
- JP
- Japan
- Prior art keywords
- power
- output
- frequency
- dut
- signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000005259 measurement Methods 0.000 description 29
- 238000000034 method Methods 0.000 description 28
- 238000001228 spectrum Methods 0.000 description 9
- 230000004044 response Effects 0.000 description 3
- 230000001131 transforming effect Effects 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 230000006903 response to temperature Effects 0.000 description 1
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/181,940 | 1998-10-28 | ||
US09/181,940 US6114858A (en) | 1998-10-28 | 1998-10-28 | System for measuring noise figure of a radio frequency device |
PCT/US1999/024207 WO2000025142A1 (en) | 1998-10-28 | 1999-10-25 | System for measuring noise figure of a radio frequency device |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2002528724A JP2002528724A (ja) | 2002-09-03 |
JP2002528724A5 true JP2002528724A5 (US06236951-20010522-M00004.png) | 2006-12-28 |
Family
ID=22666452
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2000578665A Withdrawn JP2002528724A (ja) | 1998-10-28 | 1999-10-25 | 無線周波数デバイスのノイズ指数を計測するシステム |
Country Status (5)
Families Citing this family (22)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2789181B1 (fr) * | 1999-02-01 | 2001-04-20 | St Microelectronics Sa | Procede de determination du bruit d'instabilite de frequence d'une source et dispositif mettant en oeuvre le procede |
US6496261B1 (en) | 1999-09-24 | 2002-12-17 | Schlumberger Technologies, Inc. | Double-pulsed optical interferometer for waveform probing of integrated circuits |
US6252222B1 (en) * | 2000-01-13 | 2001-06-26 | Schlumberger Technologies, Inc. | Differential pulsed laser beam probing of integrated circuits |
US7006939B2 (en) * | 2000-04-19 | 2006-02-28 | Georgia Tech Research Corporation | Method and apparatus for low cost signature testing for analog and RF circuits |
TW490563B (en) * | 2000-08-30 | 2002-06-11 | Ind Tech Res Inst | Regulable test integrated circuit (IC) system for signal noise and its measurement method |
US6693439B1 (en) * | 2000-09-28 | 2004-02-17 | Cadence Design Systems, Inc. | Apparatus and methods for measuring noise in a device |
WO2002033427A1 (fr) * | 2000-10-17 | 2002-04-25 | Advantest Corporation | Dispositif et procede de mesure de bruit, et support d'enregistrement |
US7035324B2 (en) * | 2001-08-01 | 2006-04-25 | Agilent Technologies, Inc. | Phase-noise measurement with compensation for phase noise contributed by spectrum analyzer |
JP4417042B2 (ja) * | 2002-06-28 | 2010-02-17 | ローデ ウント シュワルツ ゲゼルシャフト ミット ベシュレンクテル ハフツング ウント コンパニー コマンディット ゲゼルシャフト | 測定する電子的対象の雑音レベルを測定する方法と装置 |
US20050137814A1 (en) * | 2003-12-19 | 2005-06-23 | Joseph Kelly | Method of measuring noise figure using arbitrary waveforms |
DE102005059791A1 (de) * | 2005-12-14 | 2007-06-28 | Rohde & Schwarz Gmbh & Co. Kg | Verfahren zur Messung der Rauschzahl eines Meßobjekts mit einem Netzwerkanalysator |
US8036616B2 (en) * | 2008-05-05 | 2011-10-11 | Infineon Technologies Ag | Noise parameter determination method |
JP5274550B2 (ja) | 2008-05-09 | 2013-08-28 | 株式会社アドバンテスト | デジタル変調信号の試験装置、ならびにデジタル変調器、変調方法およびそれを用いた半導体装置 |
JP5608205B2 (ja) * | 2012-11-01 | 2014-10-15 | アンリツ株式会社 | 測定装置 |
KR101265535B1 (ko) * | 2013-01-09 | 2013-05-20 | 주식회사 썬닉스 | 감시 장치 및 그 방법 |
US10120008B2 (en) * | 2013-08-29 | 2018-11-06 | Keysight Technologies, Inc. | Method and apparatus for estimating the noise introduced by a device |
US11119140B1 (en) * | 2017-08-31 | 2021-09-14 | Christos Tsironis | Impedance pattern generation for noise parameter measurement system |
CN108508287B (zh) * | 2018-06-08 | 2019-12-27 | 中国电子科技集团公司第四十一研究所 | 基于矢量网络分析仪和功率计测量噪声系数的测量方法 |
US10761134B2 (en) * | 2018-10-25 | 2020-09-01 | Rohde & Schwarz Gmbh & Co. Kg | Method and measurement system for identifying the noise figure of a device under test |
CN111220858B (zh) * | 2018-11-26 | 2022-04-12 | 北京华航无线电测量研究所 | 一种量子Bell态探测器噪声等效功率测量方法 |
US11102596B2 (en) | 2019-11-19 | 2021-08-24 | Roku, Inc. | In-sync digital waveform comparison to determine pass/fail results of a device under test (DUT) |
JP7374938B2 (ja) * | 2021-02-08 | 2023-11-07 | アンリツ株式会社 | 移動端末試験装置、及び移動端末試験方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3267983D1 (en) * | 1981-04-25 | 1986-01-30 | Toshiba Kk | Apparatus for measuring noise factor and available gain |
US5068615A (en) * | 1988-10-25 | 1991-11-26 | Cascade Microtech, Inc. | Noise parameter test apparatus |
US4905308A (en) * | 1989-04-05 | 1990-02-27 | Cascade Microtech, Inc. | Noise parameter determination method |
US5191294A (en) * | 1990-04-02 | 1993-03-02 | Wiltron Company | Measuring noise figure and y-factor |
US5970429A (en) * | 1997-08-08 | 1999-10-19 | Lucent Technologies, Inc. | Method and apparatus for measuring electrical noise in devices |
-
1998
- 1998-10-28 US US09/181,940 patent/US6114858A/en not_active Expired - Lifetime
-
1999
- 1999-10-25 WO PCT/US1999/024207 patent/WO2000025142A1/en active IP Right Grant
- 1999-10-25 EP EP99971093A patent/EP1125139A4/en not_active Withdrawn
- 1999-10-25 JP JP2000578665A patent/JP2002528724A/ja not_active Withdrawn
- 1999-10-25 KR KR1020017003673A patent/KR100624666B1/ko not_active IP Right Cessation
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP2002528724A5 (US06236951-20010522-M00004.png) | ||
KR100624666B1 (ko) | 무선 주파수 장치의 잡음 지수 측정 시스템 | |
Pederson et al. | Application of time-delay spectrometry for calibration of ultrasonic transducers | |
US20200300756A1 (en) | System and method for estimating a gas concentration | |
Schroeder et al. | Generalized Short‐Time Power Spectra and Autocorrelation Functions | |
Carvalho et al. | Multisine signals for wireless system test and design [application notes] | |
JP2014103671A (ja) | Rf信号源の校正方法及び振幅平坦及び位相リニアリティ校正器 | |
EP0861438A1 (en) | Sensor interrogation | |
JPH0750136B2 (ja) | 周波数測定方法 | |
JP2008135372A (ja) | 大きな不要信号の存在下で燃料電池高周波抵抗を測定する方法及び装置 | |
CN109425786A (zh) | 非线性失真检测 | |
CN110907827B (zh) | 一种马达瞬态失真测量方法及系统 | |
JP2004361170A (ja) | 網特性解析装置、網特性解析方法および網特性解析プログラム | |
JP4317948B2 (ja) | 周波数分析装置の伝達関数測定方法 | |
US10379162B1 (en) | System for performing modulation analysis without using a modulated signal | |
JP2867769B2 (ja) | 音響測定方法およびその装置 | |
JP2013544369A (ja) | 継続的掃引周波数を用いるシステム周波数応答テスト | |
US5555507A (en) | Method for detecting non-linear behavior in a digital data transmission path to be examined | |
Parvis et al. | A precompliance EMC test-set based on a sampling oscilloscope | |
TWI423045B (zh) | 用以產生具有相關功率頻譜的最小化激勵信號之方法、激勵信號產生器及非暫時性電腦可讀取媒體 | |
JP4279356B2 (ja) | 掃引周波数装置試験 | |
JP3151752B2 (ja) | 部分放電測定方法 | |
Peterson et al. | The measurement of noise with the sound spectrograph | |
RU2244314C2 (ru) | Способ статистической оценки нелинейных искажений и устройство для его реализации | |
RU2104495C1 (ru) | Способ измерения физической величины |