JP2002525849A5 - - Google Patents

Download PDF

Info

Publication number
JP2002525849A5
JP2002525849A5 JP2000570823A JP2000570823A JP2002525849A5 JP 2002525849 A5 JP2002525849 A5 JP 2002525849A5 JP 2000570823 A JP2000570823 A JP 2000570823A JP 2000570823 A JP2000570823 A JP 2000570823A JP 2002525849 A5 JP2002525849 A5 JP 2002525849A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2000570823A
Other languages
Japanese (ja)
Other versions
JP4785249B2 (ja
JP2002525849A (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from PCT/US1999/021475 external-priority patent/WO2000016382A1/en
Publication of JP2002525849A publication Critical patent/JP2002525849A/ja
Publication of JP2002525849A5 publication Critical patent/JP2002525849A5/ja
Application granted granted Critical
Publication of JP4785249B2 publication Critical patent/JP4785249B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

JP2000570823A 1998-09-16 1999-09-16 縦型デバイスのための裏面オーミックコンタクトの低温形成 Expired - Lifetime JP4785249B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US10054698P 1998-09-16 1998-09-16
US60/100,546 1998-09-16
PCT/US1999/021475 WO2000016382A1 (en) 1998-09-16 1999-09-16 Low temperature formation of backside ohmic contacts for vertical devices

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2011108544A Division JP2011151428A (ja) 1998-09-16 2011-05-13 裏面オーミックコンタクトを備えた縦型の半導体デバイス

Publications (3)

Publication Number Publication Date
JP2002525849A JP2002525849A (ja) 2002-08-13
JP2002525849A5 true JP2002525849A5 (sr) 2005-12-22
JP4785249B2 JP4785249B2 (ja) 2011-10-05

Family

ID=22280313

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2000570823A Expired - Lifetime JP4785249B2 (ja) 1998-09-16 1999-09-16 縦型デバイスのための裏面オーミックコンタクトの低温形成
JP2011108544A Pending JP2011151428A (ja) 1998-09-16 2011-05-13 裏面オーミックコンタクトを備えた縦型の半導体デバイス

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2011108544A Pending JP2011151428A (ja) 1998-09-16 2011-05-13 裏面オーミックコンタクトを備えた縦型の半導体デバイス

Country Status (9)

Country Link
EP (1) EP1125320A1 (sr)
JP (2) JP4785249B2 (sr)
KR (1) KR100694681B1 (sr)
CN (1) CN1178277C (sr)
AU (1) AU6391699A (sr)
CA (1) CA2343416A1 (sr)
MX (1) MXPA01002751A (sr)
TW (1) TW449932B (sr)
WO (1) WO2000016382A1 (sr)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6884644B1 (en) 1998-09-16 2005-04-26 Cree, Inc. Low temperature formation of backside ohmic contacts for vertical devices
US6803243B2 (en) * 2001-03-15 2004-10-12 Cree, Inc. Low temperature formation of backside ohmic contacts for vertical devices
US6909119B2 (en) 2001-03-15 2005-06-21 Cree, Inc. Low temperature formation of backside ohmic contacts for vertical devices
US7138291B2 (en) * 2003-01-30 2006-11-21 Cree, Inc. Methods of treating a silicon carbide substrate for improved epitaxial deposition and resulting structures and devices
US7262434B2 (en) * 2002-03-28 2007-08-28 Rohm Co., Ltd. Semiconductor device with a silicon carbide substrate and ohmic metal layer
US7473929B2 (en) 2003-07-02 2009-01-06 Panasonic Corporation Semiconductor device and method for fabricating the same
JP2006086361A (ja) * 2004-09-16 2006-03-30 Stanley Electric Co Ltd 半導体発光素子及びその製造方法
WO2007032214A1 (ja) * 2005-09-14 2007-03-22 The Kansai Electric Power Co., Inc. 炭化珪素半導体素子の製造方法
US20100237385A1 (en) * 2008-06-26 2010-09-23 Sanken Electric Co., Ltd. Semiconductor device and method of fabricating the same
KR101220407B1 (ko) 2010-12-14 2013-01-21 (재)한국나노기술원 반도체 발광 소자
JP5811829B2 (ja) 2011-12-22 2015-11-11 住友電気工業株式会社 半導体装置の製造方法
JP5742712B2 (ja) 2011-12-29 2015-07-01 住友電気工業株式会社 炭化珪素半導体装置の製造方法
JP6253133B2 (ja) * 2012-04-27 2017-12-27 富士電機株式会社 炭化珪素半導体装置の製造方法
JP5681835B1 (ja) 2013-10-08 2015-03-11 新電元工業株式会社 炭化珪素半導体装置の製造方法
JP7135443B2 (ja) * 2018-05-29 2022-09-13 富士電機株式会社 炭化ケイ素半導体装置及びその製造方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5323022A (en) * 1992-09-10 1994-06-21 North Carolina State University Platinum ohmic contact to p-type silicon carbide
JP3303530B2 (ja) * 1994-06-23 2002-07-22 富士電機株式会社 炭化けい素半導体素子の製造方法
JPH08139053A (ja) * 1994-11-04 1996-05-31 New Japan Radio Co Ltd SiCへの電極の形成方法
JP3333896B2 (ja) * 1995-09-13 2002-10-15 富士電機株式会社 炭化珪素半導体装置の製造方法
WO1998037584A1 (en) * 1997-02-20 1998-08-27 The Board Of Trustees Of The University Of Illinois Solid state power-control device using group iii nitrides

Similar Documents

Publication Publication Date Title
BE2018C020I2 (sr)
BE2016C007I2 (sr)
BE2015C057I2 (sr)
BE2015C018I2 (sr)
BE2014C017I2 (sr)
BE2013C051I2 (sr)
BE2013C020I2 (sr)
BE2013C015I2 (sr)
BE2013C001I2 (sr)
BE2012C036I2 (sr)
BE2011C004I2 (sr)
BE2010C011I2 (sr)
JP2002501803A5 (sr)
BE2008C046I2 (sr)
BE1025464I2 (sr)
BRPI0017527B8 (sr)
BRPI0001672A2 (sr)
BRPI0001542A2 (sr)
JP2002526794A5 (sr)
BRPI0012675B8 (sr)
BRPI0017522A2 (sr)
BRMU7902607U2 (sr)
CN3097853S (sr)
CN3099876S (sr)
AU2000278349A8 (sr)