JP2002506975A5 - - Google Patents

Download PDF

Info

Publication number
JP2002506975A5
JP2002506975A5 JP2000535938A JP2000535938A JP2002506975A5 JP 2002506975 A5 JP2002506975 A5 JP 2002506975A5 JP 2000535938 A JP2000535938 A JP 2000535938A JP 2000535938 A JP2000535938 A JP 2000535938A JP 2002506975 A5 JP2002506975 A5 JP 2002506975A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2000535938A
Other versions
JP2002506975A (ja
Filing date
Publication date
Priority claimed from US09/037,155 external-priority patent/US6195617B1/en
Application filed filed Critical
Publication of JP2002506975A publication Critical patent/JP2002506975A/ja
Publication of JP2002506975A5 publication Critical patent/JP2002506975A5/ja
Pending legal-status Critical Current

Links

JP2000535938A 1998-03-09 1999-03-05 １次測定値と取得パラメータの同時表示 Pending JP2002506975A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/037,155 US6195617B1 (en) 1998-03-09 1998-03-09 Digital storage oscilloscope with simultaneous primary measurement and derived parameter display on common time axis and method therefor
US09/037,155 1998-03-09
PCT/US1999/004800 WO1999046608A1 (en) 1998-03-09 1999-03-05 Simultaneous display of primary measurement values and derived parameters

Publications (2)

Publication Number Publication Date
JP2002506975A JP2002506975A (ja) 2002-03-05
JP2002506975A5 true JP2002506975A5 (ja) 2006-04-20

Family

ID=21892738

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000535938A Pending JP2002506975A (ja) 1998-03-09 1999-03-05 １次測定値と取得パラメータの同時表示

Country Status (10)

Country Link
US (2) US6195617B1 (ja)
EP (1) EP1062521B1 (ja)
JP (1) JP2002506975A (ja)
CN (1) CN1230683C (ja)
AT (1) ATE273519T1 (ja)
AU (1) AU758784B2 (ja)
CA (1) CA2323085A1 (ja)
DE (1) DE69919337T2 (ja)
NZ (1) NZ506934A (ja)
WO (1) WO1999046608A1 (ja)

Families Citing this family (57)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000210800A (ja) * 1999-01-27 2000-08-02 Komatsu Ltd 産業機械のモニタ方法およびその装置
US6327544B1 (en) * 1999-03-01 2001-12-04 Agilent Technologies, Inc. Automatic storage of a trigger definition in a signal measurement system
US6463392B1 (en) * 1999-08-16 2002-10-08 Agilent Technologies, Inc. System and method for adjusting a sampling time in a logic analyzer
US6525525B1 (en) * 2000-05-02 2003-02-25 Tektronix, Inc. Oscilloscope with simplified setup procedure, and procedure for setting up oscilloscope
EP1397864A4 (en) * 2000-11-17 2006-03-01 Lecroy Corp PROCESSING CANVAS FOR PROCESSING DATA IN A DIGITAL OSCILLOSCOPE OR A SIMILAR INSTRUMENT
US20060256137A1 (en) * 2001-10-19 2006-11-16 Chenjing Fernando Scaling method and apparatus for displaying signals
US20030076337A1 (en) * 2001-10-19 2003-04-24 Chenjing Fernando Scaling method and apparatus for displaying signals
US6917889B2 (en) * 2002-02-26 2005-07-12 Tektronix, Inc. Method and apparatus for visually time-correlating waveform measurements to a source waveform
US6807496B2 (en) 2002-05-02 2004-10-19 Tektronix, Inc. Acquisition system for a long record length digital storage oscilloscope
US6748335B2 (en) 2002-05-06 2004-06-08 Tektronix, Inc. Acquisition system for a multi-channel relatively long record length digital storage oscilloscope
US6892150B2 (en) 2002-05-24 2005-05-10 Tektronix, Inc. Combined analog and DSP trigger system for a digital storage oscilloscope
US7519874B2 (en) * 2002-09-30 2009-04-14 Lecroy Corporation Method and apparatus for bit error rate analysis
US7437624B2 (en) * 2002-09-30 2008-10-14 Lecroy Corporation Method and apparatus for analyzing serial data streams
US7434113B2 (en) * 2002-09-30 2008-10-07 Lecroy Corporation Method of analyzing serial data streams
JP4490642B2 (ja) * 2003-04-01 2010-06-30 株式会社根本杏林堂 薬液注入装置
US7403560B2 (en) * 2004-02-09 2008-07-22 Lecroy Corporation Simultaneous physical and protocol layer analysis
US6972554B1 (en) * 2004-07-26 2005-12-06 Honeywell International, Inc. Universal aircraft generator electrical bench test apparatus
US7305312B2 (en) * 2005-01-10 2007-12-04 Wavecrest Corporation Method and apparatus for recording a real time signal
US7839792B2 (en) * 2005-08-30 2010-11-23 Tektronix, Inc. Time-correlated, simultaneous measurement and analysis of network signals from multiple communication networks
US7668235B2 (en) * 2005-11-10 2010-02-23 Teradyne Jitter measurement algorithm using locally in-order strobes
US7652465B2 (en) * 2006-03-24 2010-01-26 Tektronix, Inc. No dead time data acquisition
CN101424711B (zh) * 2007-10-31 2011-02-02 鸿富锦精密工业（深圳）有限公司 铃音自动检测系统及方法
US20090121762A1 (en) * 2007-11-09 2009-05-14 Tektronix, Inc. Timebase variation compensation in a measurement instrument
KR100949939B1 (ko) 2008-03-28 2010-03-30 주식회사 한영넉스 페이퍼 기록계
US8521457B2 (en) * 2008-10-20 2013-08-27 Olympus Ndt User designated measurement display system and method for NDT/NDI with high rate input data
JP5413796B2 (ja) * 2008-11-25 2014-02-12 横河電機株式会社 波形測定装置
US8670947B2 (en) * 2009-05-15 2014-03-11 Tektronix, Inc. Computer system for automatically determining slew rate de-rating values
CN102004177B (zh) * 2009-08-28 2014-12-10 苏文俊 示波器及利用该示波器识别串行总线信号时序的方法
CN102012444B (zh) * 2009-09-07 2014-04-23 鸿富锦精密工业（深圳）有限公司 示波器及利用该示波器测试串行总线信号的方法
JP5717332B2 (ja) * 2009-11-12 2015-05-13 横河電機株式会社 ディジタルオシロスコープ
US9297834B2 (en) * 2010-08-13 2016-03-29 Tektronix, Inc. Time-domain searching in a test and measurement instrument
US8463953B2 (en) 2010-08-18 2013-06-11 Snap-On Incorporated System and method for integrating devices for servicing a device-under-service
US8754779B2 (en) 2010-08-18 2014-06-17 Snap-On Incorporated System and method for displaying input data on a remote display device
US9633492B2 (en) 2010-08-18 2017-04-25 Snap-On Incorporated System and method for a vehicle scanner to automatically execute a test suite from a storage card
US9330507B2 (en) 2010-08-18 2016-05-03 Snap-On Incorporated System and method for selecting individual parameters to transition from text-to-graph or graph-to-text
US8560168B2 (en) 2010-08-18 2013-10-15 Snap-On Incorporated System and method for extending communication range and reducing power consumption of vehicle diagnostic equipment
US8983785B2 (en) * 2010-08-18 2015-03-17 Snap-On Incorporated System and method for simultaneous display of waveforms generated from input signals received at a data acquisition device
US9117321B2 (en) 2010-08-18 2015-08-25 Snap-On Incorporated Method and apparatus to use remote and local control modes to acquire and visually present data
CN102466745B (zh) * 2010-11-03 2015-08-19 北京普源精电科技有限公司 一种用波形显示测量结果的数字万用表
JP5477357B2 (ja) * 2010-11-09 2014-04-23 株式会社デンソー 音場可視化システム
CN102798765A (zh) * 2011-05-27 2012-11-28 特克特朗尼克公司 触发器品质因数指示器
CN102932287B (zh) * 2011-08-11 2017-04-19 特克特朗尼克公司 测试和测量仪器中的时域搜索
CN102539863B (zh) * 2012-01-12 2014-05-14 黑龙江大学 45度线观测系统状态的示波器显示电路
US9496993B1 (en) 2012-01-13 2016-11-15 Teledyne Lecroy, Inc. Noise analysis to reveal jitter and crosstalk's effect on signal integrity
US10095659B2 (en) 2012-08-03 2018-10-09 Fluke Corporation Handheld devices, systems, and methods for measuring parameters
CN102890258B (zh) * 2012-10-22 2014-06-25 电子科技大学 一种并行结构数字存储示波器捕获率的测试方法
US9329967B2 (en) * 2012-11-13 2016-05-03 Tektronix, Inc. Methods and systems for aiding the analysis of a signal
US9128721B2 (en) 2012-12-11 2015-09-08 Apple Inc. Closed loop CPU performance control
EP2973071B1 (en) * 2013-03-15 2020-05-06 Fluke Corporation Automatic recording and graphing of measurement data
CN104730306A (zh) * 2013-12-24 2015-06-24 苏州普源精电科技有限公司 解码自动门限设定方法及具有解码自动门限设定功能的示波器
US9766270B2 (en) 2013-12-30 2017-09-19 Fluke Corporation Wireless test measurement
CN106104228B (zh) * 2014-03-20 2024-06-18 株式会社石田 计量装置
CN105807114B (zh) * 2014-12-31 2018-06-26 深圳高宜电子科技有限公司 数字示波器采集数据的存取方法、装置及数字示波器
CN104977556B (zh) 2015-06-30 2017-09-12 电子科技大学 基于死区时间测量的平均波形捕获率测试方法
US10712367B2 (en) 2016-11-08 2020-07-14 Rohde & Schwarz Gmbh & Co. Kg Method for analyzing a signal as well as measurement and analyzing device
CN111948433B (zh) * 2020-08-10 2022-08-12 优利德科技(中国)股份有限公司 一种基于数字示波器的波形展示方法及装置
USD987459S1 (en) 2021-04-26 2023-05-30 Yokogawa Electric Corporation Spectrum analyzer

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4149044A (en) 1978-01-10 1979-04-10 Hekimian Norris C Method and apparatus for graphically displaying amplitude and phase jitter
US4719416A (en) * 1986-11-10 1988-01-12 Hewlett Packard Company Method for determining the minimum number of acquisition sweeps to meet the risetime specifications of a digital oscilloscope
US5111191A (en) * 1988-06-23 1992-05-05 Motorola, Inc. Method and apparatus for waveform digitization
JPH03291570A (ja) * 1990-04-10 1991-12-20 Yokogawa Electric Corp デジタルオシロスコープ
US5250935A (en) 1990-09-24 1993-10-05 Snap-On Tools Corporation Waveform peak capture circuit for digital engine analyzer
US5375067A (en) * 1992-12-11 1994-12-20 Nicolet Instrument Corporation Method and apparatus for adjustment of acquisition parameters in a data acquisition system such as a digital oscilloscope
US5446650A (en) 1993-10-12 1995-08-29 Tektronix, Inc. Logic signal extraction

Similar Documents

Publication Publication Date Title
BE2018C020I2 (ja)
BE2016C007I2 (ja)
BE2015C057I2 (ja)
BE2015C018I2 (ja)
BE2014C017I2 (ja)
BE2013C051I2 (ja)
BE2013C020I2 (ja)
BE2013C015I2 (ja)
BE2013C001I2 (ja)
BE2012C036I2 (ja)
BE2011C004I2 (ja)
BE2010C011I2 (ja)
JP2002528149A5 (ja)
BE2008C046I2 (ja)
BE1025464I2 (ja)
BRPI0017527B8 (ja)
BE2008C047I2 (ja)
JP2002506975A5 (ja)
JP2002520873A5 (ja)
IN191236B (ja)
JP2002532918A5 (ja)
BRPI0001542A2 (ja)
JP2002524745A5 (ja)
JP2002521420A5 (ja)
JP2002511602A5 (ja)