JP2002350515A5 - - Google Patents

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Publication number
JP2002350515A5
JP2002350515A5 JP2002060735A JP2002060735A JP2002350515A5 JP 2002350515 A5 JP2002350515 A5 JP 2002350515A5 JP 2002060735 A JP2002060735 A JP 2002060735A JP 2002060735 A JP2002060735 A JP 2002060735A JP 2002350515 A5 JP2002350515 A5 JP 2002350515A5
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JP
Japan
Prior art keywords
dut
ber value
sampling points
predetermined number
test
Prior art date
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Application number
JP2002060735A
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English (en)
Japanese (ja)
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JP2002350515A (ja
JP4046518B2 (ja
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Priority claimed from EP01106632A external-priority patent/EP1241483B1/en
Application filed filed Critical
Publication of JP2002350515A publication Critical patent/JP2002350515A/ja
Publication of JP2002350515A5 publication Critical patent/JP2002350515A5/ja
Application granted granted Critical
Publication of JP4046518B2 publication Critical patent/JP4046518B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2002060735A 2001-03-16 2002-03-06 ビット・エラー・レート測定 Expired - Fee Related JP4046518B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP01106632.1 2001-03-16
EP01106632A EP1241483B1 (en) 2001-03-16 2001-03-16 Bit error rate measurement

Publications (3)

Publication Number Publication Date
JP2002350515A JP2002350515A (ja) 2002-12-04
JP2002350515A5 true JP2002350515A5 (https=) 2005-09-02
JP4046518B2 JP4046518B2 (ja) 2008-02-13

Family

ID=8176813

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002060735A Expired - Fee Related JP4046518B2 (ja) 2001-03-16 2002-03-06 ビット・エラー・レート測定

Country Status (4)

Country Link
US (1) US7389450B2 (https=)
EP (1) EP1241483B1 (https=)
JP (1) JP4046518B2 (https=)
DE (1) DE60103361T2 (https=)

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US6810346B2 (en) 2002-01-31 2004-10-26 Agilent Technologies, Inc. Composite eye diagrams
US6668235B2 (en) * 2002-03-28 2003-12-23 Agilent Technologies, Inc. Identification of channels and associated signal information contributing to a portion of a composite eye diagram
EP1502377B1 (en) * 2002-05-08 2012-08-08 Rohde & Schwarz GmbH & Co. KG Method for testing the error ratio of a device using a preliminary probability
EP1426779B1 (en) * 2002-07-25 2007-08-15 Agilent Technologies, Inc. BER tester with signal sampling with clock recovery
WO2005015248A1 (en) * 2003-08-06 2005-02-17 Agilent Technologies, Inc. Digital data signal testing using arbitrary test signal
EP1508813B1 (en) * 2003-08-20 2007-01-31 Agilent Technologies, Inc. Spectral jitter analysis allowing jitter modulation waveform analysis
US7174279B2 (en) * 2004-03-31 2007-02-06 Teradyne, Inc. Test system with differential signal measurement
US7668233B2 (en) * 2004-07-28 2010-02-23 Circadiant Systems, Inc. Method of determining jitter and apparatus for determining jitter
KR100630710B1 (ko) * 2004-11-04 2006-10-02 삼성전자주식회사 다수개의 페일 비트를 검출할 수 있는 반도체 메모리의페일 비트 검출 장치
CN101300599A (zh) * 2005-08-29 2008-11-05 特克特朗尼克公司 具有期望概率的视频峰抖动的测量和显示
US7610520B2 (en) 2006-02-06 2009-10-27 Agilent Technologies, Inc. Digital data signal testing using arbitrary test signal
JP4684961B2 (ja) * 2006-07-10 2011-05-18 アンリツ株式会社 試験信号検証装置
US8705603B2 (en) * 2008-02-05 2014-04-22 Vitesse Semiconductor Corporation Adaptive data recovery system with input signal equalization
US8284888B2 (en) * 2010-01-14 2012-10-09 Ian Kyles Frequency and phase acquisition of a clock and data recovery circuit without an external reference clock
US8537480B1 (en) * 2010-11-23 2013-09-17 Western Digital Technologies, Inc. Hard drive testing
US8515416B2 (en) * 2011-04-29 2013-08-20 Silicon Laboratories Inc Performing testing in a radio device
US10491342B1 (en) 2018-07-23 2019-11-26 Hewlett Packard Enterprise Development Lp Bit error ratio tests with two-sided bit error ratio frequentist intervals
JP2020047332A (ja) * 2018-09-18 2020-03-26 株式会社東芝 ライト回数の上限値の設定方法及び磁気ディスク装置
US11216325B2 (en) * 2019-06-28 2022-01-04 Arista Networks, Inc. Reducing cross talk among connector pins
CN114301544A (zh) * 2021-09-08 2022-04-08 深圳市星芯顶科技有限公司 具有眼图功能的误码仪
CN115542136B (zh) * 2022-09-29 2024-09-10 苏州工业园区慧鱼科技有限公司 基于fpga的线缆测试方法及设备

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US4234954A (en) * 1979-01-24 1980-11-18 Ford Aerospace & Communications Corp. On-line bit error rate estimator
EP0020827B1 (en) * 1979-06-15 1982-12-01 The Post Office An arrangement for monitoring the performance of a digital transmission system
DE3012400C2 (de) * 1980-03-29 1986-03-06 ANT Nachrichtentechnik GmbH, 7150 Backnang Verfahren zur Überwachung der Bitfehlerrate
JP2604606B2 (ja) * 1987-11-24 1997-04-30 株式会社アドバンテスト 回路試験装置
US4920537A (en) * 1988-07-05 1990-04-24 Darling Andrew S Method and apparatus for non-intrusive bit error rate testing
WO1991009482A1 (en) * 1989-12-07 1991-06-27 The Commonwealth Of Australia Error rate monitor
US5228042A (en) * 1991-02-07 1993-07-13 Northern Telecom Limited Method and circuit for testing transmission paths
CA2056679C (en) * 1991-11-29 2002-02-12 Timothy Joseph Nohara Automatic monitoring of digital communication channel conditions using eye patterns
JPH07225263A (ja) * 1994-02-09 1995-08-22 Advantest Corp ビット誤り測定器
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US6249518B1 (en) * 1998-08-07 2001-06-19 Nortel Networks Limited TDMA single antenna co-channel interference cancellation
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US7149938B1 (en) * 2001-12-07 2006-12-12 Applied Micro Circuits Corporation Non-causal channel equalization

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