JP2002350236A5 - - Google Patents

Download PDF

Info

Publication number
JP2002350236A5
JP2002350236A5 JP2002130756A JP2002130756A JP2002350236A5 JP 2002350236 A5 JP2002350236 A5 JP 2002350236A5 JP 2002130756 A JP2002130756 A JP 2002130756A JP 2002130756 A JP2002130756 A JP 2002130756A JP 2002350236 A5 JP2002350236 A5 JP 2002350236A5
Authority
JP
Japan
Prior art keywords
signal
local oscillator
optical
input
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002130756A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002350236A (ja
Filing date
Publication date
Priority claimed from US09/854,070 external-priority patent/US6590666B2/en
Application filed filed Critical
Publication of JP2002350236A publication Critical patent/JP2002350236A/ja
Publication of JP2002350236A5 publication Critical patent/JP2002350236A5/ja
Pending legal-status Critical Current

Links

JP2002130756A 2001-05-11 2002-05-02 光スペクトル解析システム及び光スペクトル解析方法 Pending JP2002350236A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/854,070 US6590666B2 (en) 2001-05-11 2001-05-11 Method and system for optical spectrum analysis with non-uniform sweep rate correction
US854070 2001-05-11

Publications (2)

Publication Number Publication Date
JP2002350236A JP2002350236A (ja) 2002-12-04
JP2002350236A5 true JP2002350236A5 (enExample) 2005-09-22

Family

ID=25317643

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002130756A Pending JP2002350236A (ja) 2001-05-11 2002-05-02 光スペクトル解析システム及び光スペクトル解析方法

Country Status (4)

Country Link
US (1) US6590666B2 (enExample)
EP (1) EP1256788B1 (enExample)
JP (1) JP2002350236A (enExample)
DE (1) DE60219550T2 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6646746B1 (en) * 2000-10-02 2003-11-11 Agilent Technologies, Inc. Method and system for optical heterodyne detection of an optical signal
US6856400B1 (en) * 2000-12-14 2005-02-15 Luna Technologies Apparatus and method for the complete characterization of optical devices including loss, birefringence and dispersion effects
US6906804B2 (en) * 2002-12-16 2005-06-14 Lucent Technologies Inc. WDM channel monitor and wavelength locker
JP2006266797A (ja) * 2005-03-23 2006-10-05 Anritsu Corp 光ヘテロダイン干渉装置
DE102006025122A1 (de) * 2005-05-31 2006-12-07 Yokogawa Electric Corporation, Musashino Vorrichtung zur Messung einer optischen Charakteristik
US8611744B2 (en) * 2010-12-31 2013-12-17 Infinera Corporation Monitoring system employing carrier recovery
DE112011105112T5 (de) 2011-03-28 2014-01-09 Agilent Technologies Inc. Heterodyner Optik-Spektrum-Analysator
EP2727264B1 (en) * 2011-06-28 2017-05-17 Intuitive Surgical Operations, Inc. Fiber optic network interrogation tool for combined swept-heterodyne optical spectrum analysis and optical frequency-domain reflectometry
US20220244035A1 (en) * 2019-07-18 2022-08-04 Nippon Telegraph And Telephone Corporation Wavelength Sweeping Optical Measurement System
IT202200004667A1 (it) * 2022-03-11 2022-06-11 Sestosensor S R L Rivelatore di fase e polarizzazione per sensori acustici distribuiti a fibre ottiche ed interrogatore basato sullo stesso
US12498211B2 (en) 2024-02-06 2025-12-16 Honeywell International Inc. Techniques for compensating for errors in an optical interferometer system

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4856899A (en) 1985-12-20 1989-08-15 Yokogawa Electric Corporation Optical frequency analyzer using a local oscillator heterodyne detection of incident light
US4905244A (en) * 1986-09-26 1990-02-27 United States Department Of Energy Heterodyne laser spectroscopy system
JPH07336301A (ja) * 1994-06-06 1995-12-22 Kokusai Denshin Denwa Co Ltd <Kdd> 光波長多重通信装置
JP3459070B2 (ja) 1995-02-24 2003-10-20 アンリツ株式会社 回折格子の回転角検出装置
US5780843A (en) * 1996-07-16 1998-07-14 Universite Laval Absolute optical frequency calibrator for a variable frequency optical source
GB9701627D0 (en) * 1997-01-27 1997-03-19 Plessey Telecomm Wavelength manager
US6166816A (en) * 1998-12-31 2000-12-26 Blake; James N. Combination fiber optic current/voltage sensor
US6434176B1 (en) * 1999-02-05 2002-08-13 Zygo Corporation Frequency stabilized laser system
US6204924B1 (en) * 1999-02-23 2001-03-20 Exfo Electro-Optical Engineering Inc. Method and apparatus for measuring polarization mode dispersion of optical devices
US6970250B1 (en) * 2000-01-20 2005-11-29 Agilent Technologies, Inc. Method and system for optical heterodyne detection of an optical signal that utilizes optical attenuation
US6766115B1 (en) * 2000-08-22 2004-07-20 Agilent Technologies, Inc. Multiport optical component testing using a single optical receiver

Similar Documents

Publication Publication Date Title
JP4667728B2 (ja) 掃引波長計及び波長校正方法
JP3828111B2 (ja) 伝搬測定装置及び伝搬測定方法
JP4722110B2 (ja) 掃引レーザ用波長校正装置及び方法
TWI233990B (en) Parallel interferometric measurements using an expanded local oscillator signal
JP2006266797A (ja) 光ヘテロダイン干渉装置
JP2002350236A5 (enExample)
US7697122B2 (en) Measuring device, method, program, and recording medium
CN117109878A (zh) 基于延时自外差的激光频率漂移测量系统及方法
US6590666B2 (en) Method and system for optical spectrum analysis with non-uniform sweep rate correction
JP5487068B2 (ja) 波長分散測定装置及びそれを用いた波長分散測定方法
JPH09218130A (ja) 周波数掃引誤差検出方法および回路、光周波数掃引光源、ならびに光周波数領域反射測定回路
WO2002066940A2 (en) System and method for measurement of the state of polarization of an optical signal in a fibre
JP2792782B2 (ja) ガス濃度測定方法およびその測定装置
JP4934691B2 (ja) 分光システム
JPH06186337A (ja) レーザ測距装置
JP4599560B2 (ja) 基準信号光伝送システム及び基準信号光伝送方法
Dudzik et al. Demodulator electronics for laser vibrometry
JP2001124664A (ja) 光波長分散測定装置、及び光波長分散測定方法
JP4853255B2 (ja) ガス分析装置
JP4996669B2 (ja) 電磁波処理装置及び電磁波処理方法
CN223596989U (zh) 分布式光纤声波传感系统及光纤传感设备
KR101515980B1 (ko) 바람장 측정과 방사성물질 동시측정 라이다 장치
CN114935397B (zh) 一种分时校准频漂的激光测振光学集成芯片及方法
JP2001013245A (ja) 光波距離計
JP2006266796A (ja) 光ヘテロダイン干渉装置