JP2002350236A - 光スペクトル解析システム及び光スペクトル解析方法 - Google Patents

光スペクトル解析システム及び光スペクトル解析方法

Info

Publication number
JP2002350236A
JP2002350236A JP2002130756A JP2002130756A JP2002350236A JP 2002350236 A JP2002350236 A JP 2002350236A JP 2002130756 A JP2002130756 A JP 2002130756A JP 2002130756 A JP2002130756 A JP 2002130756A JP 2002350236 A JP2002350236 A JP 2002350236A
Authority
JP
Japan
Prior art keywords
signal
local oscillator
optical
frequency
sweep speed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002130756A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002350236A5 (enExample
Inventor
Douglas M Baney
ダグラス・エム・バーニー
Bogdan Szafraniec
ボーデン・スザファニック
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2002350236A publication Critical patent/JP2002350236A/ja
Publication of JP2002350236A5 publication Critical patent/JP2002350236A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/04—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by beating two waves of a same source but of different frequency and measuring the phase shift of the lower frequency obtained
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/45—Interferometric spectrometry
    • G01J3/453—Interferometric spectrometry by correlation of the amplitudes

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Optical Communication System (AREA)
  • Optical Modulation, Optical Deflection, Nonlinear Optics, Optical Demodulation, Optical Logic Elements (AREA)
JP2002130756A 2001-05-11 2002-05-02 光スペクトル解析システム及び光スペクトル解析方法 Pending JP2002350236A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/854,070 US6590666B2 (en) 2001-05-11 2001-05-11 Method and system for optical spectrum analysis with non-uniform sweep rate correction
US854070 2001-05-11

Publications (2)

Publication Number Publication Date
JP2002350236A true JP2002350236A (ja) 2002-12-04
JP2002350236A5 JP2002350236A5 (enExample) 2005-09-22

Family

ID=25317643

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002130756A Pending JP2002350236A (ja) 2001-05-11 2002-05-02 光スペクトル解析システム及び光スペクトル解析方法

Country Status (4)

Country Link
US (1) US6590666B2 (enExample)
EP (1) EP1256788B1 (enExample)
JP (1) JP2002350236A (enExample)
DE (1) DE60219550T2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006266797A (ja) * 2005-03-23 2006-10-05 Anritsu Corp 光ヘテロダイン干渉装置

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6646746B1 (en) * 2000-10-02 2003-11-11 Agilent Technologies, Inc. Method and system for optical heterodyne detection of an optical signal
US6856400B1 (en) * 2000-12-14 2005-02-15 Luna Technologies Apparatus and method for the complete characterization of optical devices including loss, birefringence and dispersion effects
US6906804B2 (en) * 2002-12-16 2005-06-14 Lucent Technologies Inc. WDM channel monitor and wavelength locker
DE102006025122A1 (de) * 2005-05-31 2006-12-07 Yokogawa Electric Corporation, Musashino Vorrichtung zur Messung einer optischen Charakteristik
US8611744B2 (en) * 2010-12-31 2013-12-17 Infinera Corporation Monitoring system employing carrier recovery
US20140111804A1 (en) 2011-03-28 2014-04-24 Agilent Technologies ,Inc. Heterodyne Optical Spectrum Analyzer
US9178611B2 (en) 2011-06-28 2015-11-03 Intuitive Surgical Operations, Inc. Fiber optic network interrogation tool for combined swept-heterodyne optical spectrum analysis and optical frequency-domain reflectometry
WO2021009913A1 (ja) * 2019-07-18 2021-01-21 日本電信電話株式会社 波長掃引光測定システム
IT202200004667A1 (it) * 2022-03-11 2022-06-11 Sestosensor S R L Rivelatore di fase e polarizzazione per sensori acustici distribuiti a fibre ottiche ed interrogatore basato sullo stesso
US12498211B2 (en) 2024-02-06 2025-12-16 Honeywell International Inc. Techniques for compensating for errors in an optical interferometer system

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4856899A (en) 1985-12-20 1989-08-15 Yokogawa Electric Corporation Optical frequency analyzer using a local oscillator heterodyne detection of incident light
US4905244A (en) * 1986-09-26 1990-02-27 United States Department Of Energy Heterodyne laser spectroscopy system
JPH07336301A (ja) * 1994-06-06 1995-12-22 Kokusai Denshin Denwa Co Ltd <Kdd> 光波長多重通信装置
WO1996026414A1 (en) 1995-02-24 1996-08-29 Anritsu Corporation Device for detecting angle of rotation of diffraction grating
US5780843A (en) * 1996-07-16 1998-07-14 Universite Laval Absolute optical frequency calibrator for a variable frequency optical source
GB9701627D0 (en) * 1997-01-27 1997-03-19 Plessey Telecomm Wavelength manager
US6166816A (en) * 1998-12-31 2000-12-26 Blake; James N. Combination fiber optic current/voltage sensor
US6434176B1 (en) * 1999-02-05 2002-08-13 Zygo Corporation Frequency stabilized laser system
US6204924B1 (en) * 1999-02-23 2001-03-20 Exfo Electro-Optical Engineering Inc. Method and apparatus for measuring polarization mode dispersion of optical devices
US6970250B1 (en) * 2000-01-20 2005-11-29 Agilent Technologies, Inc. Method and system for optical heterodyne detection of an optical signal that utilizes optical attenuation
US6766115B1 (en) * 2000-08-22 2004-07-20 Agilent Technologies, Inc. Multiport optical component testing using a single optical receiver

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006266797A (ja) * 2005-03-23 2006-10-05 Anritsu Corp 光ヘテロダイン干渉装置

Also Published As

Publication number Publication date
EP1256788A3 (en) 2004-09-22
DE60219550D1 (de) 2007-05-31
US20020167670A1 (en) 2002-11-14
EP1256788A2 (en) 2002-11-13
US6590666B2 (en) 2003-07-08
EP1256788B1 (en) 2007-04-18
DE60219550T2 (de) 2007-12-27

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