JP2002333371A - 波長計 - Google Patents

波長計

Info

Publication number
JP2002333371A
JP2002333371A JP2002105991A JP2002105991A JP2002333371A JP 2002333371 A JP2002333371 A JP 2002333371A JP 2002105991 A JP2002105991 A JP 2002105991A JP 2002105991 A JP2002105991 A JP 2002105991A JP 2002333371 A JP2002333371 A JP 2002333371A
Authority
JP
Japan
Prior art keywords
signal
optical signal
combined
movable
mirror
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2002105991A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002333371A5 (https=
Inventor
David M Braun
デイヴィット・エム・ブラウン
Benjamin S Wheeler
ベンジャミン・エス・ホイーラー
Rance M Fortenberry
ランス・エム・フォーテンベリー
Gregory S Hill
グレゴリー・エス・ヒル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2002333371A publication Critical patent/JP2002333371A/ja
Publication of JP2002333371A5 publication Critical patent/JP2002333371A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J9/00—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength
    • G01J9/02—Measuring optical phase difference; Determining degree of coherence; Measuring optical wavelength by interferometric methods
    • G01J9/0246—Measuring optical wavelength

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Mechanical Light Control Or Optical Switches (AREA)
JP2002105991A 2001-04-13 2002-04-09 波長計 Pending JP2002333371A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/835,269 US6462823B1 (en) 2001-04-13 2001-04-13 Wavelength meter adapted for averaging multiple measurements
US835269 2001-04-13

Publications (2)

Publication Number Publication Date
JP2002333371A true JP2002333371A (ja) 2002-11-22
JP2002333371A5 JP2002333371A5 (https=) 2005-09-15

Family

ID=25269079

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002105991A Pending JP2002333371A (ja) 2001-04-13 2002-04-09 波長計

Country Status (2)

Country Link
US (1) US6462823B1 (https=)
JP (1) JP2002333371A (https=)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008096612A (ja) * 2006-10-11 2008-04-24 Olympus Corp 光パルス多重化ユニット
JP2008104049A (ja) * 2006-10-20 2008-05-01 Olympus Corp 光パルス多重化ユニット
JP2010230574A (ja) * 2009-03-27 2010-10-14 National Institute Of Advanced Industrial Science & Technology 屈折率測定方法および屈折率測定装置
US8130448B2 (en) 2009-04-24 2012-03-06 Olympus Corporation Optical pulse multiplex unit
JP6705610B1 (ja) * 2019-05-30 2020-06-03 三菱電機株式会社 レーザ装置

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7423787B2 (en) * 2001-03-01 2008-09-09 Ricoh Company, Ltd. Optical scanning module, device, and method, and imaging apparatus
US20060216355A1 (en) * 2005-03-28 2006-09-28 Donald Spector Encapsulated pharmaceuticals in a medium having non-encapsulated flavoring agents
JP4693097B2 (ja) * 2005-03-31 2011-06-01 株式会社アドバンテスト 波長導出装置および該装置を備えた波長計、波長導出方法、プログラムおよび記録媒体
DE102008020147A1 (de) * 2008-04-22 2009-10-29 Carl Zeiss Ag Verfahren und Vorrichtung zur Bestimmung der m unterschiedlichen Wellenlängen von m optischen Meßstrahlbündeln
US8169616B2 (en) * 2010-02-16 2012-05-01 Agilent Technologies Australia (M) Pty Ltd Interferometer step scanning systems and methods
JP5729883B2 (ja) * 2012-11-05 2015-06-03 横河電機株式会社 光波長計
CN114487467B (zh) * 2022-01-30 2023-04-18 中国工程物理研究院流体物理研究所 一种具有复测功能的激光干涉测速装置及方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5166749A (en) * 1991-05-22 1992-11-24 Bio-Rad Laboratories Step scanning technique for interferometer
JPH07270245A (ja) * 1994-03-31 1995-10-20 Ando Electric Co Ltd 測長器を用いた光波長計
JPH08101072A (ja) * 1994-09-30 1996-04-16 Ando Electric Co Ltd 光波長計
JP3459327B2 (ja) * 1996-06-17 2003-10-20 理化学研究所 積層構造体の層厚および屈折率の測定方法およびその測定装置

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008096612A (ja) * 2006-10-11 2008-04-24 Olympus Corp 光パルス多重化ユニット
JP2008104049A (ja) * 2006-10-20 2008-05-01 Olympus Corp 光パルス多重化ユニット
JP2010230574A (ja) * 2009-03-27 2010-10-14 National Institute Of Advanced Industrial Science & Technology 屈折率測定方法および屈折率測定装置
US8130448B2 (en) 2009-04-24 2012-03-06 Olympus Corporation Optical pulse multiplex unit
JP6705610B1 (ja) * 2019-05-30 2020-06-03 三菱電機株式会社 レーザ装置
WO2020240788A1 (ja) * 2019-05-30 2020-12-03 三菱電機株式会社 レーザ装置

Also Published As

Publication number Publication date
US20020149776A1 (en) 2002-10-17
US6462823B1 (en) 2002-10-08

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