JP2002305145A5 - - Google Patents
Download PDFInfo
- Publication number
- JP2002305145A5 JP2002305145A5 JP2001108056A JP2001108056A JP2002305145A5 JP 2002305145 A5 JP2002305145 A5 JP 2002305145A5 JP 2001108056 A JP2001108056 A JP 2001108056A JP 2001108056 A JP2001108056 A JP 2001108056A JP 2002305145 A5 JP2002305145 A5 JP 2002305145A5
- Authority
- JP
- Japan
- Prior art keywords
- state
- semiconductor film
- energy
- semiconductor
- light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 claims description 141
- 239000010408 film Substances 0.000 claims description 97
- 239000010409 thin film Substances 0.000 claims description 54
- 238000002425 crystallisation Methods 0.000 claims description 35
- 230000008025 crystallization Effects 0.000 claims description 35
- 238000004519 manufacturing process Methods 0.000 claims description 25
- 239000000758 substrate Substances 0.000 claims description 16
- 238000012790 confirmation Methods 0.000 claims description 14
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 13
- 229910052710 silicon Inorganic materials 0.000 claims description 13
- 239000010703 silicon Substances 0.000 claims description 13
- 238000001514 detection method Methods 0.000 claims description 12
- 230000001678 irradiating effect Effects 0.000 claims description 9
- 239000013078 crystal Substances 0.000 claims description 3
- 230000010355 oscillation Effects 0.000 claims description 3
- 230000005284 excitation Effects 0.000 claims 2
- 239000011521 glass Substances 0.000 claims 2
- 230000005540 biological transmission Effects 0.000 description 1
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001108056A JP4068813B2 (ja) | 2001-04-06 | 2001-04-06 | 薄膜半導体装置の製造方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001108056A JP4068813B2 (ja) | 2001-04-06 | 2001-04-06 | 薄膜半導体装置の製造方法 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2002305145A JP2002305145A (ja) | 2002-10-18 |
JP2002305145A5 true JP2002305145A5 (enrdf_load_stackoverflow) | 2005-03-17 |
JP4068813B2 JP4068813B2 (ja) | 2008-03-26 |
Family
ID=18960266
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2001108056A Expired - Fee Related JP4068813B2 (ja) | 2001-04-06 | 2001-04-06 | 薄膜半導体装置の製造方法 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP4068813B2 (enrdf_load_stackoverflow) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7148159B2 (en) * | 2003-09-29 | 2006-12-12 | Ultratech, Inc. | Laser thermal annealing of lightly doped silicon substrates |
JP2007158372A (ja) * | 2007-02-06 | 2007-06-21 | Advanced Display Inc | 半導体装置の製造方法および製造装置 |
JP2012015445A (ja) | 2010-07-05 | 2012-01-19 | Japan Steel Works Ltd:The | レーザアニール処理装置およびレーザアニール処理方法 |
JP2014220331A (ja) * | 2013-05-07 | 2014-11-20 | 株式会社リコー | 電磁波照射装置 |
-
2001
- 2001-04-06 JP JP2001108056A patent/JP4068813B2/ja not_active Expired - Fee Related
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5315393B2 (ja) | 結晶性半導体膜の作製方法 | |
JP4748836B2 (ja) | レーザ照射装置 | |
CN100479116C (zh) | 激光照射设备和制造半导体器件的方法 | |
KR100740124B1 (ko) | 다결정 실리콘 박막 트랜지스터 및 그 제조방법 | |
EP1537938A2 (en) | Laser irradiation apparatus, laser irradiation method, and method for manufacturing semiconductor device | |
JPH07506221A (ja) | 多材料,多層装置の材料の対象物構造を選択的にレーザ処理するシステム及び方法 | |
WO2002031871A1 (en) | Method and apparatus for producing polysilicon film, semiconductor device, and method of manufacture thereof | |
CN101879658A (zh) | 激光辐照装置、激光辐照方法、以及半导体器件制造方法 | |
WO2000054314A1 (en) | Method and apparatus for laser heat treatment, and semiconductor device | |
US7145104B2 (en) | Silicon layer for uniformizing temperature during photo-annealing | |
US7615424B2 (en) | Laser irradiation apparatus and method for manufacturing semiconductor device using the laser irradiation apparatus | |
JP2007059431A (ja) | 半導体装置の製造方法及びレーザ加工装置 | |
JPH01260812A (ja) | 半導体装置の製造方法および装置 | |
JP2002305145A5 (enrdf_load_stackoverflow) | ||
JP2004207691A (ja) | 半導体薄膜の製造方法、その製造方法により得られる半導体薄膜、その半導体薄膜を用いる半導体素子および半導体薄膜の製造装置 | |
JP3847172B2 (ja) | 結晶成長方法及びレーザアニール装置 | |
JP2002305146A5 (enrdf_load_stackoverflow) | ||
JP4068813B2 (ja) | 薄膜半導体装置の製造方法 | |
JP4860116B2 (ja) | 結晶性半導体膜の作製方法 | |
JP2003224070A5 (enrdf_load_stackoverflow) | ||
CN100550284C (zh) | 激光处理装置、激光处理方法及半导体器件的制作方法 | |
JP2004072086A (ja) | レーザー照射方法及びレーザー照射装置 | |
JP2017063138A (ja) | 圧電体膜、圧電デバイス、圧電体膜の製造方法 | |
JP4100962B2 (ja) | 半導体装置の製造方法 | |
JP2005079497A (ja) | レーザ加工方法と加工装置および表示装置の製造方法と表示装置 |