JP2002158090A5 - Thin film forming apparatus and method for manufacturing light emitting device - Google Patents

Thin film forming apparatus and method for manufacturing light emitting device Download PDF

Info

Publication number
JP2002158090A5
JP2002158090A5 JP2001272825A JP2001272825A JP2002158090A5 JP 2002158090 A5 JP2002158090 A5 JP 2002158090A5 JP 2001272825 A JP2001272825 A JP 2001272825A JP 2001272825 A JP2001272825 A JP 2001272825A JP 2002158090 A5 JP2002158090 A5 JP 2002158090A5
Authority
JP
Japan
Prior art keywords
film
conductive film
forming
emitting device
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001272825A
Other languages
Japanese (ja)
Other versions
JP5159010B2 (en
JP2002158090A (en
Filing date
Publication date
Application filed filed Critical
Priority to JP2001272825A priority Critical patent/JP5159010B2/en
Priority claimed from JP2001272825A external-priority patent/JP5159010B2/en
Publication of JP2002158090A publication Critical patent/JP2002158090A/en
Publication of JP2002158090A5 publication Critical patent/JP2002158090A5/en
Application granted granted Critical
Publication of JP5159010B2 publication Critical patent/JP5159010B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Description

【特許請求の範囲】
【請求項1】
第1の導電膜を真空蒸着法において第1のマスクを用いることにより第1のパターンに形成する第1の成膜室と、
第2の導電膜を真空蒸着法において第2のマスクを用いることにより第2のパターンに形成する第2の成膜室と、
有機膜を真空蒸着法において第3のマスクを用いることにより第3のパターンに形成する第3の成膜室と、
パッシベーション膜を真空蒸着法において第4のマスクを用いることにより第4のパターンに形成する第4の成膜室と、
透光性導電膜を形成する第の成膜室とを有する薄膜形成装置であって、
前記第1の成膜室及び前記第2の成膜室は、CCDとX−Y−θステージによる位置合わせ機能をそれぞれ有し、
前記第1乃至前記第の成膜室は、搬送室とそれぞれ連結され、
前記搬送室は、基板を搬送する手段を有し、
前記第1の導電膜、前記第2の導電膜、前記有機膜、前記パッシベーション膜、及び前記透光性導電膜は、大気中に曝すことなく形成されることを特徴とする薄膜形成装置。
【請求項2】
第1の導電膜を真空蒸着法において第1のマスクを用いることにより第1のパターンに形成する第1の成膜室と、
第2の導電膜を真空蒸着法において第2のマスクを用いることにより第2のパターンに形成する第2の成膜室と、
有機膜を真空蒸着法において第3のマスクを用いることにより第3のパターンに形成する第3の成膜室と、
パッシベーション膜を真空蒸着法において第4のマスクを用いることにより第4のパターンに形成する第4の成膜室と、
透光性導電膜をスパッタリング法により形成する第の成膜室とを有する薄膜形成装置であって、
前記第1の成膜室及び前記第2の成膜室は、CCDとX−Y−θステージによる位置合わせ機能をそれぞれ有し、
前記第1乃至前記第の成膜室は、それぞれゲートで仕切られ、かつ一方向に連結され
前記第1の導電膜、前記第2の導電膜、前記有機膜、前記パッシベーション膜、及び前記透光性導電膜は、大気中に曝すことなく形成されることを特徴とする薄膜形成装置。
【請求項3】
請求項1または請求項2において、
前記第3の成膜室は、複数設けられており、複数の前記第3の成膜室は、それぞれ異なる有機膜を形成することを特徴とする薄膜形成装置。
【請求項4】
請求項1乃至請求項のいずれか一において、
前記第2の導電膜を周期表の第1族または第2族の元素により形成することを特徴とする薄膜形成装置。
【請求項5】
請求項1乃至請求項のいずれか一において、
前記マスクはメタルマスクであることを特徴とする薄膜形成装置。
【請求項6】
第1の導電膜を真空蒸着法により形成し、
前記第1の導電膜上に第2の導電膜を真空蒸着法により形成し、
前記第2の導電膜上に有機膜を真空蒸着法により形成し、
前記有機膜上にパッシベーション膜を真空蒸着法により形成し、
前記パッシベーション膜上に透光性導電膜をスパッタリング法により形成する発光装置の作製方法であって、
前記第1の導電膜、前記第2の導電膜及び前記有機膜は、マスクを用いてそれぞれ所定のパターンに形成され
前記第1の導電膜、前記第2の導電膜、前記有機膜、前記パッシベーション膜、及び前記透光性導電膜は、大気中に曝すことなく形成されることを特徴とする発光装置の作製方法。
【請求項7】
請求項において、
前記マスクとしてメタルマスクを用いたことを特徴とする発光装置の作製方法。
【請求項8】
第1の導電膜を真空蒸着法により形成し、
前記第1の導電膜上に第2の導電膜を真空蒸着法により形成し、
前記第2の導電膜上に有機膜を真空蒸着法により形成し、
前記有機膜上にパッシベーション膜を真空蒸着法により形成し、
前記パッシベーション膜上に透光性導電膜をスパッタリング法により形成する発光装置の作製方法であって、
前記第1の導電膜、前記第2の導電膜、前記有機膜、前記パッシベーション膜、及び前記透光性導電膜の形成は、減圧下で連続して処理され
前記第1の導電膜、前記第2の導電膜、前記有機膜、前記パッシベーション膜、及び前記透光性導電膜は、大気中に曝すことなく形成されることを特徴とする発光装置の作製方法。
【請求項9】
請求項乃至請求項のいずれか一において、
前記第2の導電膜は、周期表の第1族または第2族の元素を用いて形成されることを特徴とする発光装置の作製方法。
【請求項10】
請求項乃至請求項のいずれか一において、
前記パッシベーション膜は、透過率が70%以上であり、かつ仕事関数が4.5〜5.5である金属元素を用いて形成されることを特徴とする発光装置の作製方法。
【請求項11】
請求項乃至請求項10のいずれか一において、
前記透光性導電膜は、シート抵抗が50Ω/□以下であり、かつ透過率が70%以上である金属材料を用いて形成されることを特徴とする発光装置の作製方法。
[Claims]
(1)
A first deposition chamber in which a first conductive film is formed in a first pattern by using a first mask in a vacuum evaporation method;
A second film formation chamber for forming a second conductive film in a second pattern by using a second mask in a vacuum evaporation method;
A third film forming chamber for forming an organic film in a third pattern by using a third mask in a vacuum evaporation method;
A fourth film forming chamber for forming a passivation film in a fourth pattern by using a fourth mask in a vacuum evaporation method;
A fifth film formation chamber for forming a light-transmitting conductive film,
The first film forming chamber and the second film forming chamber have a positioning function using a CCD and an XY-θ stage, respectively.
The first to fifth film forming chambers are respectively connected to a transfer chamber,
The transfer chamber may have a means for transporting a substrate,
The thin film forming apparatus, wherein the first conductive film, the second conductive film, the organic film, the passivation film, and the light-transmitting conductive film are formed without being exposed to the air .
(2)
A first deposition chamber in which a first conductive film is formed in a first pattern by using a first mask in a vacuum evaporation method;
A second film formation chamber for forming a second conductive film in a second pattern by using a second mask in a vacuum evaporation method;
A third film forming chamber for forming an organic film in a third pattern by using a third mask in a vacuum evaporation method;
A fourth film forming chamber for forming a passivation film in a fourth pattern by using a fourth mask in a vacuum evaporation method;
A fifth film forming chamber for forming a light-transmitting conductive film by a sputtering method,
The first film forming chamber and the second film forming chamber have a positioning function using a CCD and an XY-θ stage, respectively.
The first to fifth film forming chambers are each partitioned by a gate and connected in one direction ,
The thin film forming apparatus, wherein the first conductive film, the second conductive film, the organic film, the passivation film, and the light-transmitting conductive film are formed without being exposed to the air .
(3)
In claim 1 or claim 2,
A plurality of the third film formation chambers are provided, and the plurality of the third film formation chambers form different organic films, respectively.
(4)
In any one of claims 1 to 3 ,
An apparatus for forming a thin film, wherein the second conductive film is formed from an element of Group 1 or Group 2 of the periodic table.
Claim 5.
In any one of claims 1 to 4 ,
The thin film forming apparatus, wherein the mask is a metal mask.
6.
Forming a first conductive film by a vacuum deposition method;
Forming a second conductive film on the first conductive film by a vacuum deposition method;
Forming an organic film on the second conductive film by a vacuum evaporation method;
Forming a passivation film on the organic film by a vacuum deposition method,
A method for manufacturing a light-emitting device, wherein a light-transmitting conductive film is formed over the passivation film by a sputtering method,
The first conductive film, the second conductive film, and the organic film are each formed in a predetermined pattern using a mask ,
The method for manufacturing a light-emitting device, wherein the first conductive film, the second conductive film, the organic film, the passivation film, and the light-transmitting conductive film are formed without exposure to the air. .
7.
In claim 6 ,
A method for manufacturing a light-emitting device, wherein a metal mask is used as the mask.
Claim 8.
Forming a first conductive film by a vacuum deposition method;
Forming a second conductive film on the first conductive film by a vacuum deposition method;
Forming an organic film on the second conductive film by a vacuum evaporation method;
Forming a passivation film on the organic film by a vacuum deposition method,
A method for manufacturing a light-emitting device, wherein a light-transmitting conductive film is formed over the passivation film by a sputtering method,
The formation of the first conductive film, the second conductive film, the organic film, the passivation film, and the light-transmitting conductive film is continuously performed under reduced pressure ;
The method for manufacturing a light-emitting device, wherein the first conductive film, the second conductive film, the organic film, the passivation film, and the light-transmitting conductive film are formed without exposure to the air. .
9.
In any one of claims 6 to 8 ,
The method for manufacturing a light-emitting device, wherein the second conductive film is formed using an element of Group 1 or Group 2 of the periodic table.
10.
In any one of claims 6 to 9 ,
The method for manufacturing a light-emitting device, wherein the passivation film is formed using a metal element having a transmittance of 70% or more and a work function of 4.5 to 5.5.
11.
In any one of claims 6 to 10 ,
The method for manufacturing a light-emitting device, wherein the light-transmitting conductive film is formed using a metal material having a sheet resistance of 50 Ω / □ or less and a transmittance of 70% or more.

JP2001272825A 2000-09-08 2001-09-10 Method for manufacturing light emitting device Expired - Fee Related JP5159010B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001272825A JP5159010B2 (en) 2000-09-08 2001-09-10 Method for manufacturing light emitting device

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2000272547 2000-09-08
JP2000272547 2000-09-08
JP2000-272547 2000-09-08
JP2001272825A JP5159010B2 (en) 2000-09-08 2001-09-10 Method for manufacturing light emitting device

Publications (3)

Publication Number Publication Date
JP2002158090A JP2002158090A (en) 2002-05-31
JP2002158090A5 true JP2002158090A5 (en) 2008-10-09
JP5159010B2 JP5159010B2 (en) 2013-03-06

Family

ID=26599503

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001272825A Expired - Fee Related JP5159010B2 (en) 2000-09-08 2001-09-10 Method for manufacturing light emitting device

Country Status (1)

Country Link
JP (1) JP5159010B2 (en)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6956240B2 (en) 2001-10-30 2005-10-18 Semiconductor Energy Laboratory Co., Ltd. Light emitting device
JP4366896B2 (en) * 2002-01-24 2009-11-18 セイコーエプソン株式会社 Light emitting device manufacturing equipment
TWI294155B (en) 2002-06-21 2008-03-01 Applied Materials Inc Transfer chamber for vacuum processing system
US20040040504A1 (en) 2002-08-01 2004-03-04 Semiconductor Energy Laboratory Co., Ltd. Manufacturing apparatus
JP4515060B2 (en) * 2002-08-30 2010-07-28 株式会社半導体エネルギー研究所 Manufacturing apparatus and method for producing layer containing organic compound
AU2003263609A1 (en) 2002-09-20 2004-04-08 Semiconductor Energy Laboratory Co., Ltd. Fabrication system and manufacturing method of light emitting device
JP4343511B2 (en) 2002-10-08 2009-10-14 キヤノン株式会社 Multicolor light emitting device
JP4170179B2 (en) * 2003-01-09 2008-10-22 株式会社 日立ディスプレイズ Organic EL panel manufacturing method and organic EL panel
JP4543691B2 (en) * 2004-02-03 2010-09-15 株式会社島津製作所 Organic electroluminescence device and method for producing the same
US7784164B2 (en) 2004-06-02 2010-08-31 Applied Materials, Inc. Electronic device manufacturing chamber method
EP1715075B1 (en) * 2005-04-20 2008-04-16 Applied Materials GmbH & Co. KG Magnetic mask holder
US7432201B2 (en) 2005-07-19 2008-10-07 Applied Materials, Inc. Hybrid PVD-CVD system
KR100674679B1 (en) 2005-12-29 2007-01-25 주식회사 아바코 Encapsulation system of organic light emitting diodes
US20080025821A1 (en) * 2006-07-25 2008-01-31 Applied Materials, Inc. Octagon transfer chamber
KR101208641B1 (en) * 2007-01-09 2012-12-06 가부시키가이샤 알박 Multilayer film forming method and multilayer film forming apparatus
KR101361481B1 (en) * 2007-06-27 2014-02-13 에스엔유 프리시젼 주식회사 Deposition system for optimization of mandufacturing oled panel
JP5132213B2 (en) * 2007-07-18 2013-01-30 富士フイルム株式会社 Vapor deposition apparatus, vapor deposition method, and electronic device and organic electroluminescence device having layers patterned using the method
JP4934619B2 (en) * 2008-03-17 2012-05-16 株式会社アルバック Organic EL manufacturing apparatus and organic EL manufacturing method
JP2009302025A (en) * 2008-06-17 2009-12-24 Seiko Epson Corp Organic light-emitting device and electronic equipment
JP5126545B2 (en) * 2009-02-09 2013-01-23 ソニー株式会社 Manufacturing method of display device
KR101146981B1 (en) * 2009-06-02 2012-05-22 삼성모바일디스플레이주식회사 Apparatus of evaporation and control method the same
KR101209656B1 (en) 2010-10-26 2012-12-07 주식회사 에스에프에이 System for encapsulation of oled
KR101957096B1 (en) * 2018-03-05 2019-03-11 캐논 톡키 가부시키가이샤 Robot system, Manufacturing apparatus of device, Manufacturing method of device and Method for adjusting teaching positions
US20240057462A1 (en) * 2020-12-25 2024-02-15 Semiconductor Energy Laboratory Co., Ltd. Manufacturing equipment of display device

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3197305B2 (en) * 1991-10-08 2001-08-13 ティーディーケイ株式会社 Protection of electroluminescent element
JP3189480B2 (en) * 1993-04-02 2001-07-16 富士電機株式会社 Organic thin film light emitting device
JPH08111285A (en) * 1994-10-07 1996-04-30 Tdk Corp Manufacture of organic electroluminescent element and its device
JPH10214682A (en) * 1997-01-30 1998-08-11 Mitsubishi Chem Corp Manufacturing device and manufacture of organic electroluminescent element
JPH10241858A (en) * 1997-02-25 1998-09-11 Tdk Corp Manufacture of organic electroluminescent display device and device therefor
JP3524711B2 (en) * 1997-03-18 2004-05-10 三洋電機株式会社 Organic electroluminescence device and method of manufacturing the same
JP3571171B2 (en) * 1997-05-08 2004-09-29 出光興産株式会社 Organic electroluminescence device
JP4058149B2 (en) * 1997-12-01 2008-03-05 キヤノンアネルバ株式会社 Mask alignment method for vacuum deposition system
JPH11162652A (en) * 1997-12-02 1999-06-18 Idemitsu Kosan Co Ltd Organic el element and its manufacture
JP2000068073A (en) * 1998-08-27 2000-03-03 Futaba Corp Organic electroluminescent element and its manufacture
JP2000208271A (en) * 1998-11-09 2000-07-28 Toray Ind Inc Light emitting element
JP2000223280A (en) * 1999-02-01 2000-08-11 Minolta Co Ltd Organic electroluminescent display element

Similar Documents

Publication Publication Date Title
JP2002158090A5 (en) Thin film forming apparatus and method for manufacturing light emitting device
US7662663B2 (en) OLED patterning method
JP6653316B2 (en) Pattern formation of organic EL device by photolithography
US7674712B2 (en) Patterning method for light-emitting devices
TWI408994B (en) Method of manufacturing organic light emitting display device
US8193018B2 (en) Patterning method for light-emitting devices
TWI266967B (en) Resist under-layer lower layer film material and method for forming a pattern
US20090004419A1 (en) Multi-layer masking film
EP1763287A3 (en) A method for fabricating organic electroluminescent devices
JP2005509283A5 (en)
WO2007124472A3 (en) Patterning sub-lithographic features with variable widths
JP2007522673A5 (en)
EP0955791A4 (en) Process for manufacturing organic electroluminescent device
EP1860500A3 (en) Phase shift mask blank, phase shift mask, and pattern transfer method
JP2006505111A5 (en)
EP0986112A3 (en) An efficient method for fabricating organic light emitting diodes
US8062834B2 (en) Method for manufacturing transparent electrode pattern and method for manufacturing electro-optic device having the transparent electrode pattern
WO2005061752A3 (en) Method for patterning films
WO2004006014A3 (en) Method of using an amorphous carbon layer for improved reticle fabrication
CN107195538B (en) The method for forming pattern
JP2003115393A5 (en)
KR100943186B1 (en) Organic light emitting display apparatus and method for manufacturing the same
US7521270B2 (en) OLED patterning method
TW201108487A (en) Electro-optic device and method for manufacturing the same
EP2784840B1 (en) Method of manufacturing an organic device