JP2002063226A - 回路基板の検証方法、設計方法、それらの装置および記録媒体 - Google Patents
回路基板の検証方法、設計方法、それらの装置および記録媒体Info
- Publication number
- JP2002063226A JP2002063226A JP2000247658A JP2000247658A JP2002063226A JP 2002063226 A JP2002063226 A JP 2002063226A JP 2000247658 A JP2000247658 A JP 2000247658A JP 2000247658 A JP2000247658 A JP 2000247658A JP 2002063226 A JP2002063226 A JP 2002063226A
- Authority
- JP
- Japan
- Prior art keywords
- signal line
- circuit board
- data
- pattern
- electric energy
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims abstract description 53
- 238000012795 verification Methods 0.000 claims abstract description 53
- 238000013461 design Methods 0.000 claims description 76
- 238000001514 detection method Methods 0.000 claims description 34
- 238000000605 extraction Methods 0.000 claims description 15
- 238000012545 processing Methods 0.000 claims description 15
- 230000008859 change Effects 0.000 claims description 8
- 230000007704 transition Effects 0.000 claims description 4
- 230000008054 signal transmission Effects 0.000 claims description 2
- 230000005855 radiation Effects 0.000 abstract description 13
- 101000911772 Homo sapiens Hsc70-interacting protein Proteins 0.000 abstract description 3
- 238000012937 correction Methods 0.000 description 25
- 238000010586 diagram Methods 0.000 description 11
- 239000000284 extract Substances 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 5
- 230000001154 acute effect Effects 0.000 description 4
- 230000005540 biological transmission Effects 0.000 description 4
- 230000007423 decrease Effects 0.000 description 3
- 238000012938 design process Methods 0.000 description 3
- 230000005684 electric field Effects 0.000 description 3
- 230000009467 reduction Effects 0.000 description 3
- 238000011835 investigation Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 230000000052 comparative effect Effects 0.000 description 1
- 230000001143 conditioned effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000247658A JP2002063226A (ja) | 2000-08-17 | 2000-08-17 | 回路基板の検証方法、設計方法、それらの装置および記録媒体 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000247658A JP2002063226A (ja) | 2000-08-17 | 2000-08-17 | 回路基板の検証方法、設計方法、それらの装置および記録媒体 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2002063226A true JP2002063226A (ja) | 2002-02-28 |
| JP2002063226A5 JP2002063226A5 (enrdf_load_stackoverflow) | 2007-03-22 |
Family
ID=18737705
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000247658A Pending JP2002063226A (ja) | 2000-08-17 | 2000-08-17 | 回路基板の検証方法、設計方法、それらの装置および記録媒体 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP2002063226A (enrdf_load_stackoverflow) |
-
2000
- 2000-08-17 JP JP2000247658A patent/JP2002063226A/ja active Pending
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