JP2002000592A5 - - Google Patents

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Publication number
JP2002000592A5
JP2002000592A5 JP2000184795A JP2000184795A JP2002000592A5 JP 2002000592 A5 JP2002000592 A5 JP 2002000592A5 JP 2000184795 A JP2000184795 A JP 2000184795A JP 2000184795 A JP2000184795 A JP 2000184795A JP 2002000592 A5 JP2002000592 A5 JP 2002000592A5
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JP
Japan
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JP2000184795A
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JP2002000592A (ja
JP4566345B2 (ja
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Priority to JP2000184795A priority Critical patent/JP4566345B2/ja
Priority claimed from JP2000184795A external-priority patent/JP4566345B2/ja
Publication of JP2002000592A publication Critical patent/JP2002000592A/ja
Publication of JP2002000592A5 publication Critical patent/JP2002000592A5/ja
Application granted granted Critical
Publication of JP4566345B2 publication Critical patent/JP4566345B2/ja
Anticipated expiration legal-status Critical
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JP2000184795A 2000-06-20 2000-06-20 放射線撮影画像処理装置 Expired - Fee Related JP4566345B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2000184795A JP4566345B2 (ja) 2000-06-20 2000-06-20 放射線撮影画像処理装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2000184795A JP4566345B2 (ja) 2000-06-20 2000-06-20 放射線撮影画像処理装置

Publications (3)

Publication Number Publication Date
JP2002000592A JP2002000592A (ja) 2002-01-08
JP2002000592A5 true JP2002000592A5 (ja) 2007-07-26
JP4566345B2 JP4566345B2 (ja) 2010-10-20

Family

ID=18685198

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000184795A Expired - Fee Related JP4566345B2 (ja) 2000-06-20 2000-06-20 放射線撮影画像処理装置

Country Status (1)

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JP (1) JP4566345B2 (ja)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6919568B2 (en) * 2003-04-08 2005-07-19 Ge Medical Systems Global Technology Company Llc Method and apparatus for identifying composite defective pixel map
JP4506446B2 (ja) * 2004-12-08 2010-07-21 株式会社島津製作所 医用処理システム
JP4950461B2 (ja) * 2005-09-06 2012-06-13 株式会社東芝 照射線量異常分析装置および照射線量異常分析プログラム
JP4921908B2 (ja) * 2006-09-25 2012-04-25 株式会社東芝 医用システム及び医用装置
JP2008302067A (ja) * 2007-06-08 2008-12-18 Aloka Co Ltd X線撮像装置
JP2008302068A (ja) * 2007-06-08 2008-12-18 Aloka Co Ltd X線撮像装置
JP5317916B2 (ja) 2009-09-29 2013-10-16 富士フイルム株式会社 放射線撮影管理システム及び放射線撮影管理方法
JP2015008884A (ja) * 2013-06-28 2015-01-19 株式会社日立メディコ X線画像診断装置
EP3077851B1 (en) * 2013-12-04 2020-06-17 Koninklijke Philips N.V. Imaging detector self-diagnostic circuitry
CN109844507B (zh) * 2016-10-20 2022-01-07 音量制图法公司 监视设备的功能状态的方法和装置以及存储介质
JP7204044B2 (ja) * 2020-03-03 2023-01-13 三菱電機株式会社 状態検知システム

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6275773A (ja) * 1985-09-30 1987-04-07 Toshiba Corp 画像圧縮装置
JP2593453B2 (ja) * 1986-08-12 1997-03-26 株式会社東芝 画像圧縮装置
JPH0662130A (ja) * 1992-08-14 1994-03-04 Toshiba Corp 医用装置の遠隔診断システム
US6115489A (en) * 1997-09-02 2000-09-05 General Electric Company System and method for performing image-based diagnosis

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