JP2001509278A - 顕微鏡のビーム路における光学装置 - Google Patents

顕微鏡のビーム路における光学装置

Info

Publication number
JP2001509278A
JP2001509278A JP52821698A JP52821698A JP2001509278A JP 2001509278 A JP2001509278 A JP 2001509278A JP 52821698 A JP52821698 A JP 52821698A JP 52821698 A JP52821698 A JP 52821698A JP 2001509278 A JP2001509278 A JP 2001509278A
Authority
JP
Japan
Prior art keywords
hole stop
optical system
variable
optics
beam path
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP52821698A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001509278A5 (enExample
Inventor
エンゲルハルト、ヨハン
イーリッヒ、クリスチアーネ
Original Assignee
ライカ ミクロジュステムス ハイデルベルク ゲーエムベーハー
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ライカ ミクロジュステムス ハイデルベルク ゲーエムベーハー filed Critical ライカ ミクロジュステムス ハイデルベルク ゲーエムベーハー
Publication of JP2001509278A publication Critical patent/JP2001509278A/ja
Publication of JP2001509278A5 publication Critical patent/JP2001509278A5/ja
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052Optical details of the image generation
    • G02B21/006Optical details of the image generation focusing arrangements; selection of the plane to be imaged
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications
    • G02B21/002Scanning microscopes
    • G02B21/0024Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036Scanning details, e.g. scanning stages
    • G02B21/004Scanning details, e.g. scanning stages fixed arrays, e.g. switchable aperture arrays

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
JP52821698A 1996-12-24 1997-12-12 顕微鏡のビーム路における光学装置 Ceased JP2001509278A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE19654211.1 1996-12-24
DE19654211A DE19654211C2 (de) 1996-12-24 1996-12-24 Konfokales Mikroskop
PCT/DE1997/002895 WO1998028646A1 (de) 1996-12-24 1997-12-12 Optische anordnung im strahlengang eines mikroskops

Publications (2)

Publication Number Publication Date
JP2001509278A true JP2001509278A (ja) 2001-07-10
JP2001509278A5 JP2001509278A5 (enExample) 2005-06-16

Family

ID=7816136

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52821698A Ceased JP2001509278A (ja) 1996-12-24 1997-12-12 顕微鏡のビーム路における光学装置

Country Status (5)

Country Link
US (1) US6285019B1 (enExample)
EP (1) EP0950205B1 (enExample)
JP (1) JP2001509278A (enExample)
DE (2) DE19654211C2 (enExample)
WO (1) WO1998028646A1 (enExample)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005266084A (ja) * 2004-03-17 2005-09-29 Lasertec Corp コンフォーカル顕微鏡及び膜厚測定装置
JP2005321657A (ja) * 2004-05-10 2005-11-17 Nikon Corp 顕微鏡の光学系、顕微鏡、及びバーチャルスライド作成システム
JP2006163402A (ja) * 2004-12-06 2006-06-22 Leica Microsystems Cms Gmbh 顕微鏡用光学装置
JP2007504498A (ja) * 2003-09-05 2007-03-01 ライカ マイクロシステムス ツェーエムエス ゲーエムベーハー ラスタ顕微鏡
JP2009116054A (ja) * 2007-11-07 2009-05-28 Nikon Corp 光学装置および顕微鏡
JP2011501244A (ja) * 2007-10-30 2011-01-06 パーキンエルマー・シンガポール・プライベート・リミテッド 走査型共焦点顕微法およびそれに関する改善

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1046073B1 (de) * 1998-01-14 2015-04-08 Leica Microsystems CMS GmbH Verfahren zur abstimmung des beleuchtungsstrahlengangs eines konfokalen mikroskops auf die eintrittspupille eines objektivs
DE19853407C2 (de) * 1998-11-19 2003-09-11 Leica Microsystems Verfahren zur Einstellung der Systemparameter eines konfokalen Laserscanmikroskops
GB9904150D0 (en) * 1999-02-23 1999-04-14 Medical Res Council Confocal microscope detector optics and methods for using them
DE10107210C1 (de) 2001-02-16 2002-10-10 Evotec Ag Mikroskop
DE10122607B4 (de) * 2001-05-10 2006-11-30 Leica Microsystems Cms Gmbh Verfahren und Anordnung zur direkten Fourierabbildung von Proben
DE10229407B4 (de) 2002-06-29 2021-10-14 Leica Microsystems Cms Gmbh Verfahren zur Einstellung der Systemparameter eines Rastermikroskops und Rastermikroskop
ATE497807T1 (de) * 2003-03-27 2011-02-15 Gen Hospital Corp Gerät für die dermatologische behandlung und fraktionale oberflächenerneuerung der haut
DE10323921A1 (de) * 2003-05-22 2004-12-16 Carl Zeiss Jena Gmbh Einstellbares Pinhole, insbesondere für ein Laser-Scanning-Mikroskop
WO2005012859A1 (de) * 2003-07-30 2005-02-10 Optris Gmbh Vorrichtung zur berührungslosen temperaturmessung
US7218446B2 (en) * 2003-08-27 2007-05-15 Biomedical Photometrics Inc. Imaging system having a fine focus
US20050111082A1 (en) * 2003-11-20 2005-05-26 Accretech (Israel) Ltd. Confocal microscopy arrangement without beam splitter
DE102004034989A1 (de) * 2004-07-16 2006-02-09 Carl Zeiss Jena Gmbh Zoomoptik für ein Lichtrastermikroskop mit punktförmiger Lichtquellenverteilung und Verwendung
DE102004034990A1 (de) 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Zoomoptik für ein Lichtrastermikroskop mit linienförmiger Abtastung und Verwendung
DE102004034991A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Zoomoptik für ein Lichtrastermikroskop
DE102005008196B4 (de) * 2005-02-22 2019-08-29 Leica Microsystems Cms Gmbh Verfahren zum Erkennen von Dunkelzuständen bei der spektroskopischen oder mikroskopischen Untersuchung von fluoreszenten Proben und Vorrichtung zur spektroskopischen oder mikroskopischen Untersuchung von fluoreszenten Proben
US7397561B2 (en) * 2005-11-07 2008-07-08 Wafermasters, Incorporated Spectroscopy system
US7564547B2 (en) * 2005-11-07 2009-07-21 Wafermasters, Inc. Spectroscopy system
JP2008225095A (ja) * 2007-03-13 2008-09-25 Olympus Corp 光走査型観察装置
US8240912B2 (en) 2008-08-15 2012-08-14 Fluke Corporation Multi-zone non-contact spot thermometer
CH699575A1 (de) * 2008-10-06 2010-04-15 Nectar Imaging S R L Optisches System für ein Konfokalmikroskop.
DE102009044983A1 (de) 2009-09-24 2011-03-31 Carl Zeiss Microimaging Gmbh Mikroskop
JP5616824B2 (ja) 2011-03-10 2014-10-29 オリンパス株式会社 顕微鏡装置

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DD276218A3 (de) * 1987-04-02 1990-02-21 Zeiss Jena Veb Carl Anordnung zur vermeidung des variablen oeffnungsfehlers in rastermikroskopen mit z-scan
US4827125A (en) * 1987-04-29 1989-05-02 The United States Of America As Represented By The Secretary Of The Department Of Health And Human Services Confocal scanning laser microscope having no moving parts
CA1325537C (en) * 1988-08-01 1993-12-28 Timothy Peter Dabbs Confocal microscope
GB9014263D0 (en) * 1990-06-27 1990-08-15 Dixon Arthur E Apparatus and method for spatially- and spectrally- resolvedmeasurements
US5334830A (en) * 1991-05-29 1994-08-02 Olympus Optical Co., Ltd. Scanning optical microscope having a compact confocal optical system for adjusting position of aperture
DE4429416A1 (de) * 1994-08-19 1996-02-22 Velzel Christiaan H F Verfahren und Interferenzmikroskop zum Mikroskopieren eines Objektes zur Erzielung einer Auflösung jenseits der Beugungsgrenze (Superauflösung)
US5563710A (en) * 1994-10-28 1996-10-08 The Schepens Eye Research Institute, Inc. Imaging system with confocally self-detecting laser

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007504498A (ja) * 2003-09-05 2007-03-01 ライカ マイクロシステムス ツェーエムエス ゲーエムベーハー ラスタ顕微鏡
JP2005266084A (ja) * 2004-03-17 2005-09-29 Lasertec Corp コンフォーカル顕微鏡及び膜厚測定装置
JP2005321657A (ja) * 2004-05-10 2005-11-17 Nikon Corp 顕微鏡の光学系、顕微鏡、及びバーチャルスライド作成システム
JP2006163402A (ja) * 2004-12-06 2006-06-22 Leica Microsystems Cms Gmbh 顕微鏡用光学装置
JP2011501244A (ja) * 2007-10-30 2011-01-06 パーキンエルマー・シンガポール・プライベート・リミテッド 走査型共焦点顕微法およびそれに関する改善
JP2009116054A (ja) * 2007-11-07 2009-05-28 Nikon Corp 光学装置および顕微鏡

Also Published As

Publication number Publication date
WO1998028646A1 (de) 1998-07-02
US6285019B1 (en) 2001-09-04
DE19654211A1 (de) 1998-08-13
EP0950205A1 (de) 1999-10-20
EP0950205B1 (de) 2002-10-09
DE19654211C2 (de) 2000-07-06
DE59708457D1 (de) 2002-11-21

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