JP2001509278A - 顕微鏡のビーム路における光学装置 - Google Patents
顕微鏡のビーム路における光学装置Info
- Publication number
- JP2001509278A JP2001509278A JP52821698A JP52821698A JP2001509278A JP 2001509278 A JP2001509278 A JP 2001509278A JP 52821698 A JP52821698 A JP 52821698A JP 52821698 A JP52821698 A JP 52821698A JP 2001509278 A JP2001509278 A JP 2001509278A
- Authority
- JP
- Japan
- Prior art keywords
- hole stop
- optical system
- variable
- optics
- beam path
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 230000003287 optical effect Effects 0.000 claims abstract description 46
- 238000005286 illumination Methods 0.000 claims abstract description 19
- 238000001514 detection method Methods 0.000 claims abstract description 18
- 239000013307 optical fiber Substances 0.000 claims description 4
- 230000004075 alteration Effects 0.000 claims description 2
- 239000000835 fiber Substances 0.000 claims description 2
- 238000000034 method Methods 0.000 claims 1
- 230000006978 adaptation Effects 0.000 abstract 1
- 230000008859 change Effects 0.000 description 5
- 230000008901 benefit Effects 0.000 description 3
- QNRATNLHPGXHMA-XZHTYLCXSA-N (r)-(6-ethoxyquinolin-4-yl)-[(2s,4s,5r)-5-ethyl-1-azabicyclo[2.2.2]octan-2-yl]methanol;hydrochloride Chemical compound Cl.C([C@H]([C@H](C1)CC)C2)CN1[C@@H]2[C@H](O)C1=CC=NC2=CC=C(OCC)C=C21 QNRATNLHPGXHMA-XZHTYLCXSA-N 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 238000004624 confocal microscopy Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
- 239000010432 diamond Substances 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000000386 microscopy Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
- G02B21/006—Optical details of the image generation focusing arrangements; selection of the plane to be imaged
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0036—Scanning details, e.g. scanning stages
- G02B21/004—Scanning details, e.g. scanning stages fixed arrays, e.g. switchable aperture arrays
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Microscoopes, Condenser (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19654211.1 | 1996-12-24 | ||
| DE19654211A DE19654211C2 (de) | 1996-12-24 | 1996-12-24 | Konfokales Mikroskop |
| PCT/DE1997/002895 WO1998028646A1 (de) | 1996-12-24 | 1997-12-12 | Optische anordnung im strahlengang eines mikroskops |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2001509278A true JP2001509278A (ja) | 2001-07-10 |
| JP2001509278A5 JP2001509278A5 (enExample) | 2005-06-16 |
Family
ID=7816136
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP52821698A Ceased JP2001509278A (ja) | 1996-12-24 | 1997-12-12 | 顕微鏡のビーム路における光学装置 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US6285019B1 (enExample) |
| EP (1) | EP0950205B1 (enExample) |
| JP (1) | JP2001509278A (enExample) |
| DE (2) | DE19654211C2 (enExample) |
| WO (1) | WO1998028646A1 (enExample) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005266084A (ja) * | 2004-03-17 | 2005-09-29 | Lasertec Corp | コンフォーカル顕微鏡及び膜厚測定装置 |
| JP2005321657A (ja) * | 2004-05-10 | 2005-11-17 | Nikon Corp | 顕微鏡の光学系、顕微鏡、及びバーチャルスライド作成システム |
| JP2006163402A (ja) * | 2004-12-06 | 2006-06-22 | Leica Microsystems Cms Gmbh | 顕微鏡用光学装置 |
| JP2007504498A (ja) * | 2003-09-05 | 2007-03-01 | ライカ マイクロシステムス ツェーエムエス ゲーエムベーハー | ラスタ顕微鏡 |
| JP2009116054A (ja) * | 2007-11-07 | 2009-05-28 | Nikon Corp | 光学装置および顕微鏡 |
| JP2011501244A (ja) * | 2007-10-30 | 2011-01-06 | パーキンエルマー・シンガポール・プライベート・リミテッド | 走査型共焦点顕微法およびそれに関する改善 |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1046073B1 (de) * | 1998-01-14 | 2015-04-08 | Leica Microsystems CMS GmbH | Verfahren zur abstimmung des beleuchtungsstrahlengangs eines konfokalen mikroskops auf die eintrittspupille eines objektivs |
| DE19853407C2 (de) * | 1998-11-19 | 2003-09-11 | Leica Microsystems | Verfahren zur Einstellung der Systemparameter eines konfokalen Laserscanmikroskops |
| GB9904150D0 (en) * | 1999-02-23 | 1999-04-14 | Medical Res Council | Confocal microscope detector optics and methods for using them |
| DE10107210C1 (de) | 2001-02-16 | 2002-10-10 | Evotec Ag | Mikroskop |
| DE10122607B4 (de) * | 2001-05-10 | 2006-11-30 | Leica Microsystems Cms Gmbh | Verfahren und Anordnung zur direkten Fourierabbildung von Proben |
| DE10229407B4 (de) | 2002-06-29 | 2021-10-14 | Leica Microsystems Cms Gmbh | Verfahren zur Einstellung der Systemparameter eines Rastermikroskops und Rastermikroskop |
| ATE497807T1 (de) * | 2003-03-27 | 2011-02-15 | Gen Hospital Corp | Gerät für die dermatologische behandlung und fraktionale oberflächenerneuerung der haut |
| DE10323921A1 (de) * | 2003-05-22 | 2004-12-16 | Carl Zeiss Jena Gmbh | Einstellbares Pinhole, insbesondere für ein Laser-Scanning-Mikroskop |
| WO2005012859A1 (de) * | 2003-07-30 | 2005-02-10 | Optris Gmbh | Vorrichtung zur berührungslosen temperaturmessung |
| US7218446B2 (en) * | 2003-08-27 | 2007-05-15 | Biomedical Photometrics Inc. | Imaging system having a fine focus |
| US20050111082A1 (en) * | 2003-11-20 | 2005-05-26 | Accretech (Israel) Ltd. | Confocal microscopy arrangement without beam splitter |
| DE102004034989A1 (de) * | 2004-07-16 | 2006-02-09 | Carl Zeiss Jena Gmbh | Zoomoptik für ein Lichtrastermikroskop mit punktförmiger Lichtquellenverteilung und Verwendung |
| DE102004034990A1 (de) | 2004-07-16 | 2006-02-02 | Carl Zeiss Jena Gmbh | Zoomoptik für ein Lichtrastermikroskop mit linienförmiger Abtastung und Verwendung |
| DE102004034991A1 (de) * | 2004-07-16 | 2006-02-02 | Carl Zeiss Jena Gmbh | Zoomoptik für ein Lichtrastermikroskop |
| DE102005008196B4 (de) * | 2005-02-22 | 2019-08-29 | Leica Microsystems Cms Gmbh | Verfahren zum Erkennen von Dunkelzuständen bei der spektroskopischen oder mikroskopischen Untersuchung von fluoreszenten Proben und Vorrichtung zur spektroskopischen oder mikroskopischen Untersuchung von fluoreszenten Proben |
| US7397561B2 (en) * | 2005-11-07 | 2008-07-08 | Wafermasters, Incorporated | Spectroscopy system |
| US7564547B2 (en) * | 2005-11-07 | 2009-07-21 | Wafermasters, Inc. | Spectroscopy system |
| JP2008225095A (ja) * | 2007-03-13 | 2008-09-25 | Olympus Corp | 光走査型観察装置 |
| US8240912B2 (en) | 2008-08-15 | 2012-08-14 | Fluke Corporation | Multi-zone non-contact spot thermometer |
| CH699575A1 (de) * | 2008-10-06 | 2010-04-15 | Nectar Imaging S R L | Optisches System für ein Konfokalmikroskop. |
| DE102009044983A1 (de) | 2009-09-24 | 2011-03-31 | Carl Zeiss Microimaging Gmbh | Mikroskop |
| JP5616824B2 (ja) | 2011-03-10 | 2014-10-29 | オリンパス株式会社 | 顕微鏡装置 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DD276218A3 (de) * | 1987-04-02 | 1990-02-21 | Zeiss Jena Veb Carl | Anordnung zur vermeidung des variablen oeffnungsfehlers in rastermikroskopen mit z-scan |
| US4827125A (en) * | 1987-04-29 | 1989-05-02 | The United States Of America As Represented By The Secretary Of The Department Of Health And Human Services | Confocal scanning laser microscope having no moving parts |
| CA1325537C (en) * | 1988-08-01 | 1993-12-28 | Timothy Peter Dabbs | Confocal microscope |
| GB9014263D0 (en) * | 1990-06-27 | 1990-08-15 | Dixon Arthur E | Apparatus and method for spatially- and spectrally- resolvedmeasurements |
| US5334830A (en) * | 1991-05-29 | 1994-08-02 | Olympus Optical Co., Ltd. | Scanning optical microscope having a compact confocal optical system for adjusting position of aperture |
| DE4429416A1 (de) * | 1994-08-19 | 1996-02-22 | Velzel Christiaan H F | Verfahren und Interferenzmikroskop zum Mikroskopieren eines Objektes zur Erzielung einer Auflösung jenseits der Beugungsgrenze (Superauflösung) |
| US5563710A (en) * | 1994-10-28 | 1996-10-08 | The Schepens Eye Research Institute, Inc. | Imaging system with confocally self-detecting laser |
-
1996
- 1996-12-24 DE DE19654211A patent/DE19654211C2/de not_active Expired - Fee Related
-
1997
- 1997-12-12 EP EP97951848A patent/EP0950205B1/de not_active Expired - Lifetime
- 1997-12-12 US US09/331,458 patent/US6285019B1/en not_active Expired - Lifetime
- 1997-12-12 JP JP52821698A patent/JP2001509278A/ja not_active Ceased
- 1997-12-12 WO PCT/DE1997/002895 patent/WO1998028646A1/de not_active Ceased
- 1997-12-12 DE DE59708457T patent/DE59708457D1/de not_active Expired - Lifetime
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007504498A (ja) * | 2003-09-05 | 2007-03-01 | ライカ マイクロシステムス ツェーエムエス ゲーエムベーハー | ラスタ顕微鏡 |
| JP2005266084A (ja) * | 2004-03-17 | 2005-09-29 | Lasertec Corp | コンフォーカル顕微鏡及び膜厚測定装置 |
| JP2005321657A (ja) * | 2004-05-10 | 2005-11-17 | Nikon Corp | 顕微鏡の光学系、顕微鏡、及びバーチャルスライド作成システム |
| JP2006163402A (ja) * | 2004-12-06 | 2006-06-22 | Leica Microsystems Cms Gmbh | 顕微鏡用光学装置 |
| JP2011501244A (ja) * | 2007-10-30 | 2011-01-06 | パーキンエルマー・シンガポール・プライベート・リミテッド | 走査型共焦点顕微法およびそれに関する改善 |
| JP2009116054A (ja) * | 2007-11-07 | 2009-05-28 | Nikon Corp | 光学装置および顕微鏡 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO1998028646A1 (de) | 1998-07-02 |
| US6285019B1 (en) | 2001-09-04 |
| DE19654211A1 (de) | 1998-08-13 |
| EP0950205A1 (de) | 1999-10-20 |
| EP0950205B1 (de) | 2002-10-09 |
| DE19654211C2 (de) | 2000-07-06 |
| DE59708457D1 (de) | 2002-11-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
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