JP2001334455A5 - - Google Patents
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- Publication number
- JP2001334455A5 JP2001334455A5 JP2000161520A JP2000161520A JP2001334455A5 JP 2001334455 A5 JP2001334455 A5 JP 2001334455A5 JP 2000161520 A JP2000161520 A JP 2000161520A JP 2000161520 A JP2000161520 A JP 2000161520A JP 2001334455 A5 JP2001334455 A5 JP 2001334455A5
- Authority
- JP
- Japan
- Prior art keywords
- water
- polishing pad
- composition
- soluble
- matrix material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005498 polishing Methods 0.000 claims description 34
- 239000002245 particle Substances 0.000 claims description 16
- 239000000203 mixture Substances 0.000 claims description 15
- 239000011159 matrix material Substances 0.000 claims description 12
- 229920001971 elastomer Polymers 0.000 claims description 8
- 239000005060 rubber Substances 0.000 claims description 8
- 229920006037 cross link polymer Polymers 0.000 claims description 6
- 229920002589 poly(vinylethylene) polymer Polymers 0.000 claims description 3
- 238000010521 absorption reaction Methods 0.000 claims description 2
- 239000007787 solid Substances 0.000 claims description 2
- 229920000858 Cyclodextrin Polymers 0.000 claims 1
- FBPFZTCFMRRESA-KVTDHHQDSA-N D-Mannitol Chemical compound OC[C@@H](O)[C@@H](O)[C@H](O)[C@H](O)CO FBPFZTCFMRRESA-KVTDHHQDSA-N 0.000 claims 1
- 229920001353 Dextrin Polymers 0.000 claims 1
- 239000004375 Dextrin Substances 0.000 claims 1
- 229920001577 copolymer Polymers 0.000 claims 1
- 235000019425 dextrin Nutrition 0.000 claims 1
- 235000010355 mannitol Nutrition 0.000 claims 1
- 229920001195 polyisoprene Polymers 0.000 claims 1
- 102000004169 proteins and genes Human genes 0.000 claims 1
- 108090000623 proteins and genes Proteins 0.000 claims 1
- 239000011347 resin Substances 0.000 claims 1
- 229920005989 resin Polymers 0.000 claims 1
- HFHDHCJBZVLPGP-UHFFFAOYSA-N schardinger α-dextrin Chemical compound O1C(C(C2O)O)C(CO)OC2OC(C(C2O)O)C(CO)OC2OC(C(C2O)O)C(CO)OC2OC(C(O)C2O)C(CO)OC2OC(C(C2O)O)C(CO)OC2OC2C(O)C(O)C1OC2CO HFHDHCJBZVLPGP-UHFFFAOYSA-N 0.000 claims 1
- 239000011148 porous material Substances 0.000 description 3
- 239000002002 slurry Substances 0.000 description 3
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 description 2
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 2
- 239000002253 acid Substances 0.000 description 2
- 239000000654 additive Substances 0.000 description 2
- AYJRCSIUFZENHW-UHFFFAOYSA-L barium carbonate Chemical compound [Ba+2].[O-]C([O-])=O AYJRCSIUFZENHW-UHFFFAOYSA-L 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000000945 filler Substances 0.000 description 2
- NUJOXMJBOLGQSY-UHFFFAOYSA-N manganese dioxide Chemical compound O=[Mn]=O NUJOXMJBOLGQSY-UHFFFAOYSA-N 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 239000004094 surface-active agent Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 125000003504 2-oxazolinyl group Chemical group O1C(=NCC1)* 0.000 description 1
- 229910000831 Steel Inorganic materials 0.000 description 1
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 1
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 1
- 239000006061 abrasive grain Substances 0.000 description 1
- 125000004018 acid anhydride group Chemical group 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 150000008044 alkali metal hydroxides Chemical class 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 125000003277 amino group Chemical group 0.000 description 1
- 239000003963 antioxidant agent Substances 0.000 description 1
- 230000003078 antioxidant effect Effects 0.000 description 1
- 239000002216 antistatic agent Substances 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229920001400 block copolymer Chemical group 0.000 description 1
- 229910000019 calcium carbonate Inorganic materials 0.000 description 1
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 1
- CETPSERCERDGAM-UHFFFAOYSA-N ceric oxide Chemical compound O=[Ce]=O CETPSERCERDGAM-UHFFFAOYSA-N 0.000 description 1
- 229910000422 cerium(IV) oxide Inorganic materials 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000004927 clay Substances 0.000 description 1
- 229910052570 clay Inorganic materials 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 239000007822 coupling agent Substances 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- 125000003700 epoxy group Chemical group 0.000 description 1
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 1
- 239000000314 lubricant Substances 0.000 description 1
- ZLNQQNXFFQJAID-UHFFFAOYSA-L magnesium carbonate Chemical compound [Mg+2].[O-]C([O-])=O ZLNQQNXFFQJAID-UHFFFAOYSA-L 0.000 description 1
- 239000001095 magnesium carbonate Substances 0.000 description 1
- 229910000021 magnesium carbonate Inorganic materials 0.000 description 1
- 230000014759 maintenance of location Effects 0.000 description 1
- GEYXPJBPASPPLI-UHFFFAOYSA-N manganese(iii) oxide Chemical compound O=[Mn]O[Mn]=O GEYXPJBPASPPLI-UHFFFAOYSA-N 0.000 description 1
- 150000001451 organic peroxides Chemical class 0.000 description 1
- 239000007800 oxidant agent Substances 0.000 description 1
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 1
- -1 pH adjusters Substances 0.000 description 1
- 150000002978 peroxides Chemical class 0.000 description 1
- 239000004014 plasticizer Substances 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 229920005604 random copolymer Chemical group 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 239000010959 steel Substances 0.000 description 1
- 239000011593 sulfur Substances 0.000 description 1
- 229910052717 sulfur Inorganic materials 0.000 description 1
- 230000008961 swelling Effects 0.000 description 1
- 239000000454 talc Substances 0.000 description 1
- 229910052623 talc Inorganic materials 0.000 description 1
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 1
- 239000006097 ultraviolet radiation absorber Substances 0.000 description 1
- 229910001928 zirconium oxide Inorganic materials 0.000 description 1
Priority Applications (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000161520A JP3925041B2 (ja) | 2000-05-31 | 2000-05-31 | 研磨パッド用組成物及びこれを用いた研磨パッド |
| TW093131164A TWI290576B (en) | 2000-05-31 | 2001-05-30 | Composition for polishing pad and polishing pad using the same |
| TW090113083A TWI290575B (en) | 2000-05-31 | 2001-05-30 | Composition for polishing pad and polishing pad using the same |
| EP01113173A EP1164559B1 (en) | 2000-05-31 | 2001-05-30 | Composition for polishing pad and polishing pad using the same |
| DE60132399T DE60132399T2 (de) | 2000-05-31 | 2001-05-30 | Zusammensetzung für Polierkissen und Polierkissen das diese Zusammensetzung verwendet |
| KR1020010029902A KR100792102B1 (ko) | 2000-05-31 | 2001-05-30 | 연마 패드용 조성물 및 이를 이용한 연마 패드 |
| US09/867,541 US6790883B2 (en) | 2000-05-31 | 2001-05-31 | Composition for polishing pad and polishing pad using the same |
| US10/868,353 US7077879B2 (en) | 2000-05-31 | 2004-06-16 | Composition for polishing pad and polishing pad using the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000161520A JP3925041B2 (ja) | 2000-05-31 | 2000-05-31 | 研磨パッド用組成物及びこれを用いた研磨パッド |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006296711A Division JP4379462B2 (ja) | 2006-10-31 | 2006-10-31 | 研磨パッド用組成物及びこれを用いた研磨パッド |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2001334455A JP2001334455A (ja) | 2001-12-04 |
| JP2001334455A5 true JP2001334455A5 (https=) | 2004-12-16 |
| JP3925041B2 JP3925041B2 (ja) | 2007-06-06 |
Family
ID=18665534
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000161520A Expired - Lifetime JP3925041B2 (ja) | 2000-05-31 | 2000-05-31 | 研磨パッド用組成物及びこれを用いた研磨パッド |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US6790883B2 (https=) |
| EP (1) | EP1164559B1 (https=) |
| JP (1) | JP3925041B2 (https=) |
| KR (1) | KR100792102B1 (https=) |
| DE (1) | DE60132399T2 (https=) |
| TW (2) | TWI290576B (https=) |
Families Citing this family (76)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| MY114512A (en) * | 1992-08-19 | 2002-11-30 | Rodel Inc | Polymeric substrate with polymeric microelements |
| JP3826702B2 (ja) * | 2000-10-24 | 2006-09-27 | Jsr株式会社 | 研磨パッド用組成物及びこれを用いた研磨パッド |
| CN100496896C (zh) * | 2000-12-01 | 2009-06-10 | 东洋橡膠工业株式会社 | 研磨垫 |
| KR100429691B1 (ko) * | 2001-06-13 | 2004-05-03 | 동성에이앤티 주식회사 | 미세기공 함유 연마패드 및 그 제조방법 |
| US7097549B2 (en) * | 2001-12-20 | 2006-08-29 | Ppg Industries Ohio, Inc. | Polishing pad |
| US20040171339A1 (en) * | 2002-10-28 | 2004-09-02 | Cabot Microelectronics Corporation | Microporous polishing pads |
| US20050276967A1 (en) * | 2002-05-23 | 2005-12-15 | Cabot Microelectronics Corporation | Surface textured microporous polishing pads |
| US6913517B2 (en) * | 2002-05-23 | 2005-07-05 | Cabot Microelectronics Corporation | Microporous polishing pads |
| US20040014413A1 (en) * | 2002-06-03 | 2004-01-22 | Jsr Corporation | Polishing pad and multi-layer polishing pad |
| US6641630B1 (en) | 2002-06-06 | 2003-11-04 | Cabot Microelectronics Corp. | CMP compositions containing iodine and an iodine vapor-trapping agent |
| TWI228768B (en) * | 2002-08-08 | 2005-03-01 | Jsr Corp | Processing method of polishing pad for semiconductor wafer and polishing pad for semiconductor wafer |
| EP1394202A3 (en) * | 2002-08-26 | 2004-03-31 | JSR Corporation | Composition for polishing pad and polishing pad therewith |
| KR100495404B1 (ko) * | 2002-09-17 | 2005-06-14 | 한국포리올 주식회사 | 임베디드 액상 미소요소를 함유하는 연마 패드 및 그 제조방법 |
| US20040058623A1 (en) * | 2002-09-20 | 2004-03-25 | Lam Research Corporation | Polishing media for chemical mechanical planarization (CMP) |
| US7267607B2 (en) * | 2002-10-28 | 2007-09-11 | Cabot Microelectronics Corporation | Transparent microporous materials for CMP |
| US7311862B2 (en) * | 2002-10-28 | 2007-12-25 | Cabot Microelectronics Corporation | Method for manufacturing microporous CMP materials having controlled pore size |
| US7435165B2 (en) | 2002-10-28 | 2008-10-14 | Cabot Microelectronics Corporation | Transparent microporous materials for CMP |
| JP4039214B2 (ja) | 2002-11-05 | 2008-01-30 | Jsr株式会社 | 研磨パッド |
| JP3910921B2 (ja) * | 2003-02-06 | 2007-04-25 | 株式会社東芝 | 研磨布および半導体装置の製造方法 |
| US20040224622A1 (en) | 2003-04-15 | 2004-11-11 | Jsr Corporation | Polishing pad and production method thereof |
| JP4292025B2 (ja) | 2003-05-23 | 2009-07-08 | Jsr株式会社 | 研磨パッド |
| US7442116B2 (en) | 2003-11-04 | 2008-10-28 | Jsr Corporation | Chemical mechanical polishing pad |
| DE602005006326T2 (de) * | 2004-02-05 | 2009-07-09 | Jsr Corp. | Chemisch-mechanisches Polierkissen und Polierverfahren |
| US7988534B1 (en) * | 2004-05-19 | 2011-08-02 | Sutton Stephen P | Optical polishing pitch formulations |
| JP2005340271A (ja) * | 2004-05-24 | 2005-12-08 | Jsr Corp | 化学機械研磨用パッド |
| US7153191B2 (en) * | 2004-08-20 | 2006-12-26 | Micron Technology, Inc. | Polishing liquids for activating and/or conditioning fixed abrasive polishing pads, and associated systems and methods |
| US20060099891A1 (en) * | 2004-11-09 | 2006-05-11 | Peter Renteln | Method of chemical mechanical polishing, and a pad provided therefore |
| US20060046064A1 (en) * | 2004-08-25 | 2006-03-02 | Dwaine Halberg | Method of improving removal rate of pads |
| US8075372B2 (en) * | 2004-09-01 | 2011-12-13 | Cabot Microelectronics Corporation | Polishing pad with microporous regions |
| DE602005007125D1 (de) | 2004-09-17 | 2008-07-10 | Jsr Corp | Chemisch-mechanisches Polierkissen und chemisch-mechanisches Polierverfahren |
| JP4475404B2 (ja) | 2004-10-14 | 2010-06-09 | Jsr株式会社 | 研磨パッド |
| US20060089094A1 (en) * | 2004-10-27 | 2006-04-27 | Swisher Robert G | Polyurethane urea polishing pad |
| US20060089095A1 (en) | 2004-10-27 | 2006-04-27 | Swisher Robert G | Polyurethane urea polishing pad |
| US20060089093A1 (en) * | 2004-10-27 | 2006-04-27 | Swisher Robert G | Polyurethane urea polishing pad |
| US8038752B2 (en) * | 2004-10-27 | 2011-10-18 | Cabot Microelectronics Corporation | Metal ion-containing CMP composition and method for using the same |
| TW200709892A (en) * | 2005-08-18 | 2007-03-16 | Rohm & Haas Elect Mat | Transparent polishing pad |
| TWI378844B (en) * | 2005-08-18 | 2012-12-11 | Rohm & Haas Elect Mat | Polishing pad and method of manufacture |
| JP4868840B2 (ja) * | 2005-11-30 | 2012-02-01 | Jsr株式会社 | 半導体装置の製造方法 |
| KR100804275B1 (ko) * | 2006-07-24 | 2008-02-18 | 에스케이씨 주식회사 | 고분자 쉘로 둘러싸인 액상 유기물 코어를 포함하는 cmp연마패드 및 그 제조방법 |
| CN100398579C (zh) * | 2006-11-15 | 2008-07-02 | 济南大学 | 一种制备无色甲阶酚醛树脂的方法 |
| JP4798103B2 (ja) * | 2007-09-03 | 2011-10-19 | Jsr株式会社 | 研磨パッド |
| JP2008168431A (ja) * | 2008-02-26 | 2008-07-24 | Jsr Corp | 研磨パッド |
| WO2009134775A1 (en) * | 2008-04-29 | 2009-11-05 | Semiquest, Inc. | Polishing pad composition and method of manufacture and use |
| JP5314329B2 (ja) * | 2008-06-12 | 2013-10-16 | 富士フイルム株式会社 | 研磨液 |
| TWI417169B (zh) * | 2009-06-11 | 2013-12-01 | Wei En Chen | Cutting tools with the top of the complex cutting |
| KR101108880B1 (ko) * | 2009-10-16 | 2012-01-30 | 대상 주식회사 | 전분계 연마 그릿 |
| US20130217231A1 (en) * | 2010-10-05 | 2013-08-22 | Basf Se | Chemical mechanical polishing (cmp) composition |
| WO2012138705A2 (en) * | 2011-04-05 | 2012-10-11 | Universal Photonics, Inc. | A self-conditioning polishing pad and a method of making the same |
| US9050697B2 (en) | 2012-03-20 | 2015-06-09 | Jh Rhodes Company, Inc. | Self-conditioning polishing pad and a method of making the same |
| US9144880B2 (en) | 2012-11-01 | 2015-09-29 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Soft and conditionable chemical mechanical polishing pad |
| US9233451B2 (en) | 2013-05-31 | 2016-01-12 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Soft and conditionable chemical mechanical polishing pad stack |
| US9238295B2 (en) | 2013-05-31 | 2016-01-19 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Soft and conditionable chemical mechanical window polishing pad |
| US9238296B2 (en) | 2013-05-31 | 2016-01-19 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Multilayer chemical mechanical polishing pad stack with soft and conditionable polishing layer |
| US20150306731A1 (en) | 2014-04-25 | 2015-10-29 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad |
| US9873180B2 (en) | 2014-10-17 | 2018-01-23 | Applied Materials, Inc. | CMP pad construction with composite material properties using additive manufacturing processes |
| SG11201703114QA (en) | 2014-10-17 | 2017-06-29 | Applied Materials Inc | Cmp pad construction with composite material properties using additive manufacturing processes |
| US11745302B2 (en) | 2014-10-17 | 2023-09-05 | Applied Materials, Inc. | Methods and precursor formulations for forming advanced polishing pads by use of an additive manufacturing process |
| US10399201B2 (en) | 2014-10-17 | 2019-09-03 | Applied Materials, Inc. | Advanced polishing pads having compositional gradients by use of an additive manufacturing process |
| US10875145B2 (en) | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Polishing pads produced by an additive manufacturing process |
| US10875153B2 (en) | 2014-10-17 | 2020-12-29 | Applied Materials, Inc. | Advanced polishing pad materials and formulations |
| US9776361B2 (en) | 2014-10-17 | 2017-10-03 | Applied Materials, Inc. | Polishing articles and integrated system and methods for manufacturing chemical mechanical polishing articles |
| US10821573B2 (en) | 2014-10-17 | 2020-11-03 | Applied Materials, Inc. | Polishing pads produced by an additive manufacturing process |
| US9484212B1 (en) | 2015-10-30 | 2016-11-01 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing method |
| KR20230169424A (ko) | 2015-10-30 | 2023-12-15 | 어플라이드 머티어리얼스, 인코포레이티드 | 원하는 제타 전위를 가진 연마 제품을 형성하는 장치 및 방법 |
| US10593574B2 (en) | 2015-11-06 | 2020-03-17 | Applied Materials, Inc. | Techniques for combining CMP process tracking data with 3D printed CMP consumables |
| US10391605B2 (en) | 2016-01-19 | 2019-08-27 | Applied Materials, Inc. | Method and apparatus for forming porous advanced polishing pads using an additive manufacturing process |
| US10456886B2 (en) | 2016-01-19 | 2019-10-29 | Applied Materials, Inc. | Porous chemical mechanical polishing pads |
| US11471999B2 (en) | 2017-07-26 | 2022-10-18 | Applied Materials, Inc. | Integrated abrasive polishing pads and manufacturing methods |
| WO2019032286A1 (en) | 2017-08-07 | 2019-02-14 | Applied Materials, Inc. | ABRASIVE DISTRIBUTION POLISHING PADS AND METHODS OF MAKING SAME |
| KR20210042171A (ko) | 2018-09-04 | 2021-04-16 | 어플라이드 머티어리얼스, 인코포레이티드 | 진보한 폴리싱 패드들을 위한 제형들 |
| KR102638363B1 (ko) | 2018-12-03 | 2024-02-19 | 주식회사 쿠라레 | 연마층용 폴리우레탄, 연마층 및 연마 패드 |
| CN111320863A (zh) * | 2018-12-14 | 2020-06-23 | 夏泰鑫半导体(青岛)有限公司 | 制备研磨垫之组合物 |
| US11813712B2 (en) | 2019-12-20 | 2023-11-14 | Applied Materials, Inc. | Polishing pads having selectively arranged porosity |
| US11806829B2 (en) | 2020-06-19 | 2023-11-07 | Applied Materials, Inc. | Advanced polishing pads and related polishing pad manufacturing methods |
| US11878389B2 (en) | 2021-02-10 | 2024-01-23 | Applied Materials, Inc. | Structures formed using an additive manufacturing process for regenerating surface texture in situ |
| KR102509973B1 (ko) * | 2021-05-07 | 2023-03-14 | 에스케이엔펄스 주식회사 | 연마패드, 이의 제조방법 및 이를 이용한 반도체 소자의 제조방법 |
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| US2701191A (en) * | 1949-02-02 | 1955-02-01 | American Optical Corp | Polishing pads |
| JPS61111343A (ja) * | 1984-11-06 | 1986-05-29 | Bridgestone Corp | 改良されたゴム組成物 |
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| WO1992018567A1 (fr) * | 1991-04-19 | 1992-10-29 | Kabushiki Kaisha Asahi | Composition a base de caoutchouc ayant la capacite de se decomposer dans la terre et article utilisant cette composition pour agreger la terre en pot |
| MY114512A (en) | 1992-08-19 | 2002-11-30 | Rodel Inc | Polymeric substrate with polymeric microelements |
| US6245861B1 (en) * | 1997-09-10 | 2001-06-12 | Hercules Incorporated | Use of peroxides to crosslink rubber compositions containing high vinyl styrene-butadiene rubber |
| JP3668046B2 (ja) * | 1998-05-11 | 2005-07-06 | 株式会社東芝 | 研磨布及びこの研磨布を用いた半導体装置の製造方法 |
| JP3918359B2 (ja) * | 1998-05-15 | 2007-05-23 | Jsr株式会社 | 研磨パッド用重合体組成物および研磨パッド |
| US6080221A (en) * | 1999-09-17 | 2000-06-27 | Agri-Nutrients Technology Group, Inc. | Vacuum coated particulate fertilizers |
| JP3826702B2 (ja) * | 2000-10-24 | 2006-09-27 | Jsr株式会社 | 研磨パッド用組成物及びこれを用いた研磨パッド |
| KR100858392B1 (ko) * | 2001-04-25 | 2008-09-11 | 제이에스알 가부시끼가이샤 | 반도체 웨이퍼용 연마 패드와, 이를 구비한 반도체웨이퍼용 연마 적층체와, 반도체 웨이퍼의 연마 방법 |
-
2000
- 2000-05-31 JP JP2000161520A patent/JP3925041B2/ja not_active Expired - Lifetime
-
2001
- 2001-05-30 TW TW093131164A patent/TWI290576B/zh not_active IP Right Cessation
- 2001-05-30 KR KR1020010029902A patent/KR100792102B1/ko not_active Expired - Fee Related
- 2001-05-30 TW TW090113083A patent/TWI290575B/zh not_active IP Right Cessation
- 2001-05-30 DE DE60132399T patent/DE60132399T2/de not_active Expired - Lifetime
- 2001-05-30 EP EP01113173A patent/EP1164559B1/en not_active Expired - Lifetime
- 2001-05-31 US US09/867,541 patent/US6790883B2/en not_active Expired - Lifetime
-
2004
- 2004-06-16 US US10/868,353 patent/US7077879B2/en not_active Expired - Lifetime
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